EP4073496A1 - Dispositif de mesure permettant la détermination d'une valeur diélectrique - Google Patents

Dispositif de mesure permettant la détermination d'une valeur diélectrique

Info

Publication number
EP4073496A1
EP4073496A1 EP20811990.9A EP20811990A EP4073496A1 EP 4073496 A1 EP4073496 A1 EP 4073496A1 EP 20811990 A EP20811990 A EP 20811990A EP 4073496 A1 EP4073496 A1 EP 4073496A1
Authority
EP
European Patent Office
Prior art keywords
frequency
signal
shf
measuring device
frequency signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP20811990.9A
Other languages
German (de)
English (en)
Inventor
Thomas Blödt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Endress and Hauser SE and Co KG
Original Assignee
Endress and Hauser SE and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Endress and Hauser SE and Co KG filed Critical Endress and Hauser SE and Co KG
Publication of EP4073496A1 publication Critical patent/EP4073496A1/fr
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/04—Investigating moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2658—Cavities, resonators, free space arrangements, reflexion or interference arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance

Definitions

  • the invention relates to a measuring device for the phase-based determination of a dielectric value of a medium.
  • field devices are often used that are used to record various measured variables.
  • the measured variable to be determined can be, for example, a level, a flow rate, a pressure, the temperature, the pFI value, the redox potential, a conductivity or the dielectric value of a medium in a process plant.
  • the field devices each include suitable sensors or are based on suitable measurement methods. A large number of different types of field devices are manufactured and sold by the Endress + Hauser group of companies.
  • dielectric constant also known as "dielectric constant” or “relative permittivity”
  • dielectric constant or “relative permittivity”
  • a reliable one Represent an indicator for contamination, the moisture content or the composition of the substance.
  • One possible measuring principle for determining the dielectric value is to measure the phase position or the phase shift of high-frequency signals.
  • a high-frequency signal with at least one defined frequency or within a defined frequency band is coupled into a measurement section and, after reflection or transmission, a corresponding received signal is evaluated with regard to its phase position relative to the transmitted high-frequency signal.
  • high-frequency signal or “radar” in the context of this patent application refers to corresponding signals with frequencies between 0.1 GHz and 30 GHz.
  • phase-based dielectric value measuring device is described, for example, in the publication DE 102017 130728 A1.
  • the effect is used that the signal speed and thus the phase position depends on the dielectric value of the medium that prevails along the measuring section.
  • a distinction is made here between a relative and an absolute phase measurement, with what is known as a quadrant correction being carried out in addition in the case of an absolute phase measurement.
  • the measuring section can be implemented, for example, in the form of a measuring probe in which the floch frequency signal is carried. Otherwise, the measuring section can also be a defined sample area for the medium through which the floch frequency signal traverses as a freely emitted radar signal.
  • the measured phase position is highly dependent on the component or environment-related noise in the received signal, above all from external radiation.
  • a software-based correction is only possible to a limited extent, however, since this may generate physically implausible measured values.
  • individual degrees of phase noise can shift the measured value by several quadrants. This is particularly critical in the case of measurement methods in which a phase gradient is determined from the phase position, since in this case an offset and gradient error results.
  • the invention is therefore based on the object of providing a robust dielectric value measuring device which is based on the phase measurement of floch frequency signals.
  • the measuring device comprises at least the following components:
  • a signal generation unit which is designed to couple a floch frequency signal with a defined frequency into the measuring section
  • An evaluation unit which is designed to o to receive the high-frequency signal as the corresponding received signal after passing through the measurement section, o to determine a phase shift between the high-frequency signal and the received signal, for example by means of a network analyzer or a phase detector such as a Gilbert cell, and o to to determine the dielectric value of the medium based on the determined phase shift.
  • the measuring device also comprises at least one filter that is permeable to the frequency of the high-frequency signal.
  • the filter is arranged in such a way that the received signal and / or the generated high-frequency signal is / will be filtered. This ensures that the determined dielectric value is not falsified by noise caused by the component or the environment.
  • the filter should preferably be designed as a high-pass filter.
  • the high-pass filter (s) can be designed as an odd-order filter, in particular a first-order filter, so that the corresponding high-pass filter blocks below a previously defined lower limit frequency and above an upper limit frequency that is lower than the frequency of the high-frequency signal , directs.
  • the high-pass filter (s) is particularly advantageous here to design the high-pass filter (s) in such a way that the high-pass filter (s) has an approximately constant phase delay below the lower limit frequency. This makes the dielectric value measurement more robust against manufacturing tolerances of the electronic measuring device components and against thermal influences.
  • the frequency or the frequency band with which the signal generating unit of the measuring device according to the invention generates the high-frequency signal is to be set as a function of the medium or as a function of the measuring range.
  • the signal generation unit must therefore be designed accordingly to generate the electrical high-frequency signal with a particularly variable frequency between 0.1 GHz and 30 GHz, in the case of aqueous media preferably between 5 GHz and 8 GHz.
  • the evaluation unit is for this to be designed accordingly in order to be able to detect the phase shift at precisely this frequency.
  • the measuring section can be designed, for example, as an electrically or dielectrically conductive measuring probe, the measuring probe for coupling in the high-frequency signal in this case being connected to the signal generating unit via a first probe end.
  • the measuring probe at the first end of the probe can also be contacted with the evaluation unit (for example via a send / receive switch).
  • the evaluation unit for example via a send / receive switch.
  • the measuring probe opposite to the signal generating unit, can be in contact with the evaluation unit via the second probe end.
  • the high-frequency signal is received as a received signal by the evaluation unit at the second end of the probe.
  • the measuring section can also be designed as a defined sample area for the medium through which the high-frequency signal SHF traverses as a freely emitted radar signal.
  • the signal generation unit must include a transmitting antenna which is designed to transmit the high-frequency signal as a radar signal.
  • the evaluation unit must include a corresponding receiving antenna. The antennas are to be arranged or aligned opposite one another on the sample space in such a way that the receiving antenna receives the radar signal as a received signal after passing through the medium.
  • the term “unit” is understood to mean in principle any electronic circuit that is designed to be suitable for the intended use. Depending on the requirements, it can therefore be an analog circuit for generating or processing corresponding analog ones Trade signals. However, it can also be a digital circuit such as an FPGA or a storage medium in conjunction with a program. The program is designed to carry out the corresponding process steps or to apply the necessary arithmetic operations of the respective unit.
  • different electronic units of the dielectric value measuring device in the sense of the invention can potentially also access a common physical memory or be operated by means of the same physical digital circuit.
  • the object on which the invention is based is also achieved by a corresponding method for operating the measuring device. Accordingly, the process comprises at least the following process steps:
  • a measuring device for measuring the dielectric value of a medium in a container
  • FIG. 3 a graph of the amplitude and phase spectrum of the filter
  • FIG. 4 a possible implementation of the filter according to the invention.
  • the medium 2 can be liquids such as beverages, paints, cement or fuels such as liquefied gases or mineral oils. It is also conceivable, however, to use the measuring device 1 with media 2 in the form of bulk goods, such as, for example, grain.
  • the measuring device 1 can be connected to a higher-level unit 4, such as a process control system.
  • a higher-level unit 4 such as a process control system.
  • PROFIBUS "HART”, “Wireless HART” or “Ethernet” can be implemented as the interface. This can be used to transmit the dielectric value as an amount or as a complex value with real part and imaginary part. However, other information about the general operating state of the measuring device 1 can also be communicated.
  • the measuring device 1 comprises a measuring probe 11 which, after installation, extends into the interior of the container 3. As a result, the measuring probe 11 is in contact with the medium 2 at a corresponding minimum fill level of the medium 2, so that the measuring device 1 can determine the dielectric value of the medium 2 via the measuring probe 11.
  • the measuring device 1 is fundamentally based on a high-frequency signal SHF, which is impressed into the measuring probe 1, as a result of which the electromagnetic near field of the high-frequency signal SHF penetrates the medium 2.
  • the measuring probe 11 is designed to be electrically or dielectrically conductive, so that a correspondingly designed signal generating unit 12 of the measuring device 1 (see FIG. 2) can couple the high-frequency signal SHF into a first probe end 111.
  • the probe geometry or the length d must be adapted to the corresponding medium 2.
  • the signal generation unit 12 can be based, for example, on a controllable high-frequency oscillator, whose frequency is regulated by a "phase locked loop".
  • the frequency I or the frequency band of the floch frequency signal SHF is to be matched to the specific type of medium 2 or the specific value range of the dielectric value to be measured.
  • a frequency f HF between 0.433 GFIz and 6 GFIz is appropriate.
  • the advantage of using several different individual frequencies or a frequency band is, on the one hand, the possibility of additionally being able to determine the density of the medium 2.
  • alternative individual frequencies can be used.
  • the dielectric value of the medium 2 can be determined by an evaluation unit 13, the evaluation unit 13 being the one shown in FIG Embodiment this is in turn connected to the first probe end 111.
  • the evaluation unit 13 can in principle also be connected to the opposite, second probe end 112. In this case, the evaluation unit 13 receives the transmitted portion of the coupled-in floch frequency signal SHF, SO as received signal T HF , so that no transmission / reception switch 15 is required at the first probe end 111.
  • a sample area for the medium 2 can alternatively be defined as the measuring section, as is shown, for example, in the publication DE 102017 130728 A1:
  • the measuring section is transmitted by a transmitting antenna of the floch frequency signal SHF as a radar signal, and defined by a receiving antenna for receiving the corresponding received signal T HF .
  • the antennas are arranged or aligned opposite one another at a corresponding distance d.
  • the evaluation unit 13 determines a phase shift cp between the coupled-in high-frequency signal SHF and the received signal THF.
  • the evaluation unit 13 can carry out an absolute phase measurement, that is to say between 0 ° phase shift and theoretically infinite. Or the phase measurement is carried out as a relative measurement between 0 ° and 360 °, i.e. without additional quadrant correction.
  • the evaluation unit 13 for measuring the phase shift cp can include, for example, a network analyzer or a phase detector, such as a Gilbert cell. Using the measured phase shift cp, the evaluation unit 13 can again determine the dielectric value of the medium 2, for example on the basis of a corresponding calibration measurement series.
  • the measuring principle of the phase-based dielectric value measurement illustrated with reference to FIG. 2 offers the advantage that the dielectric value can be determined with high sensitivity. However, this measuring principle is correspondingly susceptible to internal or external noise sources.
  • the measuring device 1 therefore comprises a first high-pass filter 14 which is permeable to the frequency f hiF of the high-frequency signal SHF and which is arranged in the reception path in front of the evaluation unit 13.
  • the first high-pass filter 14 is matched to the high-frequency signal SHF in such a way that the corresponding signal components of the high-frequency signal SHF are suppressed by at least -10 dB, in particular at least -80 dB , below a defined lower limit frequency f gj.
  • the first high-pass filter 14 conducts the received signal T HF with the lowest possible attenuation of maximum -10 dB. This characteristic is shown schematically in the graph of FIG High-pass filter 14 in the received signal T HF suppresses any noise that can impair the determination of the dielectric value.
  • a second high-pass filter 14 ′ is also arranged in the signal path of the high-frequency signal SHF between the signal generation unit 12 and the transceiver switch 15.
  • the second high-pass filter 14 ′ also preferably has the filter characteristics shown in FIG. 3.
  • Fig. 3 also a further, advantageous design of the two high-pass filters 14, 14 'is shown: Accordingly, below the lower limit frequency f g, i corresponding signal components of the high-frequency signal SHF between the input and output of the high-pass filter 14 with a frequency related to f hiF is delayed in an approximately constant phase delay c between, in particular, 30 ° and 200 °. Above the lower limit frequency f g, i , the phase delay c decreases linearly in the schematic representation, so that the high-pass filter 14 passes the received signal T HF through above the upper limit frequency f g, h without a significant phase delay c, i.e. less than 10 °.
  • This frequency-dependent phase behavior results in the advantage that the dielectric value measurement becomes more robust against manufacturing tolerances of the electronic measuring device components and against thermal influences.
  • the high-pass filter 14 is designed as a two-dimensional conductor track structure 141 on a circuit card substrate 142.
  • a structurable copper or silver layer, for example, can be used as the conductor track material.
  • Characteristic for the conductor track structure 141 is a serial arrangement of three rectangles that are basically of the same area, which are approx. 2/3 tapered conductor tracks are connected to each other.
  • the signal THF, SHF to be filtered is supplied via one of the two outer contacts and, after appropriate filtering, tapped via the other outer contact. Because of the symmetrical structure of the high-pass filter 14, 14 'shown in FIG. 4 in the path direction, it is in principle irrelevant which of the two outer contacts is used as an input or as an output.
  • the middle rectangle has, in contrast to the two outer rectangles, an asymmetry in the form of a structure that is complementary on one side.
  • the high-pass filter 14 forms corresponding properties of an odd order, so that the frequency-dependent transmission behavior of the signal amplitude AHF shown in FIG. 3 results. It goes without saying that the high-pass filter 14, 14 'can also be realized in a hybrid manner with a correspondingly odd order instead of the variant embodiment shown in FIG. 4.

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

L'invention se rapporte à un dispositif de mesure robuste (1) qui permet de déterminer la valeur diélectrique d'un milieu (2) en fonction de la phase, ledit dispositif de mesure comprenant au moins les éléments suivants : une section de mesure (11) qui peut être mise en contact avec le milieu (2), une unité de génération de signal (12) qui permet d'injecter un signal haute fréquence (sHF) à une fréquence définie (fHF) dans la section de mesure (11), et une unité d'évaluation (13) conçue pour recevoir un signal de réception correspondant (rHF) après le passage dudit signal haute fréquence à travers la section de mesure (11), afin de déterminer un déphasage (φ) entre le signal haute fréquence (sHF) et le signal de réception (rHF) et de déterminer la valeur diélectrique du milieu (2) en fonction du déphasage (φ) déterminé. Selon l'invention, le dispositif de mesure (1) comprend en outre au moins un filtre (14, 14') qui émet la fréquence (fHF) du signal haute fréquence (sHF) et qui est disposé de telle manière que le signal de réception reçu (rHF) et/ou le signal haute fréquence généré (sHF) est filtré. L'invention garantit que la valeur diélectrique déterminée n'est pas déformée par le bruit provoqué par les éléments ou l'environnement.
EP20811990.9A 2019-12-12 2020-11-20 Dispositif de mesure permettant la détermination d'une valeur diélectrique Pending EP4073496A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102019134159.0A DE102019134159A1 (de) 2019-12-12 2019-12-12 Messgerät zur Bestimmung eines Dielektrizitätswertes
PCT/EP2020/082910 WO2021115763A1 (fr) 2019-12-12 2020-11-20 Dispositif de mesure permettant la détermination d'une valeur diélectrique

Publications (1)

Publication Number Publication Date
EP4073496A1 true EP4073496A1 (fr) 2022-10-19

Family

ID=73554419

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20811990.9A Pending EP4073496A1 (fr) 2019-12-12 2020-11-20 Dispositif de mesure permettant la détermination d'une valeur diélectrique

Country Status (5)

Country Link
US (1) US12000787B2 (fr)
EP (1) EP4073496A1 (fr)
CN (1) CN114829914A (fr)
DE (1) DE102019134159A1 (fr)
WO (1) WO2021115763A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022108337A1 (de) 2022-04-06 2023-10-12 Endress+Hauser SE+Co. KG Dielektrizitätswert-Messgerät

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19915016C2 (de) * 1998-10-15 2001-08-16 Hilti Ag Verfahren zur Bestimmung der Dämpfung eines Mediums für elektromagnetische Wellen und Sensor zur Erkennung von Fremdeinschlüssen in dem Medium
US8384396B2 (en) 2006-05-01 2013-02-26 Filter Sensing Technologies, Inc. System and method for measuring retentate in filters
DE102007057092B4 (de) * 2007-11-20 2009-08-06 Tews Elektronik Dipl.-Ing. Manfred Tews Verfahren und Vorrichtung zur Feuchte- und/oder Dichtemessung
DE102012104075A1 (de) * 2012-05-09 2013-11-14 Endress + Hauser Gmbh + Co. Kg Vorrichtung zur Bestimmung und/oder Überwachung mindestens einer Prozessgröße eines Mediums
DE102015201773A1 (de) * 2015-02-02 2016-08-04 Ihp Gmbh-Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik Inhomogene Übertragungsleitung zur positionsaufgelösten Permittivitätsbestimmung
DE202016008416U1 (de) 2016-10-11 2018-01-03 Endress+Hauser Gmbh+Co. Kg Hochfrequenz-Signalerzeugungseinheit zur Erzeugung von rauscharmen Hochfrequenz-Signalen
DE102017130728A1 (de) 2017-12-20 2019-06-27 Endress+Hauser SE+Co. KG Messgerät zur Dielektrizitätswert-Bestimmung
DE102018111944A1 (de) * 2018-05-17 2019-11-21 Endress+Hauser SE+Co. KG Messgerät zur Bestimmung eines Dielektrizitätswertes
DE102019101598A1 (de) * 2019-01-23 2020-07-23 Endress+Hauser SE+Co. KG Messgerät zur Bestimmung eines Dielektrizitätswertes
DE102019102142A1 (de) * 2019-01-29 2020-07-30 Endress+Hauser SE+Co. KG Messgerät
DE102019121995A1 (de) * 2019-08-15 2021-02-18 Endress+Hauser SE+Co. KG Messgerät zur Bestimmung eines Dielektrizitätswertes

Also Published As

Publication number Publication date
US12000787B2 (en) 2024-06-04
DE102019134159A1 (de) 2021-06-17
US20230003667A1 (en) 2023-01-05
CN114829914A (zh) 2022-07-29
WO2021115763A1 (fr) 2021-06-17

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