ES2396400B8 - DEVICE FOR CHARACTERIZATION OF SAMPLES BY MEANS OF DIFRACTION OR DISPERSION OF X-RAYS - Google Patents

DEVICE FOR CHARACTERIZATION OF SAMPLES BY MEANS OF DIFRACTION OR DISPERSION OF X-RAYS Download PDF

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Publication number
ES2396400B8
ES2396400B8 ES201131432A ES201131432A ES2396400B8 ES 2396400 B8 ES2396400 B8 ES 2396400B8 ES 201131432 A ES201131432 A ES 201131432A ES 201131432 A ES201131432 A ES 201131432A ES 2396400 B8 ES2396400 B8 ES 2396400B8
Authority
ES
Spain
Prior art keywords
characterization
samples
cavity
dispersion
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES201131432A
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Spanish (es)
Other versions
ES2396400B1 (en
ES2396400A1 (en
Inventor
Ramón Pons Pons
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Consejo Superior de Investigaciones Cientificas CSIC
Original Assignee
Consejo Superior de Investigaciones Cientificas CSIC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consejo Superior de Investigaciones Cientificas CSIC filed Critical Consejo Superior de Investigaciones Cientificas CSIC
Priority to ES201131432A priority Critical patent/ES2396400B8/en
Priority to PCT/ES2012/070584 priority patent/WO2013030420A1/en
Publication of ES2396400A1 publication Critical patent/ES2396400A1/en
Publication of ES2396400B1 publication Critical patent/ES2396400B1/en
Application granted granted Critical
Publication of ES2396400B8 publication Critical patent/ES2396400B8/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Dispositivo para caracterización de muestras por medio de difracción o de dispersión de rayos x.#Permite la caracterización de muestras sometidas a condiciones de entorno controlado, tales como humedad, presión, temperatura controladas, o atmósfera reductora, inerte, oxidante, etc. por medio de difracción/dispersión de rayos X sin necesidad de emplear portamuestras (6) especialmente adaptados. Comprende una fuente (2) de rayos X, un colimador-focalizador (3) y un detector (4). Comprende adicionalmente dos compartimentos (7) sometidos a vacío que definen una cavidad (5) adaptada para alojar la muestra, limitada dicha cavidad (5) por unos medios de cierre (11, 12, 14) herméticos y estancos; así como unos medios de control (8) de entorno para controlar el entorno de la muestra dentro de la cavidad (5).Device for characterization of samples by means of diffraction or x-ray scattering. # Allows the characterization of samples subjected to controlled environment conditions, such as humidity, pressure, controlled temperature, or reducing, inert, oxidizing atmosphere, etc. by means of X-ray diffraction / dispersion without using specially adapted sample holders (6). It comprises an X-ray source (2), a collimator-focalizer (3) and a detector (4). It additionally comprises two compartments (7) subjected to vacuum which define a cavity (5) adapted to accommodate the sample, said cavity (5) limited by airtight and sealed closing means (11, 12, 14); as well as environment control means (8) to control the environment of the sample within the cavity (5).

ES201131432A 2011-08-31 2011-08-31 DEVICE FOR CHARACTERIZATION OF SAMPLES BY MEANS OF DIFRACTION OR DISPERSION OF X-RAYS Expired - Fee Related ES2396400B8 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ES201131432A ES2396400B8 (en) 2011-08-31 2011-08-31 DEVICE FOR CHARACTERIZATION OF SAMPLES BY MEANS OF DIFRACTION OR DISPERSION OF X-RAYS
PCT/ES2012/070584 WO2013030420A1 (en) 2011-08-31 2012-07-30 Device for the characterisation of samples by means of x-ray dispersion or diffraction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201131432A ES2396400B8 (en) 2011-08-31 2011-08-31 DEVICE FOR CHARACTERIZATION OF SAMPLES BY MEANS OF DIFRACTION OR DISPERSION OF X-RAYS

Publications (3)

Publication Number Publication Date
ES2396400A1 ES2396400A1 (en) 2013-02-21
ES2396400B1 ES2396400B1 (en) 2013-12-27
ES2396400B8 true ES2396400B8 (en) 2014-05-06

Family

ID=47631765

Family Applications (1)

Application Number Title Priority Date Filing Date
ES201131432A Expired - Fee Related ES2396400B8 (en) 2011-08-31 2011-08-31 DEVICE FOR CHARACTERIZATION OF SAMPLES BY MEANS OF DIFRACTION OR DISPERSION OF X-RAYS

Country Status (2)

Country Link
ES (1) ES2396400B8 (en)
WO (1) WO2013030420A1 (en)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1072397A (en) * 1963-12-11 1967-06-14 Inst Obschchei I Neorganichesk X-ray testing apparatus
US4405435A (en) * 1980-08-27 1983-09-20 Hitachi, Ltd. Apparatus for performing continuous treatment in vacuum
SU1582097A1 (en) * 1988-04-04 1990-07-30 Специальное Конструкторское Бюро Рентгеновского И Кристаллооптического Приборостроения С Экспериментальным Производством Института Кристаллографии Им.А.В.Шубникова Low-angle x-ray difractometer
US5493596A (en) * 1993-11-03 1996-02-20 Annis; Martin High-energy X-ray inspection system
JPH09178900A (en) * 1995-12-27 1997-07-11 Olympus Optical Co Ltd X-ray observing device
JP3519208B2 (en) * 1996-03-29 2004-04-12 理学電機株式会社 X-ray small-angle scattering device with vacuum chamber
DE19820321B4 (en) * 1998-05-07 2004-09-16 Bruker Axs Gmbh Compact x-ray spectrometer
JP2004125582A (en) * 2002-10-02 2004-04-22 Rigaku Corp Analyzer and analysis method

Also Published As

Publication number Publication date
ES2396400B1 (en) 2013-12-27
WO2013030420A1 (en) 2013-03-07
ES2396400A1 (en) 2013-02-21

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