EP3198603A4 - Magnetic field-assisted memory operation - Google Patents

Magnetic field-assisted memory operation Download PDF

Info

Publication number
EP3198603A4
EP3198603A4 EP15843190.8A EP15843190A EP3198603A4 EP 3198603 A4 EP3198603 A4 EP 3198603A4 EP 15843190 A EP15843190 A EP 15843190A EP 3198603 A4 EP3198603 A4 EP 3198603A4
Authority
EP
European Patent Office
Prior art keywords
magnetic field
memory operation
assisted memory
assisted
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP15843190.8A
Other languages
German (de)
French (fr)
Other versions
EP3198603B1 (en
EP3198603A1 (en
Inventor
Helia Naeimi
Shih-Lien L. LU
Shigeki Tomishima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of EP3198603A1 publication Critical patent/EP3198603A1/en
Publication of EP3198603A4 publication Critical patent/EP3198603A4/en
Application granted granted Critical
Publication of EP3198603B1 publication Critical patent/EP3198603B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1675Writing or programming circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1653Address circuits or decoders
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1659Cell access
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1673Reading or sensing circuits or methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
EP15843190.8A 2014-09-26 2015-08-26 Magnetic field-assisted memory operation Active EP3198603B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/499,067 US9747967B2 (en) 2014-09-26 2014-09-26 Magnetic field-assisted memory operation
PCT/US2015/047014 WO2016048560A1 (en) 2014-09-26 2015-08-26 Magnetic field-assisted memory operation

Publications (3)

Publication Number Publication Date
EP3198603A1 EP3198603A1 (en) 2017-08-02
EP3198603A4 true EP3198603A4 (en) 2018-05-30
EP3198603B1 EP3198603B1 (en) 2019-07-31

Family

ID=55581770

Family Applications (1)

Application Number Title Priority Date Filing Date
EP15843190.8A Active EP3198603B1 (en) 2014-09-26 2015-08-26 Magnetic field-assisted memory operation

Country Status (7)

Country Link
US (2) US9747967B2 (en)
EP (1) EP3198603B1 (en)
JP (1) JP6330970B2 (en)
KR (1) KR102240162B1 (en)
CN (1) CN106605268B (en)
TW (1) TWI592928B (en)
WO (1) WO2016048560A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9666257B2 (en) * 2015-04-24 2017-05-30 Intel Corporation Bitcell state retention
US10600477B2 (en) * 2018-04-23 2020-03-24 Arm Limited Coupling compensation circuitry
US10573364B1 (en) * 2018-12-13 2020-02-25 Nxp Usa, Inc. Magnetic disturb diagnostic system for MRAM
JP2020149748A (en) 2019-03-14 2020-09-17 キオクシア株式会社 Reliability evaluation device
US20220108158A1 (en) * 2020-10-02 2022-04-07 Sandisk Technologies Llc Ultralow power inference engine with external magnetic field programming assistance
CN112835522A (en) * 2021-02-02 2021-05-25 致真存储(北京)科技有限公司 Video data access device and method based on nonvolatile memory
CN113672053A (en) * 2021-08-23 2021-11-19 浙江大学 Editable readable and writable data memory based on mechanical structure
US20230297283A1 (en) * 2022-03-21 2023-09-21 Everspin Technologies, Inc. Persistent xspi stt-mram with optional erase operation

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080247098A1 (en) * 2007-03-09 2008-10-09 Nve Corporation Stressed magnetoresistive tamper detection devices
US20140119106A1 (en) * 2012-10-25 2014-05-01 Samsung Electronics Co., Ltd. Magnetic memory devices and methods of operating the same

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5732016A (en) 1996-07-02 1998-03-24 Motorola Memory cell structure in a magnetic random access memory and a method for fabricating thereof
IL132499A0 (en) 1999-10-21 2001-03-19 Advanced Coding Systems Ltd A security system for protecting various items and a method for reading a code pattern
US7005733B2 (en) 1999-12-30 2006-02-28 Koemmerling Oliver Anti tamper encapsulation for an integrated circuit
US6785092B2 (en) * 2001-07-24 2004-08-31 Seagate Technology Llc White head for high anisotropy media
US7159120B2 (en) 2001-11-19 2007-01-02 Good Technology, Inc. Method and system for protecting data within portable electronic devices
DE60311846T2 (en) * 2002-10-03 2007-10-18 Koninklijke Philips Electronics N.V. STORAGE SYSTEM WITH AN ELECTROMAGNETIC ARRAY
TWI330845B (en) 2002-12-18 2010-09-21 Nxp Bv Method and device for protection of an mram device against tampering
US7072209B2 (en) * 2003-12-29 2006-07-04 Micron Technology, Inc. Magnetic memory having synthetic antiferromagnetic pinned layer
US7164611B2 (en) 2004-10-26 2007-01-16 Micron Technology, Inc. Data retention kill function
KR100604913B1 (en) 2004-10-28 2006-07-28 삼성전자주식회사 Magnetoresistive RAM having multi-bit cell array configuration
DE602004024322D1 (en) 2004-12-15 2010-01-07 St Microelectronics Res & Dev Device for the detection of computer users
JP5193419B2 (en) * 2005-10-28 2013-05-08 株式会社東芝 Spin injection magnetic random access memory and writing method thereof
US7577017B2 (en) * 2006-01-20 2009-08-18 Industrial Technology Research Institute High-bandwidth magnetoresistive random access memory devices and methods of operation thereof
GB2442023B (en) 2006-09-13 2011-03-02 Advanced Risc Mach Ltd Memory access security management
US7877563B2 (en) 2006-12-07 2011-01-25 International Business Machines Corporation Programmable memory device security
US7873803B2 (en) 2007-09-25 2011-01-18 Sandisk Corporation Nonvolatile memory with self recovery
US8041912B2 (en) 2007-09-28 2011-10-18 Macronix International Co., Ltd. Memory devices with data protection
US7577020B2 (en) * 2007-10-01 2009-08-18 Shine Chung System and method for reading multiple magnetic tunnel junctions with a single select transistor
US8659852B2 (en) * 2008-04-21 2014-02-25 Seagate Technology Llc Write-once magentic junction memory array
US8315876B2 (en) 2008-05-09 2012-11-20 Plantronics, Inc. Headset wearer identity authentication with voice print or speech recognition
US8522354B2 (en) 2008-05-24 2013-08-27 Via Technologies, Inc. Microprocessor apparatus for secure on-die real-time clock
US9519772B2 (en) 2008-11-26 2016-12-13 Free Stream Media Corp. Relevancy improvement through targeting of information based on data gathered from a networked device associated with a security sandbox of a client device
US7581326B1 (en) 2008-12-31 2009-09-01 Lockheed Martin Corporation Optical solid-state heading sensor
US9092649B2 (en) 2009-03-02 2015-07-28 Macronix International Co., Ltd. Data protecting method capable of effectively recording protection information and memory using thereof
US8239663B2 (en) 2009-05-30 2012-08-07 Lsi Corporation System and method for maintaining the security of memory contents and computer architecture employing the same
EP2270708A1 (en) 2009-06-29 2011-01-05 Thomson Licensing Data security in solid state memory
JP5688081B2 (en) * 2009-07-10 2015-03-25 シーゲイト テクノロジー エルエルシー Nonvolatile memory array having resistance sensing elements for block erase and unidirectional writing
US8837209B2 (en) * 2010-03-05 2014-09-16 Hitachi, Ltd. Magnetic memory cell and magnetic random access memory
JP2012238811A (en) 2011-05-13 2012-12-06 Toshiba Corp Semiconductor non-volatile memory device and method of manufacturing the same
US8732195B2 (en) 2012-06-13 2014-05-20 Opus Deli, Inc. Multi-media management, streaming, and electronic commerce techniques implemented over a computer network
US8638596B2 (en) 2011-07-25 2014-01-28 Qualcomm Incorporated Non-volatile memory saving cell information in a non-volatile memory array
JP5814680B2 (en) * 2011-07-29 2015-11-17 株式会社東芝 Magnetoresistive element and magnetic memory
TWI451248B (en) 2012-01-13 2014-09-01 Phison Electronics Corp Data protecting method, memory controller and memory storage apparatus
US8854870B2 (en) 2012-03-13 2014-10-07 Honeywell International Inc. Magnetoresistive random access memory (MRAM) die including an integrated magnetic security structure
WO2013147831A1 (en) 2012-03-30 2013-10-03 Intel Corporation Spin transfer torque based memory elements for programmable device arrays
WO2013154564A1 (en) 2012-04-12 2013-10-17 Intel Corporation Selector for low voltage embedded memory
US8467770B1 (en) 2012-08-21 2013-06-18 Mourad Ben Ayed System for securing a mobile terminal
US9131381B1 (en) 2012-10-26 2015-09-08 Facebook, Inc. Mobile device auto wipe
US9214212B2 (en) * 2012-12-03 2015-12-15 Taiwan Semiconductor Manufacturing Company, Ltd. Magnetic tunnel junction memory device
EP2741295B1 (en) 2012-12-04 2016-03-02 Imec Spin transfer torque magnetic memory device
US9166150B2 (en) 2012-12-21 2015-10-20 Intel Corporation Electric field enhanced spin transfer torque memory (STTM) device
US20150071432A1 (en) * 2013-09-09 2015-03-12 Qualcomm Incorporated Physically unclonable function based on resistivity of magnetoresistive random-access memory magnetic tunnel junctions

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080247098A1 (en) * 2007-03-09 2008-10-09 Nve Corporation Stressed magnetoresistive tamper detection devices
US20140119106A1 (en) * 2012-10-25 2014-05-01 Samsung Electronics Co., Ltd. Magnetic memory devices and methods of operating the same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2016048560A1 *

Also Published As

Publication number Publication date
KR20170033383A (en) 2017-03-24
US20160093355A1 (en) 2016-03-31
JP2017535907A (en) 2017-11-30
JP6330970B2 (en) 2018-05-30
US20180025764A1 (en) 2018-01-25
CN106605268B (en) 2020-09-11
TW201626380A (en) 2016-07-16
WO2016048560A1 (en) 2016-03-31
EP3198603B1 (en) 2019-07-31
TWI592928B (en) 2017-07-21
US9747967B2 (en) 2017-08-29
KR102240162B1 (en) 2021-04-14
EP3198603A1 (en) 2017-08-02
CN106605268A (en) 2017-04-26

Similar Documents

Publication Publication Date Title
EP3297049A4 (en) Magnetic memory device
EP3213537A4 (en) Pushing information
EP3238101A4 (en) Graph operations
EP3193600A4 (en) Smyd inhibitors
EP3167448A4 (en) Comparison operations in memory
EP3116503A4 (en) Hptp-beta inhibitors
EP3107415A4 (en) Magnetic latch
EP3164777A4 (en) Memory card
EP3182414A4 (en) Memory circuit
EP3161577A4 (en) Memory card
EP3110747A4 (en) Magnetic elements for processing fluids
EP3198603A4 (en) Magnetic field-assisted memory operation
EP3125259A4 (en) Magnetic element
EP3171375A4 (en) Coil device
EP3097508A4 (en) Online data transformation
EP3102894A4 (en) Heat-pump system
EP3199965A4 (en) Magnetic sensor
EP3173806A4 (en) Magnetic sensor
EP3270741A4 (en) Smart pillow
EP3239995A4 (en) Solenoid
EP3178051A4 (en) Information operation
EP3198471A4 (en) Media organization
EP3198717A4 (en) Magnetic haptic system
EP3213751A4 (en) Phacosclerosis inhibitor
EP3152765A4 (en) Serial magnetic logic unit architecture

Legal Events

Date Code Title Description
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE

PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE

17P Request for examination filed

Effective date: 20170223

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

DAV Request for validation of the european patent (deleted)
DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20180502

RIC1 Information provided on ipc code assigned before grant

Ipc: G11C 11/16 20060101AFI20180424BHEP

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: GRANT OF PATENT IS INTENDED

INTG Intention to grant announced

Effective date: 20190308

RIN1 Information on inventor provided before grant (corrected)

Inventor name: NAEIMI, HELIA

Inventor name: LU, SHIH-LIEN L.

Inventor name: TOMISHIMA, SHIGEKI

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE PATENT HAS BEEN GRANTED

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

Ref country code: GB

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 602015034972

Country of ref document: DE

REG Reference to a national code

Ref country code: AT

Ref legal event code: REF

Ref document number: 1161771

Country of ref document: AT

Kind code of ref document: T

Effective date: 20190815

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: NL

Ref legal event code: FP

REG Reference to a national code

Ref country code: LT

Ref legal event code: MG4D

REG Reference to a national code

Ref country code: AT

Ref legal event code: MK05

Ref document number: 1161771

Country of ref document: AT

Kind code of ref document: T

Effective date: 20190731

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191031

Ref country code: HR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191202

Ref country code: LT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: AT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191031

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: LV

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: AL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191101

Ref country code: RS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: PL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: IT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200224

Ref country code: MC

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190831

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190831

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190826

Ref country code: SM

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

REG Reference to a national code

Ref country code: BE

Ref legal event code: MM

Effective date: 20190831

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 602015034972

Country of ref document: DE

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PG2D Information on lapse in contracting state deleted

Ref country code: IS

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190826

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191030

26N No opposition filed

Effective date: 20200603

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190831

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 20200814

Year of fee payment: 6

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190930

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20200819

Year of fee payment: 6

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HU

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT; INVALID AB INITIO

Effective date: 20150826

Ref country code: MT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

REG Reference to a national code

Ref country code: NL

Ref legal event code: MM

Effective date: 20210901

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20210826

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20210901

Ref country code: MK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190731

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20210826

REG Reference to a national code

Ref country code: DE

Ref legal event code: R081

Ref document number: 602015034972

Country of ref document: DE

Owner name: TAHOE RESEARCH, LTD., IE

Free format text: FORMER OWNER: INTEL CORPORATION, SANTA CLARA, CALIF., US

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20230821

Year of fee payment: 9