EP4123271A4 - Photography device - Google Patents

Photography device Download PDF

Info

Publication number
EP4123271A4
EP4123271A4 EP20925147.9A EP20925147A EP4123271A4 EP 4123271 A4 EP4123271 A4 EP 4123271A4 EP 20925147 A EP20925147 A EP 20925147A EP 4123271 A4 EP4123271 A4 EP 4123271A4
Authority
EP
European Patent Office
Prior art keywords
photography device
photography
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP20925147.9A
Other languages
German (de)
French (fr)
Other versions
EP4123271A1 (en
Inventor
Yosuke Asai
Kazuhiro Yamada
Hiroshi Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Intellectual Property Management Co Ltd
Original Assignee
Panasonic Intellectual Property Management Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Intellectual Property Management Co Ltd filed Critical Panasonic Intellectual Property Management Co Ltd
Publication of EP4123271A1 publication Critical patent/EP4123271A1/en
Publication of EP4123271A4 publication Critical patent/EP4123271A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements
    • G02B5/0273—Diffusing elements; Afocal elements characterized by the use
    • G02B5/0284—Diffusing elements; Afocal elements characterized by the use used in reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/87—Combinations of systems using electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4814—Constructional features, e.g. arrangements of optical elements of transmitters alone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP20925147.9A 2020-03-18 2020-12-17 Photography device Withdrawn EP4123271A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020048096 2020-03-18
PCT/JP2020/047117 WO2021186822A1 (en) 2020-03-18 2020-12-17 Photography device

Publications (2)

Publication Number Publication Date
EP4123271A1 EP4123271A1 (en) 2023-01-25
EP4123271A4 true EP4123271A4 (en) 2023-07-26

Family

ID=77771913

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20925147.9A Withdrawn EP4123271A4 (en) 2020-03-18 2020-12-17 Photography device

Country Status (5)

Country Link
US (1) US12259320B2 (en)
EP (1) EP4123271A4 (en)
JP (1) JP7645452B2 (en)
CN (1) CN115280098A (en)
WO (1) WO2021186822A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4123271A4 (en) * 2020-03-18 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. Photography device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1237016A2 (en) * 2001-02-28 2002-09-04 Nec Corporation Reflector and reflection-type LCD device using the same
US6777684B1 (en) * 1999-08-23 2004-08-17 Rose Research L.L.C. Systems and methods for millimeter and sub-millimeter wave imaging

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US5517575A (en) * 1991-10-04 1996-05-14 Ladewski; Theodore B. Methods of correcting optically generated errors in an electro-optical gauging system
GB9700966D0 (en) * 1997-01-17 1997-03-05 Secr Defence Millimetre wave imaging apparatus
FI107407B (en) * 1997-09-16 2001-07-31 Metorex Internat Oy An imaging system functioning at the submillimeter wavelength
US20090240139A1 (en) * 2008-03-18 2009-09-24 Steven Yi Diffuse Optical Tomography System and Method of Use
JP5291983B2 (en) * 2008-05-12 2013-09-18 浜松ホトニクス株式会社 Terahertz frequency-resolved imaging system
US8497477B1 (en) 2010-02-10 2013-07-30 Mvt Equity Llc Method and apparatus for efficient removal of gain fluctuation effects in passive thermal images
US9086483B2 (en) * 2011-03-28 2015-07-21 Northrop Grumman Guidance And Electronics Company, Inc. Systems and methods for detecting and/or identifying materials
US9207317B2 (en) * 2011-04-15 2015-12-08 Ariel-University Research And Development Company Ltd. Passive millimeter-wave detector
US9268017B2 (en) * 2011-07-29 2016-02-23 International Business Machines Corporation Near-field millimeter wave imaging
DE102012003201A1 (en) * 2012-02-17 2013-08-22 Hübner GmbH Method and apparatus for inspecting mail for dangerous ingredients
JP2014029478A (en) * 2012-07-03 2014-02-13 Canon Inc Terahertz wave generation element, terahertz wave detection element, and terahertz time domain spectral device
JP6290036B2 (en) * 2013-09-25 2018-03-07 株式会社東芝 Inspection device and inspection system
WO2015050941A1 (en) * 2013-10-04 2015-04-09 Battelle Memorial Institute Contrast phantom for passive millimeter wave imaging systems
MX361644B (en) * 2013-12-24 2018-12-13 Halliburton Energy Services Inc Real-time monitoring of fabrication of integrated computational elements.
WO2015101921A1 (en) * 2013-12-30 2015-07-09 University Of Manitoba Imaging using gated elements
JP6490439B2 (en) * 2015-02-05 2019-03-27 国立研究開発法人情報通信研究機構 Radio wave reflector
JP2017009296A (en) * 2015-06-16 2017-01-12 キヤノン株式会社 Electromagnetic wave propagation device and information acquisition device
JP6778856B2 (en) * 2016-03-25 2020-11-04 パナソニックＩｐマネジメント株式会社 Mirror panel, mirror film and display system
US11385105B2 (en) * 2016-04-04 2022-07-12 Teledyne Flir, Llc Techniques for determining emitted radiation intensity
JP6843600B2 (en) * 2016-11-28 2021-03-17 キヤノン株式会社 Image acquisition device, image acquisition method and irradiation device using this
JP6916435B2 (en) * 2017-01-17 2021-08-11 澁谷工業株式会社 Terahertz light generator
US10585185B2 (en) * 2017-02-03 2020-03-10 Rohde & Schwarz Gmbh & Co. Kg Security scanning system with walk-through-gate
EP3613150A4 (en) * 2017-04-20 2020-12-02 The Board of Trustees of the Leland Stanford Junior University SCALABLE MM WAVE ARRAYS WITH LARGE APERTURES THAT ARE REALIZED BY MM WAVE DIELECTRIC WAVE CONDUCTORS
CN108444913A (en) * 2018-01-30 2018-08-24 中国科学院上海技术物理研究所 Based on unit born of the same parents' solid phase grating and mutually with reference to the THz spectrometers of technology
CA3090636A1 (en) * 2019-08-23 2021-02-23 Institut National D'optique Terahertz illumination source for terahertz imaging
WO2021070428A1 (en) 2019-10-09 2021-04-15 パナソニックＩｐマネジメント株式会社 Photography device
EP4123271A4 (en) * 2020-03-18 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. Photography device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6777684B1 (en) * 1999-08-23 2004-08-17 Rose Research L.L.C. Systems and methods for millimeter and sub-millimeter wave imaging
EP1237016A2 (en) * 2001-02-28 2002-09-04 Nec Corporation Reflector and reflection-type LCD device using the same

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
DRBÚL MÁRIO ET AL: "Analysis of roughness profile on curved surfaces", MATEC WEB OF CONFERENCES, vol. 244, 1 January 2018 (2018-01-01), pages 01024, XP093054603, Retrieved from the Internet <URL:https://www.matec-conferences.org/articles/matecconf/pdf/2018/103/matecconf_itep2018_01024.pdf> DOI: 10.1051/matecconf/201824401024 *
See also references of WO2021186822A1 *

Also Published As

Publication number Publication date
JP7645452B2 (en) 2025-03-14
EP4123271A1 (en) 2023-01-25
US20230003643A1 (en) 2023-01-05
US12259320B2 (en) 2025-03-25
WO2021186822A1 (en) 2021-09-23
CN115280098A (en) 2022-11-01
JPWO2021186822A1 (en) 2021-09-23

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