EP4059055A4 - Microstructure enhanced absorption photosensitive devices - Google Patents
Microstructure enhanced absorption photosensitive devices Download PDFInfo
- Publication number
- EP4059055A4 EP4059055A4 EP20868204.7A EP20868204A EP4059055A4 EP 4059055 A4 EP4059055 A4 EP 4059055A4 EP 20868204 A EP20868204 A EP 20868204A EP 4059055 A4 EP4059055 A4 EP 4059055A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- photosensitive devices
- enhanced absorption
- microstructure enhanced
- absorption photosensitive
- microstructure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010521 absorption reaction Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1463—Pixel isolation structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/1461—Pixel-elements with integrated switching, control, storage or amplification elements characterised by the photosensitive area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14629—Reflectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/03529—Shape of the potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
- H01L31/1055—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type the devices comprising amorphous materials of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/486—Receivers
- G01S7/4861—Circuits for detection, sampling, integration or read-out
- G01S7/4863—Detector arrays, e.g. charge-transfer gates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/491—Details of non-pulse systems
- G01S7/4912—Receivers
- G01S7/4913—Circuits for detection, sampling, integration or read-out
- G01S7/4914—Circuits for detection, sampling, integration or read-out of detector arrays, e.g. charge-transfer gates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14621—Colour filter arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14634—Assemblies, i.e. Hybrid structures
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (35)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201962905065P | 2019-09-24 | 2019-09-24 | |
US201962914028P | 2019-10-11 | 2019-10-11 | |
US201962925183P | 2019-10-23 | 2019-10-23 | |
US201962937813P | 2019-11-20 | 2019-11-20 | |
US201962943146P | 2019-12-03 | 2019-12-03 | |
US201962950888P | 2019-12-19 | 2019-12-19 | |
US202062957779P | 2020-01-06 | 2020-01-06 | |
US202062964094P | 2020-01-21 | 2020-01-21 | |
US202062968093P | 2020-01-30 | 2020-01-30 | |
US202062969624P | 2020-02-03 | 2020-02-03 | |
US202062975726P | 2020-02-12 | 2020-02-12 | |
US202062978736P | 2020-02-19 | 2020-02-19 | |
US202062981979P | 2020-02-26 | 2020-02-26 | |
US202062985171P | 2020-03-04 | 2020-03-04 | |
US202062993414P | 2020-03-23 | 2020-03-23 | |
US202062994758P | 2020-03-25 | 2020-03-25 | |
US202063005152P | 2020-04-03 | 2020-04-03 | |
US202063009928P | 2020-04-14 | 2020-04-14 | |
US202063011217P | 2020-04-16 | 2020-04-16 | |
US202063016160P | 2020-04-27 | 2020-04-27 | |
US202063019208P | 2020-05-01 | 2020-05-01 | |
US202063026591P | 2020-05-18 | 2020-05-18 | |
US202063033153P | 2020-06-01 | 2020-06-01 | |
US202063034961P | 2020-06-04 | 2020-06-04 | |
US202063034964P | 2020-06-04 | 2020-06-04 | |
US202063038079P | 2020-06-11 | 2020-06-11 | |
US202063039945P | 2020-06-16 | 2020-06-16 | |
US202063039941P | 2020-06-16 | 2020-06-16 | |
US202063041997P | 2020-06-21 | 2020-06-21 | |
US202063043709P | 2020-06-24 | 2020-06-24 | |
US202063048641P | 2020-07-06 | 2020-07-06 | |
US202063050044P | 2020-07-09 | 2020-07-09 | |
US202063051896P | 2020-07-15 | 2020-07-15 | |
US202063054192P | 2020-07-20 | 2020-07-20 | |
PCT/US2020/051733 WO2021061543A1 (en) | 2019-09-24 | 2020-09-21 | Microstructure enhanced absorption photosensitive devices |
Publications (2)
Publication Number | Publication Date |
---|---|
EP4059055A1 EP4059055A1 (en) | 2022-09-21 |
EP4059055A4 true EP4059055A4 (en) | 2023-12-27 |
Family
ID=75166362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP20868204.7A Pending EP4059055A4 (en) | 2019-09-24 | 2020-09-21 | Microstructure enhanced absorption photosensitive devices |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP4059055A4 (en) |
WO (1) | WO2021061543A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113257957B (en) * | 2021-06-11 | 2022-08-23 | 四川蜀旺新能源股份有限公司 | Super-doped silicon thin-film solar cell and manufacturing method thereof |
CN114445364B (en) * | 2022-01-25 | 2024-05-07 | 中南大学 | Fundus image microaneurysm region detection method and imaging method thereof |
CN115805375B (en) * | 2022-11-22 | 2024-07-30 | 厦门大学 | Pressure sensor with interlocking integrated microstructure and manufacturing method thereof |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017112747A1 (en) * | 2015-12-21 | 2017-06-29 | W&Wsens Devices, Inc. | Microstructure enhanced absorption photosensitive devices |
KR20180077393A (en) * | 2016-12-28 | 2018-07-09 | 삼성전자주식회사 | Light sensor |
CN109659377A (en) * | 2018-12-13 | 2019-04-19 | 深圳市灵明光子科技有限公司 | Single-photon avalanche diode and production method, detector array, imaging sensor |
EP3772104A1 (en) * | 2019-08-01 | 2021-02-03 | W&SSENS Devices, Inc. | Microstructure enhanced absorption photosensitive devices |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110156195A1 (en) * | 2009-12-31 | 2011-06-30 | Tivarus Cristian A | Interwafer interconnects for stacked CMOS image sensors |
US8735791B2 (en) * | 2010-07-13 | 2014-05-27 | Svv Technology Innovations, Inc. | Light harvesting system employing microstructures for efficient light trapping |
FR2969384A1 (en) * | 2010-12-21 | 2012-06-22 | St Microelectronics Sa | IMAGE SENSOR WITH REDUCED INTERMODULATION |
US10446700B2 (en) * | 2013-05-22 | 2019-10-15 | W&Wsens Devices, Inc. | Microstructure enhanced absorption photosensitive devices |
WO2017024121A1 (en) * | 2015-08-04 | 2017-02-09 | Artilux Corporation | Germanium-silicon light sensing apparatus |
US11153514B2 (en) * | 2017-11-30 | 2021-10-19 | Brillnics Singapore Pte. Ltd. | Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatus |
-
2020
- 2020-09-21 WO PCT/US2020/051733 patent/WO2021061543A1/en unknown
- 2020-09-21 EP EP20868204.7A patent/EP4059055A4/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017112747A1 (en) * | 2015-12-21 | 2017-06-29 | W&Wsens Devices, Inc. | Microstructure enhanced absorption photosensitive devices |
KR20180077393A (en) * | 2016-12-28 | 2018-07-09 | 삼성전자주식회사 | Light sensor |
CN109659377A (en) * | 2018-12-13 | 2019-04-19 | 深圳市灵明光子科技有限公司 | Single-photon avalanche diode and production method, detector array, imaging sensor |
EP3772104A1 (en) * | 2019-08-01 | 2021-02-03 | W&SSENS Devices, Inc. | Microstructure enhanced absorption photosensitive devices |
Non-Patent Citations (1)
Title |
---|
See also references of WO2021061543A1 * |
Also Published As
Publication number | Publication date |
---|---|
EP4059055A1 (en) | 2022-09-21 |
WO2021061543A1 (en) | 2021-04-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3656000A4 (en) | Microstructure enhanced absorption photosensitive devices | |
EP3781021A4 (en) | Occlusion-crossing devices | |
EP4074063A4 (en) | Sound-output device | |
EP3411906A4 (en) | Microstructure enhanced absorption photosensitive devices | |
EP4053499A4 (en) | Three-dimensional-measurement device | |
EP4040461A4 (en) | Interruption device | |
EP4059055A4 (en) | Microstructure enhanced absorption photosensitive devices | |
EP4012137A4 (en) | Structure construction apparatus | |
EP4044942A4 (en) | Occlusion-crossing devices | |
EP3973549A4 (en) | Betavoltaic devices | |
EP3950015A4 (en) | Decontamination device | |
EP3974358A4 (en) | Image-forming device | |
EP3950090A4 (en) | Microparticle-trapping device | |
EP3909261A4 (en) | Acoustic devices | |
EP4041654A4 (en) | Vapocoolant device | |
EP4050282A4 (en) | Gas device | |
EP4019113A4 (en) | Purification device | |
EP3927393A4 (en) | Micro-delivery device | |
EP3950010A4 (en) | Continuous decontamination device | |
EP4061103A4 (en) | Neck-worn device | |
EP3995233A4 (en) | Am device | |
EP3846911A4 (en) | Mask | |
EP3794883A4 (en) | Ranging between devices | |
EP4048158A4 (en) | Needle-handling device | |
EP3998505A4 (en) | Micromirror device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
|
17P | Request for examination filed |
Effective date: 20220722 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
DAV | Request for validation of the european patent (deleted) | ||
DAX | Request for extension of the european patent (deleted) | ||
A4 | Supplementary search report drawn up and despatched |
Effective date: 20231127 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 31/0352 20060101ALI20231121BHEP Ipc: H01L 31/107 20060101ALI20231121BHEP Ipc: H01L 31/102 20060101ALI20231121BHEP Ipc: H01L 31/105 20060101ALI20231121BHEP Ipc: H01L 27/146 20060101AFI20231121BHEP |