FI19992439A - For sample analysis by Raman spectroscopy - Google Patents

For sample analysis by Raman spectroscopy

Info

Publication number
FI19992439A
FI19992439A FI992439A FI19992439A FI19992439A FI 19992439 A FI19992439 A FI 19992439A FI 992439 A FI992439 A FI 992439A FI 19992439 A FI19992439 A FI 19992439A FI 19992439 A FI19992439 A FI 19992439A
Authority
FI
Finland
Prior art keywords
sample analysis
raman spectroscopy
raman
spectroscopy
sample
Prior art date
Application number
FI992439A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI117909B (en
Inventor
Jouko Vyoerykkae
Mari Halttunen
Jussi Tenhunen
Hanna Iitti
Original Assignee
Teknillinen Korkeakoulu
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teknillinen Korkeakoulu filed Critical Teknillinen Korkeakoulu
Priority to FI992439A priority Critical patent/FI117909B/en
Priority to AU15259/01A priority patent/AU1525901A/en
Priority to PCT/FI2000/000981 priority patent/WO2001036949A1/en
Publication of FI19992439A publication Critical patent/FI19992439A/en
Application granted granted Critical
Publication of FI117909B publication Critical patent/FI117909B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
FI992439A 1999-11-12 1999-11-12 Analysis of the sample by Raman spectroscopy FI117909B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI992439A FI117909B (en) 1999-11-12 1999-11-12 Analysis of the sample by Raman spectroscopy
AU15259/01A AU1525901A (en) 1999-11-12 2000-11-10 Analysing a sample in raman spectroscopy
PCT/FI2000/000981 WO2001036949A1 (en) 1999-11-12 2000-11-10 Analysing a sample in raman spectroscopy

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI992439 1999-11-12
FI992439A FI117909B (en) 1999-11-12 1999-11-12 Analysis of the sample by Raman spectroscopy

Publications (2)

Publication Number Publication Date
FI19992439A true FI19992439A (en) 2001-05-13
FI117909B FI117909B (en) 2007-04-13

Family

ID=8555592

Family Applications (1)

Application Number Title Priority Date Filing Date
FI992439A FI117909B (en) 1999-11-12 1999-11-12 Analysis of the sample by Raman spectroscopy

Country Status (3)

Country Link
AU (1) AU1525901A (en)
FI (1) FI117909B (en)
WO (1) WO2001036949A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI115412B (en) 2002-04-16 2005-04-29 Metso Automation Oy Method and apparatus for measuring a coating weight on a paper web
US20120133933A1 (en) * 2009-05-11 2012-05-31 Smiths Detection Inc. Method for reducing loss of electromagnetic radiation in detection applications

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54109488A (en) * 1978-02-08 1979-08-28 Fuji Photo Optical Co Ltd Analyzing method and device of optically scattered image information
DE3424108A1 (en) * 1984-06-29 1986-01-09 Bernhard Prof. Dr.-Ing. 4300 Essen Schrader SPECTROMETRY SAMPLE ARRANGEMENT, METHOD FOR MEASURING LUMINESCENCE AND SCATTERING AND USE OF THE SAMPLE ARRANGEMENT
US5208648A (en) * 1991-03-11 1993-05-04 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials

Also Published As

Publication number Publication date
FI117909B (en) 2007-04-13
AU1525901A (en) 2001-05-30
WO2001036949A1 (en) 2001-05-25

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