EP2764374A4 - Procédé et appareil de mesure des performances d'un dispositif électronique - Google Patents

Procédé et appareil de mesure des performances d'un dispositif électronique

Info

Publication number
EP2764374A4
EP2764374A4 EP12839036.6A EP12839036A EP2764374A4 EP 2764374 A4 EP2764374 A4 EP 2764374A4 EP 12839036 A EP12839036 A EP 12839036A EP 2764374 A4 EP2764374 A4 EP 2764374A4
Authority
EP
European Patent Office
Prior art keywords
electronic device
measuring performance
measuring
performance
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP12839036.6A
Other languages
German (de)
English (en)
Other versions
EP2764374B1 (fr
EP2764374A1 (fr
Inventor
Jung Min Kim
Keon Young Seo
Kwang Mo Yang
Byeong Hwan Kang
Bong Hee Park
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of EP2764374A1 publication Critical patent/EP2764374A1/fr
Publication of EP2764374A4 publication Critical patent/EP2764374A4/fr
Application granted granted Critical
Publication of EP2764374B1 publication Critical patent/EP2764374B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
EP12839036.6A 2011-10-04 2012-10-04 Procédé et appareil de mesure des performances d'un dispositif électronique Active EP2764374B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20110100801 2011-10-04
PCT/KR2012/008032 WO2013051852A1 (fr) 2011-10-04 2012-10-04 Procédé et appareil de mesure des performances d'un dispositif électronique

Publications (3)

Publication Number Publication Date
EP2764374A1 EP2764374A1 (fr) 2014-08-13
EP2764374A4 true EP2764374A4 (fr) 2015-07-01
EP2764374B1 EP2764374B1 (fr) 2021-01-27

Family

ID=47991966

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12839036.6A Active EP2764374B1 (fr) 2011-10-04 2012-10-04 Procédé et appareil de mesure des performances d'un dispositif électronique

Country Status (5)

Country Link
US (1) US9091716B2 (fr)
EP (1) EP2764374B1 (fr)
KR (1) KR102045968B1 (fr)
CN (1) CN103842834B (fr)
WO (1) WO2013051852A1 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20130087150A (ko) * 2012-01-27 2013-08-06 한국전자통신연구원 반도체 칩의 ｅｍｃ 측정용 지그 및 이를 이용한 반도체 칩의 ｅｍｃ 측정 방법
US9851386B2 (en) * 2012-03-02 2017-12-26 Nokomis, Inc. Method and apparatus for detection and identification of counterfeit and substandard electronics
US9642014B2 (en) 2014-06-09 2017-05-02 Nokomis, Inc. Non-contact electromagnetic illuminated detection of part anomalies for cyber physical security
US10395032B2 (en) 2014-10-03 2019-08-27 Nokomis, Inc. Detection of malicious software, firmware, IP cores and circuitry via unintended emissions
CN105182126B (zh) * 2015-09-08 2020-01-24 中国电力科学研究院 一种改进型配电变压器能效计量检测方法
US10372587B1 (en) * 2015-11-09 2019-08-06 The United States Of America As Represented By Secretary Of The Navy Electronic device monitoring using induced electromagnetic emissions from software stress techniques
US20170245361A1 (en) * 2016-01-06 2017-08-24 Nokomis, Inc. Electronic device and methods to customize electronic device electromagnetic emissions
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
US11069952B2 (en) * 2017-04-26 2021-07-20 Nokomis, Inc. Electronics card insitu testing apparatus and method utilizing unintended RF emission features
US10685950B2 (en) * 2017-06-29 2020-06-16 Taiwan Semiconductor Manufacturing Co., Ltd. Photomask design for generating plasmonic effect
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2403554A (en) * 2003-06-30 2005-01-05 Roke Manor Research Method and apparatus for measuring electromagnetic emissions
US20100123453A1 (en) * 2008-11-19 2010-05-20 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
JP3006383B2 (ja) * 1993-05-24 2000-02-07 日本電気株式会社 電波耐性試験装置および電波耐性評価方法および電波照射部
JP3552722B2 (ja) * 1995-03-27 2004-08-11 日立電子サービス株式会社 ノイズ検知記録装置
JPH08297148A (ja) * 1995-04-26 1996-11-12 Mitsubishi Electric Corp 放射計
JP3366840B2 (ja) * 1997-09-05 2003-01-14 分析機器校正協同組合 機器の精度管理方法及び装置
WO2003012465A1 (fr) 2001-07-27 2003-02-13 Advantest Corporation Appareil de mesure d'ondes electromagnetiques
KR100456075B1 (ko) * 2001-12-28 2004-11-06 한국전자통신연구원 Ｇｔｅｍ 셀을 이용한 자유 공간에서의 전자파 복사 패턴측정 방법 및 그 시스템
JP4481578B2 (ja) * 2003-02-28 2010-06-16 パナソニック株式会社 電磁波測定装置およびその方法
KR20060014820A (ko) * 2004-08-12 2006-02-16 주식회사 팬택 최적의 측정 위치 판별 기능을 가지는 전자파 측정 시스템및 그 방법
US7541818B2 (en) * 2005-07-07 2009-06-02 Panasonic Corporation Method and apparatus of electromagnetic measurement
KR20070082504A (ko) * 2006-02-15 2007-08-21 삼성전자주식회사 신호 품질 평가 장치 및 방법과 광 디스크 구동기

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2403554A (en) * 2003-06-30 2005-01-05 Roke Manor Research Method and apparatus for measuring electromagnetic emissions
US20100123453A1 (en) * 2008-11-19 2010-05-20 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
KELLER C ET AL: "Fast Emission Measurement in Time Domain", IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, IEEE SERVICE CENTER, NEW YORK, NY, US, vol. 49, no. 4, 1 November 2007 (2007-11-01), pages 816 - 824, XP011196810, ISSN: 0018-9375, DOI: 10.1109/TEMC.2007.908282 *
See also references of WO2013051852A1 *

Also Published As

Publication number Publication date
US9091716B2 (en) 2015-07-28
WO2013051852A1 (fr) 2013-04-11
KR102045968B1 (ko) 2019-11-18
KR20130036728A (ko) 2013-04-12
CN103842834B (zh) 2016-10-12
US20130082717A1 (en) 2013-04-04
EP2764374B1 (fr) 2021-01-27
CN103842834A (zh) 2014-06-04
EP2764374A1 (fr) 2014-08-13

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