EP2726640A1 - A method for producing a neutron detector component comprising a boron carbide layer for use in a neutron detecting device - Google Patents
A method for producing a neutron detector component comprising a boron carbide layer for use in a neutron detecting deviceInfo
- Publication number
- EP2726640A1 EP2726640A1 EP11868729.2A EP11868729A EP2726640A1 EP 2726640 A1 EP2726640 A1 EP 2726640A1 EP 11868729 A EP11868729 A EP 11868729A EP 2726640 A1 EP2726640 A1 EP 2726640A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- neutron
- transparent substrate
- boron carbide
- carbide layer
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910052580 B4C Inorganic materials 0.000 title claims abstract description 107
- INAHAJYZKVIDIZ-UHFFFAOYSA-N boron carbide Chemical compound B12B3B4C32B41 INAHAJYZKVIDIZ-UHFFFAOYSA-N 0.000 title claims abstract description 99
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 238000000576 coating method Methods 0.000 claims abstract description 123
- 239000011248 coating agent Substances 0.000 claims abstract description 118
- 239000000758 substrate Substances 0.000 claims abstract description 113
- 238000000034 method Methods 0.000 claims abstract description 65
- ZOXJGFHDIHLPTG-BJUDXGSMSA-N Boron-10 Chemical compound [10B] ZOXJGFHDIHLPTG-BJUDXGSMSA-N 0.000 claims abstract description 29
- 239000000463 material Substances 0.000 claims abstract description 27
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 26
- 238000005240 physical vapour deposition Methods 0.000 claims abstract description 20
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 5
- 238000010438 heat treatment Methods 0.000 claims description 51
- 239000000356 contaminant Substances 0.000 claims description 41
- 238000001514 detection method Methods 0.000 claims description 18
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 9
- 229910052782 aluminium Inorganic materials 0.000 claims description 9
- 230000008018 melting Effects 0.000 claims description 8
- 238000002844 melting Methods 0.000 claims description 8
- 238000007872 degassing Methods 0.000 claims description 6
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 6
- 230000005855 radiation Effects 0.000 claims description 5
- 229910000838 Al alloy Inorganic materials 0.000 claims description 4
- 238000010894 electron beam technology Methods 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 108
- 239000007789 gas Substances 0.000 description 12
- 238000000151 deposition Methods 0.000 description 11
- 230000008021 deposition Effects 0.000 description 11
- 229910001868 water Inorganic materials 0.000 description 9
- 229910052796 boron Inorganic materials 0.000 description 6
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 5
- 238000005477 sputtering target Methods 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000011065 in-situ storage Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 238000000541 cathodic arc deposition Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005328 electron beam physical vapour deposition Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000000421 high-target-utilization sputter deposition Methods 0.000 description 1
- 238000000869 ion-assisted deposition Methods 0.000 description 1
- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005372 isotope separation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000004549 pulsed laser deposition Methods 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0635—Carbides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
- G01T3/08—Measuring neutron radiation with semiconductor detectors
Definitions
- a method for producing a neutron detector component comprising a boron carbide layer for use in a neutron detecting device
- the present disclosure relates to a method for producing a neutron detector component comprising a neutron detecting boron carbide layer 5 comprising boron-10 arranged on a substantially neutron transparent
- the disclosure also relates to a neutron detector component for use in a neutron detector, the use of such a neutron detector component for neutron detection, and a neutron detecting device comprising a plurality of neutron detector components arranged as a stack.
- 1 0 B has a relatively high neutron absorption cross section, resulting in an absorption efficiency of 70% compared to 3 He, at a neutron wavelength of 1.8 A.
- Naturally occurring boron contains 20% of 10 B, but due to the almost 10% mass difference to the other boron isotope, 11 B, the isotope separation is 0 relatively simple.
- a semiconductor neutron detector having a boron carbide (B 4 C) semiconducting layer, the B 4 C layer containing 10 B.
- the 5 10 B 4 C layer was deposited on doped silicon using plasma-enhanced chemical vapor deposition (PECVD). Synthesis of semiconducting B 4 C may not be possible using other methods. However, CVD techniques are in general, due to the use of gaseous materials, associated with process risks and also high material costs.
- PECVD plasma-enhanced chemical vapor deposition
- PVD Physical vapor deposition
- thicknesses in the micrometer range which thicknesses typically are desirable to be able reach for neutron detection ability reasons, and when temperature sensitive substrates are used, such as of aluminum, which often is a material desirable to use as substrate.
- one object of this disclosure is to overcome or at least alleviate problems in the prior art, or to at least present an alternative solution.
- a specific object is to present a method for producing neutron detector components based on PVD, where the neutron detector comprises a neutron detecting boron carbide layer comprising boron-10 arranged on a substantially neutron transparent substrate.
- Further objects are to present a neutron detector component for use in a neutron detector, use of such a neutron detector component for neutron detection and a neutron detecting device comprising a plurality of neutron detector components arranged as a stack.
- a method for producing a neutron detector component comprising a neutron detecting boron carbide layer comprising boron-10 arranged on a substantially neutron transparent substrate, the method comprising: placing the substantially neutron transparent substrate and at least one source of coating material comprising carbon and boron-10 inside a coating chamber, evacuating the coating chamber to a pressure that is at most 6 mPa and heating at least a coating surface of the substantially neutron transparent substrate in the coating chamber to an elevated temperature that is at least 100°C, starting to coat the neutron detecting boron carbide layer comprising boron-10 on the substantially neutron transparent substrate by means of physical vapor deposition using the at least one source of coating material when said pressure and said elevated temperature are reached, and coating the neutron detecting boron carbide layer comprising boron-10 to a desired thickness.
- boron-10 is here meant the boron isotope 10 B.
- substantially neutron transparent substrate a substrate that is made of such material and has such thickness that the substrate absorbs a number of neutrons which is less than 10% of the number of neutrons absorbed in the neutron detecting boron carbide layer, that is, has 10% or less neutron absorption than the neutron detecting boron carbide layer to be provided on the substrate.
- any heating of the substantially neutron transparent substrate is made to a temperature that is below the melting temperature of the substrate.
- Steps that are independent of each other may be performed in different order and/or may be partly or wholly overlapping.
- the step of evacuating the coating chamber overlap the step of heating at least a coating surface of the substantially neutron transparent substrate.
- the method enables improved adhesion of the boron carbide layer to the substantially neutron transparent substrate, thereby, in practice, allowing PVD to be used to provide boron-10 based neutron detecting layers in the micrometer range and on aluminum
- the method may further comprise heating of at least a coating surface of the substantially neutron transparent substrate during the coating of the neutron detecting boron carbide layer.
- the heating of at least a coating surface of the substantially neutron transparent substrate during the coating of the neutron detecting boron carbide layer may comprise heating to at least said elevated temperature.
- the heating of at least a coating surface of the substantially neutron transparent substrate may comprise specific heating thereof.
- specific heating of at least a coating surface of the substantially neutron transparent substrate is here meant that heating is specifically directed for heating the substrate and not only what happen to result from the PVD process as such.
- the specific heating may e.g. be accomplished through direct heating of the substrate by e.g. supplying high electric current through the substrate, by indirect heating through e.g. radiation from a heating element specifically arranged to heat the substrate, and/or by heating of the substrate through utilization of energized species.
- the heating of at least a coating surface of the substantially neutron transparent substrate may comprise heating thereof to at most about 660°C.
- the substantially neutron transparent substrate may be a temperature sensitive substrate having a melting temperature that is at most about 660°C.
- the method may further comprise: removing contaminants from the coating chamber with the substantially neutron transparent substrate and the source of coating material placed inside, prior to and/or during the evacuating of the coating chamber.
- Contaminant is here generally meant any substance that is undesirably present or present at an undesirable amount in the coating chamber and that, if present during production, would have a detrimental effect on the resulting product.
- Contaminants typically involve the elements H, C, N, O, Ar, Ne or Kr, and compounds comprised of these elements, for example H 2 0, OH, O 2 , H 2 , CH 4 , N 2 , CO 2 , which typically occur bound to the walls of the coating chamber and/or to the substrate and/or are present at or in the source of coating material and/or are present in gases used in the PVD process.
- removing contaminants from the coating chamber is meant to include removal of contaminants that may be present anywhere inside the chamber, including contaminants bound to the walls of the coating chamber, and/or contaminants present at/in the source of coating material, and/or contaminants bound to or present at/in the substantially neutron transparent substrate.
- the step of removing contaminants from the coating chamber may comprise heating and degassing of the coating chamber, while keeping the temperature of the substantially neutron transparent substrate below its melting temperature.
- the removing of contaminants from the coating chamber may be performed during the evacuating of the coating chamber.
- the heating of the coating chamber may comprise using heat from the heating of at least a coating surface of the substantially neutron transparent substrate.
- the heating of the coating chamber may comprise using another separate source of heat than is used for the heating of at least a coating surface of the substantially neutron transparent substrate.
- the heating of the coating chamber may comprise heating thereof to at least 100°C, or at least 200°C, or at least 300°C, or at least 400°C, or at least 500°C, or at least 600°C.
- the removing of contaminants from the coating chamber may include removal of H 2 0 contaminants.
- H 2 O contaminants may be removed using a method directed
- H 2 0 contaminants specifically at reducing H 2 0 contaminants and may be selected from the group consisting of electron beam, infrared radiation, ultraviolet light and visible light irradiation, ion irradiation, contact with a resistive heating element, or a combination of any of these methods.
- the elevated temperature may be at least 100°C, or at least 200°C, or at least 300°C, or at least 400°C, or at least 500°C, or at least 600°C.
- the temperature of at least a coating surface of the substantially neutron transparent substrate may vary during the coating process, preferably above the elevated temperature, but lower temperatures may be allowed as well. However, the temperature of the substrate should not be significantly below the elevated temperature and/or preferably only below the elevated temperature during a minor part of the coating process.
- Coating at higher temperatures may result in better adhesion of the neutron detecting boron carbide layer to the substantially neutron transparent substrate and further reduce the amount of contaminants in the layer.
- the pressure may be at most 3 mPa, preferably at most 1.5 mPa, or more preferably at most 0.75 mPa.
- the method may comprise coating of the substantially neutron transparent substrate on opposing coating surfaces.
- coating may be performed on only one surface as well.
- the substantially neutron transparent substrate may be electrically conducting.
- the 7 Li and He isotopes leave the neutron detecting layer and may be detected with both temporal and spatial resolution in a detecting gas.
- the neutron detecting layer is left with a negative net charge which may be compensated for by conducting away electrons from the boron carbide layer through the electrically conducting substantially neutron transparent substrate.
- the substantially neutron transparent substrate may comprise aluminum or aluminum alloys.
- Such an alloy is for example a Si-AI alloy.
- the neutron detecting boron carbide layer may be electrically conducting.
- the conductivity of the neutron detecting boron carbide layer should be sufficient for neutralizing the negative net charge in the boron carbide layer formed as a consequence of charged particles leaving the surface of the neutron detecting layer upon the reaction between neutrons and 10 B.
- the desired thickness of the neutron detecting boron carbide layer may be less than about 4 pm, or, less than about 3 pm, or, less than about 2 pm, or, less than about 1.5 pm, or, less than about 1.3 ⁇ , or, less than about 1.2 pm, or, less than about 1.1 ⁇ .
- the desired thickness of the neutron detecting boron carbide layer may be at least about 0.2 ⁇ , or, at least about 0.4 pm, or, at least about 0.6 ⁇ , or, at least about 0.8 ⁇ or, at least about 0.9 pm, or at least about 1 ⁇ .
- the desired thickness of the neutron detecting boron carbide layer may be in a range of about 0.3 ⁇ to about 1.8 ⁇ , preferably in a range of about 0.5 pm to about 1.6 pm, more preferably in a rage of about 0.7 pm to about 1.3 pm, and most preferably in a range of about 0.9 pm to about 1.1 pm.
- the physical vapor deposition may be accomplished by magnetron sputtering.
- the neutron detecting boron carbide layer may be coated directly onto the coating surface of the substantially neutron transparent substrate.
- the neutron detecting boron carbide layer may be coated onto an intermediate or gradient layer, such as an adhesion-promoting layer.
- the neutron detecting boron carbide layer may be a B C-layer.
- B 4 C-coatings can be made wear resistant with thermal and chemical stability.
- B 4 C is here meant crystalline or amorphous compounds, or a combination thereof, consisting of B and C, where the B-content ranges between about 70% and 84% of the total number of B and C atoms, i.e.
- detection efficiency is here meant the number of detected neutrons in relation to how many neutrons that enter the neutron detecting boron carbide layer.
- the at least one source of coating material may comprise boron-10 enriched B 4 C ( 10 B 4 C).
- the at least one source of coating material may preferably
- boron-10 enriched B 4 C substantially consist of boron-10 enriched B 4 C ( 10 B 4 C).
- Normally B is a mixture of 20% 10 B and 80% 1 B.
- Enriched 10 B C has in practice typically a 10 B content of about 70 at.% to about 84 at.%.
- 10 B 4 C instead of using 10 B 4 C as a single source of coating material, separate sources of 10 B and C may be used during the coating.
- a neutron detector component that may be produced according to the method described above, for use in a neutron detector, the neutron detector component (1) comprising a neutron detecting boron carbide layer comprising boron-10 arranged on a substantially neutron transparent substrate, wherein the substantially neutron transparent substrate is a temperature sensitive substrate having a melting temperature that is at most about 660°C.
- the substantially neutron transparent substrate may be electrically conducting.
- the substantially neutron transparent substrate may comprise aluminum or aluminum alloys.
- the neutron detecting boron carbide layer may be electrically conducting.
- the neutron detecting boron carbide layer may have a thickness that is less than about 4 ⁇ , or, less than about 3 ⁇ , or, less than about 2 ⁇ , or, less than about 1.5 ⁇ , or, less than about 1.3 ⁇ , or, less than about 1.2 pm, or, less than about 1.1 pm.
- the neutron detecting boron carbide layer may have a thickness that is at least about 0.2 pm, or, at least about 0.4 ⁇ , or, at least about 0.6 ⁇ , or, at least about 0.8 ⁇ or, at least about 0.9 ⁇ , or at least about 1 ⁇ .
- the neutron detecting boron carbide layer may have a thickness that is in a range of about 0.3 pm to about 1.8 ⁇ , preferably in a range of about 0.5 ⁇ to about 1.6 pm, more preferably in a rage of about 0.7 pm to about 1.3 pm, and most preferably in a range of about 0.9 pm to about 1.1 pm.
- the neutron detecting boron carbide layer may be coated directly onto the coating surface of the substantially neutron transparent substrate.
- the neutron detecting boron carbide layer may be a B 4 C-layer.
- the boron-10 content of the neutron detecting boron carbide layer may be at least about 60 at.%, preferably at least about 65 at.%, more preferably at least about 70 at.%, even more preferably at least about 75 at.%, and most preferably in the range of about 80 to about 100 at.%.
- a neutron detecting device comprising a plurality of neutron detector components arranged as a stack.
- the number of neutron detector components in the stack may be at least 2, preferably at least 10, more preferably at least 15, even more preferably at least 20, and most preferably at least 25.
- the detection efficiency of the neutron detecting device is at least 30%, preferably at least 40%, more preferably at least 50%, even more preferably at least 60%, and most preferably at least 70% .
- Fig. 1 schematically shows a cross-sectional view of a neutron detector component according to a first embodiment.
- Fig. 2 is a flow chart illustrating a method for producing a neutron detector component.
- Fig. 3 schematically shows a substrate in a growth chamber, the substrate being specifically heated during production of the neutron detector component.
- Fig. 4 shows a neutron detecting device with N number of detector components arranged as a stack.
- Fig.1 schematically shows a cross-sectional view of a neutron detector component 1 having as neutron detecting layers a respective boron carbide layer 2 comprising boron-10 ( 0 B) of thickness f arranged on each one of opposing coating surfaces 3a, 3a ' of a substantially neutron transparent substrate 3 that in one embodiment is made of aluminum.
- a neutron detector component 1 having as neutron detecting layers a respective boron carbide layer 2 comprising boron-10 ( 0 B) of thickness f arranged on each one of opposing coating surfaces 3a, 3a ' of a substantially neutron transparent substrate 3 that in one embodiment is made of aluminum.
- the neutron detecting boron carbide layer 2 may constitute only a sub-layer or sub-portion of a larger neutron detecting layer or neutron detecting stack of layers, for example one layer in a multi-layered neutron detecting stack.
- a two-sided coating of the shown type is an advantage.
- a one-sided coated substrate 3 may be desirable and thus in other embodiments there may be a neutron detecting layer 2 on only one side of the substrate 3.
- the neutron detector component may have different shapes, which typically is determined by the design of the neutron detector which the neutron detecting component 1 is to be used with.
- the component is sheet-shaped or in the form of a neutron detector plate or blade that may have a flat structure but may in other embodiments be curved.
- the component may also e.g. be of tubular shape or in the form of a wire.
- the neutron detecting boron carbide layer 2 may, as in the shown embodiment of fig. 1 , be arranged directly onto the substantially neutron transparent substrate 3. In other embodiments there may be one or many intermediate or gradient layers, such as a layer to promote adhesion between the substantially neutron transparent substrate 3 and the neutron detecting boron carbide layer 2.
- Such an adhesive layer may for example be a layer created in-situ by deposition from the same or a separate deposition source(s) as the neutron detecting boron carbide layer 2.
- Such an adhesion layer may be metallic or ceramic and have any chemical composition, including that of the substrate 3, the neutron detecting boron carbide layer 2, or of any other material of a larger neutron detecting layer comprising the neutron detecting boron carbide layer 2 as a sub-layer or sub-portion.
- the adhesion layer may also be created by in-situ surface modification induced by ion irradiation, electron irradiation, photon irradiation, or a combination thereof.
- the thickness ,f, of the boron carbide layer 2 as neutron detecting layer is generally typically above 0.2 pm and below 4 pm, or below 3 pm, or below 2.5 pm, or below 2 pm, or below 1.5 pm, or below 1 pm. In one embodiment it is preferably in the range of 1 pm and 2 pm.
- the substantially neutron transparent substrate 3 is provided.
- a 0.5 mm thick rolled aluminum (Al) blade from the alloy EN AW-5083 is used as the substantially neutron transparent substrate 3.
- an aluminum foil with a thickness below 0.1 mm may be used as the substantially neutron transparent substrate 3.
- substrates 3 having thicknesses up to several millimeters may be used.
- the Al blade is cleaned in ultrasonic baths of Neutracon followed by de-ionized water and subsequently blown dry in dry N 2 .
- the substrate 3 may be cleaned by other means, including for example de-greasing in organic solvents and/or etching in an acid.
- a step 120 the substantially neutron transparent substrate 3 and source(s) of coating material 16 is placed inside a coating chamber of a deposition system, for example a coating chamber 10 as schematically illustrated in fig. 3.
- a coating chamber 10 for example a coating chamber 10 as schematically illustrated in fig. 3.
- up to 24 Al blades (20 x 180 mm in size) are used as substrates 3 and mounted onto a sample carousel, which allows for 2-axis planetary rotation and 2-sided depositions, and placed in the coating chamber of an industrial CC800/9 deposition system
- a step 146 the coating chamber 10 is being evacuated to a pressure that is at most 6 mPa and in a step 44 at least a coating surface 3a of the substantially neutron transparent substrate 3 is heated to an elevated temperature that is at least 100°C. Typically the whole substrate 3 is heated to this temperature, but it may be sufficient to heat only a coating surface 3a, 3a ' , that is, the surface of the substrate 3 to be coated. Steps 146 and 144 may be performed sequentially and/or partly of wholly simultaneously.
- coating of the substantially neutron transparent substrate 3 with a neutron detecting boron carbide layer 2 starts in a step 148.
- the pressure is thus a pressure under the gas load resulting from the heating and is typically accomplished using a vacuum pumping system connected to the deposition system which
- the coating chamber 10 comprises the coating chamber 10.
- This pressure may be termed base pressure, working pressure or steady-state pressure of the system.
- the gas load is the sum of the residual gas remaining from the initial atmosphere and the vapor pressure of the materials present in the coating chamber 10 and the leakage, outgassing, and permeation. This pressure should be low enough to provide a clean substrate 3 surface and reduced amount of contaminants in the boron carbide coating 2 during deposition, and is typically higher than the ultimate pressure of the vacuum pumping system.
- the coating chamber 10 of the deposition system of the detailed embodiment may be evacuated at full pumping speed for 3 hours for reaching a base pressure of 0.25 mPa in the coating chamber 10 prior to deposition. Pressures up to 6 mPa may be used in other embodiments. In yet other embodiments pressures lower than 0.25 mPa may be used. Generally, the lower said pressure is, before and during the deposition, the better.
- a step 150 the neutron detecting boron carbide layer 2 comprising boron-10 is being coated on the substantially neutron transparent substrate 3 by means of physical vapor deposition (PVD).
- PVD physical vapor deposition
- the substrate 3 is preferably continued to be heated also during this step 150.
- the PVD method used involves a working gas, e.g. Ar, the pressure will increase; however, preferably the partial pressure of contaminants is kept at corresponding low levels when starting step 150.
- the Ar partial pressure is kept at about 0.8 Pa.
- the schematic arrows 17 represent the evaporation direction of evaporated material from the source of coating material 16 to the substrate 3 during the step of coating 150.
- the PVD method may, as in the detailed embodiment, be dc magnetron sputtering.
- PVD technique that may be used in step 150 may instead of magnetron sputtering techniques be other PVD techniques, such as cathodic arc deposition, electron beam physical vapor deposition, evaporative deposition or pulsed laser deposition.
- the heating temperature at the Al blades is kept at 400°C ion the detailed embodiment.
- temperatures of at least 100°C, 200°C, 300°C, 500°C or 600°C may be used. It is also possible to vary the temperature of the substantially neutron transparent substrate 3 during the step of coating 150.
- the heating of the substrate 3 is accomplished by indirect heating, more particularly by irradiating the substrate 3 with infrared radiation supplied by a resistive heating element inside the coating chamber 10, corresponding to what is illustrated by heating element 12 in fig. 3.
- sputtering targets 16 are used as sources of coating material 16.
- the sputtering targets 16 are operated in dc mode and the maximum applied power is 4000 W to each magnetron. A fewer number of targets 16 may be used and the power applied to each magnetron may range from 1500 W to 4000 W. In other embodiments more sputtering targets 16 and/or higher applied power to each magnetron may be used. In an alternative embodiment separate sputtering targets 16 of 10 B and C may be used instead of 10 B 4 C.
- An increased film growth rate may be achieved during the coating step
- the type of coating system used may have an effect on the growth rate. It may be advantageous to use as high growth rate as possibly allowed by the PVD deposition system used. For example may a high growth rate enable use of less clean working gases during the coating of the boron carbide layer 2, i.e. a working gas with a higher partial pressure of contaminants in the working gas, and still accomplish a boron carbide layer 2 with low levels of contaminants.
- a high growth rate enable use of less clean working gases during the coating of the boron carbide layer 2, i.e. a working gas with a higher partial pressure of contaminants in the working gas, and still accomplish a boron carbide layer 2 with low levels of contaminants.
- a working gas with a higher partial pressure of contaminants in the working gas i.e. a working gas with a higher partial pressure of contaminants in the working gas
- Typical and possible growth rates may be in the range of 0.1 to 500 pm/h.
- contaminants are removed from the coating chamber 10.
- the removal of contaminants 140 may be a separate step performed prior to and/or partly fully simultaneously with steps 144 and 146.
- heating and degassing of the coating chamber 10 containing the Al blades as substrates 3 and the source(s) of coating material 16 is performed during steps 144 and 146 using heat from the heating of the substrate 3.
- the degassing may be performed at chamber temperatures up to 500 °C, or even higher.
- temperatures of at least about 300°C are often sufficient for removal of most contaminants in step 140, although there is removal of contaminants also at temperatures of about 100°C. Different contaminants leave a surface at different temperatures. At 300°C most water molecules is believed to have desorbed from the coating chamber 10, the substantially neutron transparent substrate 3 and the source(s) of coating material 16.
- H 2 0 contaminants may, in an alternative embodiment, be removed using a method directed at specifically removing water contaminants such as electron beam, infrared radiation, ultraviolet light and visible light irradiation, and ion irradiation or a combination of any of these methods.
- a method directed at specifically removing water contaminants may be combined with preheating and degassing in the step of removing
- desorption of water vapor by for example using ultraviolet light irradiation, may be a faster process for removing H 2 0 contaminants than using heating and degassing.
- neutron detecting boron carbide layers 2 are deposited at a temperature of 400°C at the Al blades 3 using four sputtering 10 B 4 C targets 16 and an applied power of 4000 W to each magnetron. Under these conditions the resulting neutron detecting boron carbide layers 2 may have an amount of impurities of 5.6 at.% and the 10 B content may be as much as 77 at.%.
- Fig. 4 shows a neutron detecting device 30 with N number of neutron detector components 1a,1b,1c,N arranged as a stack 32.
- Each neutron detector component 1a,1b,1c,N may be a neutron detector component as discussed above and may be produced according to the method discussed above.
- the number of detector components 1a,1 b,1c,N may vary between embodiments. In general, the higher the number of detector components 1a,1b,1c,N in the stack 32, the higher is the neutron detection efficiency of the neutron detecting device 30. However, the detection efficiency also depends on the thickness t of the neutron detecting boron carbide layer 2, the neutron wavelength, and the amount of impurities in the boron carbide layer 2.
- the distance between detector components 1a,1b,1c,N in the stack 32 in the neutron detecting device 30 is in one embodiment about 2 cm. In other embodiments the distance between components a,1b,1c,N in the stack 32 may be up to 10 cm. In yet another embodiment the distance between the components 1a,1 b,1c,N may be in the millimeter range.
- the neutron detecting device 30 may comprise a folded neutron detector component 1 , which through the folding forms a stack 32 with several neutron detecting boron carbide layers 2 from only one neutron detector component 1 , instead of from several separate components
- detector components 1a,1 b,1c,N with neutron detecting boron carbide layers 2 coated on opposing surfaces 3a, 3a ' of respective substrate 3 are used in stack 32 of the neutron detecting device 30, resulting in 30 neutron detecting boron carbide layers 1a,1b,2c,N in the stack 32.
- up to 25 two-sided coated detector components 1a,1b,1c,N may be used.
- a full-scale large area neutron detecting device 30 is in one embodiment designed to cover an active surface area of about 30 m 2 , which corresponds to about 000 m 2 of 10 B-containing neutron detecting boron carbide layers 2.
- neutron detector components 1a,1b,1c,N are used in the stack 32, each neutron detector component 1a,1b,1c,N having a boron carbide layer thickness t of 1 Mm. This may result in a neutron detecting device 30 having a detection efficiency of about 67%.
- a neutron detecting boron carbide layer thickness t of 2 ⁇ results in a lower detection efficiency. Too thick neutron detecting layers 2 lowers the probability that the 7 Li and 4 He isotopes, formed in the nuclear reaction between a neutron and 10 B, can escape from the boron carbide layer 2 and be detected.
- 25 detector components 1a,1b,1c,N with 1 pm thick coatings 2 are used in the stack 32, leading to a detection efficiency approaching a maximum of about 71 %.
- the number of detector components 1a,1b,1c,N i.e. the number of neutron detecting layers 2
- the thickness ,t of the neutron detecting layers 2
- the neutron detecting boron carbide layer 2 may consist of a composition gradient.
- the neutron detector component 1 may be composed of several layers of neutron transparent layers and neutron detecting boron carbide layers 2 forming bi- layers, tri-layers or more generally multi-layers.
- the present invention is defined by the claims and variations to the disclosed embodiments and can be understood and effected by the person skilled in the art in practicing the claimed invention, for example by studying the drawings, the disclosure, and the claims. Use of the word “comprising” in the claims does not exclude other elements or steps, and use of the article "a” or "an” does not exclude a plurality.
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Abstract
Description
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Priority Applications (1)
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HUE11868729A HUE057802T2 (en) | 2011-06-30 | 2011-06-30 | A method for producing a neutron detector component comprising a boron carbide layer for use in a neutron detecting device |
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PCT/SE2011/050891 WO2013002697A1 (en) | 2011-06-30 | 2011-06-30 | A method for producing a neutron detector component comprising a boron carbide layer for use in a neutron detecting device |
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EP2726640A1 true EP2726640A1 (en) | 2014-05-07 |
EP2726640A4 EP2726640A4 (en) | 2015-02-25 |
EP2726640B1 EP2726640B1 (en) | 2021-12-08 |
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EP11868729.2A Active EP2726640B1 (en) | 2011-06-30 | 2011-06-30 | A method for producing a neutron detector component comprising a boron carbide layer for use in a neutron detecting device |
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US (1) | US20140299781A1 (en) |
EP (1) | EP2726640B1 (en) |
CA (1) | CA2839780A1 (en) |
DK (1) | DK2726640T3 (en) |
HU (1) | HUE057802T2 (en) |
SE (1) | SE535805C2 (en) |
WO (1) | WO2013002697A1 (en) |
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CN103132040B (en) * | 2013-03-12 | 2014-11-26 | 四川大学 | Preparation process method of BC4 conversion film for 4H-SiC-based neutron detector |
EP2975154A1 (en) * | 2014-07-14 | 2016-01-20 | Helmholtz-Zentrum Geesthacht Zentrum für Material- und Küstenforschung GmbH | Method for the production of neutron converters |
KR101616403B1 (en) * | 2015-05-14 | 2016-04-28 | 세종대학교산학협력단 | Nutron absorption plate with boron-carbide multi-coated layer |
FR3038988B1 (en) | 2015-07-17 | 2019-04-19 | Centre National De La Recherche Scientifique Cnrs | DETECTOR UNDER IRRADIATION OF NUCLEAR PARTICLES |
WO2017042916A1 (en) * | 2015-09-09 | 2017-03-16 | 野洲メディカルイメージングテクノロジー株式会社 | Thermal neutron detection apparatus, scintillator unit, and thermal neutron detection system |
CN110767343A (en) * | 2019-11-15 | 2020-02-07 | 散裂中子源科学中心 | Neutron shielding pipeline used in high vacuum environment |
US20240045087A1 (en) * | 2020-12-11 | 2024-02-08 | Hiroshima University | Neutron detection element |
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US4587088A (en) * | 1983-08-26 | 1986-05-06 | Westinghouse Electric Corp. | Coating a nuclear fuel with a burnable poison |
US6123797A (en) * | 1995-06-23 | 2000-09-26 | The Dow Chemical Company | Method for coating a non-wetting fluidizable and material onto a substrate |
US6771730B1 (en) * | 1998-11-25 | 2004-08-03 | Board Of Regents Of University Of Nebraska | Boron-carbide solid state neutron detector and method of using the same |
US6919576B2 (en) * | 2002-02-04 | 2005-07-19 | Bechtel Bwxt Idaho Llc | Composite neutron absorbing coatings for nuclear criticality control |
US6774013B2 (en) * | 2002-11-06 | 2004-08-10 | Board Of Regents Of University Of Nebraska | N-type boron-carbide semiconductor polytype and method of fabricating the same |
EP1578375B1 (en) * | 2002-11-13 | 2018-01-03 | Proportional Technologies, Inc. | Boron coated straw neutron detector |
US7183701B2 (en) * | 2003-05-29 | 2007-02-27 | Nova Scientific, Inc. | Electron multipliers and radiation detectors |
US7233007B2 (en) * | 2004-03-01 | 2007-06-19 | Nova Scientific, Inc. | Radiation detectors and methods of detecting radiation |
US20090302226A1 (en) * | 2005-02-08 | 2009-12-10 | Yissum Research Development Company Of The Hebrew University Of Jerusalem | Solid-state neutron and alpha particles detector and methods for manufacturing and use thereof |
CN101669042A (en) * | 2007-04-24 | 2010-03-10 | 株式会社东芝 | Radiography measuring device and radiography measuring method |
WO2008140747A1 (en) * | 2007-05-10 | 2008-11-20 | Seldon Technologies, Inc. | Methods of gas confinement within the voids of crystalline material and articles thereof |
WO2010087844A1 (en) * | 2009-01-30 | 2010-08-05 | Alliance For Sustainable Energy, Llc | High sensitivity, solid state neutron detector |
US8569710B2 (en) * | 2009-06-02 | 2013-10-29 | Proportional Technologies, Inc. | Optimized detection of fission neutrons using boron coated straw detectors distributed in moderator material |
US8445859B2 (en) * | 2009-06-15 | 2013-05-21 | Los Alamos National Security, Llc | Neutron detectors comprising boron powder |
US8492730B2 (en) * | 2009-06-15 | 2013-07-23 | Los Alamos National Security, Llc | Neutron detectors comprising ultra-thin layers of boron powder |
US8237161B2 (en) * | 2010-08-10 | 2012-08-07 | North Dakota State University Research Foundation | Amorphous boron carbide films for p-n junctions and method for fabricating same |
US8973257B2 (en) * | 2011-09-15 | 2015-03-10 | Material Innovations, Inc. | Method of making a neutron detector |
US8729487B2 (en) * | 2011-09-15 | 2014-05-20 | Material Innovations, Inc. | Neutron detector and method of making |
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2011
- 2011-06-30 SE SE1250745A patent/SE535805C2/en unknown
- 2011-06-30 US US14/128,747 patent/US20140299781A1/en not_active Abandoned
- 2011-06-30 CA CA2839780A patent/CA2839780A1/en not_active Abandoned
- 2011-06-30 DK DK11868729.2T patent/DK2726640T3/en active
- 2011-06-30 EP EP11868729.2A patent/EP2726640B1/en active Active
- 2011-06-30 HU HUE11868729A patent/HUE057802T2/en unknown
- 2011-06-30 WO PCT/SE2011/050891 patent/WO2013002697A1/en active Application Filing
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EP2726640A4 (en) | 2015-02-25 |
EP2726640B1 (en) | 2021-12-08 |
WO2013002697A1 (en) | 2013-01-03 |
SE535805C2 (en) | 2012-12-27 |
DK2726640T3 (en) | 2022-02-21 |
US20140299781A1 (en) | 2014-10-09 |
HUE057802T2 (en) | 2022-06-28 |
CA2839780A1 (en) | 2013-01-03 |
SE1250745A1 (en) | 2012-08-20 |
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