EP4042138A4 - Adapter of sample holder for evaluation of mechanical durability of thin films and method for evaluation of quality of mechanical durability of thin films via this adapter - Google Patents

Adapter of sample holder for evaluation of mechanical durability of thin films and method for evaluation of quality of mechanical durability of thin films via this adapter Download PDF

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Publication number
EP4042138A4
EP4042138A4 EP20944050.2A EP20944050A EP4042138A4 EP 4042138 A4 EP4042138 A4 EP 4042138A4 EP 20944050 A EP20944050 A EP 20944050A EP 4042138 A4 EP4042138 A4 EP 4042138A4
Authority
EP
European Patent Office
Prior art keywords
adapter
evaluation
thin films
mechanical durability
quality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP20944050.2A
Other languages
German (de)
French (fr)
Other versions
EP4042138A1 (en
Inventor
Radim CTVRTLÍK
Petr BOHÁC
Jan TOMÁSTÍK
Miroslav Hrabovský
Lubomír Jastrabík
Lukás VÁCLAVEK
Karel Cvrk
Miroslav Veselský
Petr Abrhám
Václav Koula
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Univerzita Palackeho V Olomouci
Original Assignee
Univerzita Palackeho V Olomouci
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univerzita Palackeho V Olomouci filed Critical Univerzita Palackeho V Olomouci
Publication of EP4042138A1 publication Critical patent/EP4042138A1/en
Publication of EP4042138A4 publication Critical patent/EP4042138A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2437—Piezoelectric probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/04—Chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G01N3/46—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid the indentors performing a scratching movement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/56—Investigating resistance to wear or abrasion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8812—Diffuse illumination, e.g. "sky"
    • G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0001—Type of application of the stress
    • G01N2203/0005—Repeated or cyclic
    • G01N2203/0007—Low frequencies up to 100 Hz
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/0076—Hardness, compressibility or resistance to crushing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0262—Shape of the specimen
    • G01N2203/0278—Thin specimens
    • G01N2203/0282—Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0447—Holders for quick insertion/removal of test pieces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0237—Thin materials, e.g. paper, membranes, thin films
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0258—Structural degradation, e.g. fatigue of composites, ageing of oils

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
EP20944050.2A 2020-07-10 2020-08-24 Adapter of sample holder for evaluation of mechanical durability of thin films and method for evaluation of quality of mechanical durability of thin films via this adapter Withdrawn EP4042138A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CZ2020405A CZ308746B6 (en) 2020-07-10 2020-07-10 Sample holder attachment for evaluating the mechanical resistance of thin films and a method for evaluating the quality of the mechanical resistance of thin films with this attachment
PCT/CZ2020/000039 WO2022007985A1 (en) 2020-07-10 2020-08-24 Adapter of sample holder for evaluation of mechanical durability of thin films and method for evaluation of quality of mechanical durability of thin films via this adapter

Publications (2)

Publication Number Publication Date
EP4042138A1 EP4042138A1 (en) 2022-08-17
EP4042138A4 true EP4042138A4 (en) 2022-11-09

Family

ID=75488665

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20944050.2A Withdrawn EP4042138A4 (en) 2020-07-10 2020-08-24 Adapter of sample holder for evaluation of mechanical durability of thin films and method for evaluation of quality of mechanical durability of thin films via this adapter

Country Status (3)

Country Link
EP (1) EP4042138A4 (en)
CZ (1) CZ308746B6 (en)
WO (1) WO2022007985A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113358509A (en) * 2021-05-07 2021-09-07 上海交通大学 Full-automatic glass surface abrasion resistance testing device and method

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992022805A1 (en) * 1991-06-08 1992-12-23 Renishaw Transducer Systems Limited Surface analysis apparatus
WO1996010737A1 (en) * 1994-09-30 1996-04-11 Renishaw Plc Methods and apparatus for indentation, scratch or tribological testing
US5587532A (en) * 1995-01-12 1996-12-24 The United States Of America As Represented By The Secretary Of The Army Method of measuring crack propagation in opaque materials
RU2147737C1 (en) * 1998-07-07 2000-04-20 Комсомольский-на-Амуре государственный технический университет Gear for test of materials
US20110239767A1 (en) * 2010-04-06 2011-10-06 Varel International Ind., L.P. Acoustic Emission Toughness Testing Having Smaller Noise Ratio
CZ305833B6 (en) * 2014-12-02 2016-03-30 Fyzikální ústav AV ČR, v.v.i. Holder adapter of test specimens to a device for abrasive hardness test execution
EP3267177A1 (en) * 2016-07-08 2018-01-10 Anton Paar TriTec SA Method for automated surface evaluation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5909020B2 (en) * 2012-03-27 2016-04-26 ハイジトロン, インク.Hysitron, Inc. Microscope objective lens machine inspection equipment
US9752969B2 (en) * 2014-04-09 2017-09-05 Bruker Nano Inc. Universal mechanical tester for measuring friction and wear characteristics of materials
US10258239B2 (en) * 2017-05-30 2019-04-16 Vishal Khosla Method for in-line testing and surface analysis of test material with participation of raman spectroscopy

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992022805A1 (en) * 1991-06-08 1992-12-23 Renishaw Transducer Systems Limited Surface analysis apparatus
WO1996010737A1 (en) * 1994-09-30 1996-04-11 Renishaw Plc Methods and apparatus for indentation, scratch or tribological testing
US5587532A (en) * 1995-01-12 1996-12-24 The United States Of America As Represented By The Secretary Of The Army Method of measuring crack propagation in opaque materials
RU2147737C1 (en) * 1998-07-07 2000-04-20 Комсомольский-на-Амуре государственный технический университет Gear for test of materials
US20110239767A1 (en) * 2010-04-06 2011-10-06 Varel International Ind., L.P. Acoustic Emission Toughness Testing Having Smaller Noise Ratio
CZ305833B6 (en) * 2014-12-02 2016-03-30 Fyzikální ústav AV ČR, v.v.i. Holder adapter of test specimens to a device for abrasive hardness test execution
EP3267177A1 (en) * 2016-07-08 2018-01-10 Anton Paar TriTec SA Method for automated surface evaluation

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2022007985A1 *

Also Published As

Publication number Publication date
WO2022007985A1 (en) 2022-01-13
EP4042138A1 (en) 2022-08-17
CZ2020405A3 (en) 2021-04-21
CZ308746B6 (en) 2021-04-21

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