EP3679599A1

EP3679599A1 - High density multi-component and serial packages

Info

Publication number: EP3679599A1
Application number: EP18853638.7A
Authority: EP
Inventors: James A. BURK; John Bultitude; Galen W. MILLER; John E. Mcconnell
Original assignee: Kemet Electronics Corp
Current assignee: Kemet Electronics Corp
Priority date: 2017-09-08
Filing date: 2018-09-10
Publication date: 2020-07-15
Also published as: JP2020534675A; EP3679599A4; CN111052347B; WO2019051346A1; JP7121797B2; CN111052347A

Abstract

An improved high density multi-component package is provided. The package comprising at least two electronic components. Each electronic component comprises a first external termination and a second external termination. At least one electrical connection is between adjacent first external terminations of adjacent electronic components. At least one mechanical connection is between adjacent electronic components. At least two adjacent electronic components are connected serially.

Description

HIGH DENSITY MULTI-COMPONENT AND SERIAL PACKAGES CROSS-REFERENCE TO RELATED APPLICATIONS

[0001] The present application is a continuation-in-part application claiming priority to pending U.S. Pat. Appl. No. 15/804,515 filed November 6, 2017 which is a continuation- in-part application claiming priority to pending U.S. Pat. Application No. 15/699,654 filed September 8, 2017 both of which are incorporated herein by reference. The present application is also a continuation-in-part claiming priority to pending U.S. Pat. Appl. No. 15/852,799 filed December 22, 2017 which is incorporated herein by reference.

FIELD OF THE INVENTION

[0002] The present invention is related to a high density package of electronic components, and a method of making the package, wherein increased functionality can be achieved in a limited footprint. More specifically, the present invention is specific to a high density package comprising combinations of interposers, higher temperature conductive adhesive (HTCA) and high temperature insulating adhesive (HTIA) which allows for serial connectivity of a variety of electronic components.

BACKGROUND

[0003] There is an on-going need in electronics to provide increased functionality in increasingly smaller devices. This desire, referred to as miniaturization, has dominated research efforts associated with components, mounting techniques and the like. While most of the effort has been focused on decreasing the footprint of electronic

components on a circuit board more recent efforts have focused on stacking components thereby occupying the space above and below the board instead of occupying surface area of the board.

[0004] Stacked multi-layer ceramic capacitors (MLCC) are described in commonly assigned U.S. Pat. No. 9,472,342, to McConnell et al., which is incorporated herein by reference, wherein leadless multi-layer ceramic capacitors are formed in stacks where two or more MLCC's are bonded together by their terminations using transient liquid phase sintering (TLPS) adhesives. The resulting stack can be surface mounted by techniques known in the art, such as soldering, since the TLPS does not reflow at the soldering temperature.

[0005] While advantageous, the leadless stacks provide capacitors in electrical parallel only and therefore the applications are somewhat limited. There are many applications requiring electronic components serially connected. Serially connected components can be achieved by bonding the terminals of the respective components end-to-end, rather than in a stack, however this increases the space required for mounting which is contrary to the overwhelming desire for miniaturization.

[0006] There is an ongoing necessity for a package comprising multiple components, which can be serially connected, while minimizing the footprint of the package on the circuit board. Provided herein is an improved package for multiple components, preferably including at least one MLCC, wherein at least some of the electronic components in the package are serially connected.

SUMMARY OF THE INVENTION

[0007] The present invention is related to high density multi-component packages. [0008] More specifically, the present invention is related to high density multi- component packages which allow for serial or parallel connectivity of different components in the package.

[0009] A particular feature of the invention is the ability to mount a high density package on a circuit board either vertically or horizontally.

[0010] These and other embodiments, as will be realized, are provided in a high density multi-component package and a method of manufacturing a high density multi- component package. The high density multi-component package comprises at least two electronic components wherein each electronic component of the electronic components comprise a first external termination and a second external termination. At least one interposer is between the adjacent electronic components and attached to the interposer by an interconnect wherein the interposer is selected from an active interposer and a mechanical interposer. Adjacent electronic components are connected serially.

[0011] Yet another embodiment is provided in an electronic circuit. The electronic circuit comprises a high density multi-component package comprising at least two electronic components wherein each electronic component comprises a first external termination and a second external termination. An interposer is between adjacent electronic components wherein the interposer is selected from an active interposer and a mechanical interposer. The adjacent electronic components are connected serially. A circuit board is provided wherein the circuit board comprises traces wherein at least one trace is an active trace and at least one trace is a mechanical pad . At least one first external termination of a first electronic component is in electrical contact with one active trace and at least one second external termination of a second electronic component is in electrical contact with a mechanical pad.

[0012] Yet another embodiment is provided in a method for forming a high density multi-component package comprising:

providing at least two electronic components wherein each electronic component comprises a first external termination and a second external termination;

forming a stack of electronic components with at least one interposer between adjacent electronic components wherein the interposer is selected from an active interposer and a mechanical interposer; and

attaching the first external terminations to first traces on the interposer and the second external terminations to second traces on the interposer with an interconnect wherein adjacent electronic components are connected serially.

[0013] Yet another embodiment is provided in a method for forming an electronic circuit comprising:

forming a high density multi-component package by:

attaching the first external terminations to first traces on the interposer and second external terminations to second traces on the interposer with an interconnect wherein adjacent electronic components are connected serially; providing a circuit board comprising traces wherein at least one trace is an active trace and at least one trace is a mechanical pad;

attaching at least one first external termination of a first electronic component to one active trace with an interconnect; and

attaching at least one second external termination of a second electronic component to a mechanical pad with the interconnect.

[0014] Yet another embodiment is provided in a high density multi-component package. The package has at least two electronic components wherein each electronic component comprises a first external termination and a second external termination. At least one first adhesive is between adjacent first external terminations of adjacent electronic components. At least one second adhesive is between the adjacent electronic component and at least two adjacent electronic components are connected serially. The first adhesive and second adhesive are independently selected from a high temperature conductive adhesive and a high temperature insulating adhesive.

[0015] Yet another embodiment is provided in an electronic circuit. The electronic circuit has a high density multi-component package wherein the package comprises at least two electronic components wherein each electronic component comprises a first external termination and a second external termination, at least one first adhesive between adjacent first external terminations, at least one second adhesive between adjacent electronic components and wherein at least two adjacent electronic

components are connected serially. The first adhesive and second adhesive are independently selected from a high temperature conductive adhesive and a high temperature insulating adhesive. The electronic circuit also comprises a circuit board comprising traces wherein at least one trace is an active trace and at least one trace of said traces is a mechanical pad. At least one first external termination of a first electronic component is in electrical contact with one active trace. At least one second external termination of a second electronic component is in electrical contact with a mechanical pad.

[0016] Yet another embodiment is provided in a method for forming a high density multi-component package. The method includes:

forming a stack of adjacent electronic components;

attaching adjacent first external terminations with a first adhesive there between;

attaching adjacent electronic components with a second adhesive there between; wherein the first adhesive and second adhesive are independently selected from the group consisting of a high temperature conductive adhesive and a high temperature insulating adhesive; and

wherein the adjacent electronic components are connected serially.

[0017] Yet another embodiment is provided in a high density multi-component package comprising at least two electronic components. Each electronic component comprises a first external termination and a second external termination. At least one electrical connection is between adjacent first external terminations of adjacent electronic components. At least one mechanical connection is between adjacent electronic components. At least two adjacent electronic components are connected serially. [0018] Yet another embodiment is provided in a method for forming a high density multi-component package comprising:

forming a stack of electronic components;

forming at least one electrical connection between adjacent first external terminations of adjacent electronic components;

forming at least one mechanical connection between the adjacent electronic

components; and

wherein said adjacent electronic components are connected serially. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figs. 1 and 1A are schematic side view representations of embodiments of the invention.

[0020] Fig. 2 is a schematic side view representation of an embodiment of the invention.

[0021] Fig. 3 is a schematic side view representation of an embodiment of the invention.

[0022] Fig. 4 is a schematic side view representation of an embodiment of the invention.

[0023] Fig. 5 is a schematic side view representation of an embodiment of the invention. [0024] Fig. 6 is a schematic side view representation of an embodiment of the invention.

[0025] Fig. 7 is a schematic cross-sectional side view representation of an embodiment on the invention.

[0026] Fig. 8 is a schematic cross-sectional side view representation of an embodiment on the invention.

[0027] Fig. 9 is a schematic cross-sectional side view representation of an embodiment on the invention.

[0028] Fig. 10 is a schematic top view representation of an embodiment of the invention.

[0029] Fig. 1 1 is a schematic top view representation of an embodiment of the invention.

[0030] Fig. 12 is a schematic top view representation of an embodiment of the invention.

[0031] Fig. 13 is a schematic top view representation of an embodiment of the invention.

[0032] Fig. 14 is an electrical schematic representation of an embodiment of the invention.

[0033] Fig. 15 is an electrical schematic representation of an embodiment of the invention.

[0034] Fig. 16A is a schematic side view representation of an embodiment of the invention. [0035] Fig. 16B is a schematic side view representation of an embodiment of the invention.

[0036] Fig. 17 is a schematic top view representation of an embodiment of the invention.

[0037] Fig. 18 is a schematic side view representation of an embodiment of the invention.

[0038] Fig. 19 is a schematic top view representation of an embodiment of the invention.

[0039] Fig. 20 is a schematic side view representation of an embodiment of the invention.

[0040] Fig. 21 is an electrical schematic representation of an embodiment of the invention.

[0041] Fig. 22 is an electrical schematic representation of an embodiment of the invention.

[0042] Fig. 23 is schematic side view representation of an embodiment of the invention.

[0043] Fig. 24 is schematic side view representation of an embodiment of the invention.

[0044] Fig. 25 is schematic side view representation of an embodiment of the invention.

[0045] Fig. 26 is schematic side view representation of an embodiment of the invention. [0046] Fig. 27 is an electrical invention.

[0047] Fig. 28 is an electrical invention.

[0048] Fig. 29 is an electrical invention.

[0049] Fig. 30 is a schematic invention.

[0050] Fig. 31 is a schematic invention.

[0051] Fig. 32 is a schematic invention.

[0052] Fig. 33 is a schematic embodiment on the invention.

[0053] Fig. 34 is a schematic embodiment on the invention.

[0054] Fig. 35 is a schematic embodiment on the invention.

[0055] Fig. 36 is a schematic embodiment on the invention.

[0056] Fig. 37 is an electrical invention. [0057] Fig. 38 schematic cross-sectional top view representation of an embodiment on the invention.

[0058] Fig. 39 schematic cross-sectional top view representation of an embodiment on the invention.

[0059] Fig. 40 schematic cross-sectional top view representation of an embodiment on the invention.

[0060] Figs. 41 and 42 are electrical schematic representations of embodiments of the invention.

[0061] Fig. 43 is an electrical schematic representation of an embodiment of the invention.

[0062] Fig. 44 is a schematic cross-sectional side view representation of an embodiment on the invention.

[0063] Fig. 45 schematic cross-sectional top view representation of an embodiment on the invention.

[0064] Fig. 46 is a schematic cross-sectional side view representation of an embodiment on the invention.

[0065] Fig. 47 is a schematic cross-sectional side view representation of an embodiment on the invention.

[0066] Figs. 48 and 48A are schematic cross-sectional top view representations of embodiments on the invention.

[0067] Fig. 49 is a schematic cross-sectional top view representation of an embodiment on the invention. [0068] Fig. 50 is a schematic cross-sectional top view representation of an embodiment on the invention.

[0069] Fig. 51 is a schematic cross-sectional top view representation of an

embodiment on the invention.

DESCRIPTION

[0070] The present invention is related to a high density multi-component package of electronic components wherein at least some of the electronic components are serially connected and the package minimizes surface area required on the circuit board. More specifically, the present invention is related to a stack of electronic components comprising a combination of high temperature conductive adhesives (HTCA), high temperature insulating adhesives (HTIA) and interposers between adjacent external terminations of adjacent electronic components or between adjacent electronic components. The interposer provides for a connection between one terminal of each adjacent component within the stack of electronic components. The interposer may also provide for inter-component insulation and/or separation to avoid arcing in high voltage applications.

[0071] In one embodiment, the package of electronic components can be surface mounted with the end terminals of the outermost components electrically connected to the circuit. The high density multi-component package can be used to form high density packages containing mixed electronic components and provides the flexibility to connect the electronic component in electrical series as well as in electrical parallel thereby enabling high density packages of multifunctional components with a variety of electronic configurations. [0072] In an embodiment the combination of HTCA and HTIA between adjacent electronic components provides for a serial configuration. In the present invention the HTCA provides for an electrical connection between terminals of adjacent components within the stack of electronic components. The HTIA provides a mechanical bond and electrical insulation between adjacent components. The combination of HTCA and HTIA allows components to be arranged in a higher density package with serial and parallel connectivity. This compaction can be beneficial in either the vertical or horizontal mounting configuration. In one embodiment, the package of electronic components can be surface mounted with the end terminals of the outermost

components electrically connected to the circuit. The high density multi-component package can be used to form high density packages containing mixed electronic components and provides the flexibility to connect the electronic component in electrical series as well as in electrical parallel thereby enabling high density packages of multifunctional components with a variety of electronic configurations. The HTCA and HTIA can be bonded in the same process or separately. Furthermore, the components can be formed into a bonded stack and the stack subsequently mounted to a circuit board or the circuit board mounting and stack formation can occur in concert.

[0073] To form the serial connection between adjacent electronic components using an interposer the interposers, in an embodiment, have an electrical connection through the interposer as either a via through-hole or a conductive wrap around the substrate of the interposer as will be described. Solder pads, which may be a component of a trace, are preferably provided on the via or wrap to form a mechanical and electrical bond to the external termination of the electronic component. The via may be filled or unfilled with electrically conductive material. In the unfilled case the via can be filled with interconnecting material during assembly to connect components on opposite sides. Sintered metal pastes, conductive adhesives or TLPS are suitable interconnects since they can be cured or sintered to form a connection in the assembly without flowing out during the process. These conductive pads can be formed using any conductive metal. Copper and aluminum are common in the case of organic interposers but for inorganic interposers any thick or thin conductive metals can be used. These may also be protected by over-plating.

[0074] The invention will be described with reference to the figures forming an integral, non-limiting, component of the disclosure. Throughout the various figures similar elements will be numbered accordingly.

[0075] Interposers are illustrated in cross-sectional schematic view in Figs. 1 and 2. In Fig. 1 , the interposer, 10, comprises active pads, 12, formed by a via, 14, extending through the substrate, 16, thereby providing electrical connection between conducting pads, 18, on either side of the substrate. Mechanical pads, 20, are not in electrical contact with a mechanical pad opposite thereto on the substrate. In Fig. 2, the active pad, 12, is in the form of a wrap-around pad, and the mechanical pads, 20, are portions of a trace on the surface of the substrate, 16. An interposer with at least one active pad and at least one optional mechanical pad will be referred to herein as an active interposer. An interposer with an unfilled via, 15, is illustrated in Fig. 1A wherein the via, 14', can be filled before or during assembly.

[0076] An embodiment of the invention will be described with reference to Fig. 3 wherein a high density multi-component package, 30, is illustrated in schematic side view. In Fig. 3, four electronic components are illustrated for the purposes of discussion without limit thereto. Each electronic component is arbitrarily numbered for the purposes of illustration and discussion only. In Fig. 3, interposers, 10, are between adjacent electronic components. Each electronic component has one external termination, 32, in electrical contact with an active pad, 12, thereby forming an electrical connection and one external termination in contact with, and adhered to, a mechanical pad, 20, thereby forming a mechanical connection. In Fig. 3 the active pad is

represented as conducting pads on either side of the substrate electrically connected by a via forming an electrical connection. The external terminations are preferably bonded to the pads by an interconnect, 34, such as a conductive adhesive, a solder, polymer solder, TLPS bond, sintered metal interconnects, diffusion solders or direct copper bonds as will be discussed elsewhere herein. Active pads and mechanical pads of adjacent interposers alternate thereby providing for an electronic path beginning arbitrarily at external termination, 32¹, of electronic component 1 , and ending with external termination, 32⁸, of electronic component 4. The four electronic components are therefore serially connected. While four electronic components are a sufficient number to illustrate the invention it is to be understood that the invention can be extended from two components to any number of electronic components and a large variety of variations as will be realized. It is preferable that the number of components is at least two to no more than 100.

[0077] An embodiment of the invention will be described with reference to Fig. 4 wherein a high density multi-component package, 30, is illustrated in schematic side view. In Fig. 4, four electronic components are illustrated for the purposes of discussion without limit thereto. Each electronic component is arbitrarily numbered for the purposes of illustration and discussion only. In Fig. 4, HTCA's, 310, and HTIA's, 31 1 , are between adjacent external terminations of adjacent electronic components. Each electronic component has one external termination, 32, in either electrical contact with an adjacent external termination through a HTCA, 310, or physically attached with an electrically insulating bond through a HTIA, 311 , which is preferably between adjacent external terminations. The HTCA forms an electrical connection and the HTIA forms a mechanical connection. In Fig. 4 an electronic path is formed beginning arbitrarily at external termination, 32¹, of electronic component 1 , and ending with external termination, 32⁸, of electronic component 4. The four electronic components are therefore all serially connected. While four electronic components are a sufficient number to illustrate the invention it is to be understood that the invention can be extended from two components to any number of electronic components and a large variety of variations as will be realized. It is preferable that the number of components is at least two to no more than 100.

[0078] An embodiment of the invention will be described with reference to Figs. 5 and 6 wherein a high density multi-component package vertically mounted to a substrate, 36, is illustrated in schematic side view. Active circuit traces, 38, on the substrate, 36, are in functional electronic connection with external terminations, 32¹ and 32⁸. External termination, 32¹, is directly attached to active circuit trace 38¹ by an interconnect, 42, which may be the same as the interconnect between the external terminations and interposers or it may be different. A connector, 44, is in electrical contact with external termination 32⁸ and active trace 38² wherein the active traces, 38, are integral to the electronic circuit of a device. The connector may be an electrical connection, such as a wire or jumper, and otherwise provide no further function or the connector may be a functional connection such as an electrical component. Particularly preferred connectors include a resistor, a fuse, an inductor or a flexible circuit. A mechanical pad, 40, provides mechanical stability and is directly attached to external termination 32² by an interconnect, 42.

[0079] An embodiment of the invention will be described with reference to Figs. 7, 8 and 9 wherein a flex circuit is utilized as the connector. With reference to Fig. 7 a flex circuit connector, 144, shown in cross-sectional schematic view, comprises a flexible substrate, 160. An optional but preferred mechanical pad, 20, provides for mechanical attachment to an external termination, such as 32⁶ of Fig. 9, for mechanical robustness. A pair of conducting pads, 18, are in electrical connection with vias, 14, which are in electrical contact with a trace, 146. A conducting pad is in electrical contact with an external termination, 32⁵, and a conducting pad is in electrical contact with a circuit trace, 38².

[0080] An embodiment of the invention will be described with reference to Figs. 10 and 1 1 wherein a high density multi-component package horizontally mounted to a circuit board, 36, is illustrated in schematic top view. In Figs. 10 and 1 1 , each external termination, 32, is attached to a trace of the circuit board with external terminations 32¹ and 32⁸ attached to active traces 38¹ and 38², respectively, which are in electrical contact with the circuit traces, 46, and the remaining external terminations are attached to mechanical pads, 40, preferably through a solder pad, 43, by an interconnect which is not shown. In Figs. 10 and 1 1 the electronic components are all serially connected. In Fig. 1 1 the HTIA, 31 1 , is optional as the electronic components are mechanically secured to the circuit board. The HTIA is still preferable as it provides mechanical stability and thus allows for the manufacture of a stack of electronic components prior to and independent of the board mounting process. This also facilitates part testing prior to board assembly.

[0081] An embodiment of the invention will be described with reference to Figs. 12 and 13 wherein a high density multi-component package is illustrated in schematic top view as mounted to a substrate, 36. In Fig. 12 electronic components 1 and 4 are mounted as illustrated and described relative to Figs. 10 and 11 . Electronic

components 2 and 3 have an interconnect, 34, or HTCA, 310, forming an electrical connection directly there between and therefore the electronic components 2 and 3 are in electrical parallel. A generic electrical schematic diagram is illustrated in Fig. 14 wherein electronic components 2 and 3 are in electrical parallel between serially connected electronic components 1 and 4. An electrical schematic diagram is provided in Fig. 15 wherein electrical component 1 is an inductor, electrical components 2 and 3 are MLCC's and electrical component 4 is a fuse thereby providing a fused inductor capacitor high density component.

[0082] An embodiment of the invention will be described with reference to Figs. 16A and 16B wherein interposers, 50, are illustrated. In Fig. 9A the interposer comprises mechanical pads, 20, which are not in electrical contact with a mechanical pad opposite thereto on the substrate, 16. In Fig. 9B, the mechanical pads, 20, are electrically isolated portions of a trace on the surface of the substrate, 16. The interposers illustrated in Figs. 9A and 9B do not have an active pad, as will be realized from further discussion, and will be referred to herein as a mechanical interposer.

[0083] An embodiment of the invention will be described with reference to Figs. 17, 18, 19 and 20 wherein a portion of an electronic circuit of a device is illustrated in top schematic view in Figs. 17 and 19 and side schematic view in Figs. 18 and 20. For the purposes of discussion, a series of pads, 58, are numbered sequentially. Traces, 54, connecting adjacent pads are designated by the pads being electrically connected.

Traces are electrical paths which may include pad for connectivity. Trace 54²³, for example, provides electrical conductivity between pads 58² and 58³. Mechanical interposers, 50, or HTIA, 31 1 , are between adjacent electronic components wherein pads 58¹ and 58⁸ provide connectivity to the circuit by traces, 56. A secondary electrical component, 5, electrically mounted in parallel with electrical components 2 and 3 at the external termination provides a combination of serial and parallel electrical connections and component 5 does not increase the surface area of the circuit board, 36, occupied by the package, 11 1 . A secondary electrical component is an electrical component which is peripheral to the stack but electrically connected thereto. While demonstrated with five electrical components the number and arrangement of electrical components is not limited herein.

[0084] A representative circuit diagram for the package illustrated in Figs. 17, 18, 19 and 20 is provided in Fig. 21 wherein electronic components 1 , 2, 3 and 4 are

electrically serially connected and electronic component 5 is electrically parallel to components 2 and 3. An exemplary embodiment is illustrated in Fig. 22 wherein electronic component 1 is an inductor, electronic components 2 and 3 are MLCC's, electronic component 5 is a resistor and electronic component 4 is a fuse.

[0085] An embodiment of the invention will be described with reference to Figs. 23 and 24 wherein a high density multi-component package mounted to a substrate, 36, is illustrated in partial cross-sectional schematic view. In Figs. 23 and 24, the electronic components are in parallel adjacent stacks with a secondary electronic component, P, spanning across electronic components N and M. Electronic component P may be an additional electronic component providing functionality between those components being bridged or electronic component P can provide electrical conductivity as would be provided by an electrical jumper, conductive wire or conductive foil. In an embodiment, electronic component P could be an interposer or a flexible circuit with two active pads and a trace there between for electrical connectivity between the active pads. As illustrated, without limit thereto, pads, 62, are active pads in electrical communication with circuit traces, not shown, and pads, 60, are mechanical pads which are not otherwise electrically connected to the circuit. An over-molding, 64, may be included to prevent surface arcing, to create a barrier to moisture penetration or to facilitate mechanical placement.

[0086] In a further embodiment of the invention by increasing the number of active connections to the circuit board it is possible to achieve an electrical filter within a high density component package. Pi, T, and LC filters are widely used in either feed through or surface mount configurations but there is a desire to continue to miniaturize these packages and provide a high density surface mountable solution. An example of a Pi- filter package is shown in Figs. 25 and 26 wherein electronic component 2 is an inductor and electronic components 1 and 3 are MLCC's. The input and output of the inductor is connected through an MLCC to ground traces, 51 , thereby providing a Pi filter with an electrical schematic diagram illustrated in Figure 27. Only the active circuit traces are shown in Figs. 25 and 26 and other non-active pads may be added for a mechanical bond for increased mechanical stability. An electronic schematic diagram for a "LC" filter is illustrated in Fig. 28 and an "T" filter is illustrated in Fig. 29.

[0087] In the case where the component to be attached has a face-down termination an active interposer, 70, with a reorientation via can be used as shown in Fig. 30 wherein a conducting pad, 18, is electrically connected by a via, 14, to a conducting pad, 72. When used as depicted in Fig. 31 or Fig. 32 one of the faced down terminals is connected to the circuit and the other to one terminal of the next component, 76, by connection to the re-orientation via to form a serial connection. Each pad, 74, independently represents either mechanical pads or conducting pads as necessary thereby allowing for flexibility in the design of the electronic components and the functionality of the high density multi-component package.

[0088] An embodiment of the invention will be described with reference to Figs. 33 and 34. In Figs. 33 and 34 a multiplicity of components, 1 -8, are illustrated with adjacent components in one plane, 1 and 2 or 3 and 4 or 5 and 6 or 7 and 8 for example, are serially connected through common electrical attachment using

mechanical pads, 20, or HTCA, 310. The mechanical connection to adjacent parallel electronic components, such as 2 and 3, are provided by the mechanical pads, 20, or by HTIA, 31 1 . Adjacent components are in electrical contact across the active interposer, 10, by active pads, 18, connected across the interposer by a via, 14, or by HTCA, 310. By providing multiple pads and combinations of active pads, mechanical pads, HTCA or HTIA multiple arrangements of components can be provided in a limited space.

[0089] An embodiment of the invention will be described with reference to Figs. 35 and 36.

[0090] In Fig. 35, a multiplicity of interposers provides the flexibility to form serial and parallel electrical connections. Intrastack interposers, 210, which can independently be active interposers or mechanical interposers, between components in a stack allow for serial electrical connectivity as discussed herein. An interstack interposer, 21 1 , which is preferably an active interposer, provides electrical conductivity between adjacent stacks, Si and S2 of components wherein for the purposes of illustration stack Si comprises components 1 , 2 and 3 and stack S2 comprises components 4, 5 and 6. For the purposes of illustration the interstack interposer has active pads, 18, in electrical contact by vias, 14, between adjacent components 3 and 6 and adjacent components 2 and 5 thereby providing a package with two groups of components 2-5 and 3-6 in electrical series with each set in electrical series with component 1 and 4 as

represented schematic in Fig. 36. In Fig. 35 the package is in electrical contact with active circuit traces, 38, on a circuit board, 36, with mechanical pads, 40, provided for mechanical support. Alternatively, a mechanical pad, 40¹ for example, may be an active circuit thereby allowing for the use of a portion of the stack, only component 1 for example, with the functionality of component 1 , in this illustration, be isolated between traces 38¹ and 40¹.

[0091] The embodiments illustrated in Figs. 35 and 36 allow for testing of individual components within the package. [0092] In Fig. 36, a combination of HTCA, 310, and HTIA, 31 1 , provides the flexibility to form serial and parallel electrical connections. Inter-stack HTCA, 310, provides electrical conductivity between adjacent stacks, Si and S2 of components wherein, for the purposes of illustration, stack Si comprises components 1 , 2 and 3 and stack S2 comprises components 4, 5 and 6. For the purposes of illustration adjacent

components 3 and 6 and adjacent components 2 and 5 provide a package with two groups of components 2-5 and 3-6 in electrical series with each set in electrical series with component 1 and 4 as represented schematically in Fig. 37. In Fig. 36 the package is in electrical contact with active circuit traces, 38, on a circuit board, 36, with

mechanical pads, 40, provided for mechanical support. Alternatively, a mechanical pad, 40¹ for example, may be an active circuit thereby allowing for the use of a portion of the stack, only component 1 for example, with the functionality of component 1 , in this illustration, to be isolated between traces 38¹ and 40¹. This allows for testing of individual components within the package.

[0093] An embodiment of the invention will be described with reference to Figs. 38, 39 and 40 wherein a package is provided which allows multi-terminal components to be connected to the circuit through separate pads. In Figs. 38, 39 and 40 three

components are illustrated, without limit thereto. In Fig. 38 active interposers are between adjacent components and with each external termination of each component in electrical contact with a circuit trace. In Fig. 40 a package is provided which allows multi-terminal components to be connected to the circuit through the use of HTCA, 310, and HTIA, 311 . In Fig. 40 three components are illustrated, without limit thereto, with HTCA between adjacent components and with each external termination of each component in electrical contact with a circuit trace. Depending on the desired functionality of the package some circuit traces, 151 , can be active and some can be mechanical. By way of example, traces 151 ^A, 151 ^c and 151 ^B can be utilized to provide the schematic of Fig. 41 which could provide the T-filter of Fig. 29 when components 1 and 3 are inductors and component 2 is a capacitor. Alternatively, traces 151 A, 151 B and 151 E could be utilized to provide the schematic of Fig. 42 which could provide the LC, or L filter of Fig. 28 when component 1 is an inductor and component 2 is a capacitor. By the use of alternate arrangements of HTCA and HTIA or the equivalent structure utilizing interposers, circuit traces 151 A, 151 B, 151 C and 151 F could be utilized to provide the schematic of Fig. 43 which could provide the Pi filter of Fig. 27 if components 1 and 3 are capacitors and component 2 is an inductor. A single package can provide multiple functions. It would be understood that the number of components can be quite large and therefore the functionality can be essentially limitless.

[0094] An embodiment of the invention will be described with reference to Fig. 44. In Fig. 44, a functional interposer, 200, is illustrated in schematic cross-sectional view wherein the functional interposer comprises functional pads, 300, with at least one component, 1 , in electrical contact and between the functional pads. Conductive pads, 302, in electrical contact by a trace, 304, provide electrical connectivity to additional components, 2-4, without limit to the number. A functional pad and a conductive pad are each in electrical contact with active traces, 38. The package may be encased in an overmolding, 64.

[0095] An embodiment of the invention is illustrated in schematic cross-sectional view in Fig. 45. In Fig. 45 two electronic components are illustrated with the understanding that the two electronic components could be a portion of a stack of electronic components. In Fig. 45 external terminations 32¹ and 32² are in electrical contact through a HTCA, 310, as described elsewhere herein. External terminations 32³ and 32⁴ are not in electrical contact having instead a spacer, 9, there between wherein the spacer can be an air gap or a non-conductive material wherein the non- conductive material may be an HTIA. A secondary adhesive, 112, which is preferably not conductive, adheres the body of the adjacent electronic components for stability purposes. The adhesive may be in contact with one external termination of one electronic component and the body of the adjacent electronic component. For the purposes of the instant invention a secondary adhesive is an adhesive which is in mechanical contact with at least one body of at least one electronic component and may otherwise be in mechanical contact with a body of a second electronic component, an external termination of a second electronic component or a solder pad.

[0096] An embodiment of the invention is illustrated in schematic side view in Fig. 46 wherein two stacks of electronic components, represented by 1 -8 without limit thereto, is illustrated mounted vertically to a substrate, 36. A spacer, 17, is provided which functions as an insulator between adjacent external terminations of adjacent electronic components. As would be realized a stack as represented in Fig. 46 could be mounted horizontally, as in Fig. 1 1 , and alternate arrangements of HTCA, 310, HTIA, 311 , and spacers, 17 could be employed thereby allowing for combinations of serial and parallel electrical connections as set forth elsewhere herein.

[0097] An embodiment of the invention is illustrated in schematic side view in Fig. 47. In Fig. 47 a HTIA, 311 , is between adjacent electronic components thereby allowing for serial connectivity of the stacked electronic component. Adjacent external terminations are in electrical connection by HTCA's, 310, as described elsewhere herein. As would be realized a stack as represented in Fig. 47 could be mounted horizontally, as in Fig. 35, and alternate arrangements of HTCA and HTIA could be employed, with the further inclusion of spacers, thereby allowing for combinations of serial and parallel electrical connections as set forth elsewhere herein.

[0098] An embodiment of the invention is illustrated schematically in Figs. 48 and 48A represented as a Pi filter, for the purposes of discussion, suitable for filtering out unwanted electrical interference. A pair of electronic components, 1 and 2, preferably capacitors, are serially connected through an inductor comprising a conductor, 19, with at least one layer of an inductive material, 31 , and an optional electrical insulating material, 10. More preferably the conductor has an inductive material on each side. Interconnects, 12, which can be a portion of an active interposer, provides electrical conductivity to the electronic components. The optional electrically insulating material, which can be an interposer, preferably forms the outer layer of the inductor. In a particularly preferred embodiment the inductive material is a metal flake composite material. Particularly preferred inductive material comprise alloys of at least one of iron, aluminum and silicon preferably in the form of flakes. The inductor can be formed as a sandwich of a conductive foil, or wire lead, forming an electrically connective path within or around the inductive material.

[0099] An embodiment of the inductor is shown in partial cross-sectional view in Fig. 50 wherein the inductive material, 31 , is sandwiched between conductors, 19. Electrical connectivity to the adjacent conductors can be by the use of vias, 12. An alternative embodiment of an inductor is illustrated in partial cross-sectional view in Fig. 51 wherein adjacent layers of inductive material are offset thereby allowing for electrical

conductivity through a conductive material such as a HTCA, 310. The number of layers of inductive material and conductor is not particularly limited and the thickness of each layer of inductive material and conductor may be adjusted to obtain the required inductive performance.

[00100] An alternate embodiment of a pi filter with electromagnetic interference suppressor is illustrated in schematic cross-sectional view in Fig. 49 wherein the inductor comprises offset layers as illustrated in Fig. 51.

[00101] A particular advantage of the instant invention is an improvement in inductance. A high density multi-component stack mounting in a horizontal direction, as in Fig. 10 or Fig. 1 1 , reduces stray inductance as the path length between the electronic component and circuit board is reduced, and therefore so is the Equivalent Series Inductance (ESL). In the case of MLCC an ESL of 0.9 nH in the vertical direction can be achieved compared to 2.9 nH in the horizontal direction. The Equivalent Series Resistance (ESR) can also be lowered which is particularly important since it is directly proportional to the power dissipated when AC voltage is applied. This is particularly advantageous with MLCC because in the horizontal orientation of the electronic components the interior electrodes of the MLCC are vertical which is advantageous for inductance and the resistive length is lowered reducing ESR.

[00102] Each electronic component is preferably independently selected from the group consisting of jumper, wire, capacitor, resistor, varistor, inductor, diode, fuse, overvoltage discharge device, sensor, switch, electrostatic discharge suppressor, electromagnetic interference suppressor, semiconductor and integrated circuit. The diode may be a light emitting diode. More preferably the electronic elements are selected from the group consisting of capacitor, resistor, varistor, inductor, diode, fuse, overvoltage discharge device, sensor, switch, wire, jumper, electromagnetic

interference suppressor or electrostatic discharge suppressor. It is preferred that the capacitor is an MLCC and more preferably at least one of the electronic components is an MLCC.

[00103] A particularly preferred electromagnetic interference suppressor comprises a magnetic powder, preferably a soft magnetic powder which is annealed. Flaked magnetic particles are preferred with alloys comprising at least one of iron, aluminum and silicon being particularly suitable for demonstration of the invention.

[00104] The external terminations of the electronic components are not particularly limited herein with the proviso that they can be attached to a pad, either active or mechanical, by an HTCA or HTIA or by an interconnect such as solder, conductive adhesive, polymer solder, TLPS bond, sintered metal interconnects, diffusion solders or direct copper bonds. TLPS is the preferred interconnect between the external termination of the electronic component and pad. The external termination may be one component of TLPS, as will be more fully described herein, wherein additional components of the TLPS are either inserted between the external termination to be bound or is integral to the surface to which the external termination is to be bound. The TLPS materials are compatible with surface finishes containing silver, tin, gold, copper, platinum, palladium, nickel, or combinations thereof, either as lead frame finishes, component connections or inner electrodes to form an electronically conductive metallurgical bond between two surfaces.

[00105] Transient liquid phase sintering (TLPS) adhesives form a termination to an electronic element or attach external terminations to a surface such as a solder pad or adjacent external termination thereby functioning as an interconnect. TLPS

terminations have the advantage of being able to accommodate different surface finishes as well as electronic elements of differing lengths. Furthermore, since no solder balls are formed electronic elements can be stacked on top of each other with only TLPS there between and without the gaps normally required for cleaning as with solder attachment technology. TLPS can be directly bonded with the inner electrodes of the electronic component, when the electronic element is an MLCC, and the termination can be formed at low temperature. In an embodiment, higher density terminations can be prepared by using a thermo-compression process thereby forming improved external lead attachment bonds.

[00106] Solders are alloys which do not undergo a change in composition after the first reflow. Solders have only one melting point and can be remelted an indefinite number of times. The most common solder is 60%Sn40%Pb. Solders have been the materials of choice in electronics to provide the mechanical and electrical interconnects between electronic elements and circuit boards or substrates. Solders are very well suited for mass volume production assembly processes. The physical properties of solder can be altered simply by changing the ratios or the metals used to create a solder alloy. When solder is referenced herein it will imply an alloy of at least two metals that can be remelted multiple times at nearly the same temperature. [00107] Transient liquid phase sintering (TLPS) bonds are distinguishable from solders. TLPS materials are mixtures of two or more metals or metal alloys prior to exposure to elevated temperatures thereby distinguishing the thermal history of the material. TLPS materials exhibit a low melting point prior to exposure to elevated temperatures, and a higher melting point following exposure to these temperatures. The initial melting point is the result of the low temperature metal or an alloy of two low temperature metals. The second melting temperature is that of the intermetallic formed when the low temperature metal or alloy forms a new alloy with a high temperature melting point metal thereby creating an intermetallic having a higher melting point. TLPS materials form a metallurgical bond between the metal surfaces to be joined. Unlike tin/lead or lead (Pb) free solders, the TLPS adhesives do not spread as they form the intermetallic joint. Rework of the TLPS system is very difficult due to the high secondary reflow temperatures. Transient Liquid Phase Sintering is the terminology given to a process to describe the resulting metallurgical condition when two or more TLPS compatible materials are brought in contact with one another and raised to a

temperature sufficient to melt the low temperature metal. To create a TLPS process or interconnect at least one of those metals is from a family of metals having a low melting point, such as tin (Sn) or indium (In), and the second metal is from a family having high melting points, such as copper (Cu) or silver (Ag). When Sn and Cu are brought together, and the temperature elevated, the Sn and Cu form CuSn intermetallics and the resulting melting point is higher than the melting point of the metal having a low melting point. In the case of In and Ag, when sufficient heat is applied to the In to cause it to melt it actually diffuses into the Ag creating a solid solution which in turn has a higher melting point than the In itself. TLPS will be used to generically reference the process and the TLPS compatible materials used to create a metallurgical bond between two or more TLPS compatible metals. TLPS provides an electrical and mechanical interconnect that can be formed at a relatively low temperature (< 300°C) and having a secondary re-melt temperature >600°C. These temperatures are determined by the different combination of TLPS compatible metals. The rate of diffusion or sintering is a time temperature function and is different for the different combinations of metals. The result is a solid solution having a new melt temperature approaching that of the high temperature melting metal.

[00108] The TLPS technology is particularly suited to providing both a mechanical and electrical conductive metallurgical bond between two mating surfaces preferably that are relatively flat. The metals typically used for the TLPS process are selected from two metal families. One consists of low melting temperature metals such as indium, tin, lead, antimony, bismuth, cadmium, zinc, gallium, tellurium, mercury, thallium, selenium, or polonium and a second family consist of high temperature melting metals such as silver, copper, aluminum, gold, platinum, palladium, beryllium, rhodium, nickel, cobalt, iron and molybdenum to create a diffused solid solution.

[00109] It is highly desirable to use a flux free process to eliminate any potential voids within the joint. Since TLPS is a sintering based process, the bond line is uniform and void free. Fluxes, which are necessary with solders, get entrapped in the joint and are subsequently burned out leaving a void. In the case with the semi-conductor industry, and specifically with die attach processes, these voids can create hot spots within the integrated circuit (l/C) which can lead to premature failure and reliability issues. TLPS addresses this issue since TLPS is a sintering process and free of fluxes. When the two metals are mated together and heat is applied, the lower melting metal diffuses into the higher melting metal to create a solid solution across the mating surface area.

[00110] To create a solid uniform bond line it is mandatory that the mating surfaces be flat and coplanar to insure intimate contact across the entire mating surface. The required flatness of the mating surfaces also limits the application of this technology because there are many surfaces that are not sufficiently planar to yield a good joint. The use of TLPS in paste form allows uneven surfaces to be joined. More specifically, the use of TLPS in paste form allows two irregular shaped surfaces to be joined with no intimate, or continuous, line of contact. A TLPS compatible metal particle core combined with a liquid carrier material to form a paste can be applied between two non- planar non-uniform surfaces having mixed surface preparation technologies such as plating, sintered thick film, and or plated sintered thick film and then heating to the melting temperature of the metal having the lowest melting point and holding that temperature for a sufficient amount of time to form a joint. A single metal particle core eliminates the need for multiple metals in a paste thus making the ratios of metals a non-issue. It is also possible to create a single particle by using silver, a metal having a high melting point of approximately 960°C as a core particle, and then coating that particle with a metal shell having a low temperature metal such as indium having a melting point of 157°C.

[00111] A two-step reflow can also be used with the transient liquid phase sintering process wherein in the first step an electrically conductive metallurgical bond is formed at low temperature using a relatively short time cycle, in the range of 5 seconds to 5 minutes, and low temperature, in the range of 180°C to 280°C, depending on the metals being used in the TLPS alloying process. In the second step the part is subjected to an isothermal aging process using a temperature range of 200°C to 300°C for a longer duration such as, but not limited to, 5 minutes to 60 minutes. The shorter times required to form the initial bond are well suited for an automated process. In another method a single step process can be used wherein the TLPS forms a terminal, or conductive metallurgical bond, between the external leads and electronic element(s) at

temperatures of, for example, 250°C to 325°C for a duration of, for example, 10 seconds to 30 seconds. Lower temperatures, such as 175°C to 210°C, can be used for a longer duration, such as 10 to 30 minutes. This is particularly useful when the electronic component itself is sensitive to temperature.

[00112] Indium powder mixed with a flux and solvent to form a paste can be applied to produce a TLPS metallurgical bond between two coupons having a base metal of copper overplated with Ni and then overplated with about 5 microns (200 μ inches) of silver. The samples can be prepared by dispensing the indium paste onto a coupon having the plated surfaces as mentioned and then placing two coupons in contact with one another and heating to 150°C for 5 seconds, followed by increasing the

temperature to about 320°C for about 60 seconds. The joint strength of the sample thus prepared can exhibit a pull weight in the range of 85-94 pounds equating to shear stress of 4, 177 psi and a pull peel weight in the range of 5-9 pounds with an average of 7 pounds can be achieved. These results are comparable to results for SnPb solders having shear strengths of approximately 3000 psi and pull peel strengths in the 7-10 pound range. One major difference is that the Agin joint can withstand secondary melt temperatures exceeding 600°C. These results indicate that the In paste used to bond two silver plated coupons is at least equivalent if not stronger than current solder SnPb solders but also has a much higher secondary melt temperature thus yielding a material suitable for high temperature interconnect applications and also being lead free. The TLPS paste or preform may have inert fillers therein to serve two purposes. One purpose is to minimize the cost due to expensive metals and the second purpose is to make direct electrical and metallurgical bonds directly to the non-terminated ends of the electronic element and exposed internal electrodes. The cost can be reduced, particularly, when a gap is to be filled by replacing a portion of, particularly, the high melting metal component with an inert material or with a lower cost conductive material. Particularly preferred fillers for use in place of the high melting point metal are non- metals such as ceramics with melting points > 300°C and glasses or high temperature polymers with glass transition temperatures (T_g) > 200°C. An example would be thermosetting polymers such as polyimide. Two particular advantages of replacing the high melting point metal with one of these non-metals is that the active low melting point metal of the TLPS with not be consumed by diffusion during the TLPS bond formation. The second advantage of inert fillers when selected from a family of glasses having low melting points is that the glass within the mixture of the TLPS paste or preform will create a bond with the exposed glass frit of the non-terminated and exposed ceramic body of, for example, an MLCC. The non-metals can also be coated with the low melting point metal by methods such a spraying or plating.

[00113] Sintered metal interconnects of silver as well as nano-silver and nano-copper can also be used to form interconnects. The resulting interconnect can be formed using a low temperature sintering process but the bond formed has the high melting point associated with the metal, in the case of silver 960°C. However, these processes often require elevated pressures for prolonged times in batch operation that can limit throughput compared to CuSn TLPS. Also, nano-sized metals can be prohibitively expensive.

[00114] Diffusion soldering can also be used as a joining method to form the interconnect. This combines features of conventional soldering and diffusion bonding processes. The process relies on reaction between a thin layer of molten solder and metal on the components to form one or more intermetallic phases that are solid at the joining temperature. Since a low melting point material, such as solder, reacts with a higher melting point metal this may also be considered in the broader definition of TLPS.

[00115] Direct copper bonding can also be used but this is a high temperature diffusion process primarily used in die attach so it could be detrimental to some components.

[00116] Methods to adhere an external termination to a solder pad can comprise coating two mating surfaces one with a high melting point metal and its mating surface with a low melting point metal. The coating process may consist of vapor deposition or plating. A second method is to sandwich a preform film made from a low melting point metal or an alloy of two or more low melting point metals between two planar surfaces coated with a high melting point metal. A third method is to create a paste consisting of particles of a high melting point metal such as copper and then adding particles of two alloyed low melting point metals and mixed into a dual purpose liquid that cleans the surfaces to be bonded and serves as the liquid ingredient to the metal particles to form a paste mixture.

[00117] If full diffusion of the two metals is not complete in the stated cycle time and the maximum secondary reflow temperature is not reached, the joint can be subjected to a second heating process. In this case the joint, or assembly, can be subjected to a temperature higher than that of the low melting point material and held for a period of time from 15 minutes up to 2 hours. The time and temperature can be varied to provide a desirable secondary reflow temperature as dictated by secondary assembly

processes or final environmental application requirements. In the case of the

indium/silver TLPS, secondary melt temperatures in excess of 600°C can be achieved.

[00118] In addition to applying a paste to form a TLPS alloy joint between suitable surfaces this can also be achieved with a preform. In its simplest manifestation the preform can be a thin foil of the low temperature TLPS component. Alternatively, the preform can be produced by casting and drying the paste to remove the solvent. The resulting solid preform can be placed between the surfaces to be bonded. In this case it may be necessary to add a suitable binder to the paste for additional strength after drying. In all these cases the preform should be malleable such that it can conform to the surfaces to be bonded.

[00119] In many applications a high degree of porosity may be acceptable. However, in harsh environments, such a high humidity or in circuit board mounting processes, high porosity is not desirable since water or other chemicals may penetrate through the bond which may cause the bond to fail. A preferred embodiment of this invention is therefore to form a low porosity termination within the transient liquid phase sintering joint using a thermo-compression bonding process. This process has the added advantage of using a low process time of 15 to 30 seconds at a temperature in the range of 225°C to 300°C in a single step making it suitable for automation. Robust joints can be created for the application of attaching external leads to electronic elements, when leads are used, with a one-step low temperature in less than 30 seconds and in combination with thermo-compression bonding.

[00120] Thermo compression bonding is also a preferred processing method when using polymer solder because it assists in the formation of a high density metallurgical bond between the contacting surfaces. The advantages of thermo-compression include a more robust bond with respect to secondary attachment processes and attachments with higher strength are achieved. A compressive force of 0.5 to 4.5 Kilograms/cm² (7.1 to 64 psi) and more preferably 0.6 to 0.8 Kilograms/cm 2 (8.5 to 1 1 psi) is sufficient for demonstration of the thermo-compression teachings herein. About 0.63

Kilograms/cm2 (9 psi) is a particularly suitable pressure for demonstration of the teachings.

[00121] It is highly desirable to create a joint with minimum porosity that exhibits the following characteristics: strong mechanical strength for Pull Peel test, Tensile, and Shear high electrical conductivity, low initial process temperature in the range of 150°C to 225°C, a secondary reflow temperature in excess of 300°C or higher, between nonuniform surfaces making intimate contact or having gaps up to .015 inches.

[00122] An HTCA can be an interconnect comprising a single metal, such as indium, contained within a paste which can be used to form a bond to a surface coated with a high melting point metal, such as silver. The diffusion of the indium into silver allows a lower temperature transient liquid phase to form that subsequently reacts to achieve a higher temperature bond. Achieving a high rate of diffusion in the lower melting point paste is critical to this bond formation. In order to achieve the desired properties in the final joint, such as reduced voids and a homogeneous phase the addition of other metals to the paste may be desirable. However, it is critical to retain the high diffusivity of the low melting point material. For this reason if one or more metals are required in addition to the low melting point metal it is preferred that these be incorporated by coating the metal powders prior to forming the paste. Coating the lowest melting point metal onto the higher melting point metal is preferred to retain an active surface.

Coatings also have the desired effect of reducing the diffusion lengths between the different metallic elements of the paste allowing preferred phases to be more readily formed as opposed to a simple mixing of one or more additional metal powders to the single metal paste.

[00123] Conductive adhesives as HTCA's are typically cross linking polymers filled with silver or gold particles that cure or cross link within a specified temperature range, generally 150°C, to form a mechanical bond to the materials to be joined. Their conductivity is created by the metal particles making intimate contact with one another, within the confines of the polymer matrix, to form an electrically conductive path from one particle to another. Because the binder is organic in nature, they have relatively low temperature capabilities, normally in the range of about 150°C to about 300°C.

Conductive epoxies, once cured, cannot be reworked. Unlike TLPS bonds, exposure to high heat or corrosive environments may decompose the polymeric bonds and oxidize the metal particles degrading the electrical properties. Both the electrical and mechanical performance of the interconnect can be compromised resulting in increased ESR and decreased mechanical strength.

[00124] Polymer solders HTCA's may comprise conventional solder systems based on Pb/Sn alloy systems or lead free systems, such as Sn/Sb, which are combined with crosslinking polymers which serve as cleaning agents. The cross-linked polymers also have the ability to form a cross-linked polymer bond, such as an epoxy bond, that forms during the melting phase of the metals thereby forming a solder alloy and a mechanical polymeric bond. An advantage of polymer solders is that the polymeric bond provides additional mechanical bond strength at temperatures above the melting point of the solder, thus giving the solder joint a higher operating temperature in the range of about 5 to 80°C above the melting point of the solder. Polymer solders combine current solder alloys with a cross linking polymer within the same paste to provide both a metallurgical bond and a mechanical bond when cured, such as by heating, to provide additional solder joint strength at elevated temperatures. However, the upper temperature limits and joint strength has been increased, just by the physical properties of the materials. A practical limit of 300°C remains whereas the bonds created by TLPS can achieve higher temperatures.

[00125] High temperature insulating adhesives can be a thermal or moisture set adhesives, UV cure adhesives or pressure sensitive adhesives. Particularly preferred high temperature insulating adhesives include epoxy resins, phenolic formaldehyde resins, phenolic melamine formaldehyde resins, phenolic neoprene, resorcinol formaldehydes, polyesters, polyimides, cyanoacrylates, acrylics, styrene block copolymers, styrene butadiene copolymers, polyurethanes, polyarylenes, polysulfides, polyamides, silicones and waxes etc. The HTIA may be selected to form a bond at the same time as the HTCA or in some circumstances, it may be preferable to provide a separate bonding process. The HTIA bonding processes may be achieved by pressure, heating, UV curing, moisture curing or hot melt deposition. Additionally, the HTIA may contain inert fillers of sufficient size and dielectric properties to ensure minimal dielectric spacing between adjacent components as required by the circuit / stack design and service conditions.

[00126] The material of construction for the interposer is not particularly limited herein with standard printed circuit board (PCB) materials being suitable for use. Laminates, fiber reinforced resins, ceramic filled resins, specialty materials and flexible substrates are particularly suitable. Flame Retardant (FR) laminates are particularly suitable as an interposer material and especially FR-1 , FR-2, FR-3, FR-4, FR-5 or FR-6. FR-2 is a phenolic paper, phenolic cotton paper or paper impregnated with phenol formaldehyde resin. FR-4 is particularly preferred which is a woven fiberglass cloth impregnated with epoxy resin. Composite epoxy materials (CEM) are suitable and particularly CEM-1 , CEM-2, CEM-3, CEM-4 or CEM-5 each of which comprise reinforcement such as a cotton paper, non-woven glass or woven glass in epoxy. Glass substrates (G) are widely used such as G-5, G-7, G-9, G-10, G-11 and others with G-10 and G-1 1 being most preferred each of which is a woven glass in epoxy. Polytetrafluoroethylene

(PTFE), which can be ceramic filled, or fiberglass reinforced such as in RF-35, is a particularly suitable substrate. Electronic grade ceramic materials such as polyether ether ketone (PEEK), alumina or yttria stabilized zirconia are available with 96% AI2O3 and 99.6% AI2O3 being readily available commercially. BismaSeimide-Triazine (BT) epoxy is a particularly suitable substrate material Flexible substrates are typically a poiyimide such as a polyimide foil available commercially as Kapton or UPILEX or a polyimide-fluoropolymer composite commercially available as Pyralux. Ferrous alloys are also used such as Alloy 42, Invar, Kovar or non-ferrous materials such as Cu, Phosphor Bronze or BeCu.

[00127] The package, or portions of the package, can be over-molded by a non- conductive polymer or resin. The material used for overmolding is not particularly limited herein. Overmolding can be done to isolate the package, or components therein, from electrical interaction with other elements of a circuit or to protect the package, or components therein, from environmental variations. Overmolding can also be beneficial for labeling and for use with pick-and-place equipment since the over- molding can be applied with specific geometry identifiable by optical or mechanical equipment. Additionally, the package can be mechanically encapsulated in a case, shell or other assembly for use as a plug in electrical circuit or assembly utilizing commercially available electrical connections attached to the package via extant assembly methodologies.

[00128] The invention has been described with reference to the preferred

embodiments without limit thereto. Additional embodiments and improvements may be realized which are not specifically set forth herein but which are within the scope of the invention as more specifically set forth in the claims appended hereto.

Claims

Claimed is:

1 . A high density multi-component package comprising:

at least two electronic components wherein each electronic component of said electronic components comprises a first external termination and a second external termination;

at least one electrical connection between adjacent first external terminations of adjacent electronic components;

at least one mechanical connection between said adjacent electronic

components; and

wherein said at least two adjacent electronic components are connected serially.

2. The high density multi-component package of claim 1 wherein said electrical connection comprises a first adhesive and said mechanical connection comprises a second adhesive.

3. The high density multi-component package of claim 2 wherein said first adhesive and said second adhesive are independently selected from a high temperature conductive adhesive and a high temperature insulating adhesive.

4. The high density multi-component package of claim 3 wherein said second

adhesive is said high temperature insulating adhesive and said second adhesive is between adjacent second external terminations.

5. The high density multi-component package of claim 2 wherein said high

temperature insulating adhesive is selected from epoxy resins, phenolic formaldehyde resins, phenolic melamine formaldehyde resins, phenolic neoprene, resorcinol formaldehydes, polyesters, polyimides, cyanoacrylates, acrylics, styrene block copolymers, styrene butadiene copolymers, polyarylenes, polyurethanes, polysulfides, polyamides, silicones and waxes.

6. The high density multi-component package of claim 1 further comprising at least one interposer between adjacent electronic components and said adjacent electronic components are attached to said interposer by an interconnect wherein said interposer is selected from an active interposer and a mechanical interposer.

7. The high density multi-component package of claim 6 wherein said active

interposer comprises active pads and mechanical pads and wherein an external termination of each said adjacent electronic component is electrically connected by said active pads.

8. The high density multi-component package of claim 6 wherein said active

interposer comprises mechanical pads on opposite faces wherein an external termination of each said adjacent electronic component is independently mechanically connected to a mechanical pad of said mechanical pads.

9. The high density multi-component package of claim 6 wherein said mechanical interposer comprises mechanical pads on opposite faces wherein an external termination of each said adjacent electronic component is independently mechanically connected to a mechanical pad of said mechanical pads.

10. The high density multi-component package of claim 6 comprising multiple

interposers.

1 1 . The high density multi-component package of claim 10 wherein each interposer of said multiple interposers is an active interposer.

12. The high density multi-component package of claim 10 wherein each interposer of said multiple interposers is a mechanical interposer.

13. The high density multi-component package of claim 10 comprising at least one said active interposer and at least one said mechanical interposer.

14. The high density multi-component package of claim 6 wherein said interconnect is selected from the group consisting of solder, conductive adhesive, polymer solder and transient liquid phase sintering adhesive.

15. The high density multi-component package of claim 14 wherein said transient liquid phase sintering adhesive comprises a high melting point metal and a low melting point metal.

16. The high density multi-component package of claim 15 wherein said low melting point metal is selected from the group consisting of indium, tin, lead, antimony, bismuth, cadmium, zinc, gallium, tellurium, mercury, thallium, selenium, or polonium.

17. The high density multi-component package of claim 15 wherein said high melting point metal is selected from the group consisting of silver, copper, aluminum, gold, platinum, palladium, beryllium, rhodium, nickel, cobalt, iron and

molybdenum.

18. The high density multi-component package of claim 15 wherein said transient liquid phase sintering adhesive comprises tin and copper or indium and silver.

19. The high density multi-component package of claim 6 wherein said interposer comprises at least three pads.

20. The high density multi-component package of claim 1 wherein at least one said external termination comprises a metal selected from the group consisting of silver, tin, gold, copper, platinum, palladium and nickel.

21 . The high density multi-component package of claim 1 further comprising a

spacer between adjacent second external terminations.

22. The high density multi-component package of claim 21 wherein said spacer is selected from an air gap and a non-conducting material.

23. The high density multi-component package of claim 1 further comprising a

secondary adhesive.

24. The high density multi-component package of claim 1 wherein each said

electronic component is independently selected from the group consisting of jumper, wire, capacitor, resistor, varistor, inductor, diode, fuse, overvoltage discharge device, sensor, switch, electrostatic discharge suppressor,

electromagnetic interference suppressor, semiconductor and integrated circuit.

25. The high density multi-component package of claim 24 wherein said capacitor is an MLCC.

26. The high density multi-component package of claim 24 wherein said electronic component is selected from the group consisting of MLCC, resistor, varistor, inductor, diode, fuse, overvoltage discharge device, electromagnetic interference suppressor, sensor, switch and electrostatic discharge suppressor.

27. The high density multi-component package of claim 26 wherein at least one said electronic component is an MLCC.

28. The high density multi-component package of claim 26 wherein said diode is a light emitting diode.

29. The high density multi-component package of claim 1 wherein all electronic

components are serially connected.

30. The high density multi-component package of claim 1 wherein at least two

additional electronic components are electrically connected in parallel.

31 . The high density multi-component package of claim 1 wherein at least one

component of said components is directly attached to an adjacent component by an interconnect.

32. The high density multi-component package of claim 31 wherein said interconnect is conductive.

33. The high density multi-component package of claim 1 wherein said electronic components form at least one stack.

34. The high density multi-component package of claim 33 further comprising a

secondary electrical component.

35. The high density multi-component package of claim 34 comprising at least two stacks wherein said secondary electrical component spans said stacks.

36. The high density multi-component package of claim 34 wherein said secondary electrical component is in electrical parallel with at least two said electronic components.

37. The high density multi-component package of claim 36 wherein said secondary electrical component is selected from a secondary active interposer a secondary mechanical interposer.

38. The high density multi-component package of claim 1 selected from the group consisting of a Pi filter, a T filter and an LC filter.

39. The high density multi-component package of claim 1 comprising at least three terminals.

40. The high density multi-component package of claim 1 further comprising a substrate.

41 . The high density multi-component package of claim 40 wherein said substrate comprises at least two circuit traces.

42. The high density multi-component package of claim 41 wherein said substrate comprises at least three circuit traces.

43. The high density multi-component package of claim 1 wherein said electronic components form at least two stacks.

44. The high density multi-component package of claim 43 further comprising an interstack interposer.

45. The high density multi-component package of claim 44 wherein said interstack interposer is an active interposer.

46. The high density multi-component package of claim 43 further wherein at least one said interposer is an intrastack interposer.

47. The high density multi-component package of claim 1 further comprising a flexible circuit.

48. The high density multi-component package of claim 1 further comprising

overmolding.

49. The high density multi-component package of claim 1 wherein said interposer is a functional interposer.

50. The high density multi-component package of claim 1 wherein at least one said external termination comprises a metal selected from the group consisting of silver, tin, gold, copper, platinum, palladium and nickel.

51 . An electronic circuit comprising:

a high density multi-component package of claim 1 ;

and

a circuit board comprising traces wherein at least one trace of said traces is an active trace and at least one trace of said traces is a mechanical pad; wherein at least one first external termination of a first electronic component of said electronic components is in electrical contact with one said active trace;

wherein at least one second external termination of a second electronic

component of said electronic components is in electrical contact with a mechanical pad.

52. The electronic circuit of claim 51 wherein said high density multi-component package is mounted vertically on said circuit board.

53. The electronic circuit of claim 52 further comprising a connector between one said external termination and one said active trace.

54. The electronic circuit of claim 53 wherein said connector is selected from the group consisting of an electrical connection and a functional connection.

55. The electronic circuit of claim 54 wherein said connector is an additional electronic component.

56. The electronic circuit of claim 51 wherein said high density multi-component package is mounted horizontally on said circuit board.

57. The electronic circuit of claim 56 further comprising at least one trace electrically connecting adjacent external terminations.

58. The electronic circuit of claim 51 wherein at least three terminals are in electrical contact with a trace of said circuit board.

59. The electronic circuit of claim 51 wherein said interposer comprises at least three pads.

60. A method for forming a high density multi-component package comprising:

providing at least two electronic components wherein each electronic component of said electronic components comprises a first external termination and a second external termination;

forming a stack of said electronic components;

forming at least one electrical connection between adjacent first external

terminations of adjacent electronic components;

forming at least one mechanical connection between said adjacent electronic components; and

wherein said adjacent electronic components are connected serially.

61 . The method for forming a high density multi-component package of claim 60 wherein said electrical connection comprises a first adhesive and said

mechanical connection comprises a second adhesive.

62. The method for forming a high density multi-component package of claim 61 wherein said first adhesive and said second adhesive are independently selected from a high temperature conductive adhesive and a high temperature insulating adhesive.

63. The method for forming a high density multi-component package of claim 61 wherein said second adhesive is said high temperature insulating adhesive and said second adhesive is between adjacent second external terminations.

64. The method for forming a high density multi-component package of claim 61 wherein said high temperature insulating adhesive is selected from epoxy resins, phenolic formaldehyde resins, phenolic melamine formaldehyde resins, phenolic neoprene, resorcinol formaldehydes, polyesters, polyimides, cyanoacrylates, acrylics, styrene block copolymers, styrene butadiene copolymers, polyarylenes, polyurethanes, polysulfides, polyamides, silicones and waxes.

65. The method for forming a high density multi-component package of claim 60 further comprising:

attaching at least one interposer between adjacent electronic components

wherein said interposer is selected from an active interposer and a mechanical interposer; and

attaching said first external terminations to first traces on said interposer and said second external terminations to second traces on said interposer with an interconnect.

66. The method for forming a high density multi-component package of claim 65 wherein said active interposer comprises active pads and mechanical pads and wherein an external termination of each said adjacent electronic component is electrically connected by said active pads.

67. The method for forming a high density multi-component package of claim 65 further comprising forming a conductive via during said attaching.

68. The method for forming a high density multi-component package of claim 65 wherein said interposer comprises a void comprising a sintered metal paste, conductive adhesive or TLPS.

69. The method for forming a high density multi-component package of claim 65 wherein said interposer comprises a void wherein said attaching comprises incorporating sintered metal paste, conductive adhesive or TLPS in said void to form a conductive via.

70. The method for forming a high density multi-component package of claim 65 wherein said active interposer comprises mechanical pads on opposite faces wherein an external termination of each said adjacent electronic component is independently mechanically connected to a mechanical pad of said mechanical pads.

71 . The method for forming a high density multi-component package of claim 65 wherein said mechanical interposer comprises mechanical pads on opposite faces wherein an external termination of each said adjacent electronic

component is independently mechanically connected to a mechanical pad of said mechanical pads.

72. The method for forming a high density multi-component package of claim 60 comprising multiple interposers.

73. The method for forming a high density multi-component package of claim 72 wherein each interposer of said multiple interposers is an active interposer.

74. The method for forming a high density multi-component package of claim 72 wherein each interposer of said multiple interposers is a mechanical interposer.

75. The method for forming a high density multi-component package of claim 72 comprising at least one said active interposer and at least one said mechanical interposer.

76. The method for forming a high density multi-component package of claim 65 wherein said interconnect is selected from the group consisting of solder, conductive adhesive, polymer solder and transient liquid phase sintering adhesive.

77. The method for forming a high density multi-component package of claim 76 wherein said transient liquid phase sintering adhesive comprises a high melting point metal and a low melting point metal.

78. The method for forming a high density multi-component package of claim 77 wherein said low melting point metal is selected from the group consisting of indium, tin, lead, antimony, bismuth, cadmium, zinc, gallium, tellurium, mercury, thallium, selenium, or polonium.

79. The method for forming a high density multi-component package of claim 77 wherein said high melting point metal is selected from the group consisting of silver, copper, aluminum, gold, platinum, palladium, beryllium, rhodium, nickel, cobalt, iron and molybdenum.

80. The method for forming a high density multi-component package of claim 77 wherein said transient liquid phase sintering adhesive comprises tin and copper or indium and silver.

81 . The method for forming a high density multi-component package of claim 65 wherein said interposer comprises at least three pads.

82. The method for forming a high density multi-component package of claim 60 further comprising a spacer between adjacent second external terminations.

83. The method for forming a high density multi-component package of claim 82 wherein said spacer is selected from an air gap and a non-conducting material.

84. The method for forming a high density multi-component package of claim 60 further comprising a secondary adhesive.

85. The method for forming a high density multi-component package of claim 60 wherein each said electronic component is independently selected from the group consisting of jumper, wire, capacitor, resistor, varistor, inductor, diode, fuse, overvoltage discharge device, sensor, switch, electrostatic discharge suppressor, electromagnetic interference suppressor, semiconductor and integrated circuit.

86. The method for forming a high density multi-component package of claim 85 wherein said capacitor an MLCC.

87. The method for forming a high density multi-component package of claim 86 wherein said electronic component is selected from the group consisting of jumper, wire, MLCC, resistor, varistor, inductor, diode, fuse, overvoltage discharge device, sensor, switch electromagnetic interference suppressor, and electrostatic discharge suppressor.

88. The method for forming a high density multi-component package of claim 87 wherein at least one said electronic component is an MLCC.

89. The method for forming a high density multi-component package of claim 87 wherein said diode is a light emitting diode.

90. The method for forming a high density multi-component package of claim 65 wherein all electronic components are serially connected.

91 . The method for forming a high density multi-component package of claim 65 wherein at least two additional electronic components are electrically connected in parallel.

92. The method for forming a high density multi-component package of claim 65 wherein at least one component of said components is directly attached to an adjacent component by an interconnect.

93. The method for forming a high density multi-component package of claim 92 wherein said interconnect is conductive.

94. The method for forming a high density multi-component package of claim 65 wherein said electronic components form at least one stack.

95. The method for forming a high density multi-component package of claim 94 further comprising a secondary electrical component.

96. The method for forming a high density multi-component package of claim 95 comprising at least two stacks wherein said secondary electrical component spans said stacks.

97. The method for forming a high density multi-component package of claim 96 wherein said secondary electrical component is selected from a secondary active interposer a secondary mechanical interposer.

98. The method for forming a high density multi-component package of claim 95 wherein said secondary electrical component is in electrical parallel with at least two said electronic components.

99. The method for forming a high density multi-component package of claim 60 wherein at least one said external termination comprises a metal selected from the group consisting of silver, tin, gold, copper, platinum, palladium and nickel.

100. The method for forming a high density multi-component package of claim 60 wherein said high density multi-component package is selected from the group consisting of a Pi filter, a T filter and an LC filter.

101 . The method for forming a high density multi-component package of claim 60 further comprising a substrate.

102. The method for forming a high density multi-component package of claim 101 wherein said substrate comprises at least two circuit traces.

103. The method for forming a high density multi-component package of claim 102 wherein said substrate comprises at least three circuit traces.

104. The method for forming a high density multi-component package of claim 60 wherein said electronic components form at least two stacks.

105. The method for forming a high density multi-component package of claim 104 further comprising an interstack interposer.

106. The method for forming a high density multi-component package of claim 105 wherein said interstack interposer is an active interposer.

107. The method for forming a high density multi-component package of claim 104 further wherein at least one said interposer is an intrastack interposer.

108. The method for forming a high density multi-component package of claim 60 further comprising a flexible circuit.

109. The method for forming a high density multi-component package of claim 60 further comprising overmolding.

1 10. The method for forming a high density multi-component package of claim 60 wherein said interposer is a functional interposer.