EP3729498A1 - Procede de fabrication d'une puce a circuit integre et puce a circuit integre - Google Patents
Procede de fabrication d'une puce a circuit integre et puce a circuit integreInfo
- Publication number
- EP3729498A1 EP3729498A1 EP18852778.2A EP18852778A EP3729498A1 EP 3729498 A1 EP3729498 A1 EP 3729498A1 EP 18852778 A EP18852778 A EP 18852778A EP 3729498 A1 EP3729498 A1 EP 3729498A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- wire element
- substrate
- lateral groove
- protuberance
- groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W99/00—Subject matter not provided for in other groups of this subclass
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07336—Soldering or alloying
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07337—Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07521—Aligning
- H10W72/07527—Aligning involving guiding structures, e.g. spacers or supporting members
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
- H10W72/07536—Soldering or alloying
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
- H10W72/07537—Techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
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- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/381—Auxiliary members
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- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/521—Structures or relative sizes of bond wires
- H10W72/524—Bond wires having multiple distinct cores
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- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/533—Cross-sectional shape
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- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
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- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5434—Dispositions of bond wires the connected ends being on auxiliary connecting means on bond pads, e.g. on other bond wires
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- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5445—Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
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- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/865—Die-attach connectors and bond wires
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- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
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- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/791—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads
- H10W90/792—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads between multiple chips
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/791—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads
- H10W90/794—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads between a chip and a stacked insulating package substrate, interposer or RDL
Definitions
- the invention relates to a method for manufacturing an electronic device and in particular an integrated circuit chip
- the invention also relates to an electronic device.
- US2009 / 0200066 discloses a microelectronic chip having two parallel main faces and opposite side faces. At least one of the side faces has a groove forming a housing for a wire element having a longitudinal axis parallel to the longitudinal axis of the groove. The groove is provided with an electrical connection pad electrically connected to an integrated circuit.
- the integrated circuit which is formed in a first chip substrate is electrically contacted with an outer member by means of the electrically conductive wire which is inserted into the groove.
- US2009 / 0227069 discloses an assembly of microelectronic chips mechanically connected by a wire element.
- Fleas define a groove and the wire element is forced into the different grooves.
- the groove may elastically deform when the wire element is inserted. Then, by elastic return, the groove compresses the wire element which is embedded in the groove. This embodiment requires having an elastically deformable groove in flexion to allow the introduction of the wire element.
- the wire element can be fixed in the groove of the chip by welding, gluing or by depositing a polymer.
- the signals from or to the integrated circuit must pass through the electrically conductive wire.
- the electrical connection between the electrically conductive wire and the integrated circuit appears as a crucial point for the realization of the chips.
- the object of the invention is to provide a method for manufacturing an electronic device that is easy to implement and / or that makes it possible to produce a device whose service life is improved.
- the method of manufacturing the electronic device comprises:
- a first substrate provided with at least a first main surface and having at least a first projecting protuberance of the first main surface
- a second substrate comprising at least one main surface, a spacer separating the first substrate and the second substrate so as to define at least one first lateral groove, the first lateral groove being delimited by the first substrate, the second substrate and the first substrate; spacer, the first protuberance being arranged in the first lateral groove,
- the method is remarkable in that the first protrusion is arranged at a distance from the spacer so as to partially close the first lateral groove and in that the first protrusion is introduced into the cavity of the first wire element so that the first element wired is installed in the first lateral groove by rotation around the first protuberance.
- the first wire element is formed by a plurality of wires arranged in the form of a strand of wires, the cavity being formed by a gap between two adjacent wires.
- the first wire element is subjected to a tensile stress along the longitudinal axis of the first wire element at least when the first protrusion is introduced into the first wire element. least one cavity of the first wire element.
- the first protuberance has a first inclined face and a second inclined face joining to define a contact edge, the first inclined face and the second inclined face defining an obtuse angle.
- the first wire element is subjected to a tensile stress along the longitudinal axis of the first wire element to elastically reduce the section of the first wire element , the tensile force being reduced or eliminated after the installation of the first wire element in the first lateral groove.
- a gluing element is disposed on a wall of the at least one first lateral groove during the installation of the first wire element in the first lateral groove.
- the gluing element is in the liquid state during the installation of the first wire element in the first lateral groove, the element of bonding being at least on the second substrate to come into contact with the first wire element when rotating around the first protuberance.
- liquid-state bonding element is obtained by melting a fusible material.
- the bonding element is made of a solder material.
- the first wire element is electrically conductive
- the bonding element is electrically conductive
- the first lateral groove has an electrically conductive pad electrically connected on the one hand to a logic and / or analog circuit formed in the first substrate and electrically connected on the other hand to the first wire element.
- At least the first substrate is silicon and the first inclined face of the first protrusion forms an obtuse angle with a side wall connecting a second main face of the first substrate with the first major face of the first substrate.
- the invention also relates to an electronic device that is easier to implement and whose durability is improved.
- the electronic device comprises:
- a first substrate provided with at least a first main surface
- a second substrate comprising at least one main surface and having at least one first projecting protuberance of the second main surface, a spacer separating the first substrate and the second substrate so as to define at least one first lateral groove, the first lateral groove being delimited by the first substrate, the second substrate and the spacer, the first protuberance being arranged in the first lateral groove,
- first wire element formed by a plurality of wires arranged to define at least one cavity, said first wire element being installed in the first lateral groove.
- the first protuberance is arranged at a distance from the spacer so as to partially close the first lateral groove.
- the first wired element has at least a width greater than a minimum distance separating the first protrusion and the first substrate.
- the first protuberance is disposed wholly or partially out of the cavity.
- FIG. 1 is a diagrammatic sectional view of a first embodiment of an integrated circuit chip
- FIG. 2 schematically represents, in section, a second embodiment of an integrated circuit chip
- FIG. 3 schematically represents, in section, the rotation of the wire element when it is inserted into the groove
- FIG. 4 shows schematically in section, another embodiment of an integrated circuit chip. detailed description
- the electronic device is an integrated circuit chip or chip which comprises a first substrate 1 and a second substrate 2 defining at least one first groove 3a by means of a spacer 4.
- the first substrate 1 and the second substrate 2 are separated by the spacer 4.
- the first substrate 1 and the second substrate 2 are fixed to the spacer 4.
- the chip has two opposite external main faces 1a and 2a.
- the first external main face 1a is formed by a first face of the first substrate 1.
- the second main external face 2a is formed by a first face of the second substrate 2.
- the two opposite external main faces 1a and 2a are parallel .
- the chip comprises two main faces 1a and 2a connected to one another by side faces.
- a first groove 3a and optionally at least one second groove 3b are present in at least one of the lateral faces.
- two grooves 3a and 3b are formed in two opposite lateral faces.
- the two lateral grooves 3a and 3b are separated by the spacer 4.
- the side walls of the two grooves are formed by internal main surfaces 1b and 2b of the two substrates.
- the two side walls 1b and 2b are parallel.
- the side walls 1a and 1b are parallel to each other and / or the side walls 2a and 2b are parallel to each other.
- Each groove 3a / 3b is open at both ends.
- Wire elements 5a, 5b are inserted respectively in the grooves 3a, 3b. It has been observed that the insertion of the wire element in a groove is a critical step in the realization of the chip, because the dimensions of the groove 3a / 3b are generally close to those of the wire element 5a / 5b. This induces an important technical constraint for guiding the wire element precisely inside the groove.
- the wire element 5a In order to facilitate the guiding of the wire element 5a in the first lateral groove 3a, it is proposed to modify the shape of the groove 3a and the shape of the wire element 5a so as to install the wire element 5a to the inside the groove 3a by rotation.
- the wire element 5a When installed in the groove 3a, the wire element 5a rotates about a first protrusion 6 which protrudes into the groove 3a.
- the first protrusion 6 is arranged at a distance from the spacer 4 so as to partially close the first lateral groove 3a and thus prevent the wire element from leaving the groove 3a.
- the rotation of the wire element 5a makes it possible to less stress the edges of the chip and thus to reduce the risk of fracturing near the groove 3a, especially when the wire element 5 meshes with the first protuberance 6.
- the first protuberance 6 forms a stop which prevents the exit of the wire element 5a from the groove 3a.
- the protuberance 6 protrudes from the surface 2b of the second substrate 2 by a height of between a few microns and a few hundred microns.
- the height of the protrusion is greater than 10 m ⁇ ti, reference between 10 microns and several tens of microns, preferably less than 200m ⁇ ti.
- the groove 3a has a bottom formed by the spacer 4 and defines a first width which represents the separation distance between the two opposite side walls of the groove, here the walls 1b and 2b.
- the first protrusion 6 protrudes from the first substrate 1 so that the minimum distance between the first protrusion 6 and the first substrate 1 is less than the first width. In other words, the first protrusion defines a narrowing in the width of the groove 3a.
- the first wire element 5a defines at least one cavity 7 and / or a pin.
- the first protuberance 6 will be introduced into the cavity 7 which will facilitate the controlled rotation of the wire element 5a around the first protuberance 6 and possibly rotating with possibly a displacement from the outside of the groove with the inside of the groove in a direction parallel to the surface of the first substrate 1 and / u of the second substrate 2.
- the first protrusion 6 goes s' mesh with the pin which will also facilitate the controlled rotation of the wire element 5a around the first protrusion 6.
- the wire element 5a has a plurality of cavities 7 and therefore a plurality of lugs which are arranged on the surface in order to facilitate cooperation with the first protuberance 6 and thus facilitate insertion into the groove 3a.
- the cavities and / or the lugs are evenly distributed on the surface of the wire element 5a, for example in a cutting plane perpendicular to the longitudinal axis of the wire element.
- the wire element 5a has a substantially circular section and defines a plurality of cavities 7.
- the maximum diameter of the wire element 5a is greater than the distance between the first substrate 1 and the protrusion 6 to form a blocking stop.
- the wire element 5a has several diameters which are greater than the distance separating the first substrate 1 and the protuberance 6 in order to form a locking stop, these different diameters are advantageously offset by an angle of between 30 ° and 150 ° or possibly greater than 150 ° if the wire element has only two maximum diameters.
- the wire element 5a is formed by a plurality of wires which are fixed to one another.
- the wires are arranged in the form of a strand.
- the wires are rotated relative to each other so as to form a wire element having a plurality of wires which are mechanically secured.
- the space that exists between the adjacent wires makes it possible to define a plurality of cavities 7 on the surface of the wire element 5a.
- This configuration makes it easy to form a wire element 5a which has a plurality of cavities 7 which facilitates cooperation with the protrusion 6 for the insertion of the wire element 5a into the groove 3a.
- the first wire element 5a is subjected to a tensile stress along the longitudinal axis of the first wire element 5a. This tensile force is applied at least when the first protrusion 6 is introduced into the cavity 7 of the first wire element 5a.
- the inventors have observed that by applying such a tensile force, the arrangement of the wires relative to each other is slightly modified which facilitates or even causes the rotation of the wire element 5a relative to the first protuberance 6. pulling on the wire element 5a, the rotation is improved and it is easier to install the wire element 5a in the groove 3a.
- a cavity 7 or a lug is brought into contact with the protrusion 6.
- a tensile stress is applied to the wire element, preferably in the form of a strand. Traction of the wired element 5a induces a rotation relative to the protrusion 6 which generates or facilitates the insertion of the wire element 5a in the groove 3a.
- the first protrusion 6 has a first inclined face 8 and a second inclined face 9 which meet to define a contact edge.
- the first protuberance 6 has a triangular shape.
- the first inclined face 8 and the second inclined face 9 define an obtuse angle which makes it possible to have a stop contact with a good mechanical grip on the cavity 7 of the wire element 5a, for example in comparison with a hemispherical protuberance or rectangular. This also reduces the risk of fracture of the end of the first protrusion 6.
- the angle is greater than 100 °.
- the first protuberance is for example steel.
- the first protrusion 6 may extend over the entire length of the groove or possibly over at least the majority of the length of the groove.
- a plurality of protuberances may be disposed in the groove.
- the protuberances are regularly spaced.
- the first protuberance 6 is at the end of the groove 3a and advantageously at the end of the first substrate 1 so that the protuberance 6 forms an extra thickness to mechanically reinforce the substrate 1. It is particularly advantageous to using a first inclined face 8 extending to the side wall of the chip and providing that the angle formed by the first inclined face 8 and the side wall the chip is an obtuse angle. In this way, the mechanical strength is improved.
- the angle is advantageously greater than 100 °.
- the first wire element 5a is subjected to a tensile force along the longitudinal axis of the first wire element 5a.
- the tensile force is configured to elastically reduce the section of the first wire element 5a.
- the tensile force is reduced or advantageously eliminated after the installation of the first wire element 5a in the first lateral groove 3a.
- the tensile force is used to elastically deform the son so that they have a reduced section.
- Such a tensile force reduces the section of the wire element 5a during its introduction into the groove 3a. Once the effort is removed, the section of the wire element 5a increases which complicates the output out of the groove.
- the width of the wire element is greater than the minimum distance separating the first protuberance 6 and the first substrate 1.
- the wire element has several dimensions greater than the minimum distance separating the first protuberance 6 and the first substrate 1. These dimensions are advantageously offset by an angle at least equal to 15 ° according to the sectional plane illustrated in the different figures.
- the width of the wire element 5a is greater than the width of the groove 3a so that in the absence of tensile stress, the wire element 5a presses on the side walls of the wire. groove 3a which makes it more difficult an unwanted output of the wire element 5a out of the groove 3a.
- the section of the wire element 5a can be arbitrary. However, it is advantageous to provide a wire element of substantially circular section.
- substantially circular it is meant that the ends of the lugs are arranged along a perimeter of a circle.
- the wire element 5a may be a single strand or stranded conductive wire.
- the chip has two grooves 3a and 3b each associated with a wire element 5a and 5b, it is possible to have a chip comprising two son single conductor conductors or two son stranded conductors or a mixture of these two technologies.
- a multi-stranded conductor wire has a plurality of conductive wires that are electrically dissociated and allow different signals to be passed.
- the multi-stranded conductor wire has a plurality of conductive wires which are electrically connected together and circulate the same electrical signal.
- the wire element 5a is formed by a plurality of wires.
- the tensile stress applied to the wire element makes it possible to rearrange the arrangement of the wires relative to one another in order to reduce the section of the wire element.
- one or more electrically conductive wires are present among the plurality of wires.
- Each wire element 5a / 5b is advantageously secured to the first substrate 1 by welding with material supply, by gluing.
- the embedding in the groove 3a / 3b requires properly dimensioning the wire element 5a / 5b and the groove 3a / 3b.
- the mechanical resistance by embedding may be insufficient and generally requires a reinforcing phase by the provision of glue and / or metal.
- the first groove 3a has a gluing element 10. The first wire element 5a is introduced into the first groove 3a while the gluing element 10 is in the liquid or viscous state so as not to not interfere with the introduction into the groove 3a.
- the gluing element 10 Since the gluing element 10 is in the liquid state, the introduction of the wire element 5a by rotation makes it possible to cover more easily a larger portion of the outer wall of the wire element 5a. The mechanical strength is improved because the contact surface with the wire element 5a is increased.
- the gluing element 10 is arranged for example on the first substrate 1 so as to be brought into contact with the wire element 5 when it is inserted into the groove 3. It is also possible to provide that the gluing element is disposed on the second substrate 2 and / or on the spacer 4 to secure the wire element.
- the bonding element 10 forms a protruding zone on the second substrate 2, preferably substantially vis-à-vis the first protuberance in a direction parallel to the bottom of the groove 3a.
- the bonding element 10 polymerizes or goes into the solid state to fix the wire element 5a to one or more internal walls of the groove 3a.
- the bonding element 10 is electrically conductive and electrically connects the wire element 5a with a functional block of the first substrate 1.
- the wire element 5a can supply a power supply and / or transmit a signal to the functional block.
- the gluing element 10 is formed in a solder material, for example a metallic material which is in the liquid state when the wire element 5a is introduced into the groove 3a.
- the solder material may be a metal or a metal alloy.
- the solder material liquefies. Since the solder material is in the liquid state, it wets the wired element 5a by capillarity, which makes it possible to increase the contact area between the solder material and the electrically conductive wire 5a / 5b. Thus, the mechanical strength and the passage of a current is improved.
- the first protrusion 6 is formed of a material whose melting temperature is higher than the melting temperature of the solder material.
- the wired element 5a is introduced while the chip undergoes a heat treatment which melts the solder material.
- the wire element 5a is introduced while the chip has undergone a heat treatment which has melted the solder material.
- the wire element 5a is introduced during the cooling phase.
- the wire element is stressed in tension when it is inserted into the groove, it is particularly advantageous to reduce or even eliminate this stress when the bonding element is still in the liquid state. Indeed, by releasing the stress, the son of a wired wire element move away from each other which allows the bonding element to interfere between the various interstices to ensure better contact. When the wires are electrically conductive and the bonding element is also electrically conductive, this improves electrical conduction.
- the bonding element regions formed on the second substrate 2 are made by electrolytic growth or by screen printing.
- the chip is an RFID chip
- the first and / or second wire elements 5a / 5b are advantageously configured to form communication antennas.
- the first substrate 1 comprises at least one functional block configured to perform at least one logic and / or analog and possibly mechanical function.
- the first substrate 1 comprises at least a first electrical contact zone 11 a.
- the first substrate 1 comprises a silicon substrate or is constituted by a silicon substrate.
- the first integrated circuit is configured to perform a function of the type Radio-identification also called "radio frequency identification" or RFID.
- the functional block is an integrated circuit configured to perform at least one logic and / or analog function. It is also possible for the functional block to provide a mechanical function and advantageously the support of the electrical wires.
- the electrical contact zones 11a and 11b are electrically connected to the integrated circuit formed in the first substrate 1.
- the electrical contact zone 11a is located inside the groove 3a of the chip. If only one side groove 3a is defined, only one electrical contact area 11a may be formed and connected to the integrated circuit.
- the contact zone 11b is formed in the second groove 3b.
- the electrical contact zone 11a is formed on the second face 1b of the first substrate 1 which is opposite the first face 1a of the first substrate 1.
- the second face 1b of the first substrate 1 is in direct vis-à-vis with the second face 2b of the second substrate 2.
- the second face 1b of the first substrate 1 is made of an electrically insulating or semi-insulating material and advantageously a material barrier to external pollutants, eg water.
- the electrical contact zone 11 has a restricted surface because it must integrate into the first substrate 1 without hindering the transit of the signals in the different levels of interconnection. It is possible to use silicon as a semi-insulating material.
- the spacer 4 and the second substrate 2 are made of different materials or the spacer 4 and the second substrate 2 are made of the same materials.
- the second substrate 2 may comprise or consist of a silicon substrate.
- the second substrate 2 may be made of an electrically insulating or electrically conductive material which is covered by an electrically insulating layer.
- the second substrate 2 is an active element, that is to say that it comprises an electronic component, for example a battery.
- the second substrate 2 may be configured to feed the first substrate 1.
- the second substrate 2 is devoid of electronic component.
- the first and second electrically conductive wires 5a / 5b are advantageously configured to be embedded in the first groove 3a and in the second groove 3b, that is to say that the first substrate 1 and the second substrate 2 both support the electrically conductive wires 5a / 5b so that the latter remain inside the lateral grooves. In this way, the risks of separation of the electrically conductive wires 5a / 5b with the chip are reduced.
- the first and second electrically conductive wires 5a / 5b can be compressed by means of the first and second substrates 1 and 2. It is then advantageous to insert the wire element by stretching it to reduce its section and to facilitate its installation in the groove.
- first and second electrically conductive yarns 5a / 5b are not constrained by the first and second substrates 1 and 2.
- the retention of the wire element 5a in the groove 3a is provided by the first protuberance 6 and advantageously by the gluing element 10.
- the shape of the first substrate 1 is identical to the shape of the second substrate 2 which makes the chip more robust during its use, in particular by reducing the risk of separation between the first substrate 1 and the second substrate 2.
- the general shape of the chip is parallelepiped, the two outer major faces can then be of substantially equal dimensions, and they are connected by four side faces.
- the two outer major faces can then be of substantially equal dimensions, and they are connected by four side faces.
- other forms of chips are possible. It will be possible, for example, to have a first substrate 1 and / or a second substrate 2 having a curved outer main surface.
- a lateral face may be an extension of a main face, without precise delimiting edges between them.
- the chip may be formed by providing a first substrate 1 and then associating a second substrate 2 which comprises a spacer 4 protruding.
- the spacer 4 separates the first substrate 1 and the second substrate 2.
- the spacer 4 has been secured to the second substrate 2, for example by gluing.
- the spacer 4 is formed inside the second substrate 2 by ion etching and preferably by ionic etching of the Reactive Ion Etching type and more preferably by Deep Reactive Ion Etching. It is also possible to combine these two embodiments.
- the substrate is etched to form a spacer 4 which has a height of between 100 microns and 200 microns.
- the height of the spacer 4 corresponds to the height of the projecting portion relative to the rest of the second substrate.
- the height of the spacer 4 is defined according to the diameter of the electrically conductive wires 5a / 5b.
- the spacer 4 is brought into contact with the first substrate 1 and then a fixing step is advantageously carried out in order to fix the spacer 4 on the first substrate 1.
- the fixing the spacer 4 with the first substrate 1 is done by gluing.
- the fixing step is performed by bonding, melting a fusible material, molecular sealing or anodic sealing of the spacer 4 with the first substrate 1.
- the fixing step is carried out by means of of an annealing.
- the length of the spacer 4 is of the order of a few hundred microns, for example at least equal to 100 microns and advantageously less than several millimeters.
- the width of the spacer 4 is advantageously of the order of a few tens of microns, for example at least equal to 10 microns and advantageously less than several millimeters.
- the width of the protuberance 6 is advantageously of the order of a few tens of microns, for example between 10 microns and 100 microns.
- first substrate 1 provided with at least a first main surface 1b
- second substrate 2 comprising at least one main surface 2b and having at least one first protrusion 6 projecting from the second main surface 2b.
- the spacer 4 separates the first substrate 1 and the second substrate 2 so as to define at least one first lateral groove 3a.
- the first lateral groove 3a is delimited by the first substrate 1, the second substrate 2 and the spacer 4.
- the first protuberance 6 being arranged in the first lateral groove 3a.
- the first wire element 5a is formed by a plurality of wires arranged to define at least one cavity 7.
- the first wire element is installed in the first lateral groove 3a.
- the first protrusion 6 is arranged at a distance from the spacer 4 so as to partially close the first lateral groove 3a which forms the stop preventing the undesired exit of the wire element.
- the first wire element 5a has at least a width greater than a minimum distance separating the first protrusion 6 and the first substrate 1.
- the first protuberance 6 being disposed outside the cavity 7 so that the cavity does not come from a depression of the protrusion in the wire element which allows to maintain the integrity of the wire element. It is also possible to provide that the first protuberance is partially disposed outside the cavity once the first wired element inserted.
- the first protrusion allows a movement of the first wire element, for example along the longitudinal axis of the groove, an autorotation movement of the first wire element or a movement inside the groove. This movement can nevertheless be prevented by the
- the chips as described can be incorporated into clothing to form smart fabrics by their small size.
Landscapes
- Pressure Sensors (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1762897A FR3076071B1 (fr) | 2017-12-21 | 2017-12-21 | Procede de fabrication d’une puce a circuit integre et puce a circuit integre |
| PCT/FR2018/053511 WO2019122782A1 (fr) | 2017-12-21 | 2018-12-21 | Procede de fabrication d'une puce a circuit integre et puce a circuit integre |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP3729498A1 true EP3729498A1 (fr) | 2020-10-28 |
Family
ID=61913312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP18852778.2A Withdrawn EP3729498A1 (fr) | 2017-12-21 | 2018-12-21 | Procede de fabrication d'une puce a circuit integre et puce a circuit integre |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP3729498A1 (fr) |
| FR (1) | FR3076071B1 (fr) |
| WO (1) | WO2019122782A1 (fr) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2905518B1 (fr) | 2006-08-29 | 2008-12-26 | Commissariat Energie Atomique | Puce microelectronique a faces laterales munies de rainures et procede de fabrication |
| FR2928491A1 (fr) * | 2008-03-06 | 2009-09-11 | Commissariat Energie Atomique | Procede et dispositif de fabrication d'un assemblage d'au moins deux puces microelectroniques |
| FR2937464B1 (fr) * | 2008-10-21 | 2011-02-25 | Commissariat Energie Atomique | Assemblage d'une puce microelectronique a rainure avec un element filaire sous forme de toron et procede d'assemblage |
| FR2954588B1 (fr) * | 2009-12-23 | 2014-07-25 | Commissariat Energie Atomique | Procede d'assemblage d'au moins une puce avec un element filaire, puce electronique a element de liaison deformable, procede de fabrication d'une pluralite de puces, et assemblage d'au moins une puce avec un element filaire |
-
2017
- 2017-12-21 FR FR1762897A patent/FR3076071B1/fr not_active Expired - Fee Related
-
2018
- 2018-12-21 WO PCT/FR2018/053511 patent/WO2019122782A1/fr not_active Ceased
- 2018-12-21 EP EP18852778.2A patent/EP3729498A1/fr not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| FR3076071B1 (fr) | 2019-11-15 |
| FR3076071A1 (fr) | 2019-06-28 |
| WO2019122782A1 (fr) | 2019-06-27 |
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