ES437555A1 - Circuito de deteccion. - Google Patents

Circuito de deteccion.

Info

Publication number
ES437555A1
ES437555A1 ES437555A ES437555A ES437555A1 ES 437555 A1 ES437555 A1 ES 437555A1 ES 437555 A ES437555 A ES 437555A ES 437555 A ES437555 A ES 437555A ES 437555 A1 ES437555 A1 ES 437555A1
Authority
ES
Spain
Prior art keywords
region
gate
semiconductor
forms
emitter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES437555A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of ES437555A1 publication Critical patent/ES437555A1/es
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/18Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
    • G01K7/20Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00Control of temperature
    • G05D23/19Control of temperature characterised by the use of electric means
    • G05D23/20Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/07Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
    • H01L27/0705Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
    • H01L27/0711Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors
    • H01L27/0716Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors in combination with vertical bipolar transistors and diodes, or capacitors, or resistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Ceramic Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Bipolar Transistors (AREA)
  • Measuring Magnetic Variables (AREA)
  • Amplifiers (AREA)
  • Thyristors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Light Receiving Elements (AREA)
ES437555A 1974-05-10 1975-05-09 Circuito de deteccion. Expired ES437555A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5211674A JPS5648983B2 (es) 1974-05-10 1974-05-10

Publications (1)

Publication Number Publication Date
ES437555A1 true ES437555A1 (es) 1977-01-16

Family

ID=12905889

Family Applications (1)

Application Number Title Priority Date Filing Date
ES437555A Expired ES437555A1 (es) 1974-05-10 1975-05-09 Circuito de deteccion.

Country Status (9)

Country Link
US (1) US4010486A (es)
JP (1) JPS5648983B2 (es)
AT (1) AT374976B (es)
CA (1) CA1048125A (es)
DE (1) DE2520713A1 (es)
ES (1) ES437555A1 (es)
FR (1) FR2270560B1 (es)
GB (1) GB1505585A (es)
NL (1) NL7505427A (es)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5648983B2 (es) * 1974-05-10 1981-11-19
JPS5248986A (en) * 1975-10-17 1977-04-19 Mitsubishi Electric Corp Semiconductor temperature sensitive switch element
US5189367A (en) * 1991-11-21 1993-02-23 Nec Research Institute, Inc. Magnetoresistor using a superlattice of GaAs and AlGaAs
US5347142A (en) * 1993-06-25 1994-09-13 The United States Of America As Represented By The Secretary Of The Army Modes of infrared hot electron transistor operation in infrared detection
DE10240404A1 (de) * 2002-09-02 2004-03-18 Austriamicrosystems Ag Hall-Sensor und Verfahren zu dessen Betrieb
KR100854463B1 (ko) 2007-05-21 2008-08-27 주식회사 하이닉스반도체 온도센서회로 및 이를 이용한 반도체 메모리 장치
TWI802858B (zh) * 2021-03-26 2023-05-21 立積電子股份有限公司 溫度偵測器

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL103476C (es) * 1955-04-21
NL242787A (es) * 1958-09-05
NL274830A (es) * 1961-04-12
US3500141A (en) * 1964-10-13 1970-03-10 Ibm Transistor structure
US3445734A (en) * 1965-12-22 1969-05-20 Ibm Single diffused surface transistor and method of making same
SE320729B (es) * 1968-06-05 1970-02-16 Asea Ab
US3591430A (en) * 1968-11-14 1971-07-06 Philco Ford Corp Method for fabricating bipolar planar transistor having reduced minority carrier fringing
US3600650A (en) * 1968-12-30 1971-08-17 Texas Instruments Inc Protected semiconductor device having sensor thermally coupled to electrode
US3668439A (en) * 1969-09-11 1972-06-06 Mitsubishi Electric Corp Magnetically operated semiconductor device
BE756139A (fr) * 1969-09-15 1971-02-15 Rca Corp Circuit intermediaire integre pour le couplage d'un circuit de commandea impedance de sortie faible a une charge a impedance d'entree elevee
JPS4831516B1 (es) * 1969-10-17 1973-09-29
DE2211384A1 (de) * 1971-03-20 1972-11-30 Philips Nv Schaltungsanordnung mit mindestens einem strahlungsgespeisten Schaltungselement und Halbleiteranordnung zur Anwendung in einer derartigen Schaltungsanordnung
JPS5123432B2 (es) * 1971-08-26 1976-07-16
JPS493583A (es) * 1972-04-20 1974-01-12
JPS49131388A (es) * 1973-04-18 1974-12-17
JPS5147583B2 (es) * 1972-12-29 1976-12-15
JPS5147584B2 (es) * 1972-12-29 1976-12-15
JPS5648983B2 (es) * 1974-05-10 1981-11-19

Also Published As

Publication number Publication date
NL7505427A (nl) 1975-11-12
JPS50145086A (es) 1975-11-21
CA1048125A (en) 1979-02-06
AU8065375A (en) 1976-11-04
FR2270560A1 (es) 1975-12-05
FR2270560B1 (es) 1985-11-15
AT374976B (de) 1984-06-25
US4010486A (en) 1977-03-01
DE2520713A1 (de) 1975-11-27
JPS5648983B2 (es) 1981-11-19
GB1505585A (en) 1978-03-30
ATA359075A (de) 1983-10-15

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