EP3545340A1 - Verfahren zur signalverarbeitung eines photosensors - Google Patents
Verfahren zur signalverarbeitung eines photosensorsInfo
- Publication number
- EP3545340A1 EP3545340A1 EP17811181.1A EP17811181A EP3545340A1 EP 3545340 A1 EP3545340 A1 EP 3545340A1 EP 17811181 A EP17811181 A EP 17811181A EP 3545340 A1 EP3545340 A1 EP 3545340A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- formula
- scintillation
- signals
- linear
- pet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
- G01T1/164—Scintigraphy
- G01T1/1641—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
- G01T1/1647—Processing of scintigraphic data
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
- G01T1/164—Scintigraphy
- G01T1/1641—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
- G01T1/1642—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras using a scintillation crystal and position sensing photodetector arrays, e.g. ANGER cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/248—Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
Definitions
- the invention relates to a method for signal processing of a photosensor.
- positron emission tomography detector rings are used to detect the ⁇ + ⁇ " annihilation radiation.”
- the rings consist of scintillation crystals adjoining photosensors that are capable of detecting the scintillation radiation Photosensors are photomultipliers (PMTs), avalanche photodiodes (APDs), photodiodes and silicon photomultipliers (SiPMs) .
- the structure is such that the detector ring is usually circular, with the object to be measured, for example a body part of a patient or Tiers are placed in the center of the detector ring (PET ring) .
- the use of radiodiagnostic agents generates ß + ß ⁇ annihilation radiation, which is to be detected.
- the ß + ß " annihilation radiation, hereinafter called annihilation radiation strikes scintillation crystals, the are arranged annularly or quadratically around the object to be examined and generates the di e Scintillation radiation
- the scintillation radiation is in turn registered by the photosensors, which are located in the concentric arrangement behind the scintillation crystal with respect to the radiation source.
- the photosensors can also be arranged on other sides of the scintillation crystal, for example in front of the scintillation crystal or laterally thereof.
- the scintillation crystal is a three-dimensional body. Relative to an arrangement in which the object to be examined emits annihilation radiation from the center of the detector ring, the cross section on which the annihilation radiation strikes the scintillation crystal biases an xy-axis. The depth of the scintillation crystal is referred to in this nomenclature as the z-axis.
- an object to be examined or an emission source for radiation of an energy of 511 keV which ideally meets the xy plane of the scintillation crystal and has a penetration depth along the z-axis of the scintillation crystal, is located in the center of the detector ring ,
- the 511 keV annihilation radiation then initiates scintillation at a point on the scintillation crystal along the z axis which is registered as a signal by the photosensor, for example a SiPM.
- a SiPM is able to detect even single photons.
- the design of a PET ring compromises between increasing the sensitivity of longer scintillation crystals and reducing the DOI error due to shorter scintillation crystals.
- close-fitting PET rings detector rings
- the PET ring must fit into the opening of the MRI scanner tube.
- the diameter of the PET ring used must be small in order to fit into the opening of the MRI ring.
- the object to be examined for example, a body part of a small animal or even a human can be centered, but measured to the diameter of the PET ring is dimensioned so that he extends far into the edge regions of the opening of the PET ring.
- the DOI problem becomes significant.
- the resolution has been significantly improved in small animal PET scanners with the use of pixilated scintillation crystal blocks with smaller and smaller pixel sizes.
- the pixelization on the xy plane is realized, so that tubes of pixels which are aligned in the z direction are formed in the scintillation crystal.
- the pixel size has already reached the submillimeter range. That's why there are more and more problems that need to be solved.
- the pixilated crystal blocks consist of adhesive and reflector foil, which is located between the individual scintillation crystals, so as to build up the pixilated block.
- the layer of adhesive and reflector foil has an approximate thickness of 70pm.
- very small pitch pixelized arrays have an increased sensitivity loss.
- the ratio of adhesive and film to scintillation crystal is significantly reduced, so that adhesive and film account for as much as 29%.
- the scintillation crystal fraction is logically reduced to 71%. In the other 29% volume no gamma quanta can be stopped and converted into light. If even smaller pixilated arrays of, for example, 0.5 cm ⁇ 0.5 cm are used, the crystal fraction is even reduced to 59%. Therefore, increasing the resolution with pixilated arrays is always tied to a loss of sensitivity.
- the second problem with pixilated scintillation crystal arrays is that the emitted light is concentrated on a smaller area of the photosensor surface. This is a problem especially for binary photosensors such as SiPM.
- a SiPM consists of several microcells that function as binary elements. They detect whether light has been detected or not. When light is detected, the microcell makes a breakthrough. The number of broken microcells quantify how much light the detector surface has reached. When two or more light quanta triggers a microcell, the output remains the same. The more light that hits a SiPM, the higher the likelihood that two or more light quanta will hit the same microcell of the SiPM. These additional light quanta can then not be detected.
- Prior art detectors use SiPM-based photosensor technologies to enable magnetic resonance tomography compatibility (MRI compatibility) for use in MR / PET hybrid scanners.
- MRI magnetic resonance tomograph
- Another problem with hybrid scanners is that the space for PET detectors and associated electronics is limited by the tube diameter of the magnetic resonance tomograph (MRI). This is especially true for ultra high field tomographs.
- the PET scintillation crystals must be as short as possible. Shorter scintillation crystals also reduce the sensitivity. This also means that due to the conditions of the tube diameter, the PET ring is closer to the examination object. The parallax error is the closer the annihilations and thus the resulting LOR take place on the PET ring, the greater.
- a PET ring with a diameter of 8 cm and a length of 10 cm results in a detector surface of 251 cm 2 . If a 1-to-1 coupling of scintillation crystals and photosensors with a crystal pixel size of 0.8 mm is used, 39270 read-out channels are required if each channel is read out individually.
- a concept published in [7] proves the possibility of constructing a PET detector consisting of monolithic crystals and SiPMs.
- monolithic crystals solve the problem of loss of sensitivity due to the space required by reflector films and associated adhesives.
- the production costs of monolithic crystals are lower.
- the used thickness of the crystals is 2mm.
- DOI detection which only detects light on one side of the crystal using monolithic crystals, is published in [8] and patented in [9]. It uses the well-known Principle that the light distribution of the crystal is dependent on the DOI.
- the detector concept used is coupled with monolithic crystals to Hamamatsu's position sensitive photomultiplier (PMT) H8500.
- PMT position sensitive photomultiplier
- a resistor network is used, which allows position coding and thus also output channel reduction. The standard deviation of the light distribution is used to estimate the DOI.
- the detector described in [7] is realized with monolithic crystals.
- a close-fitting ring was designed to increase sensitivity.
- monolithic crystals were used. Due to the resulting short distance between the scintillation crystals and the examination subject, the DOI problem is increased. Therefore, the developers of the ring are limited to 2 mm crystal thickness. As a result, the sensitivity gained through the narrow ring and the use of monolithic crystals is lost again due to the short thickness of the scintillation crystals. However, this work proves that high resolution with monolithic crystals is possible.
- DOI positions can be determined by attaching sensors to two crystal surfaces. This requires the double photosensor area.
- sensors are one of the most expensive components of a PET ring.
- a three-dimensional animal PET scanner was designed by Judenhofer et. al. [11] integrated in a 7T animal scanner. It is based on APDs using scintillation crystals 4.5 mm thick and consisting of crystal arrays of 144 crystals spaced 1.6 mm apart. The crystal array is coupled to a 3 by 3 APD array. The axial field of view (FOV) is 19 mm. This developed system shows that special space is heavily limited for integrated systems, which forces a compromise between crystal thickness and axial FOV. This results in the low sensitivity of 0.23% of the system. In addition, the DOI problem also limits the crystal thickness here.
- German patent applications 102016006056.5 and 102016008904.0 disclose sensor chips with which the DOI problem can be solved or reduced.
- a method is to be provided which enables the use of scintillation single crystals for the detection of signals in positron emission tomography, whereby the DOI problem can be avoided by reducing the parallax error in the determination of the LOR.
- the method should be suitable for all types of photosensors with monolithic crystals and pixilated crystal arrays, which produce an interaction depth-dependent light distribution and additionally each contain a spatial encoding which should be as linear as possible.
- the PET detector does not need to be modified. Therefore, it is also possible to upgrade existing PET and MR-PET systems with the software-based method.
- the sensitivity and the resolution of photosensors should be improved, since in addition the depth of interaction is determined.
- the depth of interaction resolution depends on the xy resolution of the photosensor.
- the method which is also compatible with MR, should be suitable for using photosensors together with an MRI, in particular at high magnitudes. net fields, operate.
- the accuracy of small-sized PET rings or PET rings, which are close to the object under investigation, should be improved.
- the space required by the measuring device normally associated additional electronics for determining the depth of interaction should be reduced. It is to be saved by the unnecessary integration of, for example, resistor networks space, which can usually consume sensitive photosensor area. The cost of the device should be reduced.
- the method should not be limited in its application to use in PET, but should generally be used for scintillation single crystals and arrays of scintillation crystals that have a light distribution dependent on the depth of interaction.
- the object is achieved with the features specified in the characterizing part of claim 1.
- Sensitivity and the resolution of the measuring method and the device are improved.
- the use of z-direction longer scintillation single crystals is possible.
- the method can also be applied to photosensors operating in conjunction with an MRI apparatus. Particularly in the case of devices with a small tube dimensioning or if the PET ring is in close contact with the examination subject, the parallax error is reduced. There is space for the associated electronics and costs saved.
- the method according to the invention achieves an accuracy of z-resolution dependent on the x-y resolution. This can lead to a very high resolution of the depth of interaction, in particular with high-resolution photosensors such as LG-SiPM, SeSP or iSiPM. This leads to a more accurate estimate of the 2nd order moment.
- the inventive method is for all photosensors encoded on the site, which encoding should be as linear as possible, such as SiPM such as LG-SiPM, SeSP and iSIPM, ADP such as position-sensitive APD or PMT such as position-sensitive PMT and arrays of scintillation crystals have a distribution of light dependent on the distribution of light, applicable.
- each individual detector has at least one scintillation single crystal and at least one photosensor positioned on one side of the scintillation crystal.
- the Photosensor on the xy plane of Szintiallations single crystal attached, more preferably on the side of the scintillation single crystal, which faces away from the center of the detector ring.
- the photosensor may be attached to a side of the scintillation single crystal that is not on the xy plane, for example, on the xz or yz plane.
- this has the disadvantage that for photosensors mounted on the xz or yz plane, scanner sensitivity losses are incurred. If the sensor is on the side facing the center, additional Compton effects are created.
- the use of the scintillation single crystal has the advantage that the sensitivity of the single crystal to pixellated scintillation crystals can be maximized.
- the efficiency of the scintillation crystals is significantly reduced, for example, to only 71% or 59% at 0.8mm x 0.8mm or 0.5mm x 0.5mm crystal pixel size of a pixellated crystal array.
- the scintillation monocrystal can, however, for example not be made up of LSO, LYSO, BGO, GSO, BaF 2 or Nal: TI (thallium-doped sodium iodide). The materials are known to the person skilled in the art.
- the ratio of the z-dimension of the scintillation single crystal to its extension in the x-direction of less than or equal to 1 leads to good results with a square cross section for xy. The best results are obtained at a ratio of 0.25. Optionally, the ratio may be smaller.
- the length of the scintillation single crystal achieved in this case is determined more by practical circumstances, such as the diameter of the PET ring or the costs associated with large single crystals.
- the sizing of the scintillation single crystal in the z-direction depends on the desired sensitivity that is to be achieved. Achieving the large z-direction scintillation single crystal expansion is a result of the photosensor readout of the invention described below, which allows such dimensioning to minimize DOI errors.
- the method can also be used when using specially prepared scintillation crystal arrays.
- Condition here is that the crystal arrays are constructed so that a light distribution over the sensor surface depending on the depth of interaction results.
- a recently published method is to install a light guide for distributing the light to the surface facing away from the sensor. There, scintillation light is reflected and distributed to several pixels depending on the depth of interaction in the pixel. [18].
- Another known method for this is the superimposition of two or more crystal arrays, which are offset from each other are such that an upper crystal diffuses light to several - usually 4 - underlying crystals. Thus it can be decided by the width in which crystal array layer the scintillation event took place [19], [20].
- a photosensor or a plurality of small photosensors can be applied, which are assembled to form a larger photosensor. These can be adhered to the scintillation single crystal. In the event that several small photosensors are combined, these are considered as a single photosensor in the sense of the invention when they are mounted together on one side of the scintillation single crystal.
- the adhesive used should be translucent.
- a layer of a light distributor can be located between the scintillation single crystal and the photosensor if the light intensity is to be bundled.
- An arrangement is also possible in which more than one photosensor is attached to the single crystal. For example, there may be stacking along the z-axis where photosensors and scintillation crystals alternate.
- photosensors may also be attached to the sides of the scintillation single crystal that are not on the xy plane of the scintillation single crystal. There may be one, two or more, for example, 3 photosensors mounted on different sides. In this case, photosensors may be mounted on two opposite sides of the scintillation single crystal or on adjacent sides of the scintillation single crystal lying in the xz or yz direction. Every sub-combination is conceivable.
- the variant in which photosensors are mounted on opposite sides has the advantage that it increases the accuracy when a measurement signal is received. According to the embodiment of the method and the device according to the invention, however, there is the particular advantage that the signals need only be read on one side of the scintillation single crystal. This corresponds to an embodiment with a single photosensor. Thus, the inventive method and the device are also inexpensive.
- the photosensor is designed so that it allows in the x-direction and / or in the y-direction linear encoding of the currents with respect to the position of the corresponding pixel.
- the sensor chip can be designed differently, among other things rem with the mentioned in the prior art coding options, which can be realized for example with a resistor network.
- an arbitrary combination of readout channels with linearly increasing and decreasing signal strengths can be used for the linear coding for which the linearly rising and linearly descending signals are multiplied together.
- the direction over which the signal strengths rise and fall linearly can deviate from the x and y direction of the photosensor.
- a direction of the linearly rising and falling signal strengths is referred to as e.
- the readout channels lie exclusively on the x-axis or the y-axis of the photosensor.
- output channels A and B are available for the x-direction and output channels C and D for the y-direction, which provide a linearly coded signal of the light distribution.
- the x-position is calculated from the currents Q of the channels A and B according to the formula
- the y-position is calculated from the currents Q of the channels C and D according to the formula 2: (Formula 2)
- the xy position is calculated from the detected currents Q of the channels A to D.
- the x and y position results from the formulas: (Formula 1) and (Formula 2)
- the signals of the channels A and B for the x-direction and C and D for the y-direction are multiplied together.
- the signal strengths for the x and / or y position may be described by formulas 3 and 4.
- x ((Q F + Q H ) - (Q E + Q G)) (Q E + Q F + Q G + Q H ) (Formula 3)
- resistor networks or resistive layers can be used.
- the currents that lead to the signals can be distributed to the corners of the photosensor, for example.
- a photosensor with the corners E, F, G and H is shown in FIG.
- Formula 5 or 6 calculates the energy or the moment 0th order ⁇ 0 and the position along x and / or y the moment 1. Order i ⁇ of the scanned light distribution.
- the 2nd order moment is determined in the prior art by a summing network which generates a signal squared square in the x or y position.
- the output signals obtained by the output channels A and B and / or C and D are multiplied together, if the spatial coding according to formula 1 and / or 2 takes place.
- ⁇ 2 is the approximated by the product and then normalized moment.
- the constants ⁇ and ß are to be determined by means of calibration measurement.
- ⁇ 2 ' the standard deviation which, as described above and generally known, is a function of the depth of interaction can be determined. This is shown by way of example in FIGS. 8 and 11.
- the functions for calculating the depth of interaction from the standard deviation shall be determined from appropriate calibration measurements. The methods are known to the person skilled in the art.
- the multiplication can be carried out for both embodiments for a direction x or y or for both directions x and y.
- the DOI problems described at the outset are solved and an information about the depth of the signal along the z-direction of the scintillation single crystal or of the crystal array with interaction depth-dependent light distribution of the sensor chip used is obtained.
- the tasks are all solved.
- the method can be carried out with all photosensors, which include a spatial encoding, which should correspond to a linear encoding if possible.
- the output signal of one channel or a combination of channels must change as linearly ascending as possible with the x- or y- or e-position, while the output signal of another channel or a combination of channels should descend as linearly as possible with the x- or y-position. or e-position changes.
- the direction e is an arbitrary direction, which can also be composed of x and y direction vectors.
- Directional vectors, which result solely from signals of the x-direction or the y-direction, are special cases of signals of the e-direction.
- a linear coding is to be understood as any coding which corresponds to the formula 11.
- Q1 is the charge of the e-position rising output channels and Q2 is the charge of the e-position descending output channels.
- e denotes the coding direction, ie x or y or a combination thereof.
- Q x ⁇ e) d - e ⁇ + approx
- Formula 11 takes into consideration that embodiments which do not meet the requirements of strict linearity may still be suitable for realizing the teaching according to the invention. Ideally, linear coding is strictly linear.
- a sensor chip it is possible for a sensor chip to have linear coding in more than one e-direction, eg e 2 , e 3 , etc.
- the second order moment is multiplied by the respective increasing and decreasing signal strengths along the coding direction approximated.
- a special case are the sensor chips described above, which contain two coding directions, the x and e 2 corresponding to the y direction. In this case, there is a linear coding in at least one e-direction.
- the second-order torque is additionally determined using a resistance network. Thus, the depth of interaction can be determined even more accurately.
- SiPM-based sensors such as LG-SiPM, SeSP and iSIPM
- ADP-based sensors such as position-sensitive APD or PMT-based sensors, such as position-sensitive PMT.
- PMT-based sensors such as position-sensitive PMT.
- sensors which have a location coding along x- and y-direction, which is as linear as possible, the method is applicable.
- Fig. 1 a photosensor with the output channels A, B, C and D in a schematic form.
- Fig. 2 a photosensor with the output channels E, F, G and H in a schematic form.
- 3 shows the multiplied photocurrent profile of channels A and B versus time in seconds.
- Fig. 4 the voltage curve of the channels E and F against the time in seconds.
- FIG. 5 shows typical light distributions which are measured using monolithic scintillator crystals with position-resolving photodetectors.
- Fig.6 1. Normalized moment, which can be determined with the aid of position-coded currents according to the prior art.
- Fig. 7 2nd Normalized moment, which with the help of the position coded currents after the
- State of the art can be determined by means of a summing circuit.
- Fig. 8 Standard deviation, which can be determined from the normalized 1st and 2nd moment with the aid of formula 7 according to the prior art.
- FIG. 9 approximated second normalized moment, which according to the invention can be calculated from the product of the position-coded currents.
- FIG. 10 linear transformed approximated second torque according to formula 8.
- FIG. 11 Standard deviation, which according to the invention is determined from the normalized 1 st and the linearly transformed approximated 2 nd moment with the aid of formula 7.
- Figure 1 shows in schematic form a photosensor with the outputs A, B, C and D, wherein the outputs A and B lie on the y-axis and the outputs C and D on the x-axis.
- the x-axis and the y-axis are indicated by the arrows.
- FIG. 2 shows in schematic form a photosensor which has a resistance network or a resistive layer which distributes the charges to the corners, wherein the output channels for the charge E, F, G and H to be read are positioned in the corners of the photo sensor.
- the arrows indicate the x-axis and the y-axis.
- FIG. 3 shows a curve which maps the multiplication of the photocurrents in [A 2 ] of two read-out channels A and B, which linearly ascend and descend with the x or y or e direction, against time in [s].
- Figure 4 shows a graph in which the voltage in [V] of channel J for the embodiment which makes use of the second-order moment from a summing network is mapped against time in [s]. From the comparison of FIGS. 3 and 4, it can be seen that, for the multiplication according to the invention, the signal strength rising linearly and linearly for the x-direction is obtained equivalent results are obtained as for the determination of the second order moment by means of a summing network.
- Axis of abscissa Actual photo-conversion position x along the sensor surface, ordinate axis: Measured standard deviation [a.u.].
- Abscess axis actual photo-conversion position x along the sensor surface
- ordinate axis linear transformed approximated 2nd normalized moment (scaled, measured, normalized product of the two signals) [au].
- Abscissa axis actual photo-conversion position x along the sensor surface
- ordinate axis measured, approximated standard deviation [au].
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Abstract
Description
Claims
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102016014113 | 2016-11-25 | ||
| DE102017009365.2A DE102017009365B3 (de) | 2016-11-25 | 2017-10-05 | Verfahren zur Signalverarbeitung eines Photosensors |
| PCT/DE2017/000380 WO2018095447A1 (de) | 2016-11-25 | 2017-11-10 | Verfahren zur signalverarbeitung eines photosensors |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP3545340A1 true EP3545340A1 (de) | 2019-10-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP17811181.1A Withdrawn EP3545340A1 (de) | 2016-11-25 | 2017-11-10 | Verfahren zur signalverarbeitung eines photosensors |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10539686B2 (de) |
| EP (1) | EP3545340A1 (de) |
| JP (1) | JP7022125B2 (de) |
| CN (1) | CN109997058A (de) |
| DE (1) | DE102017009365B3 (de) |
| WO (1) | WO2018095447A1 (de) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR101700828B1 (ko) * | 2014-11-03 | 2017-02-01 | 주식회사 케이피씨 | 프로세스 챔버의 순환 정제장치 |
| DE102019000614A1 (de) * | 2019-01-28 | 2020-08-13 | Forschungszentrum Jülich GmbH | Sensorchip für die Lichtdetektion |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5576546A (en) * | 1992-10-28 | 1996-11-19 | Park Medical Systems Inc. | Depth-of-interaction normalization of signals for improved positioning, and energy resolution in scintillation camera |
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| US5813983A (en) * | 1997-06-03 | 1998-09-29 | Picker International, Inc. | Depth-of-interaction and other high order moments filtering for improved detection in thick scintillation crystals |
| US6288399B1 (en) * | 1997-11-12 | 2001-09-11 | Cti Pet Systems, Inc. | Depth of interaction detector block for high resolution positron emission tomography |
| JP2005533245A (ja) * | 2002-07-17 | 2005-11-04 | ヨーロピアン オーガナイゼーション フォー ニュークリア リサーチ | 陽電子放射断層撮影(pet)用及び単一光子放射コンピュータ断層撮影(spect)用のガンマ線検出器 |
| ES2239506B1 (es) | 2003-04-10 | 2006-11-16 | Consejo Superior Investigacion | Detector de rayos gamma con codificacion de profundidad de interaccion. |
| US7291841B2 (en) * | 2003-06-16 | 2007-11-06 | Robert Sigurd Nelson | Device and system for enhanced SPECT, PET, and Compton scatter imaging in nuclear medicine |
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| DE102016008904B4 (de) | 2016-07-22 | 2019-03-28 | Forschungszentrum Jülich GmbH | Sensorchip |
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2017
- 2017-10-05 DE DE102017009365.2A patent/DE102017009365B3/de not_active Expired - Fee Related
- 2017-11-10 WO PCT/DE2017/000380 patent/WO2018095447A1/de not_active Ceased
- 2017-11-10 US US16/344,409 patent/US10539686B2/en not_active Expired - Fee Related
- 2017-11-10 JP JP2019522313A patent/JP7022125B2/ja not_active Expired - Fee Related
- 2017-11-10 EP EP17811181.1A patent/EP3545340A1/de not_active Withdrawn
- 2017-11-10 CN CN201780066219.3A patent/CN109997058A/zh active Pending
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| See also references of WO2018095447A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2020501117A (ja) | 2020-01-16 |
| US10539686B2 (en) | 2020-01-21 |
| US20190339399A1 (en) | 2019-11-07 |
| CN109997058A (zh) | 2019-07-09 |
| DE102017009365B3 (de) | 2018-03-22 |
| WO2018095447A1 (de) | 2018-05-31 |
| JP7022125B2 (ja) | 2022-02-17 |
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