EP3392902A4 - Ion analyzing apparatus - Google Patents

Ion analyzing apparatus Download PDF

Info

Publication number
EP3392902A4
EP3392902A4 EP15910743.2A EP15910743A EP3392902A4 EP 3392902 A4 EP3392902 A4 EP 3392902A4 EP 15910743 A EP15910743 A EP 15910743A EP 3392902 A4 EP3392902 A4 EP 3392902A4
Authority
EP
European Patent Office
Prior art keywords
analyzing apparatus
ion analyzing
ion
analyzing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP15910743.2A
Other languages
German (de)
French (fr)
Other versions
EP3392902A1 (en
Inventor
Wataru Fukui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of EP3392902A1 publication Critical patent/EP3392902A1/en
Publication of EP3392902A4 publication Critical patent/EP3392902A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H01J49/167—Capillaries and nozzles specially adapted therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
EP15910743.2A 2015-12-17 2015-12-17 Ion analyzing apparatus Withdrawn EP3392902A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2015/085409 WO2017104053A1 (en) 2015-12-17 2015-12-17 Ion analyzing apparatus

Publications (2)

Publication Number Publication Date
EP3392902A1 EP3392902A1 (en) 2018-10-24
EP3392902A4 true EP3392902A4 (en) 2018-12-26

Family

ID=59056225

Family Applications (1)

Application Number Title Priority Date Filing Date
EP15910743.2A Withdrawn EP3392902A4 (en) 2015-12-17 2015-12-17 Ion analyzing apparatus

Country Status (5)

Country Link
US (1) US10991565B2 (en)
EP (1) EP3392902A4 (en)
JP (1) JP6547843B2 (en)
CN (1) CN108475615A (en)
WO (1) WO2017104053A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6547843B2 (en) * 2015-12-17 2019-07-24 株式会社島津製作所 Ion analyzer
GB201808949D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
WO2023026355A1 (en) * 2021-08-24 2023-03-02 株式会社島津製作所 Ionization device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090045330A1 (en) * 2007-08-15 2009-02-19 Varian, Inc. Sample ionization at above-vacuum pressures
US20100090104A1 (en) * 2008-10-15 2010-04-15 Splendore Maurizio A Electro-dynamic or electro-static lens coupled to a stacked ring ion guide
US20130056633A1 (en) * 2010-04-19 2013-03-07 Yuichiro Hashimoto Mass spectrometer
US20130146759A1 (en) * 2010-02-26 2013-06-13 Zheng Ouyang Systems and methods for sample analysis
WO2013124364A1 (en) * 2012-02-21 2013-08-29 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Device for transferring ions from high to low pressure atmosphere, system and use

Family Cites Families (27)

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US2610300A (en) * 1951-08-07 1952-09-09 Wilson W Walton Flow control
US2775707A (en) * 1955-05-09 1956-12-25 Cons Electrodynamics Corp Heat compensating device
GB1092803A (en) * 1964-06-03 1967-11-29 Ass Elect Ind Improvements in or relating to mass spectrometers
JPS4816426B1 (en) 1968-07-13 1973-05-22
US4018241A (en) * 1974-09-23 1977-04-19 The Regents Of The University Of Colorado Method and inlet control system for controlling a gas flow sample to an evacuated chamber
US4201913A (en) * 1978-10-06 1980-05-06 Honeywell Inc. Sampling system for mass spectrometer
JPH02110859U (en) 1989-02-20 1990-09-05
JPH08166500A (en) 1994-12-15 1996-06-25 Nikon Corp Vacuum protector
EP1217643B1 (en) * 2000-12-15 2008-09-10 V & F Analyse- und Messtechnik G.m.b.H. Method and apparatus for the determination of the state of organisms and natural products and for the analysis of gaseous mixtures having main components and secondary components
US6622746B2 (en) * 2001-12-12 2003-09-23 Eastman Kodak Company Microfluidic system for controlled fluid mixing and delivery
US6568799B1 (en) * 2002-01-23 2003-05-27 Eastman Kodak Company Drop-on-demand ink jet printer with controlled fluid flow to effect drop ejection
FR2856046B1 (en) * 2003-06-16 2005-07-29 Biomerieux Sa FLUIDIC MICROVANNE WITH OPENING BY ELECTRICAL CONTROL
JP4643290B2 (en) 2005-01-31 2011-03-02 ジーエルサイエンス株式会社 Method and apparatus for controlling fluid with minute flow rate
US9024255B2 (en) * 2007-07-11 2015-05-05 Excellims Corporation Intelligently controlled spectrometer methods and apparatus
JP4816426B2 (en) 2006-11-22 2011-11-16 株式会社島津製作所 Mass spectrometer
EP1959242A3 (en) 2007-02-19 2009-01-07 Yamatake Corporation Flowmeter and flow control device
WO2009023361A2 (en) * 2007-06-01 2009-02-19 Purdue Research Foundation Discontinuous atmospheric pressure interface
WO2009031179A1 (en) * 2007-09-04 2009-03-12 Shimadzu Corporation Mass spectrometer
WO2010039512A1 (en) * 2008-09-30 2010-04-08 Advion Biosciences, Inc. Atmospheric pressure ionization (api) interface structures for a mass spectrometer
JP5497615B2 (en) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ Mass spectrometer
JP2013105737A (en) 2011-11-14 2013-05-30 Laser-Spectra Kk Microscopic laser mass spectrometer
JP6025406B2 (en) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ Mass spectrometer
JP6136773B2 (en) 2013-08-30 2017-05-31 株式会社島津製作所 Ionization probe
JP2015198014A (en) 2014-04-01 2015-11-09 株式会社島津製作所 Ion transport device, and mass spectrometer using the device
WO2015195607A1 (en) * 2014-06-16 2015-12-23 Purdue Research Foundation Systems and methods for analyzing a sample from a surface
FR3024436B1 (en) * 2014-07-30 2018-01-05 Safran Aircraft Engines SYSTEM AND METHOD FOR SPACE PROPULSION
JP6547843B2 (en) * 2015-12-17 2019-07-24 株式会社島津製作所 Ion analyzer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090045330A1 (en) * 2007-08-15 2009-02-19 Varian, Inc. Sample ionization at above-vacuum pressures
US20100090104A1 (en) * 2008-10-15 2010-04-15 Splendore Maurizio A Electro-dynamic or electro-static lens coupled to a stacked ring ion guide
US20130146759A1 (en) * 2010-02-26 2013-06-13 Zheng Ouyang Systems and methods for sample analysis
US20130056633A1 (en) * 2010-04-19 2013-03-07 Yuichiro Hashimoto Mass spectrometer
WO2013124364A1 (en) * 2012-02-21 2013-08-29 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Device for transferring ions from high to low pressure atmosphere, system and use

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
"Buidling Scientific Apparatus - A practical Guide to Design and Construction", 1 January 2009, CAMBRIDGE UNIVERSITY PRESS, New York, ISBN: 978-0-521-87858-6, article JOHN H MOORE ET AL: "3.2.1. Conductance Formulae", pages: 98, XP055523932 *
See also references of WO2017104053A1 *

Also Published As

Publication number Publication date
JPWO2017104053A1 (en) 2018-08-02
US20180374694A1 (en) 2018-12-27
JP6547843B2 (en) 2019-07-24
CN108475615A (en) 2018-08-31
EP3392902A1 (en) 2018-10-24
US10991565B2 (en) 2021-04-27
WO2017104053A1 (en) 2017-06-22

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