EP3879486A4 - Procédé de capture d'image et dispositif de capture d'image - Google Patents
Procédé de capture d'image et dispositif de capture d'image Download PDFInfo
- Publication number
- EP3879486A4 EP3879486A4 EP19882722.2A EP19882722A EP3879486A4 EP 3879486 A4 EP3879486 A4 EP 3879486A4 EP 19882722 A EP19882722 A EP 19882722A EP 3879486 A4 EP3879486 A4 EP 3879486A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- image capture
- capture device
- capture method
- image
- capture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/045—Combinations of networks
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20084—Artificial neural networks [ANN]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Software Systems (AREA)
- Mathematical Physics (AREA)
- Evolutionary Computation (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Data Mining & Analysis (AREA)
- Artificial Intelligence (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Computational Linguistics (AREA)
- Molecular Biology (AREA)
- Biophysics (AREA)
- Biomedical Technology (AREA)
- Signal Processing (AREA)
- Medical Informatics (AREA)
- Image Analysis (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018211495A JP7006567B2 (ja) | 2018-11-09 | 2018-11-09 | 撮影方法及び撮影装置 |
PCT/JP2019/041849 WO2020095712A1 (fr) | 2018-11-09 | 2019-10-25 | Procédé de capture d'image et dispositif de capture d'image |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3879486A1 EP3879486A1 (fr) | 2021-09-15 |
EP3879486A4 true EP3879486A4 (fr) | 2022-08-10 |
Family
ID=70611814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19882722.2A Pending EP3879486A4 (fr) | 2018-11-09 | 2019-10-25 | Procédé de capture d'image et dispositif de capture d'image |
Country Status (5)
Country | Link |
---|---|
US (1) | US11435297B2 (fr) |
EP (1) | EP3879486A4 (fr) |
JP (1) | JP7006567B2 (fr) |
CN (1) | CN112567428B (fr) |
WO (1) | WO2020095712A1 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180054063A (ko) * | 2016-11-14 | 2018-05-24 | 주식회사 고영테크놀러지 | 검사체에 대한 양부 판정 조건을 조정하는 방법 및 장치 |
US11366068B2 (en) | 2016-11-14 | 2022-06-21 | Koh Young Technology Inc. | Inspection apparatus and operating method thereof |
KR102453132B1 (ko) * | 2020-07-17 | 2022-10-11 | (주)바질컴퍼니 | 품질 분석 결과를 이용한 최적 촬영 범위 제공 장치 및 방법 |
WO2022044150A1 (fr) * | 2020-08-26 | 2022-03-03 | 三菱重工業株式会社 | Dispositif de génération d'image, procédé de génération d'image, et programme |
KR102173121B1 (ko) * | 2020-09-14 | 2020-11-03 | 메이크모어엔터티 주식회사 | 영상을 근거로 한 주차 공간 확인 시스템 및 그 방법 |
JP2022086892A (ja) * | 2020-11-30 | 2022-06-09 | ブラザー工業株式会社 | 情報処理装置、および、情報処理方法 |
US11790508B2 (en) * | 2021-04-21 | 2023-10-17 | Baker Hughes Holdings Llc | Computer vision predictions for non-destructive testing |
CN117038064B (zh) * | 2023-10-07 | 2024-01-09 | 之江实验室 | 一种辅助分析算法的评估方法、装置、存储介质及设备 |
CN117422890A (zh) * | 2023-11-03 | 2024-01-19 | 厦门翼方健数信息科技有限公司 | 一种视觉深度学习模型的优化部署方法、系统和介质 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3762795A1 (fr) * | 2018-03-06 | 2021-01-13 | Omron Corporation | Procédé, dispositif, système et programme de réglage de condition d'éclairage ainsi que support d'enregistrement |
EP3762794A1 (fr) * | 2018-03-05 | 2021-01-13 | Omron Corporation | Procédé, dispositif, système et programme de définition de condition d'éclairage et support d'informations |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3310524B2 (ja) * | 1996-02-08 | 2002-08-05 | 日本電信電話株式会社 | 外観検査方法 |
US7805066B2 (en) * | 2007-12-24 | 2010-09-28 | Microsoft Corporation | System for guided photography based on image capturing device rendered user recommendations according to embodiments |
FR2940449A1 (fr) * | 2008-12-24 | 2010-06-25 | Snecma | Procede de controle non destructif d'une piece mecanique |
JP5506273B2 (ja) * | 2009-07-31 | 2014-05-28 | 富士フイルム株式会社 | 画像処理装置及び方法、データ処理装置及び方法、並びにプログラム |
EP2887055B1 (fr) | 2013-12-17 | 2016-05-11 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | Procédé et appareil de détection de défauts visibles |
CA2951723C (fr) * | 2014-06-10 | 2021-04-27 | Sightline Innovation Inc. | Systeme et procede pour le developpement et la mise en oeuvre d'applications a base de reseau |
CN106651795A (zh) * | 2016-12-03 | 2017-05-10 | 北京联合大学 | 一种利用光照估计来校正图像颜色的方法 |
JP2018126799A (ja) * | 2017-02-06 | 2018-08-16 | セイコーエプソン株式会社 | 制御装置、ロボットおよびロボットシステム |
WO2018194525A1 (fr) * | 2017-04-18 | 2018-10-25 | Yeditepe Universitesi | Analyseur biochimique basé sur un algorithme d'apprentissage automatique utilisant des bandelettes d'essai et un dispositif intelligent |
-
2018
- 2018-11-09 JP JP2018211495A patent/JP7006567B2/ja active Active
-
2019
- 2019-10-25 EP EP19882722.2A patent/EP3879486A4/fr active Pending
- 2019-10-25 US US17/270,438 patent/US11435297B2/en active Active
- 2019-10-25 WO PCT/JP2019/041849 patent/WO2020095712A1/fr unknown
- 2019-10-25 CN CN201980053476.2A patent/CN112567428B/zh active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3762794A1 (fr) * | 2018-03-05 | 2021-01-13 | Omron Corporation | Procédé, dispositif, système et programme de définition de condition d'éclairage et support d'informations |
EP3762795A1 (fr) * | 2018-03-06 | 2021-01-13 | Omron Corporation | Procédé, dispositif, système et programme de réglage de condition d'éclairage ainsi que support d'enregistrement |
Non-Patent Citations (1)
Title |
---|
See also references of WO2020095712A1 * |
Also Published As
Publication number | Publication date |
---|---|
US11435297B2 (en) | 2022-09-06 |
EP3879486A1 (fr) | 2021-09-15 |
WO2020095712A1 (fr) | 2020-05-14 |
JP2020077326A (ja) | 2020-05-21 |
CN112567428B (zh) | 2024-01-19 |
JP7006567B2 (ja) | 2022-01-24 |
US20210247324A1 (en) | 2021-08-12 |
CN112567428A (zh) | 2021-03-26 |
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Legal Events
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Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
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17P | Request for examination filed |
Effective date: 20210209 |
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AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
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DAV | Request for validation of the european patent (deleted) | ||
DAX | Request for extension of the european patent (deleted) | ||
A4 | Supplementary search report drawn up and despatched |
Effective date: 20220707 |
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RIC1 | Information provided on ipc code assigned before grant |
Ipc: G06T 7/00 20170101AFI20220701BHEP |