ES2726992T3 - Monitoreo de proceso para curado por UV - Google Patents

Monitoreo de proceso para curado por UV Download PDF

Info

Publication number
ES2726992T3
ES2726992T3 ES15800776T ES15800776T ES2726992T3 ES 2726992 T3 ES2726992 T3 ES 2726992T3 ES 15800776 T ES15800776 T ES 15800776T ES 15800776 T ES15800776 T ES 15800776T ES 2726992 T3 ES2726992 T3 ES 2726992T3
Authority
ES
Spain
Prior art keywords
radiation
hardening
source
lacquer
monitoring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES15800776T
Other languages
English (en)
Spanish (es)
Inventor
Othmar Zueger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oerlikon Surface Solutions AG Pfaeffikon
Original Assignee
Oerlikon Surface Solutions AG Pfaeffikon
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oerlikon Surface Solutions AG Pfaeffikon filed Critical Oerlikon Surface Solutions AG Pfaeffikon
Application granted granted Critical
Publication of ES2726992T3 publication Critical patent/ES2726992T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/8411Application to online plant, process monitoring
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427Coatings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/845Objects on a conveyor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • G01N2201/0636Reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
ES15800776T 2014-11-25 2015-11-24 Monitoreo de proceso para curado por UV Active ES2726992T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462084004P 2014-11-25 2014-11-25
PCT/EP2015/077445 WO2016083342A1 (de) 2014-11-25 2015-11-24 Prozess monitoring für uv aushärtung

Publications (1)

Publication Number Publication Date
ES2726992T3 true ES2726992T3 (es) 2019-10-11

Family

ID=54703960

Family Applications (1)

Application Number Title Priority Date Filing Date
ES15800776T Active ES2726992T3 (es) 2014-11-25 2015-11-24 Monitoreo de proceso para curado por UV

Country Status (8)

Country Link
US (1) US10161858B2 (ko)
EP (1) EP3224599B1 (ko)
JP (1) JP6716589B2 (ko)
KR (1) KR20170086520A (ko)
CN (1) CN107250768A (ko)
ES (1) ES2726992T3 (ko)
PL (1) PL3224599T3 (ko)
WO (1) WO2016083342A1 (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015016730A1 (de) 2015-12-22 2017-06-22 Oerlikon Surface Solutions Ag, Pfäffikon UV-Aushärtevorrichtung mit geteilten UV-Umlenkspiegeln
EP3490494A4 (en) * 2016-07-29 2020-01-29 3M Innovative Properties Company DENTAL CURING LIGHTING SYSTEMS AND METHOD
FR3116118A1 (fr) * 2020-11-12 2022-05-13 Exelsius Dispositif de caractérisation de l’état de réticulation d’un matériau d’un objet.

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69731542T2 (de) 1996-09-19 2005-05-19 Nippon Soda Co. Ltd. Photokatalytische zusammensetzung
US5962860A (en) * 1997-05-19 1999-10-05 The Procter & Gamble Company Apparatus for generating controlled radiation for curing photosensitive resin
WO2001086261A1 (fr) * 2000-05-09 2001-11-15 Hamamatsu Photonics K.K. Procede et dispositif permettant de detecter le point final de durcissement d'une resine, ensemble, appareil et procede permettant de produire ledit ensemble
US20040149026A1 (en) * 2003-02-05 2004-08-05 General Electric Company Method and devices for quantitative evaluation of coatings
JP2005208046A (ja) * 2003-12-25 2005-08-04 Canon Inc 反応性硬化樹脂の硬化状態測定装置及び方法
US7245371B2 (en) 2004-08-27 2007-07-17 B & W Tek, Inc. Laser curing apparatus with real-time monitoring and control
WO2008137637A2 (en) * 2007-05-04 2008-11-13 The General Hospital Corporation Methods, arrangements and systems for obtaining information associated with a sample using brillouin microscopy
JP5056308B2 (ja) * 2007-09-21 2012-10-24 オムロン株式会社 硬化状態測定装置
DE102010061767A1 (de) 2010-11-23 2012-05-24 Ist Metz Gmbh Verfahren und System zur Härtungsprüfung
DE102011016683A1 (de) * 2011-01-27 2012-08-02 Oerlikon Trading Ag, Trübbach Radartransparente Beschichtung
US9211695B2 (en) 2012-05-15 2015-12-15 Palo Alto Research Center Incorporated Low-cost measurement system for photopolymer film polymerization monitoring
US20140044889A1 (en) * 2012-08-10 2014-02-13 Globalfoundries Inc. Methods of making stressed material layers and a system for forming such layers
JP6111571B2 (ja) * 2012-09-06 2017-04-12 東洋製罐株式会社 インクジェット印刷装置及び円筒形状容器への印刷方法
CN104937164A (zh) * 2013-01-17 2015-09-23 阿姆斯特郎世界工业公司 固化方法及其制备的产品

Also Published As

Publication number Publication date
KR20170086520A (ko) 2017-07-26
JP6716589B2 (ja) 2020-07-01
US10161858B2 (en) 2018-12-25
CN107250768A (zh) 2017-10-13
WO2016083342A1 (de) 2016-06-02
EP3224599B1 (de) 2019-01-23
JP2018501494A (ja) 2018-01-18
EP3224599A1 (de) 2017-10-04
PL3224599T3 (pl) 2019-07-31
US20170254745A1 (en) 2017-09-07

Similar Documents

Publication Publication Date Title
ES2569231T3 (es) Método de calibración de espectrógrafos de tratamiento de imagen
US9383311B2 (en) Non-scanning SPR system
ES2726992T3 (es) Monitoreo de proceso para curado por UV
JP2006030204A (ja) 光表面特性の測角検査装置
US20160130696A1 (en) Optical transmission/reflection mode in-situ deposition rate control for ice fabrication
CN103718022B (zh) 药剂检测装置和药剂检测方法
JP2008164628A (ja) 光表面特性の測角検査装置
JP2014209094A (ja) テラヘルツ波を用いて試料の情報を取得する情報取得装置および情報取得方法
US20200103338A1 (en) Diffuse reflectance infrared fourier transform spectroscopy
JP5605399B2 (ja) 偏光測定方法、及び偏光測定システム
JP2017161432A5 (ko)
CN108254161A (zh) 自准直式中阶梯光栅衍射效率测试装置
US9013700B2 (en) Variable path length photon trapping spectrometer
JP5372719B2 (ja) 表面特性測定方法および装置
TWI625510B (zh) 光照射裝置
JP2008128873A (ja) オンライン分光透過色測定方法及びオンライン分光透過色測定装置
ES2808550T3 (es) Método y sistema para la medición en tiempo real durante el proceso del espesor de recubrimiento
US10371628B2 (en) Apparatus for measuring spectral hemispherical reflectance of samples at grazing angles
JP2012063333A (ja) 光学特性値計測装置、光学特性値計測方法及び光学特性値計測プログラム
JP2004317324A (ja) レンズの基礎データの測定方法及び測定装置
WO2017117320A1 (en) Apparatus for analysis of irregular surface using electromagnetic energy
CN112747902A (zh) 光学测定方法和处理装置
Brandt et al. Laser Raman spectrometer for the studies of biomolecules with monitoring temperature of the samples
WO2019086727A1 (es) Dispositivo de inspección y caracterización de productos
JP2012063332A (ja) 表示装置、表示方法、プログラム、および、光学特性表示システム