EP4315418A1 - Method for producing a metal-ceramic substrate, and metal-ceramic substrate produced using a method of this type - Google Patents
Method for producing a metal-ceramic substrate, and metal-ceramic substrate produced using a method of this typeInfo
- Publication number
- EP4315418A1 EP4315418A1 EP22718103.9A EP22718103A EP4315418A1 EP 4315418 A1 EP4315418 A1 EP 4315418A1 EP 22718103 A EP22718103 A EP 22718103A EP 4315418 A1 EP4315418 A1 EP 4315418A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- metal
- metal layer
- ceramic
- ceramic substrate
- ceramic element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000919 ceramic Substances 0.000 title claims abstract description 103
- 238000000034 method Methods 0.000 title claims abstract description 83
- 239000000758 substrate Substances 0.000 title claims abstract description 50
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 229910052751 metal Inorganic materials 0.000 claims abstract description 131
- 239000002184 metal Substances 0.000 claims abstract description 131
- 238000005530 etching Methods 0.000 claims abstract description 27
- 239000000126 substance Substances 0.000 claims abstract description 16
- 238000009413 insulation Methods 0.000 claims abstract description 12
- 238000005476 soldering Methods 0.000 claims abstract description 11
- 238000001513 hot isostatic pressing Methods 0.000 claims abstract description 7
- 229910000679 solder Inorganic materials 0.000 claims abstract description 7
- 238000012545 processing Methods 0.000 claims description 15
- 230000015572 biosynthetic process Effects 0.000 claims description 10
- 238000010297 mechanical methods and process Methods 0.000 claims description 7
- 238000002360 preparation method Methods 0.000 claims description 6
- 238000001311 chemical methods and process Methods 0.000 claims description 4
- 238000003801 milling Methods 0.000 claims description 3
- 238000003754 machining Methods 0.000 claims description 2
- 238000005304 joining Methods 0.000 abstract 2
- 239000000463 material Substances 0.000 description 30
- 230000000873 masking effect Effects 0.000 description 17
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 15
- 229910052802 copper Inorganic materials 0.000 description 10
- 239000010949 copper Substances 0.000 description 10
- 238000001465 metallisation Methods 0.000 description 8
- 238000002955 isolation Methods 0.000 description 6
- 239000011889 copper foil Substances 0.000 description 5
- 239000011888 foil Substances 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 229910052593 corundum Inorganic materials 0.000 description 4
- 229910001845 yogo sapphire Inorganic materials 0.000 description 4
- 238000002679 ablation Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 238000007373 indentation Methods 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 229910010293 ceramic material Inorganic materials 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 230000000930 thermomechanical effect Effects 0.000 description 2
- 229910016570 AlCu Inorganic materials 0.000 description 1
- 238000012935 Averaging Methods 0.000 description 1
- 102100033565 Biogenesis of lysosome-related organelles complex 1 subunit 6 Human genes 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 239000005751 Copper oxide Substances 0.000 description 1
- 229910018565 CuAl Inorganic materials 0.000 description 1
- 229910016525 CuMo Inorganic materials 0.000 description 1
- 201000005400 Hermansky-Pudlak syndrome 9 Diseases 0.000 description 1
- 101000872147 Homo sapiens Biogenesis of lysosome-related organelles complex 1 subunit 6 Proteins 0.000 description 1
- 241000530268 Lycaena heteronea Species 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- -1 S13N4 Inorganic materials 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 229910000431 copper oxide Inorganic materials 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000013532 laser treatment Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 239000010970 precious metal Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- 238000007514 turning Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B37/00—Joining burned ceramic articles with other burned ceramic articles or other articles by heating
- C04B37/02—Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles
- C04B37/023—Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles characterised by the interlayer used
- C04B37/026—Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles characterised by the interlayer used consisting of metals or metal salts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
- C04B2237/34—Oxidic
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
- C04B2237/34—Oxidic
- C04B2237/343—Alumina or aluminates
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
- C04B2237/34—Oxidic
- C04B2237/345—Refractory metal oxides
- C04B2237/348—Zirconia, hafnia, zirconates or hafnates
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
- C04B2237/36—Non-oxidic
- C04B2237/365—Silicon carbide
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
- C04B2237/36—Non-oxidic
- C04B2237/366—Aluminium nitride
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
- C04B2237/36—Non-oxidic
- C04B2237/368—Silicon nitride
Definitions
- the present invention relates to a method for producing a metal-ceramic substrate and a metal-ceramic substrate produced using such a method.
- Carrier substrates for electrical components are well known, for example as printed circuit boards or circuit boards from the prior art, for example from DE 10 2013 104 739 A1, DE 19 927 046 B4 and DE 10 2009 033 029 A1 .
- connection surfaces for electrical components and conductor tracks are arranged on one component side of the metal-ceramic substrate, with the electrical components and conductor tracks being able to be interconnected to form electrical circuits.
- Essential components of the metal-ceramic substrates are an insulation layer, which is preferably made of a ceramic material, and a metal layer or component metallization connected to the insulation layer. Because of their comparatively high insulation strength, ceramic insulation layers have proven to be particularly advantageous in power electronics. By structuring the metal layer, conductor tracks and/or connection areas for the electrical components can then be implemented.
- An etchant is then used to expose those areas that have remained free of the masking, as a result of which structuring in the metal layer corresponding to the masking is possible.
- Such a procedure is material and time-consuming, particularly with regard to applying the masking and the use of an etchant.
- a method for producing a metal-ceramic substrate comprising:
- the laser light is used to define the course of the structuring, while the etching agent used, for example, serves to uniformly remove material from the at least one metal layer.
- the etching agent used for example, serves to uniformly remove material from the at least one metal layer.
- the production or removal by means of laser light and/or by means of an etchant takes place simultaneously, at least at times. i.e. the two independent methods for removing material can overlap in time in order to further speed up the manufacturing process.
- an etchant is applied to the at least one metal layer over the entire area, while the laser light ensures further removal in further passes. Provision is preferably made for the processing with the laser light and the chemical treatment to be carried out one after the other.
- Another advantage that results from the combination of etching and ablating with laser light is ensuring that no material of the ceramic element is ablated during processing with the laser light. As a result, damage to the ceramic element by the laser light can be avoided.
- the removal with the etching agent does not is closed before the structuring with the laser light has been completed.
- the ablation with the laser light as part of a preparatory or preparation step serves to specify a course for the isolation trenches and/or the depressions, which in turn only receive their final or final depth through the etching step.
- At least 50%, preferably at least 75% and particularly preferably at least 90% of the material removal takes place by means of laser light.
- Indentations are understood in particular to mean such profilings in the at least one metal layer that do not lead to an isolation of two adjacent metal sections, but instead are used, for example, to be used as a soldering stop.
- a soldering stop prevents, for example, the soldering material from flowing unintentionally into certain areas, in that the recess acts as a ditch and receives the soldering material, thus preventing it from flowing further.
- Conceivable materials for the at least one metal layer or the rear-side metallization in the metal-ceramic substrate are copper, aluminum, molybdenum and/or their alloys, and laminates such as CuW, CuMo, CuAl, AlCu and/or CuCu, in particular copper -Sandwich structure with a first copper layer and a second copper layer, wherein a grain size in the first copper layer differs from the grain size in a second copper layer.
- the primary metal layer in particular as a component metallization, is surface-modified.
- sealing with a precious metal, in particular silver and/or gold, or ENIG (“electroless nickel immersion gold”), nickel or edge casting on the at least one metal layer to suppress crack formation or widening is conceivable as a surface modification.
- SiC SiC
- BeO MgO
- MgO high-density MgO (> 90% of theoretical density)
- TSZ tetragonal stabilized zirconium oxide
- the ceramic element prefferably be designed as a composite or hybrid ceramic, in which several ceramic layers, which differ in terms of their material composition, are arranged one on top of the other and joined together to form an insulating layer to combine various desired properties. It is also conceivable that a metallic intermediate layer is arranged between two ceramic layers, which is preferably thicker than 1.5 mm and/or thicker than the two ceramic layers in total. A ceramic that is as thermally conductive as possible is preferably used for the lowest possible thermal resistance.
- DCB method Direct Copper Bond Technology
- DAB method Direct Aluminum Bond Technology
- metal layers or sheets e.g . B. copper sheets or foils or aluminum sheets or foils
- ceramics or ceramic layers namely using metal or copper sheets or metal or copper foils which have a layer or coating ( Reflow layer)
- Reflow layer metal or copper sheets or metal or copper foils which have a layer or coating ( Reflow layer)
- an active soldering process e.g. B. for connecting metal layers or metal foils, in particular copper layers or copper foils with ceramic material
- a method is to be understood, which is also used specifically for the production of metal-ceramic substrates, at a temperature between approx. 600-1000° C a connection between a metal foil, such as copper foil, and a ceramic substrate, such as aluminum nitride ceramic, produced un ter using a hard solder, which in addition to a Schokom component such as copper, silver and / or gold also contains an active metal.
- This active metal which for example contains at least one element from the group Hf, Ti, Zr,
- connection between the solder and the ceramic by chemical reaction, while the connection between the solder and the metal is a metallic brazing connection.
- connection between the solder and the metal is a metallic brazing connection.
- a thick layer process is also conceivable for connection.
- Hot isostatic pressing is known, for example, from EP 3080055 B1, the content of which with regard to hot isostatic pressing is hereby explicitly referred to.
- the structuring is specified by means of the ablation by the laser light and an isotropically acting etching is used in order to cause an even ablation on the entire upper side of the at least one metal layer.
- masking is provided.
- the recess which has a depth that is smaller than the thickness of the at least one metal layer, is produced in the preparatory step before the etching.
- the recess that has already been formed can then be used to allow an etching medium to flow only into this recess or to concentrate it here.
- an etchant is applied and, by tilting and swiveling movements on the upper side of the at least one metal layer, protruding etchant either flows off the metal-ceramic substrate or flows into the recess.
- the chemical process that begins or continues after the end of the laser treatment ensures that a residual amount of the metal layer is removed to form an isolation trench.
- a masking is provided at least in sections, for example in order to realize a stepped profile or in order to maintain the thickness in the areas outside the planned isolation trenches.
- the pre-structuring by means of the laser light i.e. the formation of the recess during the preparation step, also proves to be advantageous because it allows the masking to be applied more flexibly and easily, for example by means of a corresponding printing process on the areas that do not have to be removed during the pre-structuring have experienced.
- a masking is provided at least in sections, which is partially removed with laser light, as a result of which no material is removed from the upper side of the at least one metal layer during etching. The original metal layer thickness can thus be retained, at least in selected areas. In these areas it is also conceivable to structure the at least one metal layer analogously to the other examples mentioned with laser light in combination with the etching process.
- a geometry of a side surface of the at least one metal layer that does not run parallel to the main plane of extension is preferably defined at least in sections by means of the laser method.
- this relates to that side surface which connects an upper edge of the at least one metal layer to a lower edge of the at least one metal layer.
- This side surface which essentially laterally delimits the at least one metal layer, can be shaped accordingly in order to have a particularly advantageous effect on the thermal shock resistance. For example, it has been shown that the thermal shock resistance can be increased by forming a local maximum and/or a local minimum between the upper edge and the lower edge.
- the manufactured side surface runs obliquely and/or curved and/or curved and/or stepped and/or segmented.
- Additional positive properties for the metal-ceramic substrate can be caused by the corresponding geometric design, in particular with regard to the temperature change resistance and the ability of the at least one metal layer to be pulled off the ceramic element.
- the heat spread can also be taken into account when forming the corresponding geometry of at least one metal layer or its side surface.
- a free area between two mutually insulated and adjacent metal sections has an aspect ratio (height to width of the free area) greater than 1, preferably greater than 1.5 and particularly preferably greater than 2.
- narrow isolation trenches can be provided, which allow a very compact arrangement of the metal sections, in particular even when the metal layer is comparatively thick, for example greater than 1.5 mm.
- an ultra-short pulsed laser to be used when ablating with laser light.
- the light used can be continuously emitted or pulsed light, for example. It is preferably ultra-short-pulse laser light with light pulses whose pulse length or pulse durations are shorter than one nanosecond.
- the USP laser is preferably a laser source that provides light pulses with a pulse duration of 0.1 to 800 ps, preferably 1 to 500 ps, particularly preferably 10 to 50 ps
- mechanical processing for example machining, in particular milling, especially in those areas in which a predetermined breaking point is to be embedded later should, along which, in turn, a break between isolated metal-ceramic substrates should take place, for example in a large map.
- the laser light is used to produce a recess with a depth measured perpendicularly to the main extension plane, with a ratio of a maximum depth of the recess to a thickness of the at least one metal layer being between 0.7 and 0.99, preferably between 0 .8 and 0.98 and more preferably between 0.9 and 0.95.
- the maximum depth includes the greatest depth to be determined, which is measured from a top side of the at least one metal layer in a direction that runs perpendicular to the main plane of extension. If the depth of the recesses is modulated, the maximum depth also means in particular its arithmetic mean, which is determined, for example, by determining the depth of the recesses at a hundred different positions and then averaging it.
- the at least one metal layer is preferably made to have a thickness which is greater than 1 mm, preferably greater than 1.5 mm and particularly preferably greater than 2.5 mm. Exploiting or pre-structuring by means of the laser light has proven to be particularly advantageous for such thick metal layers, because this enables particularly small distances to be achieved between two adjacent metal sections, which would otherwise not be possible if material is removed solely using an etchant. As a result, the correspondingly produced printed circuit board can be designed in such a way that metal sections can be realized and formed on the upper side of the ceramic element in the most space-saving manner possible.
- Another object of the present invention is a method for producing a metal-ceramic substrate, comprising:
- processing using the chemical method is ended after the end of the mechanical method and/or processing using the mechanical method is carried out as a preparatory step before or partially overlapping with the chemical method.
- This advantageously makes it possible to avoid the outside of the ceramic element being adversely affected during removal by a mechanical tool. Instead, a remaining metal residue is removed from the outside of the ceramic element in a manner that is gentle on the material and the ceramic element is exposed again in certain areas. This is used for the final formation of the structuring or the desired insulation trenches between two adjacent metal sections.
- a further object of the present invention is a metal-ceramic substrate produced using the method according to the invention. All the properties and advantages described for the process can be transferred analogously to the metal-ceramic substrate and vice versa.
- the metal-ceramic substrate is part of a power module and serves as a carrier for electrical or electronic components.
- FIG. 2 shows a metal-ceramic substrate according to a second preferred embodiment of the present invention
- FIG. 1 shows a schematic representation of a metal-ceramic substrate 1 according to a first preferred embodiment of the present invention.
- a metal-ceramic substrate 1 is preferably a carrier for electrical components (not shown).
- the metal-ceramic substrate 1 has a ceramic element 30 and at least one metal layer 10, the ceramic element 30 and the at least one metal layer 10 extending along a main extension plane HSE. Since the at least one metal layer 10 is attached to the ceramic element 30, the at least one metal layer 10 and the ceramic element 30 being arranged one above the other in a stacking direction S running perpendicular to the main plane of extension HSE.
- the at least one metal layer 10 has a plurality of metal sections 10′, which, for example, are arranged next to one another, electrically isolated from one another, along a direction running parallel to the main plane of extent HSE.
- a rear-side metallization 20 is provided on the ceramic element 30 on the opposite side of the at least one metal layer 10 .
- the rear side metallization 20 is intended in particular to counteract bending that would otherwise occur during operation, which is caused by thermomechanical stresses, which in turn are the result of different expansion voltage coefficients in the at least one metal layer 10 and the ceramic element 30 are.
- the rear-side metallization 20 should provide sufficient thermal capacity, which is particularly desirable in order to be able to provide a corresponding buffer in overload situations.
- the prior art regularly provides for a masking or a resist layer to be applied to the attached at least one metal layer 10 in order to use an etching process to etch the areas to be removed in the at least one metal layer 10 that is not covered by a resist layer or the masking.
- a structuring 15 of the at least one metal layer 1 which means that, for example, two metal sections 10′ of the at least one metal layer 10 are electrically insulated from one another.
- applying and producing the masking is expensive and the consumption of the etching agent is comparatively large.
- FIG. 2 schematically shows a sectional view through a metal-ceramic substrate 1 produced using a method according to an exemplary embodiment of the present invention.
- a structure 15 in particular to form a free area between two adjacent metal sections, i.e. to form a so-called isolation trench, material is removed in the at least one metal layer 10 both by using laser light and by etching becomes.
- a recess 18 is first produced in the at least one metal layer 10 in a preparatory step by means of the laser light, where the recess 18 has a maximum depth T that is smaller than the thickness D of the at least one metal layer 10.
- the recess 18 has a maximum depth T that is smaller than the thickness D of the at least one metal layer 10.
- a ratio of a maximum depth T of the recess to a thickness D of the at least one metal layer 10 is a ratio of between 0.7 and 0.99, preferably between 0.8 and 0.98 and particularly preferably between 0. 9 and 0.95 assumes. In other words: a significant proportion of the material is removed from the at least one metal layer 10 by means of the laser light.
- This can be, for example, a continuously operated cw laser or an ultra-short pulse laser, which is used to remove or abtra gene in the preparation step material of the at least one metal layer 10.
- mechanical processing is used in order to convince the recess 18 with that maximum depth T as part of a preparatory step, which is smaller than the thickness D of the at least one metal layer 10. This is useful, for example, in cases in which where comparatively large areas are to be exposed, for example in those areas in which later predetermined breaking points are admitted along which, for example in the case of a large card, the metal-ceramic substrate is separated into several individual metal-ceramic substrates.
- the material of the at least one metal layer 10 is removed by means of an etching process.
- residual components 13 of the at least one metal layer 10 are removed by means of the etching process, which remain after removing the material of the at least one metal layer 10 by means of the laser light and are removed with the etching process.
- the use of the etching process results in the removal of the residual components 13 required for the insulation of adjacent metal sections 10', for example in the area of the planned insulation trench.
- the remaining components 13 also extend over the metal sections 13, which are to remain after the formation of the structuring or the depression on the manufactured metal-ceramic substrate 1.
- no masking or a resist layer is used in the etching process or in the etching step. This results in material being removed uniformly, in particular on the at least one metal layer 10 , preferably on the side which faces away from the ceramic element 30 . Due to the profiling or contour of the recess 18 with the maximum depth T, which is smaller than the thickness D of the at least one metal layer 10, predetermined by the laser light, this means that, particularly in the area of this recess 18, the remaining residual component 13 of the material the at least one metal layer 10 can be removed in order to realize electrical insulation of two adjacent metal sections 10 ′ in the at least one metal layer 10 .
- etchant can advantageously be saved and the process preferably also accelerated, since the etching process is only intended for a minor or smaller removal of material, in order to ensure in particular that no damage is caused during production using laser light and/or mechanical processing takes place on the ceramic element 30.
- the method is also accelerated in particular when the formation of a masking or a resist layer, which specifies the position of the structure 15, is dispensed with.
- the laser light is used to define at least in sections a geometry of a side face 17 of the at least one metal layer 10 that does not run parallel to the main plane of extension.
- the laser light it is advantageously possible to use the laser light to specify how an edge region of the at least one metal layer 10 or of the metal sections 10' is designed. This is particularly because of that advantageous because it has proven to be advantageous to implement specific geometries in the side surface 17 for resistance to temperature changes, which connects an upper edge of the at least one metal layer 10 to a lower edge of the at least one metal layer 10, the lower edge representing the at least - Limits at least one metal layer on the side that faces the ceramic element 30, while the upper edge delimits the metal layer 10 on the side facing away from the ceramic element 30.
- FIG. 3 shows top views of two different manufactured metal-ceramic substrates 1, the manufactured metal-ceramic substrates 1 having been produced using an exemplary method for producing the metal-ceramic substrate 1 according to the present invention.
- the upper representation in FIG. 3 shows an island-like, square metal section 10', while in the lower representation a substantially circular free area for the structure 15 is realized in the at least one metal layer 10.
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Materials Engineering (AREA)
- Power Engineering (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Laser Beam Processing (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Structure Of Printed Boards (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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DE102021107690.0A DE102021107690A1 (en) | 2021-03-26 | 2021-03-26 | Method for producing a metal-ceramic substrate and metal-ceramic substrate produced by such a method |
PCT/EP2022/057595 WO2022200406A1 (en) | 2021-03-26 | 2022-03-23 | Method for producing a metal-ceramic substrate, and metal-ceramic substrate produced using a method of this type |
Publications (1)
Publication Number | Publication Date |
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EP4315418A1 true EP4315418A1 (en) | 2024-02-07 |
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ID=81384778
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Application Number | Title | Priority Date | Filing Date |
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EP22718103.9A Pending EP4315418A1 (en) | 2021-03-26 | 2022-03-23 | Method for producing a metal-ceramic substrate, and metal-ceramic substrate produced using a method of this type |
Country Status (7)
Country | Link |
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US (1) | US20240178098A1 (en) |
EP (1) | EP4315418A1 (en) |
JP (1) | JP2024510808A (en) |
KR (1) | KR20230150354A (en) |
CN (1) | CN117043934A (en) |
DE (1) | DE102021107690A1 (en) |
WO (1) | WO2022200406A1 (en) |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3766634A (en) | 1972-04-20 | 1973-10-23 | Gen Electric | Method of direct bonding metals to non-metallic substrates |
US3744120A (en) | 1972-04-20 | 1973-07-10 | Gen Electric | Direct bonding of metals with a metal-gas eutectic |
US4563383A (en) * | 1984-03-30 | 1986-01-07 | General Electric Company | Direct bond copper ceramic substrate for electronic applications |
US4904340A (en) * | 1988-10-31 | 1990-02-27 | Microelectronics And Computer Technology Corporation | Laser-assisted liquid-phase etching of copper conductors |
DE4004844C1 (en) * | 1990-02-16 | 1991-01-03 | Abb Ixys Semiconductor Gmbh | Copper metallisation on ceramic substrate - obtd. by bonding copper foil directly to whole surface of substrate, then masking and etching |
DE19927046B4 (en) | 1999-06-14 | 2007-01-25 | Electrovac Ag | Ceramic-metal substrate as a multi-substrate |
DE102009033029A1 (en) | 2009-07-02 | 2011-01-05 | Electrovac Ag | Electronic device |
DE102013104739B4 (en) | 2013-03-14 | 2022-10-27 | Rogers Germany Gmbh | Metal-ceramic substrates and method for producing a metal-ceramic substrate |
DE102013113734B4 (en) | 2013-12-10 | 2018-03-08 | Rogers Germany Gmbh | Method for producing a metal-ceramic substrate |
HUE055979T2 (en) | 2015-05-27 | 2022-01-28 | Ngk Electronics Devices Inc | Substrate for power modules, substrate assembly for power modules, and method for producing substrate for power modules |
TWI625080B (en) * | 2016-12-20 | 2018-05-21 | 鈺橋半導體股份有限公司 | Wiring board having isolator and bridging element and method of making wiring board |
DE102018212272A1 (en) | 2018-07-24 | 2020-01-30 | Robert Bosch Gmbh | Ceramic circuit board and electronics unit |
DE102018123681A1 (en) | 2018-09-26 | 2020-03-26 | Rogers Germany Gmbh | Carrier substrate for electrical, in particular electronic components and method for producing a carrier substrate |
-
2021
- 2021-03-26 DE DE102021107690.0A patent/DE102021107690A1/en active Pending
-
2022
- 2022-03-23 WO PCT/EP2022/057595 patent/WO2022200406A1/en active Application Filing
- 2022-03-23 EP EP22718103.9A patent/EP4315418A1/en active Pending
- 2022-03-23 CN CN202280018031.2A patent/CN117043934A/en active Pending
- 2022-03-23 JP JP2023558562A patent/JP2024510808A/en active Pending
- 2022-03-23 KR KR1020237032968A patent/KR20230150354A/en unknown
- 2022-03-23 US US18/283,506 patent/US20240178098A1/en active Pending
Also Published As
Publication number | Publication date |
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WO2022200406A1 (en) | 2022-09-29 |
US20240178098A1 (en) | 2024-05-30 |
DE102021107690A1 (en) | 2022-09-29 |
JP2024510808A (en) | 2024-03-11 |
KR20230150354A (en) | 2023-10-30 |
CN117043934A (en) | 2023-11-10 |
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