EP2689258B1 - SYSTEMS AND METHODS FOR FORMING AT LEAST ONE DETACHABLE ELECTRICAL CONTACT WITH AT LEAST ONE PHOTOVOLTAIC DEVICE - Google Patents

SYSTEMS AND METHODS FOR FORMING AT LEAST ONE DETACHABLE ELECTRICAL CONTACT WITH AT LEAST ONE PHOTOVOLTAIC DEVICE

Info

Publication number
EP2689258B1
EP2689258B1 EP12715727.9A EP12715727A EP2689258B1 EP 2689258 B1 EP2689258 B1 EP 2689258B1 EP 12715727 A EP12715727 A EP 12715727A EP 2689258 B1 EP2689258 B1 EP 2689258B1
Authority
EP
European Patent Office
Prior art keywords
systems
methods
forming
electrical contact
photovoltaic device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
EP12715727.9A
Other languages
German (de)
French (fr)
Other versions
EP2689258A1 (en
Inventor
Jonas Hiller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pasan SA
Original Assignee
Pasan SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pasan SA filed Critical Pasan SA
Publication of EP2689258A1 publication Critical patent/EP2689258A1/en
Application granted granted Critical
Publication of EP2689258B1 publication Critical patent/EP2689258B1/en
Withdrawn - After Issue legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06727—Cantilever beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00—Manufacture or treatment of devices covered by this subclass
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
EP12715727.9A 2011-03-23 2012-03-19 SYSTEMS AND METHODS FOR FORMING AT LEAST ONE DETACHABLE ELECTRICAL CONTACT WITH AT LEAST ONE PHOTOVOLTAIC DEVICE Withdrawn - After Issue EP2689258B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IN804DE2011 2011-03-23
PCT/IB2012/051316 WO2012127411A1 (en) 2011-03-23 2012-03-19 Systems and methods for making atleast a detachable electrical contact with atleast a photovoltaic device

Publications (2)

Publication Number Publication Date
EP2689258A1 EP2689258A1 (en) 2014-01-29
EP2689258B1 true EP2689258B1 (en) 2015-07-22

Family

ID=45992570

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12715727.9A Withdrawn - After Issue EP2689258B1 (en) 2011-03-23 2012-03-19 SYSTEMS AND METHODS FOR FORMING AT LEAST ONE DETACHABLE ELECTRICAL CONTACT WITH AT LEAST ONE PHOTOVOLTAIC DEVICE

Country Status (6)

Country Link
EP (1) EP2689258B1 (en)
JP (1) JP2014509088A (en)
KR (1) KR20140019804A (en)
CN (1) CN103597739B (en)
TW (1) TW201244117A (en)
WO (1) WO2012127411A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6305400B2 (en) * 2012-07-20 2018-04-04 パサン エス アー Test equipment
JP5912156B2 (en) * 2014-07-28 2016-04-27 株式会社エヌ・ピー・シー Power generation output measurement jig
DE102015105975B4 (en) 2015-04-20 2019-07-11 h.a.l.m. elektronik GmbH Contacting device and method for measuring a characteristic of a solar cell
DE102017125626A1 (en) 2017-11-02 2019-05-02 Hanwha Q Cells Gmbh Contacting element and device for temporarily contacting a solar cell
JP2019140705A (en) * 2018-02-06 2019-08-22 三菱電機株式会社 Solar cell measuring method and solar cell module manufacturing method
DE102018102840A1 (en) * 2018-02-08 2019-08-08 Wavelabs Solar Metrology Systems Gmbh Device for electrical contacting of a solar cell in the measurement of electrical characteristics of the solar cell and method for measuring electrical characteristics of a solar cell
CN109347437A (en) * 2018-09-17 2019-02-15 江西展宇新能源股份有限公司 A kind of more main grid test equipment of solar cells
KR102347628B1 (en) * 2019-10-15 2022-01-06 (주)티에스이 Test apparatus for solar cell
DE102020117760A1 (en) * 2020-07-06 2022-01-13 Wavelabs Solar Metrology Systems Gmbh Contacting device, solar cell test device and light source

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58158977A (en) * 1982-02-25 1983-09-21 ユニバ−シテイ・オブ・デラウエア Method and device for increasing durability and yield of thin film photovoltaic device
US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
WO2008129010A2 (en) * 2007-04-19 2008-10-30 Oc Oerlikon Balzers Ag Test equipment for automated quality control of thin film solar modules
CN101926009B (en) * 2008-01-25 2012-01-25 应用材料股份有限公司 Automated solar cell electrical connection equipment
DE102008038186A1 (en) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Probe for the temporary electrical contacting of a solar cell
DE102008038184A1 (en) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Method and device for the temporary electrical contacting of a solar cell
CN201359613Y (en) * 2009-01-19 2009-12-09 李毅 Test electrode jig of amorphous silicon solar battery
CN101793945B (en) * 2010-03-12 2013-04-17 中国电子科技集团公司第四十五研究所 Solar cell testing device
CN101975917A (en) * 2010-10-09 2011-02-16 中国电子科技集团公司第四十八研究所 Electric test desk for testing crystal silicon solar cells

Also Published As

Publication number Publication date
WO2012127411A1 (en) 2012-09-27
KR20140019804A (en) 2014-02-17
TW201244117A (en) 2012-11-01
CN103597739A (en) 2014-02-19
CN103597739B (en) 2016-12-14
EP2689258A1 (en) 2014-01-29
JP2014509088A (en) 2014-04-10

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