FI125849B - Absolute radiation power measurement - Google Patents
Absolute radiation power measurement Download PDFInfo
- Publication number
- FI125849B FI125849B FI20070429A FI20070429A FI125849B FI 125849 B FI125849 B FI 125849B FI 20070429 A FI20070429 A FI 20070429A FI 20070429 A FI20070429 A FI 20070429A FI 125849 B FI125849 B FI 125849B
- Authority
- FI
- Finland
- Prior art keywords
- power measurement
- radiation power
- absolute radiation
- absolute
- measurement
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
- H01L31/02165—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/044—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using shutters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20070429A FI125849B (en) | 2007-05-31 | 2007-05-31 | Absolute radiation power measurement |
PCT/FI2008/050321 WO2008145829A1 (en) | 2007-05-31 | 2008-06-02 | Absolute radiation power measurement |
EP08761717.1A EP2160766A4 (en) | 2007-05-31 | 2008-06-02 | Absolute radiation power measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20070429A FI125849B (en) | 2007-05-31 | 2007-05-31 | Absolute radiation power measurement |
Publications (3)
Publication Number | Publication Date |
---|---|
FI20070429A0 FI20070429A0 (en) | 2007-05-31 |
FI20070429A FI20070429A (en) | 2008-12-01 |
FI125849B true FI125849B (en) | 2016-03-15 |
Family
ID=38069468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20070429A FI125849B (en) | 2007-05-31 | 2007-05-31 | Absolute radiation power measurement |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP2160766A4 (en) |
FI (1) | FI125849B (en) |
WO (1) | WO2008145829A1 (en) |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3506835A (en) * | 1967-08-01 | 1970-04-14 | Zenith Radio Corp | Photo-detector signal-translating device |
US3567948A (en) | 1969-04-14 | 1971-03-02 | Us Navy | Method and apparatus for improving the quantum efficiency of phototubes |
US4096387A (en) * | 1976-12-09 | 1978-06-20 | Rca Corporation | Ultraviolet radiation detector |
JPS596582A (en) * | 1982-07-05 | 1984-01-13 | Mitsubishi Electric Corp | Power source device |
CH669050A5 (en) * | 1985-05-29 | 1989-02-15 | Oerlikon Buehrle Holding Ag | Optical sensor detecting specific substances in material |
US4681450A (en) * | 1985-06-21 | 1987-07-21 | Research Corporation | Photodetector arrangement for measuring the state of polarization of light |
US4782382A (en) * | 1986-10-17 | 1988-11-01 | Applied Solar Energy Corporation | High quantum efficiency photodiode device |
DE3920219A1 (en) * | 1989-06-21 | 1991-01-10 | Licentia Gmbh | Operating optical detector with active semiconductor detector layer - impinging radiation to be detected on side face under Brewster angle |
US5291055A (en) * | 1992-01-28 | 1994-03-01 | The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration | Resonant infrared detector with substantially unit quantum efficiency |
US5281804A (en) | 1992-08-06 | 1994-01-25 | Fujitsu Ltd. | Mirror apparatus for increasing light absorption efficiency of an optical detector |
US7501303B2 (en) * | 2001-11-05 | 2009-03-10 | The Trustees Of Boston University | Reflective layer buried in silicon and method of fabrication |
US6963061B2 (en) * | 2002-08-15 | 2005-11-08 | Motorola, Inc. | Orthogonal coupled transceiver |
-
2007
- 2007-05-31 FI FI20070429A patent/FI125849B/en not_active IP Right Cessation
-
2008
- 2008-06-02 WO PCT/FI2008/050321 patent/WO2008145829A1/en active Application Filing
- 2008-06-02 EP EP08761717.1A patent/EP2160766A4/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
FI20070429A (en) | 2008-12-01 |
FI20070429A0 (en) | 2007-05-31 |
EP2160766A1 (en) | 2010-03-10 |
EP2160766A4 (en) | 2014-06-11 |
WO2008145829A1 (en) | 2008-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Transfer of assignment of patent |
Owner name: AALTO UNIVERSITY FOUNDATION |
|
FG | Patent granted |
Ref document number: 125849 Country of ref document: FI Kind code of ref document: B |
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MM | Patent lapsed |