EP3412024A2 - Procédé de balayage d'imagerie ligne par ligne - Google Patents

Procédé de balayage d'imagerie ligne par ligne

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Publication number
EP3412024A2
EP3412024A2 EP17724732.7A EP17724732A EP3412024A2 EP 3412024 A2 EP3412024 A2 EP 3412024A2 EP 17724732 A EP17724732 A EP 17724732A EP 3412024 A2 EP3412024 A2 EP 3412024A2
Authority
EP
European Patent Office
Prior art keywords
image
pixels
pixel
picture elements
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP17724732.7A
Other languages
German (de)
English (en)
Inventor
Krisztina Tichawa
Nikolaus Tichawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tichawa Vision GmbH
Original Assignee
Tichawa Vision GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tichawa Vision GmbH filed Critical Tichawa Vision GmbH
Publication of EP3412024A2 publication Critical patent/EP3412024A2/fr
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/0402—Scanning different formats; Scanning with different densities of dots per unit length, e.g. different numbers of dots per inch (dpi); Conversion of scanning standards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/0402—Scanning different formats; Scanning with different densities of dots per unit length, e.g. different numbers of dots per inch (dpi); Conversion of scanning standards
    • H04N1/0408—Different densities of dots per unit length
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/0402—Scanning different formats; Scanning with different densities of dots per unit length, e.g. different numbers of dots per inch (dpi); Conversion of scanning standards
    • H04N1/042—Details of the method used
    • H04N1/0455—Details of the method used using a single set of scanning elements, e.g. the whole of and a part of an array respectively for different formats
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/0402—Scanning different formats; Scanning with different densities of dots per unit length, e.g. different numbers of dots per inch (dpi); Conversion of scanning standards
    • H04N1/042—Details of the method used
    • H04N1/0455—Details of the method used using a single set of scanning elements, e.g. the whole of and a part of an array respectively for different formats
    • H04N1/0458—Details of the method used using a single set of scanning elements, e.g. the whole of and a part of an array respectively for different formats using different portions of the scanning elements for different formats or densities of dots

Definitions

  • the invention relates to a method for line-by-line image scanning, and more particularly relates to a method for line-wise image scanning with an integrated dynamic lens function using pixels with size-independent sensitivity.
  • CCD sensors are brightness or light-sensitive electronic components, which are based on the internal photoelectric effect occurring in semiconductors, and in the area of the image sensors primarily on the subsequent accumulation of photon-generated electron-hole pairs in pixels.
  • CCD sensors are predominantly surface sensors, in which the readouts of the sensor stored in a potential well are taken over by the photodiodes in numerous vertical CCDs (vertical shift register) and then shifted vertically in line with the line frequency.
  • each CCD column passes into one or more horizontal CCDs (horizontal shift registers) which are rapidly shifted (video bandwidth defining pixel frequency).
  • a readout structure typically a charging capacitor, a reset or discharge switch and a single or multi-stage source follower as an impedance converter.
  • the CCD shift register structures usually provide no noise contribution, the amplifying output structure, however, already.
  • CMOS sensors active pixel sensors or active pixel sensors
  • An active CMOS pixel sensor is a semiconductor detector for light measurement, which is made in CMOS technology and in which each pixel has an amplifier circuit for reading the signal, so therefore usually not single amplifier as in CCD sensors for several Pixels must be used (passive CMOS pixels are no longer common due to their poor characteristics).
  • each amplifier can be operated at a lower bandwidth and lower intrinsic noise.
  • CMOS technology further functions, such as exposure control, contrast correction or analog-to-digital conversion, can also be integrated into a sensor chip.
  • CMOS sensors are advantageous in comparison with CCD sensors in that the signal of each individual pixel can be read out more quickly and more flexibly by directly addressing the individual pixels and thereby eliminating the charge shifts. Further advantages include high dynamics, the ability to detect high-contrast and bright objects, and a lower power consumption compared to CCD sensors. In addition, they are highly resistant to blooming.
  • image sensor is photodiode arrays (PDA) of CCD or CMOS sensors, which as such form the shape of an n * 1 image sensor, i. in which the individual photosensitive semiconductor pixels are arranged in rows.
  • PDA photodiode arrays
  • Such arrangements can be used to fabricate line sensors or photodiode arrays as optoelectronic sensors.
  • the pixel size determines the resolution, the number of pixels in turn being dependent on the length of the scan line and the pixel size. Depending on the application, the resolution can be between a few pixels per inch (dpi) or cm and up to several thousand pixels per inch.
  • the number of lines is typically between one line for monochrome applications and up to 4 lines for color (RGBIR or RGBSW) applications and up to 128 lines for so-called TDI (Time Delay and Integration) sensors with particularly high photosensitivity and for 3D sensors with spatially structured lighting.
  • TDI Time Delay and Integration
  • Line sensors are particularly suitable for use as so-called CCD lines or (in the case of CMOS) contact image sensors (CIS) in devices in which they scan an object, preferably already moved, line by line.
  • CIS contact image sensors
  • the sensor area is illuminated with a light strip.
  • the reflected light is imaged on the line sensor for line scan cameras with an objective, for CIS sensors with a GRIN (Graded Index) lens array (SELFOC), detected by the line sensor as an analog signal, and then in an A / D - Converter converted into a digital signal.
  • CIS sensors achieve with up to 100,000 pixels per line a higher spatial resolution than line scan cameras and have degrees of freedom in favor of a distortion-free optics and high clock rates.
  • CCD sensors of the aforementioned type are clocked during reading so that even on a sensor array (sensor chip) pixel charges are summed (for example, by analog addition of the brightness values by physical charge addition and charge transport on the image sensor itself to the local line amplifier) and thereby a two-dimensional locally variable resolution is achieved.
  • pixel charges for example, by analog addition of the brightness values by physical charge addition and charge transport on the image sensor itself to the local line amplifier.
  • the possibility of summation of charges is an inherent feature of CCD sensors.
  • a combination of adjacent pixels or (single) pixels within a row and / or a column to a virtual pixel is also referred to as binning.
  • Variants of Binning include horizontal or vertical binning (one-dimensional horizontal or vertical) and full binning (two-dimensional).
  • binning can reduce the bandwidth during transmission to a subsequent further processing, in particular if high-resolution sensors are used and if a high dynamic range is required.
  • binning of, for example, (linear) 8: 1 for 8-bit gray values requires a dynamic of 64 x 256 or 16384 (2 14 brightness values corresponding to 84 dB).
  • the risk of Bloom effects increases.
  • CMOS sensors In contrast to CCD sensors, CMOS sensors not only have no intrinsic binning mechanism, the active pixels are particularly poorly suited to supporting time and locally variable analog binning due to the fluctuating threshold voltage of the amplifier transistors and the low output impedance as well as the lack of accurate resistors.
  • digital binning - as shown in simulations - leads to enormously complex summation structures with extreme power losses.
  • the prior art is also the use of shutters or exposure electrodes for controlling the accumulation of photoelectrons on the one hand and of pulsed light sources on the other. It seems in the CCD area rather the use of shutters and exposure electrodes usual, in the CIS area rather the use of pulsed light sources. Both - shutter like pulsed light sources - can be used in addition to the same bright images at different transport speeds and to control the pixel size in the direction of rotation, possibly also by multiple flashes.
  • the effective pixel height results essentially as a convolution integral from the geometric pixel height on the sensor and from the region recorded on the original (flash duration or shutter shutter duration multiplied by the feed rate).
  • the reading of color images by means of LED multiplex is also widespread, for example in ATMs or CIS-based desktop scanners.
  • the invention is based on the general idea, by means of an image sensor, preferably a line sensor, to allow at least one locally magnified image detail for closer inspection of details of a scanned object or object without significant or negligible bandwidth increase.
  • an image sensor preferably a line sensor
  • local magnification zoom
  • ROI region of interest
  • the inventive method solves at least three different ways application-specific problems with an object to be examined, specifically those of a predefined fixed geometry (type and / or location of a region of interest are known, for example, a predetermined large barcode or a connection structure such as a weld at a predetermined location of the object), a predefined variable geometry (Type and / or location of a region of interest may vary, for example different bar codes at different locations depending on the object), and / or a previously unknown variable geometry (type and / or location of a region of interest are initially indefinite and can be recorded from a current image acquisition, for example, irregular defects, holes, cracks, inclusions and the like).
  • a predefined fixed geometry type and / or location of a region of interest are known, for example, a predetermined large barcode or a connection structure such as a weld at a predetermined location of the object
  • a predefined variable geometry Type and / or location of a region of interest may vary, for example different bar codes at different locations depending
  • a sensitivity which is constant or constant in accordance with the invention in that both "small" picture elements or pixels (without binning) and "large” picture elements or pixels (with binning) are fully controlled at the same or the same luminance can be fully controlled by using the charge generating photodiode can be achieved as a charging capacitor, whereby pixels are obtained, which are fully controlled in this way, regardless of a current pixel area at the same luminance. These pixels can then simultaneously capture at the same location and by the same imaging optics any image sections with the same or different resolutions.
  • elementary pixels are controllably locally combined to form larger pixels via analog switching devices (analog switches or binning switches in the form of, for example, suitable transistors) in the X and / or Y direction.
  • constant sensitivity can be achieved by adjusting the charge capacity of an integrator to the pixel size, and the pixel size control signals can simultaneously control the charge capacitor so that the pixels are fully driven at the same luminance regardless of the current pixel area.
  • constant sensitivity can be achieved by parallel paths, and if there is a charge amplifier to each of elementary pixels, simultaneously with the parallel switching of predetermined elementary pixels to larger pixels, the amplifiers will also be (re) switched and thereby the pixels independent of the current one Pixel area can be fully controlled at the same luminance.
  • constant sensitivity can be achieved by averaging, where large pixels are formed by averaging small pixels, such as resistor networks, and all pixels are fully driven at the same luminance regardless of the current pixel area.
  • large pixels can be formed by averaging small pixels, for example, by arranging switches and capacitors in the manner of advanced switched capacitor technology in filters and ADCs.
  • constant sensitivity can be achieved by averaging in the digital domain where large pixels are formed by digital averaging of small pixels and all pixels are fully driven at the same luminance regardless of the current pixel area.
  • constant feed-forward sensitivity can be achieved by a suitable combined sensor and light control in which the light intensity is proportionally increased for lines of low pixel height and consequently low line time, such that all lines are the same product of luminous flux and light regardless of the actual line duration Exposure time can be applied.
  • a constant sensitivity can be achieved by combining two or more of the methods according to the invention.
  • an analog averaging can be combined transversely to the transport direction with exposure and sensor control and subsequent locally variable summation in the transport direction.
  • pixels of different sizes can be operated locally partially overlapping or spatially separated.
  • Local separation in the sense of the invention is herein understood to mean a position of individual pixels at different positions in the transport direction of a scanned object, but within the imaging field or imaging region of the same optics (lenses, lens arrangement (array), illumination or the like).
  • a large pixel can be formed additively from a plurality of small pixels, or can be multiply non-reactive Readable, large pixel limited aperture are read out several times to achieve smaller effective pixels.
  • the separately arranged pixels can be brought to local coverage via delay stages operating in synchrony with an object feed in the sensor electronics.
  • the pixels or picture elements according to the invention thus provide an image with locally different sized picture elements with uniform modulation in the case of locally homogeneous illumination. Advantages are therefore to be achieved according to the invention wherever images or objects with a basic optical resolution have zones of higher optical resolution, such as banknotes or identification papers with security features, printed matters with 1 D or 2D barcodes, materials with seams or welds and the like.
  • static or dynamic zones ie static or dynamic window-like regions or windows as regions of interest (ROI) of higher one-dimensional resolution for detecting line defects, for example in digital printing (nozzle calibration) or in laser-processed materials (eg battery foils) are further examples , Solar cells), static zones, ie in a field of view immovable windows (ROI), higher two-dimensional resolution for the targeted evaluation of more critical, mainly rectangular image sections, such as security features in ID cards or banknotes, address fields, 2D barcodes in printed matter, printed circuits or similar products, test structures on semiconductor wafers, in digital printing or in laser-processed materials (eg battery foils, solar cells), dynamic zones, ie movable or variably positionable windows (ROI) of higher resolution to the pendulum like, in oscillating motion or displacement of the windows, taking place inspection of all kinds of web material, comparable to a mechanically traversing camera or the use of a magnifying glass by a human observer, dynamic zones, ie higher resolution moving
  • the object is achieved in detail advantageously by a method for line-by-line image-sensing scanning of an object by means of an image sensor, the image sensor having a plurality of first charge-generating elements as first picture elements having a first element surface, with light remaining the same on the first picture elements Luminance, and on the basis of charges output by the image sensor, an image of the scanned object is generated including: dynamically controllable combining predetermined adjacent pixels to at least a second pixel having a larger pixel than the first pixel and a second one opposite to the second pixel first element surface forms larger element surface; and fully driving the at least one second picture element including the combined first picture elements and remaining first picture elements for equal sensitivity at the constant luminance and independent of the size of the first and second element surfaces, and optionally appropriate sensor and light source control
  • combining includes controlling by means of signals to control the size of a pixel.
  • pixels of size-independent sensitivity are combined and in a field generated by the image-enhancing scan, a positionally variable or positionally fixed region of interest of higher one-dimensional resolution is generated which provides an enlarged image section of the image produced by the scan of the object.
  • pixels with size-independent sensitivity are combined and are generated in one by the image-enhancing scan Image field generates a positionally variable or positionally fixed interesting region of higher two-dimensional resolution, which provides an enlarged image section of the image generated by the scanning of the object.
  • image-enhancing scan Image field generates a positionally variable or positionally fixed interesting region of higher two-dimensional resolution, which provides an enlarged image section of the image generated by the scanning of the object.
  • the merging captures at least a portion of a width of the image sensor and is performed within at least one of successive scan lines of the line-by-line scan.
  • first picture elements and / or second picture elements of different sizes locally overlap at least partially, for example completely or partially.
  • first picture elements and / or second picture elements of different size are spatially separated at different positions in the transport direction of the scanned object.
  • charge-generating photodiodes are preferably driven as the charge-generating elements and used as a charging capacitor.
  • a charge capacitance and / or an integrator is preferably matched to the current size of the pixel, whereby an associated charge capacitor can also be simultaneously controlled by means of the signals for controlling the size of a pixel.
  • predetermined first image elements which form elementary pixels and at the same time a parallel amplifier are connected to each of elementary pixels.
  • averaging is preferred performed, wherein the averaging second picture elements are formed by averaging of first picture elements.
  • the averaging is performed using a resistor network or by arrangements of switches and capacitors in the manner of sophisticated "switched capacitor” technology in filters and analog-to-digital converters or converters (ADCs; Analog Digital Converter).
  • averaging is preferably carried out, with second picture elements being formed by averaging from first picture elements during averaging.
  • the averaging is done by averaging in the digital domain, in which large pixels are formed by digital averaging of small pixels
  • a suitable combined control of sensor and light source is made to obtain in the transport direction independently of a respective element surface with constant luminance fully controllable pixels in which the light intensity is increased proportionally for lines with low pixel height and consequently low line time, so that all lines independently be acted upon by the current line duration with the same product of light flux and exposure time.
  • an analog averaging can be combined transversely to the transport direction with exposure and sensor control and subsequent locally variable summation in the transport direction.
  • pixels of size independent sensitivity are combined and a positionally varying or positionally fixed region of interest of higher two-dimensional resolution is generated in an image field generated by the image-obtaining scan, which provides an enlarged image section of the image generated by the scanning of the object.
  • a positionally varying or positionally fixed region of interest of higher two-dimensional resolution is generated in an image field generated by the image-obtaining scan, which provides an enlarged image section of the image generated by the scanning of the object.
  • FIG. 1 is a simplified sectional view of a contact image sensor usable for the line-by-line image scanning method of an object according to an embodiment
  • FIG. 2 is a fragmentary, exemplary illustration of an image obtained using the contact image sensor of FIG. 1 with a locally magnified image detail for closer inspection of details of the scanned object;
  • 3 shows a schematic representation of pixel arrangements of different sizes and in each case the same sensitivity
  • Fig. 4 is a view schematically illustrating a comparison of bandwidths required for various resolutions of a predetermined region of interest.
  • Fig. 5 is a schematic representation of an example of a combination of two or more methods for achieving a constant sensitivity.
  • the senor should be capable of multiplexing color images and have a low image lag (shadow effect of the previous image).
  • CMOS image sensors do not meet requirements e), f) and g).
  • conventional CMOS image sensors with active pixels and global shutter or shutter can certainly meet the requirements b) to i) when well designed.
  • common active pixels are equally sensitive in the sense described above because the charge and charge capacitance increase simultaneously with the pixel area.
  • these active pixels can not be combined in a conventional readout structure, so that in the following also only the above-mentioned brooding force approach remains.
  • Sub-sampling CMOS sensors are capable of satisfying requirement a), but not requirement c). As a result, dropped pixels that form blind spots or spots and interference noise occur.
  • FIG. 1 is a simplified sectional view of a contact image sensor (CIS) or contact image sensor 100 useful for the method of scanning an object line by line according to one embodiment.
  • CIS contact image sensor
  • the CIS 100 is preferably equipped with CMOS ICs, depending on the application, however, other sensors can be used, such as CCD elements.
  • CCD elements such as CCD elements.
  • the CIS 100 used by way of example in this embodiment may be of a single-line type, i. have a juxtaposition of multiple sensor chips or sensor ICs across its width, or be of a multicellular type, i. have across its width several rows of aligned sensor modules. These can be used as color lines in the manner of a trilinear or quadrilinear sensor, as a TDI (Time Delay and Integration) sensor with high sensitivity or for obtaining 3D images by means of locally structured illumination.
  • a sensor IC includes on one of its surfaces a predetermined number of elementary charge generating pixels, also referred to as pixels.
  • the CIS 100 shown in Fig. 1 may be basically constructed as follows using sensor ICs of the aforementioned type and arrangement.
  • a support frame 1 10 arranged to receive and / or support additional components of the CIS 100, and a light emitting diode or LED frame 120 arranged to Receiving and / or supporting a light source board 130, on which at least one light emitting diode 132 serving as a light source is electrically connected, each form a lower part and an upper part of a box-like outer structure of the CIS 100.
  • the support frame 110 is preferably formed as a one-piece profile with recesses for receiving the other components and extends upwardly tapering in the height direction.
  • the LED frame 120 is formed in this embodiment by two identical profile structures, which are each set on opposite sides of a tapered in the height direction extending portion of the support frame 1 10 that they form with this an object-side recess.
  • the light source board 130 with the at least one light emitting diode 132 mounted thereon is arranged on an inclined partial surface of each of the LED frame 120 forming the light emitted from the light emitting diode 132 through the object side recess to the outside and on a fall from the CIS 100 object to be scanned (not shown) and can be reflected there.
  • a rod-shaped lens 140 which may preferably be a self-focusing (SELFOC) and / or a graded index (GRIN) lens.
  • a sensor IC 160 which is arranged on a sensor board 150 and electrically connected.
  • the sensor board 150 is arranged on a lower portion of the support frame 110 and fixed to this, or connected thereto, which is opposite to the object-side recess.
  • a signal processing board 170 can additionally be fixed to the sensor board 150, electrically connected thereto and arranged for signal processing components that are not already integrated into the sensor IC 160 and / or at least one interface, for example one in CIS widespread CameraLinkO interface for controlling the CIS and for occurring data transfer.
  • Covers 180, 190 which may for example be made of glass, protect the interior of the CIS 100 from its surroundings.
  • the above briefly circumscribed and known as such CIS 100 is representative of commercially available line sensors. It should be understood that there is no limitation to this CIS 100 in terms of a number and arrangement of built-in light sources and / or sensor circuits, and / or configured rows of the CIS 100, but correspondingly application-related to the object sensing and imaging detection assembly modified or replaced by an alternative arrangement.
  • image sensor devices of the aforementioned kind are predominantly used to scan, record and process object objects or their surfaces and to provide an image of the object or its surface, or corresponding image data, for a closer examination, such as described above .
  • Common scenarios are, for example, a two-dimensional or two-dimensional detection by means of illuminating surface cameras, or a line-by-line detection by means of a fixed CIS 100, in which an object to be scanned is transported close to a CIS 100.
  • Line-by-line detection can also be carried out and evaluated one-dimensionally or, if the components involved are appropriately designed and controlled, in two dimensions.
  • FIG. 2 is a fragmentary, exemplary illustration of an image obtained using the CIS 100 of FIG. 1, with a locally magnified image detail for closer inspection of details of the scanned object.
  • the representation of an electronic circuit arrangement on a card or circuit board shown in FIG. 2, for example, can be generated by passing the card or circuit board past a detection area of the CIS 100.
  • the transport usually takes place synchronously with the control of the CIS 100, so that it can detect the object to be scanned without gaps.
  • the charge-generating elements of the sensor ICs in the line direction dynamically at least from (image) line to (image) line, ie in the width direction of the CIS 100, controlled such that at least one dynamic switching of the resolution of Line to line is achievable. If the resolution remains constant in the line, a line-by-line enlargement of the captured image can be displayed.
  • the charge-generating elements of the sensor ICs are dynamically controllable in the column direction as well (in the transport direction of the object) that a dynamic switching of the resolution over (image) lines in the transport direction of the object can be achieved, corresponding to a two-dimensionally locally variable one Resolution with which optionally an enlarged image section (region of interest or interest, ROI) can be generated.
  • An essential feature according to the invention is therefore a locally controllable enlargement (zoom) with which one or more windows of higher resolution than areas of interest (ROI) are optionally firmly anchored or movably implemented in an image field.
  • ROI areas of interest
  • the charge-generating photodiodes in the sensor ICs are used as a charging capacitor and thereby fully controlled independently of the pixel area at the same luminance, and / or the charge capacitance or the integrator on the Matched pixel size, wherein the signals to control the pixel size simultaneously control the charging capacitor, so that the pixels are fully controlled regardless of the pixel area at the same luminance, and / or (if there is a charge amplifier to each elementary pixel) elemental pixels connected in parallel and simultaneously Paralleling the elementary pixels to larger pixels and the charge amplifiers are switched so that the pixels are fully controlled regardless of the current pixel area at the same luminance, and / or large pixels by averaging out small pixels are generated, for example, by resistor networks, wherein all pixels are fully controlled independently of the pixel area at the same luminance.
  • Fig. 4 is a view schematically illustrating a comparison of bandwidths required for various resolutions of a predetermined region of interest.
  • the (video) bandwidth in megapixels is plotted along the ordinate, and four example cases and Comparative Examples A, B, C, and D are plotted along the abscissa for different dissolution scenarios, respectively.
  • the example cases A and B relate to a comparison with known resolution change, and the example cases C and D represent contrast, which can be achieved using the method according to the embodiment.
  • the bandwidth in example case B increases considerably compared to example case A, but in the example cases C and D it remains approximately on the bandwidth of example case A, ie. not or only slightly increases.
  • Table 1 illustrates this in conjunction with Fig. 3, which is a partial schematic representation of pixel arrays of different sizes and the same sensitivity, indicating each of the pixel array size in ⁇ , the total diode capacity, the quantum efficiency, the saturation level, the saturation charge and the saturation flux of electrons / photons in comparison to a base or useful pixel of size 1 ⁇ 1, a relationship between pixel arrangements (3 ⁇ 3 pixels vertically and horizontally, 3 ⁇ 1 pixels horizontally and 1 ⁇ 3 pixels vertically) and a resulting arithmetically each same saturation flux in photons per ⁇ 2 .
  • Size of diode quantum satur. Sttt. Saturation flow saturation flux ⁇ capacity yield level charge El./Phot. Phot./mm 2
  • Fig. 4 clearly shows, on the basis of the considerable differences, the effect according to the invention of an extraordinary reduction of the required bandwidth in the immediate vicinity of the bandwidth which is required anyway without a change in resolution.
  • the graph in Fig. 4 refers to the bandwidth needed to resolve a 1.27 cm x 1.27 cm (ROI) area of interest for a total image size of 20.32 cm by 30.48 cm ,
  • Example Case A refers to an unexpanded ROI at a resolution of 400 dpi.
  • the bandwidth required for this purpose is shown in FIG. 4 about 16 megapixels.
  • Example B refers to a fully magnified overall image at a resolution of 2400 dpi. The bandwidth required in this case increases compared to example case A to thirty-six times of over 500 megapixels.
  • Example C relates to a ROI at a resolution of 400, increased by one-dimensional dynamic line-to-line switching in only one direction, for example an x-direction with respect to the transport direction of the object (see Fig. 2) dpi.
  • the bandwidth required compared to example case A remains essentially unchanged or increases only insignificantly.
  • Example case D according to the present embodiment refers to a two-dimensional dynamic switching in the x-direction (transverse to the transport direction of the object) and in the y-direction (in the transport direction of the object) increased ROI at a resolution then switched to 2400 dpi resolution.
  • the bandwidth required compared to example case A remains essentially unchanged or increases only insignificantly.
  • FIG. 5 shows a schematic representation of an example of a combination of two or more methods for achieving a constant sensitivity based on an embodiment of a combination of analog averaging transversely to the transport direction with exposure and sensor control and subsequent locally variable summation in the transport direction.
  • pixels of size-independent sensitivity are combined and in a field generated by the image-acquiring scan, a positionally varying or positionally fixed region of interest of higher two-dimensional resolution is generated which provides an enlarged image section of the image produced by the scanning of the object.
  • suitable control of sensor and / or light source is advantageous for two-dimensional imaging.
  • a line scan may be replaced by a single CIS sensor by means of cameras scanning one or more area scan areas.
  • the foregoing has been a method for line-by-line image-sensing scanning of an object by means of an image sensor, wherein the image sensor has a plurality of first charge-generating elements as first picture elements having a first element area, on which first picture elements light of a constant luminance is incident, and on the basis of Image sensor output charges an image of the scanned object is generated described.
  • the method comprises a dynamically controllable combination of predetermined neighboring picture elements to at least one second picture element, which forms a larger picture element with respect to the first picture element with a second element surface larger with respect to the first element surface, and a full control of the at least one second picture element, which comprises the combined first picture elements and remaining first picture elements for equal sensitivity at the constant luminance and independent of the size of the first and the second element surface.
  • the method provides a constant sensitivity which results in bandwidth increasing only insignificantly when increasing Both small (unassembled) and large (combined) pixels are fully controlled at the same luminance, also with the aid of suitable sensor and light control.

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Facsimile Scanning Arrangements (AREA)

Abstract

L'invention concerne un procédé de balayage ligne par ligne d'un objet au moyen d'un capteur d'imagerie pour l'obtention d'une image, le capteur d'imagerie présentant une pluralité de premiers éléments produisant des charges en tant que premiers éléments d'imagerie comportant une première surface d'élément que la lumière atteint avec une luminance constante, et une image de l'objet balayé étant produite sur la base des charges émises par le capteur d'imagerie. Le procédé consiste à : assembler de manière commandable dynamiquement des éléments d'imagerie adjacents prédéterminés pour obtenir au moins un deuxième élément d'imagerie, qui forme un élément d'imagerie plus grand que le premier élément d'imagerie et présentant une deuxième surface d'élément plus grande que la première surface d'élément; régler entièrement le ou les deuxièmes éléments d'imagerie qui contiennent les premiers éléments d'imagerie assemblés et les premiers éléments d'imagerie restants à une sensibilité identique pour une luminance inchangée et indépendamment de la taille de la première et de la deuxième surface d'élément. Le procédé permet d'obtenir par le réglage complet à la fois de petits et de grands pixels pour la même luminance une sensibilité constante, qui produit, même lors d'un agrandissement d'un extrait de l'image, une région d'intérêt dans une largeur de bande n'augmentant qu'insensiblement.
EP17724732.7A 2016-02-07 2017-02-06 Procédé de balayage d'imagerie ligne par ligne Withdrawn EP3412024A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102016102110.5A DE102016102110A1 (de) 2016-02-07 2016-02-07 Verfahren zur zeilenweisen Bildabtastung
PCT/DE2017/100087 WO2017133736A2 (fr) 2016-02-07 2017-02-06 Procédé de balayage d'imagerie ligne par ligne

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EP3412024A2 true EP3412024A2 (fr) 2018-12-12

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EP17724732.7A Withdrawn EP3412024A2 (fr) 2016-02-07 2017-02-06 Procédé de balayage d'imagerie ligne par ligne

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EP (1) EP3412024A2 (fr)
DE (1) DE102016102110A1 (fr)
WO (1) WO2017133736A2 (fr)

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Publication number Priority date Publication date Assignee Title
CN113905185B (zh) * 2021-10-27 2023-10-31 锐芯微电子股份有限公司 图像处理方法和装置

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WO1999048281A1 (fr) * 1998-03-16 1999-09-23 California Institute Of Technology Capteur d'integration cmos comprenant un circuit totalement differentiel de lecture de colonnes aux fins d'imagerie adaptative a la lumiere
US7554067B2 (en) * 2001-05-07 2009-06-30 Panavision Imaging Llc Scanning imager employing multiple chips with staggered pixels
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DE102016102110A1 (de) 2017-08-10
WO2017133736A3 (fr) 2017-09-28
WO2017133736A2 (fr) 2017-08-10

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