ES2114490B1 - METHOD FOR QUANTITATIVE X-RAY MICROANALYSIS OF METAL ALLOYS BASED ON A SET OF PATTERN SAMPLES OF ALLOY AND A MATHEMATICAL MODEL OF ADJUSTMENT. - Google Patents
METHOD FOR QUANTITATIVE X-RAY MICROANALYSIS OF METAL ALLOYS BASED ON A SET OF PATTERN SAMPLES OF ALLOY AND A MATHEMATICAL MODEL OF ADJUSTMENT.Info
- Publication number
- ES2114490B1 ES2114490B1 ES9601013A ES9601013A ES2114490B1 ES 2114490 B1 ES2114490 B1 ES 2114490B1 ES 9601013 A ES9601013 A ES 9601013A ES 9601013 A ES9601013 A ES 9601013A ES 2114490 B1 ES2114490 B1 ES 2114490B1
- Authority
- ES
- Spain
- Prior art keywords
- quantitative
- intensities
- alloy
- adjustment
- mathematical model
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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- Analysing Materials By The Use Of Radiation (AREA)
Abstract
METODO PARA EL MICROANALISIS CUANTITATIVO DE RAYOS X DE ALEACIONES METALICAS BASADO EN UN CONJUNTO DE MUESTRAS PATRON DE LA ALEACION Y UN MODELO MATEMATICO DE AJUSTE. EL METODO SE BASA EN LA APLICACION DE UN DISPOSITIVO QUE CONTIENE UN CONJUNTO DE ALEACIONES DE LA MISMA BASE METALICA, HOMOGENEAS QUIMICA Y ESTRUCTURALMENTE, ADECUADAS PARA SU UTILIZACION COMO PATRONES EN EL MICROANALISIS CUANTITATIVO DE LA ALEACION METALICA DE INTERES, EN SISTEMAS DE ANALISIS DE RAYOS X QUE UTILIZAN DETECTORES DE DISPERSION DE ENERGIAS (EDS), O DE DISPERSION DE LONGITUDES DE ONDAS (WDS), ACOPLADOS A UN MICROSCOPIO ELECTRONICO DE BARRIDO (SEM) O A UNA MICROSONDA ELECTRONICA (EPMA). EMPLEANDO DICHO DISPOSITIVO SE CALIBRA EL SISTEMA DE ANALISIS, SE PREPARA LA MUESTRA A ANALIZAR, SE OBTIENEN LAS INTENSIDADES NETAS DE CADA ELEMENTO Y SE INTRODUCEN LOS VALORES DE LAS INTENSIDADES NETAS EN UNA ECUACION DE AJUSTE QUE RELACIONA MATEMATICAMENTE LAS INTENSIDADES DE LOS ELEMENTOS CON LA COMPOSICION CENTESIMAL PARA CALCULAR LA COMPOSICION DE LA MUESTRA PROBLEMA. ESTE METODO TIENE APLICACION EN LA INDUSTRIA SIDERURGICA.METHOD FOR QUANTITATIVE X-RAY MICROANALYSIS OF METAL ALLOYS BASED ON A SET OF PATTERN SAMPLES OF ALLOY AND A MATHEMATICAL MODEL OF ADJUSTMENT. THE METHOD IS BASED ON THE APPLICATION OF A DEVICE CONTAINING A SET OF ALLOYS OF THE SAME METAL BASE, CHEMICAL AND STRUCTURALLY HOMOGENES, SUITABLE FOR USE AS A QUANTITATIVE ANALYSIS OF INTEREST METALISTIC METALISIS, X USING ENERGY DISPERSION DETECTORS (EDS), OR WAVE LENGTH DISPERSION (WDS), COUPLED TO A SWEEPING ELECTRON MICROSCOPE (SEM) OR AN ELECTRONIC MICROSONDA (EPMA). USING SUCH DEVICE, THE ANALYSIS SYSTEM IS CALIBRATED, THE SAMPLE IS PREPARED TO BE ANALYZED, THE NET INTENSITIES OF EACH ELEMENT ARE OBTAINED AND THE VALUES OF THE NET INTENSITIES ARE INTRODUCED IN A MATCH EQUATION THAT MATEMTICALLY RELATES THE INTENSITIES TO THE INTENSITIES CENTESIMAL TO CALCULATE THE COMPOSITION OF THE SAMPLE PROBLEM. THIS METHOD HAS APPLICATION IN THE STEEL INDUSTRY.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES9601013A ES2114490B1 (en) | 1996-05-07 | 1996-05-07 | METHOD FOR QUANTITATIVE X-RAY MICROANALYSIS OF METAL ALLOYS BASED ON A SET OF PATTERN SAMPLES OF ALLOY AND A MATHEMATICAL MODEL OF ADJUSTMENT. |
DE69631395T DE69631395T2 (en) | 1995-05-09 | 1996-05-08 | Quantitative microanalysis method with X-rays for metal alloys |
EP96500055A EP0742434B1 (en) | 1995-05-09 | 1996-05-08 | X-ray quantative microanalysis method for metal alloys |
AT96500055T ATE258680T1 (en) | 1995-05-09 | 1996-05-08 | QUANTATIVE MICROANALYSIS METHOD USING X-RAYS FOR METAL ALLOYS |
PT96500055T PT742434E (en) | 1995-05-09 | 1996-05-08 | METHOD OF X-RAY QUATITATIVE MICROANALYSIS FOR METAL ALLOYS |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES9601013A ES2114490B1 (en) | 1996-05-07 | 1996-05-07 | METHOD FOR QUANTITATIVE X-RAY MICROANALYSIS OF METAL ALLOYS BASED ON A SET OF PATTERN SAMPLES OF ALLOY AND A MATHEMATICAL MODEL OF ADJUSTMENT. |
Publications (2)
Publication Number | Publication Date |
---|---|
ES2114490A1 ES2114490A1 (en) | 1998-05-16 |
ES2114490B1 true ES2114490B1 (en) | 1999-02-01 |
Family
ID=8294717
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES9601013A Expired - Fee Related ES2114490B1 (en) | 1995-05-09 | 1996-05-07 | METHOD FOR QUANTITATIVE X-RAY MICROANALYSIS OF METAL ALLOYS BASED ON A SET OF PATTERN SAMPLES OF ALLOY AND A MATHEMATICAL MODEL OF ADJUSTMENT. |
Country Status (1)
Country | Link |
---|---|
ES (1) | ES2114490B1 (en) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4134012A (en) * | 1977-10-17 | 1979-01-09 | Bausch & Lomb, Inc. | X-ray analytical system |
GB2116698A (en) * | 1982-02-26 | 1983-09-28 | Coal Ind | Coal analysis using x-rays |
JPS58150845A (en) * | 1982-03-04 | 1983-09-07 | Kawatetsu Kousen Kogyo Kk | Method of quantitative analysis of multi-element alloy plating layer by x-ray measurement |
US4592082A (en) * | 1984-08-10 | 1986-05-27 | The United States Of America As Represented By The United States Department Of Energy | Quantitative determination of mineral composition by powder X-ray diffraction |
US4659437A (en) * | 1985-01-19 | 1987-04-21 | Tokusen Kogyo Kabushiki Kaisha | Method of thermal diffusion alloy plating for steel wire on continuous basis |
US4697080A (en) * | 1986-01-06 | 1987-09-29 | The United States Of America As Represented By The United States Department Of Energy | Analysis with electron microscope of multielement samples using pure element standards |
JPH0335149A (en) * | 1989-06-30 | 1991-02-15 | Nkk Corp | Method and instrument for measuring plating deposition and plating film composition of plated steel sheet |
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1996
- 1996-05-07 ES ES9601013A patent/ES2114490B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ES2114490A1 (en) | 1998-05-16 |
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Legal Events
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