ES2093988T3 - Un metodo y un dispositivo para medir la radiacion electromagnetica emitida o recibida por una tarjeta de circuito. - Google Patents

Un metodo y un dispositivo para medir la radiacion electromagnetica emitida o recibida por una tarjeta de circuito.

Info

Publication number
ES2093988T3
ES2093988T3 ES93924259T ES93924259T ES2093988T3 ES 2093988 T3 ES2093988 T3 ES 2093988T3 ES 93924259 T ES93924259 T ES 93924259T ES 93924259 T ES93924259 T ES 93924259T ES 2093988 T3 ES2093988 T3 ES 2093988T3
Authority
ES
Spain
Prior art keywords
circuit board
radiation
pct
considered
backplane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES93924259T
Other languages
English (en)
Inventor
Fredrik Kjebon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Application granted granted Critical
Publication of ES2093988T3 publication Critical patent/ES2093988T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0069Methods for measuring the shielding efficiency; Apparatus therefor; Isolation container for testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/14Mounting supporting structure in casing or on frame or rack
    • H05K7/1438Back panels or connecting means therefor; Terminals; Coding means to avoid wrong insertion
    • H05K7/1439Back panel mother boards
    • H05K7/1445Back panel mother boards with double-sided connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Power Sources (AREA)

Abstract

PARA MEDIR RADIACION EMITIDA DESDE, O LA INFLUENCIA DE RADIACION SOBRE, UNA PLACA DE CIRCUITO IMPRESO INDIVIDUAL, LA CUAL EN USO ESTA NORMALMENTE DISPUESTA EN UNA RANURA EN PARALELO A OTRAS PLACAS DE CIRCUITOS IMPRESOS, ESTANDO CONECTADOS A UN PLANO POSTERIOR (3) COMUN, EL PLANO POSTERIOR (5) ESTA MODIFICADO DE TAL MODO QUE LA CONEXION (9) DE UNA PLACA (7) CONSIDERADA ESTARA LOCALIZADA SOBRE LA CARA OPUESTA DE DICHO PLANO POSTERIOR EN COMPARACION A LAS CONEXIONES (5) DE LAS OTRAS PLACAS (1). LA TOTALIDAD DEL EQUIPAMIENTO ESTA LOCALIZADO EN UN ALOJAMIENTO (11) APANTALLADO A EXCEPCION DEL CIRCUITO IMPRESO (7) CONSIDERADO. POR ELLO LA RADIACION DE LOS OTROS CIRCUITOS (1) IMPRESOS ESTARA APANTALLADA O ATENUADA Y SOLO LA RADIACION DEL CIRCUITO IMPRESO (7) CONSIDERADO CONTRIBUIRA AL CAMPO DE RADIACION ALREDEDOR DEL DISPOSITIVO. DEL MISMO MODO SOLO ESTE CIRCUITO IMPRESO (7) CONSIDERADO SERA SENSIBLE A RADIACIONES ELECTROMAGNETICAS QUE LLEGAN DEL EXTERIOR. LA FUENTE DE ENERGIA DEL DISPOSITIVO ESTAPREFERIBLEMENTE DOTADA POR EQUIPAMIENTO DE POTENCIA LOCALIZADO DENTRO DEL ALOJAMIENTO (11) PROTEGIDO, TAL COMO UNA BATERIA (15) O UNA UNIDAD (17) DE ADAPTACION DE ENERGIA DE TENSION CONTINUA.
ES93924259T 1992-10-27 1993-10-26 Un metodo y un dispositivo para medir la radiacion electromagnetica emitida o recibida por una tarjeta de circuito. Expired - Lifetime ES2093988T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9203145A SE500305C2 (sv) 1992-10-27 1992-10-27 Sätt och anordning för att mäta elektromagnetisk utstrålning från eller mottagning av utifrån kommande elektromagnetisk strålning i ett kretskort

Publications (1)

Publication Number Publication Date
ES2093988T3 true ES2093988T3 (es) 1997-01-01

Family

ID=20387578

Family Applications (1)

Application Number Title Priority Date Filing Date
ES93924259T Expired - Lifetime ES2093988T3 (es) 1992-10-27 1993-10-26 Un metodo y un dispositivo para medir la radiacion electromagnetica emitida o recibida por una tarjeta de circuito.

Country Status (9)

Country Link
US (1) US5498968A (es)
EP (1) EP0619936B1 (es)
AT (1) ATE145315T1 (es)
AU (1) AU673559B2 (es)
DE (1) DE69305975T2 (es)
DK (1) DK0619936T3 (es)
ES (1) ES2093988T3 (es)
SE (1) SE500305C2 (es)
WO (1) WO1994010825A1 (es)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5920984A (en) * 1993-12-10 1999-07-13 Ericsson Ge Mobile Communications Inc. Method for the suppression of electromagnetic interference in an electronic system
US6160517A (en) * 1998-01-20 2000-12-12 Dell Usa, Llp Method and apparatus for testing electronic systems using electromagnetic emissions profiles
US6411102B1 (en) * 2000-01-07 2002-06-25 International Business Machines Corporation Apparatus for testing various structural parameters of an electro-magnetic radiation barrier
CN100392414C (zh) * 2005-04-15 2008-06-04 中兴通讯股份有限公司 一种电子设备内电磁辐射源的测量方法和装置
US11644425B2 (en) 2019-07-19 2023-05-09 Dell Products L.P. System and method for optical state determination
US12004336B2 (en) 2019-07-19 2024-06-04 Dell Products L.P. System and method for thermal management and electromagnetic interference management
US11399450B2 (en) 2019-07-19 2022-07-26 Dell Products L.P. System and method for managing electromagnetic interference
US11378608B2 (en) * 2019-07-19 2022-07-05 Dell Products L.P. System and method for device state determination

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2509045A (en) * 1947-11-26 1950-05-23 Collins Radio Co Ultra high frequency radiation indicating system
FR2513769A1 (fr) * 1981-09-29 1983-04-01 Aerospatiale Procede pour determiner le seuil de resistance d'un equipement electrique ou electronique a une agression electromagnetique exterieure et dispositifs pour sa mise en oeuvre
SU1045430A1 (ru) * 1982-06-04 1983-09-30 Предприятие П/Я В-8231 Устройство дл контрол печатных плат
JPS61187672A (ja) * 1985-02-15 1986-08-21 Nec Corp 密着型イメ−ジセンサの欠陥検査方法および欠陥検査装置
CA1286724C (en) * 1986-03-27 1991-07-23 Richard Ralph Goulette Method and apparatus for monitoring electromagnetic emission levels
US4939446A (en) * 1988-03-30 1990-07-03 Rogers Wesley A Voltage transmission link for testing EMI susceptibility of a device or circuits

Also Published As

Publication number Publication date
EP0619936A1 (en) 1994-10-19
ATE145315T1 (de) 1996-11-15
US5498968A (en) 1996-03-12
DE69305975D1 (de) 1996-12-19
DE69305975T2 (de) 1997-04-03
SE9203145L (sv) 1994-04-28
SE9203145D0 (sv) 1992-10-27
SE500305C2 (sv) 1994-05-30
WO1994010825A1 (en) 1994-05-11
DK0619936T3 (da) 1997-04-07
AU673559B2 (en) 1996-11-14
AU5400594A (en) 1994-05-24
EP0619936B1 (en) 1996-11-13

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