EP2825858A4 - Schnelle spektroskopische messung polarimetrischer parameter - Google Patents

Schnelle spektroskopische messung polarimetrischer parameter

Info

Publication number
EP2825858A4
EP2825858A4 EP13760626.5A EP13760626A EP2825858A4 EP 2825858 A4 EP2825858 A4 EP 2825858A4 EP 13760626 A EP13760626 A EP 13760626A EP 2825858 A4 EP2825858 A4 EP 2825858A4
Authority
EP
European Patent Office
Prior art keywords
polarimetric parameters
measure
rapid spectroscopic
rapid
spectroscopic measure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP13760626.5A
Other languages
English (en)
French (fr)
Other versions
EP2825858A1 (de
Inventor
Baoliang Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hinds Instruments Inc
Original Assignee
Hinds Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hinds Instruments Inc filed Critical Hinds Instruments Inc
Publication of EP2825858A1 publication Critical patent/EP2825858A1/de
Publication of EP2825858A4 publication Critical patent/EP2825858A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/19—Dichroism
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
EP13760626.5A 2012-03-15 2013-03-01 Schnelle spektroskopische messung polarimetrischer parameter Withdrawn EP2825858A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261611072P 2012-03-15 2012-03-15
PCT/US2013/028586 WO2013138090A1 (en) 2012-03-15 2013-03-01 Rapid spectroscopic measure of polarimetric parameters

Publications (2)

Publication Number Publication Date
EP2825858A1 EP2825858A1 (de) 2015-01-21
EP2825858A4 true EP2825858A4 (de) 2015-11-18

Family

ID=49161661

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13760626.5A Withdrawn EP2825858A4 (de) 2012-03-15 2013-03-01 Schnelle spektroskopische messung polarimetrischer parameter

Country Status (2)

Country Link
EP (1) EP2825858A4 (de)
WO (1) WO2013138090A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014189967A2 (en) 2013-05-23 2014-11-27 Hinds Instruments, Inc. Polarization properties imaging systems
GB201411478D0 (en) 2014-06-27 2014-08-13 Univ Salford Entpr Ltd Measuring polarisation
US10436644B2 (en) 2015-10-06 2019-10-08 Hinds Instruments, Inc. Mitigating meniscus effects in vertically oriented circular dichroism spectrometery

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2529338A1 (fr) * 1982-06-29 1983-12-30 Akad Wissenschaften Ddr Procede et montage pour mesurer le dichroisme circulaire
US20010007496A1 (en) * 1998-07-27 2001-07-12 Ljl Biosystems, Inc. Apparatus and methods for spectroscopic measurements
US20050134849A1 (en) * 2003-02-03 2005-06-23 Beaglehole Instruments Ltd Method of performing optical measurement on a sample
JP2009109439A (ja) * 2007-10-31 2009-05-21 Chiba Univ 振動円偏光二色性分光光度計、それに用いられるアタッチメント及びサンプル保持機構
US20110063617A1 (en) * 2008-04-04 2011-03-17 Hiromi Takahashi Method and Device for Measuring Circular Dichroism Spectra

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5877859A (en) * 1996-07-24 1999-03-02 Therma-Wave, Inc. Broadband spectroscopic rotating compensator ellipsometer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2529338A1 (fr) * 1982-06-29 1983-12-30 Akad Wissenschaften Ddr Procede et montage pour mesurer le dichroisme circulaire
US20010007496A1 (en) * 1998-07-27 2001-07-12 Ljl Biosystems, Inc. Apparatus and methods for spectroscopic measurements
US20050134849A1 (en) * 2003-02-03 2005-06-23 Beaglehole Instruments Ltd Method of performing optical measurement on a sample
JP2009109439A (ja) * 2007-10-31 2009-05-21 Chiba Univ 振動円偏光二色性分光光度計、それに用いられるアタッチメント及びサンプル保持機構
US20110063617A1 (en) * 2008-04-04 2011-03-17 Hiromi Takahashi Method and Device for Measuring Circular Dichroism Spectra

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ANDERT K: "AN INSTRUMENT FOR MEASURING CIRCULAR DICHROISM SIMULTANEOUSLY AT ALL WAVELENGTHS IN A LIMITED SPECTRAL RANGE", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 62, no. 8, 1 August 1991 (1991-08-01), pages 1912 - 1915, XP000260769, ISSN: 0034-6748, DOI: 10.1063/1.1142391 *
See also references of WO2013138090A1 *

Also Published As

Publication number Publication date
EP2825858A1 (de) 2015-01-21
WO2013138090A1 (en) 2013-09-19

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