ES2127779T3 - Compensacion de no uniformidad de amplio intervalo dinamico para ordenaciones planas focales infrarrojas. - Google Patents

Compensacion de no uniformidad de amplio intervalo dinamico para ordenaciones planas focales infrarrojas.

Info

Publication number
ES2127779T3
ES2127779T3 ES93119688T ES93119688T ES2127779T3 ES 2127779 T3 ES2127779 T3 ES 2127779T3 ES 93119688 T ES93119688 T ES 93119688T ES 93119688 T ES93119688 T ES 93119688T ES 2127779 T3 ES2127779 T3 ES 2127779T3
Authority
ES
Spain
Prior art keywords
response
focal plane
digital video
uniformity
compensation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES93119688T
Other languages
English (en)
Inventor
Gary M Lindgren
Joseph A Spagnolia
Anthony J Kay
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Application granted granted Critical
Publication of ES2127779T3 publication Critical patent/ES2127779T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

UN METODO Y UN APARATO PARA COMPENSAR LA FALTA DE UNIFORMIDAD DE SISTEMAS DE PLANOS FOCALES INFRARROJOS EN UN DISPOSITIVO DE FORMACION DE IMAGENES INFRARROJO (10) QUE INCLUYE UNA OPERACION DE CALIBRADO Y UNA OPERACION DE CORRECCION. LA OPERACION DE CALIBRADO MIDE LA RESPUESTA (24) GENERADA POR UNOS ELEMENTOS DETECTORES (14) QUE HAY COLOCADOS EN EL SISTEMA DE PLANOS FOCALES (16) A UNA AMPLIA GAMA DE NIVELES DE FLUJO DE SEÑALES CONOCIDOS DE RADIACION INFRARROJA (22) PRODUCIDA POR UN CUERPO NEGRO UNIFORME BAJO CONDICIONES CONTROLADAS. A CONTINUACION SE ALMACENAN LAS RESPUESTAS (24) A MODO DE SEÑAL DE VIDEO DIGITAL (27) EN UNA MEMORIA DE CONSULTA (38). CON LA OPERACION DE CORRECCION SE LOGRA UNA COMPENSACION EN TIEMPO CASI REAL DE UNA SEGUNDA RESPUESTA DEL ELEMENTO DETECTOR (14) AL NIVEL DE FLUJO DE SEÑALES DE RADIACION INFRARROJA (22) PRODUCIDO POR OBJETOS QUE SE ENCUENTRAN EN EL CAMPO DE VISION CONSULTADO POR EL DISPOSITIVO DE FORMACION DE IMAGENES (10) A BASE DE COMPARAR LA SEGUNDA RESPUESTACON LAS SEÑALES DE VIDEO DIGITALES ALMACENADAS (27) E INTERPOLA LA SEGUNDA RESPUESTA A UNA SEÑAL DE SALIDA DE VIDEO DIGITAL CORREGIDA (31).
ES93119688T 1992-12-07 1993-12-07 Compensacion de no uniformidad de amplio intervalo dinamico para ordenaciones planas focales infrarrojas. Expired - Lifetime ES2127779T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US98630492A 1992-12-07 1992-12-07

Publications (1)

Publication Number Publication Date
ES2127779T3 true ES2127779T3 (es) 1999-05-01

Family

ID=25532280

Family Applications (1)

Application Number Title Priority Date Filing Date
ES93119688T Expired - Lifetime ES2127779T3 (es) 1992-12-07 1993-12-07 Compensacion de no uniformidad de amplio intervalo dinamico para ordenaciones planas focales infrarrojas.

Country Status (10)

Country Link
US (1) US5420421A (es)
EP (1) EP0601534B1 (es)
JP (1) JP2661865B2 (es)
AU (1) AU656492B2 (es)
CA (1) CA2110368C (es)
DE (1) DE69323531T2 (es)
ES (1) ES2127779T3 (es)
IL (1) IL107828A (es)
NO (1) NO934422L (es)
TR (1) TR28036A (es)

Families Citing this family (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729639A (en) * 1995-05-16 1998-03-17 Santa Barbara Research Center Sensor system having detector to detector responsivity correction for pushbroom sensor
US5631466A (en) * 1995-06-16 1997-05-20 Hughes Electronics Apparatus and methods of closed loop calibration of infrared focal plane arrays
GB2303988A (en) * 1995-07-31 1997-03-05 Secr Defence Thermal imaging system with detector array calibration mode
GB2317779B8 (en) * 1995-07-31 2000-01-31 Sec Dep For Defence Defence Re Thermal sensing system having a fast response calibration device
JP3212874B2 (ja) * 1996-04-19 2001-09-25 日本電気株式会社 ボロメータ型赤外線撮像装置
GB2314227B (en) * 1996-06-14 1998-12-23 Simage Oy Calibration method and system for imaging devices
US5994701A (en) * 1996-10-15 1999-11-30 Nippon Avonics Co., Ltd. Infrared sensor device with temperature correction function
DE19715983C1 (de) * 1997-04-17 1998-09-24 Aeg Infrarot Module Gmbh Verfahren zum Korrigieren der Grauwerte von Bildern einer digitalen Infrarot-Kamera
US6184529B1 (en) 1998-01-28 2001-02-06 Lockheed Martin Corporation Methods and apparatus for performing scene based uniformity correction in imaging systems
NL1013296C2 (nl) * 1999-10-14 2001-04-18 Hollandse Signaalapparaten Bv Detectieinrichting voorzien van offsetcompensatie.
US6433333B1 (en) * 2000-03-03 2002-08-13 Drs Sensors & Targeting Systems, Inc. Infrared sensor temperature compensated response and offset correction
AU2001255178A1 (en) * 2000-03-17 2001-10-03 Infrared Components Corp. Method and apparatus for correction of microbolometer output
GB0008662D0 (en) * 2000-04-07 2000-05-31 Innovation Tk Limited Calibration techniques in telecine machines
DE10064184C1 (de) * 2000-12-22 2002-04-04 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Bilderzeugung unter Verwendung mehrerer Belichtungszeiten
US6683310B2 (en) * 2001-06-18 2004-01-27 Honeywell International Inc. Readout technique for microbolometer array
GB2384934A (en) * 2002-02-02 2003-08-06 Qinetiq Ltd Calibration of thermal imaging detector
US6737639B2 (en) * 2002-03-27 2004-05-18 Raytheon Company Display uniformity calibration system and method for a staring forward looking infrared sensor
US7443431B2 (en) * 2002-09-13 2008-10-28 Eastman Kodak Company Fixed pattern noise removal in CMOS imagers across various operational conditions
US8436905B2 (en) * 2002-09-20 2013-05-07 Bae Systems Information And Electronic Systems Integration Inc. Front lens shutter mount for uniformity correction
US6969856B1 (en) 2003-06-19 2005-11-29 The United States Of America As Represented By The Secretary Of The Navy Two band imaging system
DE10340515B4 (de) * 2003-09-03 2007-04-19 Carl Zeiss Optronics Gmbh Verfahren und Einrichtung zur Inhomogenitätskorrektur und Kalibrierung von optronischen Kameras mit Hilfe aufgenommener Bilder und Darstellen physikalischer Größen
DE10343496B4 (de) * 2003-09-19 2015-08-06 Siemens Aktiengesellschaft Korrektur eines von einem digitalen Röntgendetektor aufgenommenen Röntgenbildes sowie Kalibrierung des Röntgendetektors
US7463753B2 (en) * 2004-09-15 2008-12-09 Raytheon Company FLIR-to-missile boresight correlation and non-uniformity compensation of the missile seeker
US7899271B1 (en) 2004-09-15 2011-03-01 Raytheon Company System and method of moving target based calibration of non-uniformity compensation for optical imagers
US7218705B2 (en) * 2005-06-25 2007-05-15 General Electric Systems, methods and apparatus to offset correction of X-ray images
DE102005047595A1 (de) * 2005-10-05 2007-04-12 Carl Zeiss Sms Gmbh Verfahren zur Ermittlung der Empfindlichkeit von Sensorarrays
US7920982B2 (en) * 2008-01-15 2011-04-05 Raytheon Company Optical distortion calibration for electro-optical sensors
US8124937B2 (en) * 2009-01-15 2012-02-28 Raytheon Company System and method for athermal operation of a focal plane array
RU2407213C1 (ru) * 2009-07-01 2010-12-20 Федеральное государственное унитарное предприятие "Научно-производственное объединение "Государственный институт прикладной оптики" (ФГУП "НПО "ГИПО") Устройство формирования изображения
US7949241B2 (en) * 2009-09-29 2011-05-24 Raytheon Company Anamorphic focal array
US8610062B2 (en) 2011-03-24 2013-12-17 Raytheon Company Apparatus and method for multi-spectral imaging
US9143703B2 (en) * 2011-06-10 2015-09-22 Flir Systems, Inc. Infrared camera calibration techniques
CN102829873B (zh) * 2012-08-20 2014-06-25 南京理工大学 红外热像仪非均匀性评价装置
SE536679C2 (sv) 2012-11-01 2014-05-20 Flir Systems Ab Förfarande för mappning vid upptagning av videoflöden medelst kamera
CN103076097A (zh) * 2013-01-06 2013-05-01 河北汉光重工有限责任公司 基于参照源的分段线性非均匀矫正方法
KR101418110B1 (ko) * 2014-02-06 2014-08-06 엘아이지넥스원 주식회사 적외선 영상 보정 방법
KR101407723B1 (ko) * 2014-02-06 2014-06-13 엘아이지넥스원 주식회사 적외선 영상 보정 장치
CN104748865B (zh) * 2015-03-30 2018-01-05 北京空间机电研究所 一种用于红外图像的多点组合校正方法
JP2016219914A (ja) * 2015-05-15 2016-12-22 日本電気株式会社 赤外線撮像装置、及びその制御方法
CN105716720B (zh) * 2016-02-03 2019-05-31 姜志富 红外图像非均匀性校正方法及装置
DE102018001076A1 (de) * 2018-02-10 2019-08-14 Diehl Defence Gmbh & Co. Kg Verfahren zur Bestimmung von Kennlinienkorrekturfaktoren eines im infraroten Spektralbereich abbildenden Matrixdetektors
CN108519161B (zh) * 2018-04-10 2019-11-26 中国科学院上海技术物理研究所 一种红外焦平面非均匀性校正方法
CN110686781B (zh) * 2019-04-12 2024-04-09 福建鼎泰康医疗设备有限公司 一种温度校准方法及装置
CN110595626A (zh) * 2019-09-18 2019-12-20 深圳市一体医疗科技有限公司 一种红外探测器系统及成像方法
CN113865722B (zh) * 2021-09-28 2023-04-07 北京环境特性研究所 基于漫反射金属板的面阵制冷红外热像仪校正方法
CN116295869B (zh) * 2021-12-21 2026-01-30 中国石油天然气股份有限公司 差分式光谱滤波红外成像的二次非均匀校正方法和系统
CN117455794A (zh) * 2023-10-27 2024-01-26 昆明北方红外技术股份有限公司 一种基于加权分段最小二乘拟合及均值方差补偿的红外图像条纹噪声校正方法
CN119756607A (zh) * 2024-11-27 2025-04-04 中国航空工业集团公司洛阳电光设备研究所 一种非均匀校正片及校正方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57132031A (en) * 1981-02-09 1982-08-16 Fujitsu Ltd Correction system for output of infrared ray detecting elenent
JPS62298732A (ja) * 1986-06-18 1987-12-25 Nec Corp 赤外撮像装置
JP2565260B2 (ja) * 1987-10-17 1996-12-18 ソニー株式会社 固体撮像装置用画像欠陥補正装置
JPH06105186B2 (ja) * 1988-08-18 1994-12-21 富士電機株式会社 センサアレイの検出値出力方式
US4975864A (en) * 1989-01-26 1990-12-04 Hughes Aircraft Company Scene based nonuniformity compensation for starting focal plane arrays
US5128884A (en) * 1989-12-18 1992-07-07 Prager Kenneth E Black body calibration using image processing techniques
JPH04109128A (ja) * 1990-08-29 1992-04-10 Chino Corp 放射温度計
JPH0726871B2 (ja) * 1991-03-19 1995-03-29 日本アビオニクス株式会社 赤外線センサ信号処理回路

Also Published As

Publication number Publication date
IL107828A (en) 1996-09-04
DE69323531D1 (de) 1999-03-25
CA2110368A1 (en) 1994-06-08
NO934422D0 (no) 1993-12-06
AU5220793A (en) 1994-06-16
IL107828A0 (en) 1994-07-31
AU656492B2 (en) 1995-02-02
EP0601534B1 (en) 1999-02-17
JPH06235663A (ja) 1994-08-23
NO934422L (no) 1994-06-08
TR28036A (tr) 1995-12-11
EP0601534A1 (en) 1994-06-15
US5420421A (en) 1995-05-30
JP2661865B2 (ja) 1997-10-08
CA2110368C (en) 1999-11-23
DE69323531T2 (de) 1999-06-17

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