EP2678668A4 - Röntgenstrahlprüfungssystem und -verfahren - Google Patents

Röntgenstrahlprüfungssystem und -verfahren Download PDF

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Publication number
EP2678668A4
EP2678668A4 EP11859314.4A EP11859314A EP2678668A4 EP 2678668 A4 EP2678668 A4 EP 2678668A4 EP 11859314 A EP11859314 A EP 11859314A EP 2678668 A4 EP2678668 A4 EP 2678668A4
Authority
EP
European Patent Office
Prior art keywords
inspection system
ray inspection
ray
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP11859314.4A
Other languages
English (en)
French (fr)
Other versions
EP2678668A1 (de
Inventor
Edward James Morton
Francis Baldwin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rapiscan Systems Inc
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Publication of EP2678668A1 publication Critical patent/EP2678668A1/de
Publication of EP2678668A4 publication Critical patent/EP2678668A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/505—Detectors scintillation
EP11859314.4A 2011-02-22 2011-02-22 Röntgenstrahlprüfungssystem und -verfahren Withdrawn EP2678668A4 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2011/025777 WO2012115629A1 (en) 2011-02-22 2011-02-22 X-ray inspection system and method

Publications (2)

Publication Number Publication Date
EP2678668A1 EP2678668A1 (de) 2014-01-01
EP2678668A4 true EP2678668A4 (de) 2017-04-05

Family

ID=46721149

Family Applications (1)

Application Number Title Priority Date Filing Date
EP11859314.4A Withdrawn EP2678668A4 (de) 2011-02-22 2011-02-22 Röntgenstrahlprüfungssystem und -verfahren

Country Status (3)

Country Link
EP (1) EP2678668A4 (de)
GB (1) GB2501661B (de)
WO (1) WO2012115629A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
DE102012017872A1 (de) * 2012-09-06 2014-05-15 Technische Universität Dresden Verfahren und Vorrichtung zur bildgebenden Prüfung von Objekten mit Röntgenstrahlung
DE102018133525A1 (de) * 2018-12-21 2020-06-25 Smiths Heimann Gmbh Dual-Energie-Detektor sowie Verfahren zur Verbesserung damit erzeugter Bilder
CN117109494B (zh) * 2023-10-23 2024-01-23 北京华力兴科技发展有限责任公司 一种x射线测厚仪智能标定方法

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5841832A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
EP1063538A2 (de) * 1999-06-23 2000-12-27 The Nottingham Trent University Lineare Szintillations-Detektoranordnung
WO2003052397A1 (en) * 2001-12-19 2003-06-26 Agresearch Limited A phantom
US20070003003A1 (en) * 2002-07-24 2007-01-04 Seppi Edward J Radiation scanning of objects for contraband
WO2009130491A1 (en) * 2008-04-24 2009-10-29 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
US20100020934A1 (en) * 2005-12-16 2010-01-28 Edward James Morton X-Ray Scanners and X-Ray Sources Therefor
US20100220835A1 (en) * 2007-08-17 2010-09-02 Durham Scientific Crystals Ltd Method and apparatus for inspection of materials
US20100278296A1 (en) * 2009-04-29 2010-11-04 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering
WO2010145016A1 (en) * 2009-06-15 2010-12-23 Optosecurity Inc. Method and apparatus for assessing the threat status of luggage

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5319547A (en) * 1990-08-10 1994-06-07 Vivid Technologies, Inc. Device and method for inspection of baggage and other objects
US6816571B2 (en) * 2002-02-06 2004-11-09 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner
US7868665B2 (en) * 2002-03-05 2011-01-11 Nova R&D, Inc. Integrated circuit and sensor for imaging
GB0309374D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray sources
US7769138B2 (en) * 2004-03-29 2010-08-03 Cmt Medical Technologies Ltd. Apparatus and method of improved angiographic imaging
US7224763B2 (en) * 2004-07-27 2007-05-29 Analogic Corporation Method of and system for X-ray spectral correction in multi-energy computed tomography
US7372934B2 (en) * 2005-12-22 2008-05-13 General Electric Company Method for performing image reconstruction using hybrid computed tomography detectors
US9256713B2 (en) * 2007-08-30 2016-02-09 Exelis Inc. Library generation for detection and identification of shielded radioisotopes
US7636638B2 (en) * 2007-11-27 2009-12-22 Canberra Industries, Inc. Hybrid radiation detection system
US8391581B2 (en) * 2007-12-27 2013-03-05 Omron Corporation X-ray inspecting apparatus and X-ray inspecting method
US7835495B2 (en) * 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5841832A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
EP1063538A2 (de) * 1999-06-23 2000-12-27 The Nottingham Trent University Lineare Szintillations-Detektoranordnung
WO2003052397A1 (en) * 2001-12-19 2003-06-26 Agresearch Limited A phantom
US20070003003A1 (en) * 2002-07-24 2007-01-04 Seppi Edward J Radiation scanning of objects for contraband
US20100020934A1 (en) * 2005-12-16 2010-01-28 Edward James Morton X-Ray Scanners and X-Ray Sources Therefor
US20100220835A1 (en) * 2007-08-17 2010-09-02 Durham Scientific Crystals Ltd Method and apparatus for inspection of materials
WO2009130491A1 (en) * 2008-04-24 2009-10-29 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
US20100278296A1 (en) * 2009-04-29 2010-11-04 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering
WO2010145016A1 (en) * 2009-06-15 2010-12-23 Optosecurity Inc. Method and apparatus for assessing the threat status of luggage

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2012115629A1 *

Also Published As

Publication number Publication date
GB201315125D0 (en) 2013-10-09
EP2678668A1 (de) 2014-01-01
GB2501661A (en) 2013-10-30
WO2012115629A1 (en) 2012-08-30
GB2501661B (en) 2017-04-12

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