EP2777066A4 - Wärmestabile optische sensorhalterung - Google Patents
Wärmestabile optische sensorhalterungInfo
- Publication number
- EP2777066A4 EP2777066A4 EP12848391.4A EP12848391A EP2777066A4 EP 2777066 A4 EP2777066 A4 EP 2777066A4 EP 12848391 A EP12848391 A EP 12848391A EP 2777066 A4 EP2777066 A4 EP 2777066A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- support
- optical sensor
- thermally stable
- stable optical
- thermally
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
- G01D5/34746—Linear encoders
- G01D5/34753—Carriages; Driving or coupling means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70258—Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D2205/00—Indexing scheme relating to details of means for transferring or converting the output of a sensing member
- G01D2205/90—Two-dimensional encoders, i.e. having one or two codes extending in two directions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Public Health (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Optical Transform (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161557609P | 2011-11-09 | 2011-11-09 | |
| PCT/US2012/064223 WO2013070965A1 (en) | 2011-11-09 | 2012-11-08 | Thermally stable optical sensor mount |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP2777066A1 EP2777066A1 (de) | 2014-09-17 |
| EP2777066A4 true EP2777066A4 (de) | 2015-10-07 |
| EP2777066B1 EP2777066B1 (de) | 2019-01-09 |
Family
ID=48290564
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP12848391.4A Active EP2777066B1 (de) | 2011-11-09 | 2012-11-08 | Wärmestabile optische sensorhalterung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9200892B2 (de) |
| EP (1) | EP2777066B1 (de) |
| JP (1) | JP5922788B2 (de) |
| TW (1) | TWI467126B (de) |
| WO (1) | WO2013070965A1 (de) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6730197B2 (ja) * | 2014-05-14 | 2020-07-29 | カール・ツァイス・エスエムティー・ゲーエムベーハー | ニアフィールドマニピュレータを有する投影露光装置 |
| US10211589B2 (en) | 2015-04-20 | 2019-02-19 | Mitsubishi Electric Corporation | Laser apparatus and extreme ultraviolet light generation apparatus |
| US10866531B2 (en) | 2016-10-04 | 2020-12-15 | Asml Netherlands B.V. | Athermalization of an alignment system |
| DE102016219333A1 (de) * | 2016-10-06 | 2018-04-12 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsanlage für die Halbleiterlithographie mit erhöhter thermischer Robustheit |
| WO2024061736A1 (en) * | 2022-09-23 | 2024-03-28 | Asml Netherlands B.V. | Positioning system for an optical element of a metrology apparatus |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050225768A1 (en) * | 2004-02-11 | 2005-10-13 | Belt Robert T | Flexured athermalized pseudokinematic mount |
| EP2006740A1 (de) * | 2007-06-21 | 2008-12-24 | ASML Netherlands B.V. | Steuerungssystem, lithografisches Projektionsgerät, Verfahren zur Steuerung einer Stützstruktur und Computerprogramm |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3219349B2 (ja) | 1993-06-30 | 2001-10-15 | キヤノン株式会社 | 波長コンペンセータ、該波長コンペンセータを用いたレーザ干渉測定装置、該レーザ干渉測定装置を有するステージ装置、該ステージ装置を有する露光システム、および該露光システムを用いたデバイスの製造方法 |
| US6884707B1 (en) | 2000-09-08 | 2005-04-26 | Gabe Cherian | Interconnections |
| US7025498B2 (en) * | 2003-05-30 | 2006-04-11 | Asml Holding N.V. | System and method of measuring thermal expansion |
| US7126674B2 (en) * | 2004-06-14 | 2006-10-24 | Asml Netherlands B.V. | Positioning device and device manufacturing method |
| US7755742B2 (en) * | 2005-10-11 | 2010-07-13 | Asml Netherlands B.V. | Lithographic apparatus with mounted sensor |
| EP2082118B1 (de) * | 2006-09-08 | 2015-10-07 | GSI Group Corporation | Interferometrischer optischer positionskodierer mit räumlicher filterung von beugungsordnungen für verbesserte genauigkeit |
| KR101538245B1 (ko) | 2007-07-18 | 2015-07-20 | 가부시키가이샤 니콘 | 계측 방법, 스테이지 장치, 및 노광 장치 |
| US8080791B2 (en) | 2008-12-12 | 2011-12-20 | Fei Company | X-ray detector for electron microscope |
| EP3006902B1 (de) | 2010-03-30 | 2018-04-11 | Zygo Corporation | Lithografieverfahren und lithografiesystem |
-
2012
- 2012-11-08 WO PCT/US2012/064223 patent/WO2013070965A1/en not_active Ceased
- 2012-11-08 TW TW101141504A patent/TWI467126B/zh active
- 2012-11-08 US US13/672,544 patent/US9200892B2/en active Active
- 2012-11-08 JP JP2014541273A patent/JP5922788B2/ja active Active
- 2012-11-08 EP EP12848391.4A patent/EP2777066B1/de active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050225768A1 (en) * | 2004-02-11 | 2005-10-13 | Belt Robert T | Flexured athermalized pseudokinematic mount |
| EP2006740A1 (de) * | 2007-06-21 | 2008-12-24 | ASML Netherlands B.V. | Steuerungssystem, lithografisches Projektionsgerät, Verfahren zur Steuerung einer Stützstruktur und Computerprogramm |
Non-Patent Citations (1)
| Title |
|---|
| See also references of WO2013070965A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| US9200892B2 (en) | 2015-12-01 |
| JP5922788B2 (ja) | 2016-05-24 |
| TWI467126B (zh) | 2015-01-01 |
| JP2014534449A (ja) | 2014-12-18 |
| WO2013070965A1 (en) | 2013-05-16 |
| US20130128254A1 (en) | 2013-05-23 |
| TW201335567A (zh) | 2013-09-01 |
| EP2777066A1 (de) | 2014-09-17 |
| EP2777066B1 (de) | 2019-01-09 |
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