EP3642600A1 - Device for luminescent imaging - Google Patents
Device for luminescent imagingInfo
- Publication number
- EP3642600A1 EP3642600A1 EP19819682.6A EP19819682A EP3642600A1 EP 3642600 A1 EP3642600 A1 EP 3642600A1 EP 19819682 A EP19819682 A EP 19819682A EP 3642600 A1 EP3642600 A1 EP 3642600A1
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- European Patent Office
- Prior art keywords
- feature
- features
- photons
- time
- formation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
- G01N21/6454—Individual samples arranged in a regular 2D-array, e.g. multiwell plates using an integrated detector array
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/76—Chemiluminescence; Bioluminescence
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/1336—Illuminating devices
- G02F1/133614—Illuminating devices using photoluminescence, e.g. phosphors illuminated by UV or blue light
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
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- C—CHEMISTRY; METALLURGY
- C12—BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
- C12Q—MEASURING OR TESTING PROCESSES INVOLVING ENZYMES, NUCLEIC ACIDS OR MICROORGANISMS; COMPOSITIONS OR TEST PAPERS THEREFOR; PROCESSES OF PREPARING SUCH COMPOSITIONS; CONDITION-RESPONSIVE CONTROL IN MICROBIOLOGICAL OR ENZYMOLOGICAL PROCESSES
- C12Q1/00—Measuring or testing processes involving enzymes, nucleic acids or microorganisms; Compositions therefor; Processes of preparing such compositions
- C12Q1/68—Measuring or testing processes involving enzymes, nucleic acids or microorganisms; Compositions therefor; Processes of preparing such compositions involving nucleic acids
- C12Q1/6869—Methods for sequencing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
- G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
- G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
- G01N2021/6441—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks with two or more labels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
- G01N2021/6471—Special filters, filter wheel
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0635—Structured illumination, e.g. with grating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/067—Electro-optic, magneto-optic, acousto-optic elements
- G01N2201/0675—SLM
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
Definitions
- SBS sequencing by synthesis
- Sequencing can involve using luminescent imaging, such as a fluorescent microscopy system, to identify nucleotides or localized clusters of identical nucleotides by emission wavelength of their respective fluorescent markers.
- luminescent imaging such as a fluorescent microscopy system
- SBS chemistries under development may use a single dye, multiple fluorescent dyes (up to four) are generally used in commercial systems so as to uniquely identify the nucleotides in a polynucleotide, such as A, G, C, and T nucleotides in DNA.
- a device comprises a plurality of imaging pixels arranged in a spatial pattern; a formation of features disposed over the plurality of imaging pixels; a first feature of the formation of features, the first feature disposed over a first pixel of the plurality of imaging pixels, a second feature of the formation of features, the second feature disposed over the first pixel and spatially displaced from the first feature; a first luminophore disposed within or over the first feature; a second luminophore disposed within or over the second feature; and a structured illumination source to direct at least a portion of first photons in an illumination pattern to the first feature at a first time, and to direct at least a portion of second photons in the illumination pattern to the second feature at a second time, the second time being different from the first time, the first pixel to selectively receive luminescence emitted by the first luminophore responsive to the portion of the first photons at the first time, and to selectively receive luminescence emitted
- the structured illumination source includes an illumination pattern generator having an illumination pattern generator actuator connected to the illumination pattern generator to cause the illumination pattern to translate or rotate relative to the formation of features.
- illumination intensity maxima with a periodicity corresponding to a pixel spacing in the spatial pattern of the plurality of imaging pixels generator.
- a device comprises: a plurality of imaging pixels arranged in a spatial pattern; a formation of features disposed over the plurality of imaging pixels; an illumination pattern generator; a first feature of the formation of features, the first feature being disposed over a first pixel of the plurality of imaging pixels; and a second feature of the formation of features, the second feature disposed over the first pixel and spatially displaced from the first feature; wherein the
- Fig. 15B is an intensity distribution of a representative dotted pattern of light on the formation of features of the example of the device depicted in Fig. 15A according to the present disclosure
- nucleotide or “nucleic acid” also is intended to encompass any nucleotide analogue which is a type of nucleotide that includes a modified nucleobase, sugar and/or phosphate moiety.
- Single stranded DNA can be converted to dsDNA and vice-versa.
- the precise sequence of nucleotides in a polynucleotide can be known or unknown.
- chemically coupled is intended to mean an attachment between a first member and a second member. In some examples, such an
- an attachment can be formed by hybridizing a first polynucleotide to a second polynucleotide that inhibits detachment of the first polynucleotide from the second polynucleotide.
- an attachment can be formed using physical or biological interactions, e.g., an interaction between a first protein and a second protein that inhibits detachment of the first protein from the second protein.
- sequencing devices can be limited by the size of imaging pixels. For example, relatively large pixel sizes can be useful for providing sufficient signal collection from individual DNA molecules or clusters of identical molecules. Although pixels can be made smaller so as to increase throughput, such size reduction can reduce full well capacity and can increase cross-talk between pixels, thereby reducing the signal-to- noise ratio (SNR) of the imaging, and the sequencing. Such an approach also can increase the cost of fabricating the imaging matrix, e.g., by increasing the amount of engineering of the imaging matrix as well as the integration of such imaging matrix with microfluidic components.
- SNR signal-to- noise ratio
- the present multi-site per pixel configuration can significantly increase the number of sites that can be imaged using a given plurality of imaging pixels. Flowever, if all of the sites disposed over a given imaging pixel were to be excited simultaneously with one another, the imaging pixel would receive luminescence from each such site simultaneously with one another, thus impeding the ability to distinguish between luminescence from one such site and luminescence from another such site based on an electrical signal that the pixel generates responsive to receiving such
- a structured illumination source such as disclosed herein can be used so as selectively to excite a single one of the multiple sites disposed over a given imaging pixel at a given time, so as to obtain an electrical signal from that pixel responsive to luminescence just from that site at that time, and subsequently to excite a second one of the multiple sites over that imaging pixel at a second time, so as to obtain a second electrical signal from that pixel responsive to luminescence from that second site.
- the luminescence from the two sites can be distinguished from one another based on the electrical signals obtained from the imaging pixel at the two times.
- examples of the devices and methods of the present disclosure can provide luminescent imaging of a greater number of sites than the number of pixels in a plurality of imaging pixels, e.g., an integer multiple n of the number of pixels, where n is greater than or equal to 2, or 3, or 4, or 5, or greater than 5.
- the different sites disposed over an imaging pixel can be selectively excited by selectively directing excitation photons to respective ones of the sites at different times than one another.
- the sites can be irradiated at a first time with any suitable number of laser beams that interfere with one another in such a manner as to generate a first optical intensity pattern that selectively excites one of the sites per imaging pixel at the first time, and can be irradiated at a second time with any suitable number of laser beams that interfere with one another in such a manner as to generate a second optical intensity pattern that selectively excites another one of the sites per imaging pixel at the second time.
- the pixel can generate respective electrical signals at the first and second times responsive to luminescence from the respective sites.
- the stacked layer 81 may represent a plurality of layers, for example, silicon layer(s), dielectric layer(s), metal layer(s), etc.
- the stacked layers may make up device circuitry, which includes detection circuitry.
- the stacked layers 81 may include optical components such as optical waveguide(s), filter(s), etc.
- a site 25 (see, e.g., Fig. 2A) including one or more luminophores 40, e.g., one or more analytes respectively coupled to luminophores 40, e.g., one or more nucleotides respectively coupled to luminophores 40, can be disposed within each nanowell.
- the luminophore(s) 40 can be disposed in the nanowell and excited evanescently by the excitation wavelengths, e.g., photons having suitable wavelengths (illustrated as first photons 61 and second photons 62 in Fig. 1A).
- the arrow representing second photons 62 is shown in phantom line in Fig. 1A because the first photons 61 and the second photons 62 are emitted at different times.
- the imaging pixel 20 can be suitably electronically coupled to a detection circuit (not specifically illustrated), which can be configured so as to receive and analyze an electrical signal generated by the imaging pixel 20 responsive to
- the imaging pixel 20 in Fig. 1A may have a dimension of 1.75 pm on each side; however it should be appreciated that imaging pixels 20 of any suitable dimensions can be used.
- a plurality of any suitable number of such portions 12 of the device 10 can be provided, arranged in a spatial pattern.
- Fig. 1 B schematically illustrates a perspective view of an example of a formation 28 of features 30 disposed over a plurality 18 (see Fig. 1 C) of the imaging pixels 20 arranged in a spatial pattern 22.
- the spatial pattern 22 is a matrix having 3 rows and 3 columns in an X-Y plane.
- a plurality of features 30 corresponds to each imaging pixel 20.
- a first feature 31 of the formation 28 of features 30 is disposed over a first pixel 21 of the plurality of imaging pixels 20.
- a formation 28 of features 30, e.g., a plurality of nanowells spatially arranged in a pattern that is repeated, can be disposed over each imaging pixel 20.
- each imaging pixel 20 can receive luminescence from luminophore(s) 40 disposed within the nanowells over that imaging pixel 20, and generate a suitable electronic signal responsive to receipt of such luminescence.
- a formation 28 of features 30 is disposed over the plurality 18 of imaging pixels 20.
- a first feature 31 of the formation 28 of features 30 is disposed over a first pixel 21 of the plurality 18 of imaging pixels 20.
- a second feature 32 of the formation 28 of features 30 is disposed over the first pixel 21 and spatially displaced from the first feature 31. In an example, the second feature 32 is laterally displaced from the first feature 31.
- a first luminophore 41 is disposed within or over the first feature 31.
- the first luminophore 41 may be disposed within the first feature 31 (nanowell); if the first feature 31 is a post, the first luminophore 41 may be disposed over the first feature 31 (post).
- a second luminophore 42 is disposed within or over the second feature 32.
- a structured illumination source 50 is to direct at least a portion of first photons 61 in an illumination pattern to the first feature 31 at a first time. The first time is schematically indicated in Fig. 2A by watch face 65.
- the structured illumination source 50 is to direct at least a portion of second photons 62 in the illumination pattern to the second feature 32 at a second time, the second time being different from the first time.
- the second time is indicated by watch face 65’.
- the first pixel 21 is to selectively receive luminescence 71 emitted by the first luminophore 41 responsive to the first photons 61 at the first time (Fig. 2A), and to selectively receive luminescence 72 emitted by the second luminophore 42 responsive to the second photons 62 at the second time (Fig. 2B).
- the structured illumination source 50 includes an illumination pattern generator 52 having an illumination pattern generator actuator connected to the illumination pattern generator 52 to cause the illumination pattern to translate or rotate relative to the formation 28 of features 30.
- the illumination pattern generator actuator may be any actuator that is connected to the illumination pattern generator 52 to cause the illumination pattern to translate or rotate relative to the formation 28 of features 30. It is to be understood that the illumination pattern generator actuator moves the illumination pattern at the same time, by the action of the illumination pattern generator actuator.
- the illumination pattern generator actuator may be a mask layer actuator 55 to actuate a mask layer 53.
- an interference pattern generator actuator 95 connected to an interference pattern generator 93 to change a positional state of the interference pattern generator 93 to cause the interference pattern to translate or rotate relative to the formation 28 of features 30.
- a controller 47 is coupled to an optical component 46 to control the optical component 46 so as to translate or rotate the illumination pattern.
- the controller 47 i.e.
- an actuator may rotate a mirror (i.e. , an optical component) to move an entire illumination pattern to illuminate all of the features 30 that have a position relative to the individual pixels that corresponds to the first feature 31 at a first time, and a second feature 32 at a second time.
- a mirror i.e. , an optical component
- the quantity of features 30 can be increased as an integer multiple n > 1 of the quantity of imaging pixels 20 by selectively exciting different ones of such features 30 at different times than one another.
- Fig. 1 B schematically illustrates a perspective view of an example of a formation 28 of features 30 such as provided herein, wherein multiple features 30 correspond to each imaging pixel 20.
- the formation 28 of features 30 has the features 30 repeating in the same spatial pattern 22 in which the plurality 18 of imaging pixels 20 is arranged.
- Fig. 1 B schematically illustrates a perspective view of an example of a formation 28 of features 30 such as provided herein, wherein multiple features 30 correspond to each imaging pixel 20.
- the formation 28 of features 30 has the features 30 repeating in the same spatial pattern 22 in which the plurality 18 of imaging pixels 20 is arranged.
- first feature 31 second feature 32, third feature 33, and fourth feature 34
- first feature 31 second feature 32, third feature 33, and fourth feature 34
- second feature 32 third feature 33
- fourth feature 34 fourth feature 34
- any suitable number of features 30 can be provided per pixel, e.g., two or more features per pixel, three or more features per pixel, four or more features per pixel, or five or more features per pixel.
- Such features can be provided using any suitable geometric characteristics.
- a plurality of features 30, such as a plurality of nanowells, can be defined in the feature layer 82 (see Fig. 1A).
- each imaging pixel 20 can receive luminescence at different times from luminophore(s) 40 disposed within or over each such feature 30, e.g., within each such nanowell, over that imaging pixel 20, and generate a suitable electronic signal responsive to receipt of such
- the imaging pixel 20, the stacked layer 81 , and the features 30 optionally can be monolithically integrated with one another.
- the formation 28 of features 30 can include a plurality of wells; the first feature 31 can include a first well within which the first luminophore is disposed, and the second feature 32 can include a second well within which the second luminophore is disposed, e.g., in a manner similar to that illustrated in Fig. 2A.
- the formation 28 of features 30 can include a plurality of posts; the first feature 31 can include a first post upon which the first luminophore is disposed, and the second feature 32 can include a second post upon which the second luminophore is disposed.
- the first and second features each can have a substantially circular cross-section.
- Fig. 3A and Fig. 3B are block diagrams depicting an example of a structured illumination source 50 as disclosed herein.
- the structured illumination source 50 may include an illumination pattern generator 52.
- the structured illumination source 50 may be to flood illuminate the illumination pattern generator 52 with the first photons 61 (Fig. 3A) and the second photons 62 (Fig. 3B).
- the term “flood illuminate” means that the illumination is provided to a surface all at once rather than scanning a narrow beam over portions of the surface.
- the illumination source 50 may include an illumination pattern generator 52.
- the structured illumination source 50 may be to flood illuminate the illumination pattern generator 52 with the first photons 61 (Fig. 3A) and the second photons 62 (Fig. 3B).
- the term “flood illuminate” means that the illumination is provided to a surface all at once rather than scanning a narrow beam over portions of the surface.
- the illumination is provided to a surface all at once rather than scanning a narrow beam over portions of the surface.
- the structured illumination source 50 includes a light source 54.
- the light source 54 may emit white light, monochrome light, or photons with any combination of wavelengths.
- the light source 54 may be a broadband source of light, such as a light emitting diode (LED) 54’ (see, e.g., Fig. 15A), or a narrowband excitation source, such as a laser 54” (see, e.g., Fig. 14) or any other suitable source of photons.
- Optical components may be included between the light source 54 and the illumination pattern generator 52. For example, optical components may be included to filter white light to a narrow band of frequencies, to polarize, to collimate, and/or to expand a beam emitted by the light source 54.
- the first and second photons emitted by the light source 54 can be in the optical range of the spectrum, e.g., the first and second photons may have
- wavelengths in a range from about 300 nm to about 800 nm are examples of wavelengths in a range from about 300 nm to about 800 nm.
- Fig. 4A is a schematic side view of an example of a device 10 of the present disclosure.
- Fig. 4A is similar to Fig. 2A except Fig. 4A depicts schematic details of an example of a structured illumination source 50.
- the illumination pattern generator 52 may include a mask layer 53 and the illumination pattern generator actuator includes a mask layer actuator 55 connected to the mask layer 53 to translate or rotate the mask layer 53 relative to the formation 28 of features 30.
- a first position of the mask layer 53 causes the portion of the first photons 61 to selectively illuminate the first feature 31.
- a second position of the mask layer 53 causes the portion of the second photons 62 to selectively illuminate the second feature 32.
- a device 10 includes a plurality 18 of imaging pixels 20 arranged in a spatial pattern 22.
- a formation 28 of features 30 is disposed over the plurality 18 of imaging pixels 20.
- an illumination pattern generator 52 may be disposed over the formation 28 of features 30.
- the illumination pattern generator 52 may be formed as part of the structure with the formation 28 of features 30.
- the illumination pattern generator 52 may be formed as a structure separate from the formation 28 of features 30.
- a first feature 31 of the formation 28 of features 30 is disposed over a first pixel 21 of the plurality 18 of imaging pixels 20.
- a second feature 32 of the formation 28 of features 30 is disposed over the first pixel 21 and spatially displaced from the first feature 31.
- the illumination pattern generator 52 includes an illumination pattern generator actuator connected to the illumination pattern generator 52 to cause an illumination pattern having illumination intensity maxima with a periodicity 92 corresponding to a pixel spacing 94 in the spatial pattern 22 of the plurality 18 of imaging pixels 20 to selectively irradiate the first feature 31 with light at a first time.
- the illumination pattern generator 52 causes the illumination pattern to selectively irradiate the second feature 32 with light at a second time, the second time being different from the first time.
- the illumination intensity maxima may be interference maxima 73, or other locations of illumination intensity such as illumination stripes 67 (e.g., Fig. 5B) or spots (e.g., Fig. 6B).
- the device 10 may further include a structured illumination source 50 to generate first photons 61 at the first time, and to generate second photons 62 at the second time.
- a first luminophore 41 may be disposed within or over the first feature 31 and a second luminophore 42 may be disposed within or over the second feature 32.
- a first target analyte may be disposed within or over the first feature 31 and a second target analyte disposed within or over the second feature 32.
- the first target analyte may be different from the second target analyte.
- the first target analyte and second target analyte may include nucleic acids having different sequences.
- the mask layer 53 includes a grate 56 of alternating, periodically-spaced, light-transmitting regions 57 and opaque regions 58.
- the light-transmitting regions 57 are defined by parallel strips 51 of a mask absorber 59 disposed on a mask substrate 66.
- the portion of the first photons 61 and the portion of the second photons 62 are transmitted through the light- transmitting regions 57 to illuminate parallel illumination stripes 67 on the formation 28 of features 30.
- the mask absorber 59 may be a thin metallic coating disposed on the mask substrate 66.
- the mask absorber 59 may be chromium, aluminum, iron oxide, titanium, or a silver halide emulsion. It is to be understood that in the mask layer 53 of the present disclosure, the light transmitting regions 57, and the opaque regions are fixed with respect to the mask layer 53. The mask layer 53 is moved using the mask layer actuator 55. Moving the mask layer 53, rather than individually opening and closing pixels, may be advantageous.
- the device can include a first luminophore disposed within or over the first feature and a second luminophore disposed within or over the second feature.
- the device can include a first target analyte disposed within or over the first feature and a second target analyte disposed within or over the second feature, wherein the first target analyte is different from the second target analyte.
- the first target analyte and second target analyte can include nucleic acids having different sequences.
- the first pixel 21 can selectively receive luminescence emitted by the first luminophore 41 responsive to the first photons 61 at the first time, and can selectively receive luminescence emitted by the second luminophore 42 responsive to the second photons 62 at the second time.
- the structured illumination source 50 may selectively excite the first luminophore relative to the second luminophore.
- the parallel illumination stripes 67 are depicted as transparent bars to schematically illustrate illuminated regions.
- the illumination stripes 67 may have a uniform intensity distribution, or a gradient intensity distribution of transverse locations in the illumination stripes 67.
- the illumination stripes 67 may have less intensity at the edges of the illustrated illumination stripes 67 compared to a more intense portion of the illumination stripes 67 along the axial centerline of the illumination stripes 67.
- the first photons 61 generate a spatial pattern of field strengths (intensity) that is significantly more intense at the first feature 31 than at the second feature 32, and thus can selectively excite the first luminophore 41 relative to the second luminophore 42 at the first time (Fig. 5A).
- the imaging pixel 20 can generate an electrical signal at the first time that substantially corresponds to selective excitation of the first luminophore 41 disposed within or over the first feature 31.
- This combination of spatial and temporal separation of excitation events can allow the imaging pixel 20 to distinguish the two or more luminophores 40 within the detection zone of the imaging pixel 20.
- any suitable number of sites can be provided per imaging pixel 20.
- a device 10 having four sites per imaging pixel is illustrated in Fig. 1 C and Figs. 7A-7D.
- a third feature 33 of the formation 28 of features 30 may be disposed over the first pixel 21 and spatially displaced from each of the first features 31 and the and second features 32.
- a third luminophore may be disposed within or over the third feature 33. The third
- the structured illumination source 50 may be to direct at least a portion of third photons 63 to the third feature 33 at a third time, the third time being different from the first time and second time.
- the third time is indicated by watch face 65” in Fig. 7C.
- the first pixel 21 is to selectively receive luminescence emitted by the third luminophore responsive to the portion of the third photons 63 at the third time.
- the structured illumination source 50 may be to direct at least a portion of fourth photons 64 to the fourth feature 34 at a fourth time, the fourth time being different from the first time, second time, and third time.
- the fourth time is indicated by watch face 65’” in Fig. 7D.
- the first pixel 21 is to selectively receive luminescence emitted by the fourth luminophore responsive to the portion of the fourth photons 64 at the fourth time.
- Figs. 7A-7D respectively schematically illustrate perspective views of examples of selective excitation of first, second, third, and fourth sites within a formation 28 of features 30 such as provided herein and illustrated in Figs. 7A-7D using a structured illumination source 50 generating photons at selected features at different times.
- the illumination pattern generator 52 can be irradiated with first photons 61 so as to selectively excite a first site disposed over each imaging pixel 20. Subsequently, in a manner such as illustrated in Fig.
- illumination pattern generator 52 can be irradiated with second photons 62 so as selectively to excite a second site disposed over each imaging pixel 20.
- illumination pattern generator 52 can be irradiated with third photons 63 so as to selectively excite a third site disposed over each imaging pixel 20.
- illumination pattern generator 52 can be irradiated with fourth photons 64 so as to selectively excite a fourth site disposed over each imaging pixel 20.
- the imaging pixels 20 respectively can generate electrical signals at the first, second, third, and fourth times, based upon which the first, second, third, and fourth sites disposed over such imaging pixels 20 can be distinguished from one another.
- Fig. 8A is a schematic cross-sectional side view of an example of a device 10 of the present disclosure.
- Fig. 8A is similar to Fig. 2A except Fig. 8A depicts schematic details of an example of a structured illumination source 50.
- the illumination pattern generator 52 may include an interference pattern generator 93 to propagate light defining a multi-beam interference pattern on the formation 28 of features 30.
- the illumination pattern generator actuator may include an interference pattern generator actuator 95 connected to the interference pattern generator 93 to change a positional state or rotational state of the interference pattern generator 93 to cause the interference pattern to translate or rotate relative to the formation 28 of features 30.
- the positional state of the interference pattern generator 93 may be a position of the interference pattern generator 93 relative to the formation 28 of features 30 as depicted in Fig. 8A and Fig. 8B. As depicted in Fig. 8A, a first position of the interference pattern generator 93
- interference pattern generator 93 causes the first photons 61 to selectively illuminate the first feature 31. As depicted in Fig. 8B, a second position of the interference pattern generator 93 causes the second photons 62 to selectively illuminate the second feature 32. In other examples, the positional state of the interference pattern generator 93 may be any position of a component of the interference pattern generator 93, actuatable by the interference pattern generator actuator 95, that causes the interference pattern to translate or rotate relative to the formation 28 of features 30.
- rotation, bending, stretching or compression of a component of the interference pattern generator 93 caused by the interference pattern generator actuator 95 may cause a change in the interference pattern to translate or rotate relative to the formation 28 of features 30.
- a first positional state or rotational state of the interference pattern generator 93 causes the portion of the first photons 61 to selectively illuminate the first feature 31.
- a second positional state or rotational state of the interference pattern generator 93 causes the portion of the second photons to selectively illuminate the second feature 32.
- the arrowheads of the dashed arrows with reference numerals 61 and 62 indicate locations of maximum intensity of the interference pattern.
- the interference pattern may have other maxima and minima along the arrows. Interference patterns and their generation are discussed further herein.
- Fig. 9A and Fig. 9B are schematic diagrams depicting the selectivity of multi-beam interference patterns.
- the multi-beam interference pattern is a two-beam interference pattern.
- the interference pattern generator is to project parallel linear interference fringes 91 , 9T on the formation 28 of features 30.
- the parallel linear interference fringes 91 , 9T have a predetermined periodicity 92 equal to a pixel spacing 94.
- Fig. 9A depicts the interference fringes 91 from the first time (indicated by the watch face 65), and the interference fringes 9T from the second time (indicated by the watch face 65’).
- the interference fringes 91 and 9T are not projected simultaneously in examples of the present disclosure.
- the multi-beam interference pattern is an interference pattern from at least four interfering beams.
- the interference pattern is a two-dimensional interference pattern having interference maxima 73, 73’, 73”, 73”’ with a predetermined periodicity 92’ equal to a pixel spacing 94.
- Fig. 9B depicts the interference maxima 73 from the first time (indicated by the watch face 65); the interference maxima 73’ from the second time (indicated by the watch face 65’); the interference maxima 73” from the first time (indicated by the watch face 65”); and the interference maxima 73”’ from the second time (indicated by the watch face 65”’).
- the interference maxima 73, 73’, 73” and 73”’ are not projected simultaneously in examples of the present disclosure.
- periodicity means the center-to- center spacing of the interference maxima 73, 73’, 73”, 73”’.
- Fig. 10A is a schematic diagram that illustrates certain geometry and terminology relating to interference.
- Fig. 10B is a simplified version of Fig. 10A that also includes a depiction of the interference fringes 91”.
- Fig. 10A illustrates the geometry of a“double-slit” demonstration of interference, similar to Young’s double-slit experiment
- h is a distance from s-i to point P (path length).
- r 2 is a distance from s 2 to point P (path length)
- d is the distance between the centers of the slits.
- L is the distance between the barrier and the screen.
- Y is the height above the centerline QO.
- Q is the angle between QO and QP.
- d is the path difference.
- Reference numeral 76 indicates a coherent beam of light having wavelength l.
- the coherent beam of light 76 is split into two coherent beams (both having wavelength l) by the slits Si and s 2 in the barrier.
- the difference between n and r 2 causes the light waves to reach the point P at different phases at a particular time.
- the order number m m
- the distance between the fringes is proportional to the ratio ⁇ Kid) of the wavelength l to the distance between the centers of the slits d.
- Fig. 1 1 is a schematic diagram that applies the interference relationships of the“double-slit” demonstration of Fig. 10A to a diffraction grating having a many slits.
- Fig. 12 is a schematic diagram that depicts the relative intensity of orders m produced by a coherent beam of light 76 diffracted by a diffraction grating.
- Fig. 13A and Fig. 13B are schematic diagrams depicting interference fringes 91 that are produced by a diffraction grating 60.
- the diffraction grating 60 has alternating, periodically-spaced, light-transmitting regions 57’ and opaque regions 58’.
- Fig. 13C is a schematic, cross-sectional view of an example of the diffraction grating 60 shown in Fig. 13A.
- the light-transmitting regions 57’ are defined by parallel strips 5T of a mask absorber 59 disposed on a transparent substrate 66’.
- FIG. 13C is a binary diffraction grating because light is either transmitted through the light-transmitting regions 57’ or light is blocked from entering the opaque regions 58’.
- a coherent wavefront 77 produces coherent wavelets 78 exiting each light-transmitting region 57’.
- the interference fringes 91 depicted in Fig. 13A and Fig. 13B are parallel to the light-transmitting regions 57’.
- Fig. 13D is a schematic view of a two-dimensional diffraction grating 60’ formed from the orthogonal diffraction gratings 60 depicted in Fig. 13A and Fig. 13B superimposed upon one another.
- Fig. 13E is a schematic diagram depicting an interference intensity distribution 74 produced by a two-dimensional diffraction grating 60’ as shown in Fig. 13D.
- Fig. 14 is a schematic diagram of an example of a device 10 according to the present disclosure.
- a laser 54” produces a coherent beam of light 76.
- a two- dimensional diffraction grating 60’ splits the coherent beam of light 76 into a set of interfering beams.
- a lens 68 directs the set of interfering beams to a beam blocker 69 which blocks zero order, second and higher order beams, and passes first order beams in the x/y axis.
- a second lens 68’ directs the first order beams to the formation 28 of features 30.
- the coherent beam of light 76 may be shifted, or the two- dimensional diffraction grating 60’ may be shifted to illuminate each of the features 30 (one feature 30 per imaging pixel 20 at any particular time) disposed over the imaging pixels 20.
- the coherent light beam 76 or the two-dimensional diffraction grating 60’ may be shifted by a piezoelectric actuator.
- a plurality of features 30 corresponds to each imaging pixel 20. In Fig. 14, two features 30 are shown corresponding to the first pixel 21 and two features 30 are shown corresponding to the second pixel 23.
- examples of the present disclosure may include any number of features 30 greater than one disposed over each imaging pixel 20, e.g., 2,
- Fig. 15A is a schematic diagram of a device 10 according to the present disclosure.
- An LED 54’ (or white light with a band pass filter) produces a beam of light.
- a mask layer 53 includes a two-dimensional arrangement of periodically-spaced, light-transmitting regions 57 defined on an opaque field region 49. The portion of the first photons 61 (Fig. 6A) and the portion of the second photons 62 (Fig. 6B) are transmitted through the light-transmitting regions 57 to illuminate corresponding features on the formation 28 of features 30.
- the structured illumination source 50 may include an optical component 46.
- the mask layer 53 may be shifted by e.g., a piezoelectric actuator.
- a plurality of features 30 corresponds to each imaging pixel 20.
- two features 30 are shown corresponding to the first pixel 21 and two features 30 are shown corresponding to the second pixel 23.
- examples of the present disclosure may include any number of features 30 greater than one disposed over each imaging pixel 20, e.g., 2, 3, 4, 5, 6, 7, 8 or more features may be disposed over each imaging pixel 20.
- the features 30 may be arranged in any suitable formation 28.
- the formation 28 of features 30 may be in rows and columns, a row, a column, triangular clusters, hexagonal clusters, etc.
- Fig. 15B is an intensity distribution 75 of a representative dotted pattern of light on the formation 28 of features 30 of the example of the device 10 depicted in Fig. 15A according to the present disclosure.
- FIG. 17B is an example of an intensity contour plot depicting an interference intensity distribution 74’ produced using the two-dimensional transmission phase mask 85’ depicted in Fig. 17A.
- the two-dimensional interference pattern has intensity wavelengths equal to the wavelengths Ax and Ay.
- the method 100 further includes“selectively receiving, by the first pixel, luminescence emitted by a first luminophore responsive to the portion of the first photons at the first time, wherein the first luminophore is disposed within or over the first feature” as shown at block 130.
- the method 100 optionally includes“the illumination pattern generator includes a mask layer and the illumination pattern generator actuator comprises a mask layer actuator connected to the mask layer to translate or rotate the mask layer relative to the formation of features; a first position of the mask layer causes the portion of the first photons to selectively illuminate the first feature; a second position of the mask layer causes the portion of the second photons to selectively illuminate the second feature; the mask layer includes a grate of alternating, periodically-spaced, light-transmitting regions and opaque regions; the light-transmitting regions are defined by parallel stripes of a mask absorber disposed on a mask substrate; and the portion of the first photons and the portion of the second photons are transmitted through the light-transmitting regions to illuminate parallel illumination stripes on the formation of features.” [00130] In Fig. 18C, continuation circle“B” connects optional element 170 to block 150 of Fig. 18A. At block 170, the method 100 optionally includes“the
- illumination pattern generator comprises: an interference pattern generator to propagate light defining a multi-beam interference pattern on the formation of features; wherein the illumination pattern generator actuator comprises an interference pattern generator actuator connected to the interference pattern generator to change a positional state or rotational state of the interference pattern generator to cause the interference pattern to translate or rotate relative to the formation of features.”
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Abstract
Description
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| PCT/US2019/036853 WO2019241447A1 (en) | 2018-06-14 | 2019-06-12 | Device for luminescent imaging |
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