ES430876A1 - Una disposicion de circuito para determinar valores de ten-sion y de intensidad asociados con una duracion de conexion dada de una fuente de rayos x. - Google Patents

Una disposicion de circuito para determinar valores de ten-sion y de intensidad asociados con una duracion de conexion dada de una fuente de rayos x.

Info

Publication number
ES430876A1
ES430876A1 ES430876A ES430876A ES430876A1 ES 430876 A1 ES430876 A1 ES 430876A1 ES 430876 A ES430876 A ES 430876A ES 430876 A ES430876 A ES 430876A ES 430876 A1 ES430876 A1 ES 430876A1
Authority
ES
Spain
Prior art keywords
current
voltage
nomogram
function
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES430876A
Other languages
English (en)
Spanish (es)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of ES430876A1 publication Critical patent/ES430876A1/es
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/46—Combined control of different quantities, e.g. exposure time as well as voltage or current

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)
  • Measurement Of Radiation (AREA)
ES430876A 1973-10-12 1974-10-10 Una disposicion de circuito para determinar valores de ten-sion y de intensidad asociados con una duracion de conexion dada de una fuente de rayos x. Expired ES430876A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NLAANVRAGE7314037,A NL168392C (nl) 1973-10-12 1973-10-12 Inrichting voor het instellen van een roentgenstraalbuis.

Publications (1)

Publication Number Publication Date
ES430876A1 true ES430876A1 (es) 1976-10-01

Family

ID=19819807

Family Applications (1)

Application Number Title Priority Date Filing Date
ES430876A Expired ES430876A1 (es) 1973-10-12 1974-10-10 Una disposicion de circuito para determinar valores de ten-sion y de intensidad asociados con una duracion de conexion dada de una fuente de rayos x.

Country Status (10)

Country Link
JP (1) JPS5721118B2 (sv)
BE (1) BE820939A (sv)
CA (1) CA1055163A (sv)
DE (1) DE2448309C2 (sv)
ES (1) ES430876A1 (sv)
FR (1) FR2247872B1 (sv)
GB (1) GB1489377A (sv)
IT (1) IT1032542B (sv)
NL (1) NL168392C (sv)
SE (1) SE411826B (sv)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4638500A (en) * 1974-10-07 1987-01-20 U.S. Philips Corporation Method of determining voltage and current for a given operating period of an X-ray source
DE2613997A1 (de) * 1976-04-01 1977-10-13 Philips Patentverwaltung Regelvorrichtung, insbesondere zum regeln des emissionsstromes einer roentgenroehre
US4446365A (en) * 1979-03-22 1984-05-01 University Of Texas System Electrostatic imaging method
JPS6046714U (ja) * 1983-09-09 1985-04-02 株式会社　住建産業 床材
JPS61250258A (ja) * 1985-04-25 1986-11-07 ミサワホ−ム株式会社 防振床パネル
GB2174492A (en) * 1985-04-29 1986-11-05 Philips Nv X-ray examination system and method of controlling an exposure therein
JPS6376142U (sv) * 1986-05-16 1988-05-20
JPH0542417U (ja) * 1991-11-11 1993-06-08 イビデン株式会社 断熱防水パネル
JP4393090B2 (ja) * 2002-07-19 2010-01-06 東芝医用システムエンジニアリング株式会社 Ｘ線コンピュータ断層撮影装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1076836B (de) * 1957-09-28 1960-03-03 Siemens Reiniger Werke Ag Roentgendiagnostikapparat mit einem Belichtungsautomaten
DE1614150B1 (de) * 1966-04-07 1971-07-15 Medicor Muevek Roentgendurchleuchtungseinrichtung/ mit photoelektrischem wandler zum abtasten der leuchtbildflaeche zwecks bestim mung optimaler werte von roentgenroehrenspannung und strom
DE2204453B2 (de) * 1972-01-31 1977-09-01 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikapparat mit einer bildverstaerker-fernsehkette und einem die dosisleistung nach dem patienten einstellenden regelkreis
NL7314036A (nl) * 1973-10-12 1975-04-15 Philips Nv Gloeistroomverzorging voor een op hoogspanning ven elektronenbuis.

Also Published As

Publication number Publication date
JPS5721118B2 (sv) 1982-05-04
IT1032542B (it) 1979-06-20
DE2448309C2 (de) 1986-12-04
FR2247872B1 (sv) 1981-05-29
BE820939A (fr) 1975-04-10
DE2448309A1 (de) 1975-04-17
NL7314037A (nl) 1975-04-15
SE411826B (sv) 1980-02-04
NL168392C (nl) 1982-03-16
FR2247872A1 (sv) 1975-05-09
AU7398174A (en) 1976-04-08
JPS5068089A (sv) 1975-06-07
NL168392B (nl) 1981-10-16
SE7412654L (sv) 1975-04-14
CA1055163A (en) 1979-05-22
GB1489377A (en) 1977-10-19

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