EP3879486A4 - Procédé de capture d'image et dispositif de capture d'image - Google Patents

Procédé de capture d'image et dispositif de capture d'image Download PDF

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Publication number
EP3879486A4
EP3879486A4 EP19882722.2A EP19882722A EP3879486A4 EP 3879486 A4 EP3879486 A4 EP 3879486A4 EP 19882722 A EP19882722 A EP 19882722A EP 3879486 A4 EP3879486 A4 EP 3879486A4
Authority
EP
European Patent Office
Prior art keywords
image capture
capture device
capture method
image
capture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP19882722.2A
Other languages
German (de)
English (en)
Other versions
EP3879486A1 (fr
Inventor
Yosuke Naruse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp, Omron Tateisi Electronics Co filed Critical Omron Corp
Publication of EP3879486A1 publication Critical patent/EP3879486A1/fr
Publication of EP3879486A4 publication Critical patent/EP3879486A4/fr
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • G06N3/045Combinations of networks
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/08Learning methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20084Artificial neural networks [ANN]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Software Systems (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Artificial Intelligence (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Computational Linguistics (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Signal Processing (AREA)
  • Medical Informatics (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
EP19882722.2A 2018-11-09 2019-10-25 Procédé de capture d'image et dispositif de capture d'image Pending EP3879486A4 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018211495A JP7006567B2 (ja) 2018-11-09 2018-11-09 撮影方法及び撮影装置
PCT/JP2019/041849 WO2020095712A1 (fr) 2018-11-09 2019-10-25 Procédé de capture d'image et dispositif de capture d'image

Publications (2)

Publication Number Publication Date
EP3879486A1 EP3879486A1 (fr) 2021-09-15
EP3879486A4 true EP3879486A4 (fr) 2022-08-10

Family

ID=70611814

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19882722.2A Pending EP3879486A4 (fr) 2018-11-09 2019-10-25 Procédé de capture d'image et dispositif de capture d'image

Country Status (5)

Country Link
US (1) US11435297B2 (fr)
EP (1) EP3879486A4 (fr)
JP (1) JP7006567B2 (fr)
CN (1) CN112567428B (fr)
WO (1) WO2020095712A1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180054063A (ko) * 2016-11-14 2018-05-24 주식회사 고영테크놀러지 검사체에 대한 양부 판정 조건을 조정하는 방법 및 장치
US11366068B2 (en) 2016-11-14 2022-06-21 Koh Young Technology Inc. Inspection apparatus and operating method thereof
KR102453132B1 (ko) * 2020-07-17 2022-10-11 (주)바질컴퍼니 품질 분석 결과를 이용한 최적 촬영 범위 제공 장치 및 방법
WO2022044150A1 (fr) * 2020-08-26 2022-03-03 三菱重工業株式会社 Dispositif de génération d'image, procédé de génération d'image, et programme
KR102173121B1 (ko) * 2020-09-14 2020-11-03 메이크모어엔터티 주식회사 영상을 근거로 한 주차 공간 확인 시스템 및 그 방법
JP2022086892A (ja) * 2020-11-30 2022-06-09 ブラザー工業株式会社 情報処理装置、および、情報処理方法
US11790508B2 (en) * 2021-04-21 2023-10-17 Baker Hughes Holdings Llc Computer vision predictions for non-destructive testing
CN117038064B (zh) * 2023-10-07 2024-01-09 之江实验室 一种辅助分析算法的评估方法、装置、存储介质及设备
CN117422890A (zh) * 2023-11-03 2024-01-19 厦门翼方健数信息科技有限公司 一种视觉深度学习模型的优化部署方法、系统和介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3762795A1 (fr) * 2018-03-06 2021-01-13 Omron Corporation Procédé, dispositif, système et programme de réglage de condition d'éclairage ainsi que support d'enregistrement
EP3762794A1 (fr) * 2018-03-05 2021-01-13 Omron Corporation Procédé, dispositif, système et programme de définition de condition d'éclairage et support d'informations

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3310524B2 (ja) * 1996-02-08 2002-08-05 日本電信電話株式会社 外観検査方法
US7805066B2 (en) * 2007-12-24 2010-09-28 Microsoft Corporation System for guided photography based on image capturing device rendered user recommendations according to embodiments
FR2940449A1 (fr) * 2008-12-24 2010-06-25 Snecma Procede de controle non destructif d'une piece mecanique
JP5506273B2 (ja) * 2009-07-31 2014-05-28 富士フイルム株式会社 画像処理装置及び方法、データ処理装置及び方法、並びにプログラム
EP2887055B1 (fr) 2013-12-17 2016-05-11 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Procédé et appareil de détection de défauts visibles
CA2951723C (fr) * 2014-06-10 2021-04-27 Sightline Innovation Inc. Systeme et procede pour le developpement et la mise en oeuvre d'applications a base de reseau
CN106651795A (zh) * 2016-12-03 2017-05-10 北京联合大学 一种利用光照估计来校正图像颜色的方法
JP2018126799A (ja) * 2017-02-06 2018-08-16 セイコーエプソン株式会社 制御装置、ロボットおよびロボットシステム
WO2018194525A1 (fr) * 2017-04-18 2018-10-25 Yeditepe Universitesi Analyseur biochimique basé sur un algorithme d'apprentissage automatique utilisant des bandelettes d'essai et un dispositif intelligent

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3762794A1 (fr) * 2018-03-05 2021-01-13 Omron Corporation Procédé, dispositif, système et programme de définition de condition d'éclairage et support d'informations
EP3762795A1 (fr) * 2018-03-06 2021-01-13 Omron Corporation Procédé, dispositif, système et programme de réglage de condition d'éclairage ainsi que support d'enregistrement

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2020095712A1 *

Also Published As

Publication number Publication date
US11435297B2 (en) 2022-09-06
EP3879486A1 (fr) 2021-09-15
WO2020095712A1 (fr) 2020-05-14
JP2020077326A (ja) 2020-05-21
CN112567428B (zh) 2024-01-19
JP7006567B2 (ja) 2022-01-24
US20210247324A1 (en) 2021-08-12
CN112567428A (zh) 2021-03-26

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