Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daimler AG
Original Assignee
DaimlerChrysler AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DaimlerChrysler AGfiledCriticalDaimlerChrysler AG
Priority to ES9901754UpriorityCriticalpatent/ES1043618Y/en
Publication of ES1043618UpublicationCriticalpatent/ES1043618U/en
Application grantedgrantedCritical
Publication of ES1043618YpublicationCriticalpatent/ES1043618Y/en
Investigating Strength Of Materials By Application Of Mechanical Stress
(AREA)
Abstract
Circuit measuring and testing device, characterized in that it incorporates a computer (1) as controller (2), preferably with a printer (3), peripheral measuring devices (4) with the measuring instruments (5) required in each case, for example with a digital multimeter, with a network component (7) for power supply, and with a test adapter (9) for housing the piece or electrical circuit (8) to be tested, with the component of the network to power both the test adapter and the measuring instruments and there are connecting lines between the devices of the peripheral measuring devices and the test adapter. (Machine-translation by Google Translate, not legally binding)
ES9901754U1999-07-021999-07-02
DEVICE FOR MEASURING AND TESTING ELECTRICAL CIRCUITS.
Expired - LifetimeES1043618Y
(en)
Method and apparatus for electrical testing of a unit under test, as well as a method for production of a contact-making apparatus which is used for testing
Film-type semiconductor package and method using test pads shared by output channels, and test device, semiconductor device and method using patterns shared by test channels