EP2592521A3 - Procédés et circuits pour la fourniture de références stables de tension et de courant basées sur des courants s'écoulant à travers des composants de couche diélectrique ultra-mince - Google Patents

Procédés et circuits pour la fourniture de références stables de tension et de courant basées sur des courants s'écoulant à travers des composants de couche diélectrique ultra-mince Download PDF

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Publication number
EP2592521A3
EP2592521A3 EP12007509.8A EP12007509A EP2592521A3 EP 2592521 A3 EP2592521 A3 EP 2592521A3 EP 12007509 A EP12007509 A EP 12007509A EP 2592521 A3 EP2592521 A3 EP 2592521A3
Authority
EP
European Patent Office
Prior art keywords
dielectric layer
current
ultra
voltage
thin dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP12007509.8A
Other languages
German (de)
English (en)
Other versions
EP2592521B1 (fr
EP2592521A2 (fr
Inventor
Mark Alan Lemkin
Thor Nelson Juneau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices International ULC
Original Assignee
Dust Networks Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dust Networks Inc filed Critical Dust Networks Inc
Publication of EP2592521A2 publication Critical patent/EP2592521A2/fr
Publication of EP2592521A3 publication Critical patent/EP2592521A3/fr
Application granted granted Critical
Publication of EP2592521B1 publication Critical patent/EP2592521B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
EP12007509.8A 2011-11-03 2012-11-05 Procédés et circuits pour la fourniture de références stables de tension et de courant basées sur des courants s'écoulant à travers des composants de couche diélectrique ultra-mince Active EP2592521B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201161555309P 2011-11-03 2011-11-03

Publications (3)

Publication Number Publication Date
EP2592521A2 EP2592521A2 (fr) 2013-05-15
EP2592521A3 true EP2592521A3 (fr) 2013-11-20
EP2592521B1 EP2592521B1 (fr) 2021-03-10

Family

ID=47627876

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12007509.8A Active EP2592521B1 (fr) 2011-11-03 2012-11-05 Procédés et circuits pour la fourniture de références stables de tension et de courant basées sur des courants s'écoulant à travers des composants de couche diélectrique ultra-mince

Country Status (3)

Country Link
EP (1) EP2592521B1 (fr)
CN (1) CN103149964B (fr)
TW (1) TWI570536B (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103631311A (zh) * 2013-11-28 2014-03-12 苏州贝克微电子有限公司 一种稳压器
JP6805049B2 (ja) * 2017-03-31 2020-12-23 エイブリック株式会社 基準電圧発生装置
US11469223B2 (en) * 2019-05-31 2022-10-11 Analog Devices International Unlimited Company High precision switched capacitor MOSFET current measurement technique
US10845839B1 (en) * 2019-09-13 2020-11-24 Analog Devices, Inc. Current mirror arrangements with double-base current circulators

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5883798A (en) * 1996-09-30 1999-03-16 Nec Corporation Voltage/current conversion circuit
US20020005749A1 (en) * 2000-06-13 2002-01-17 Arthur Descombes Method for generating a substantially temperature independent current and device allowing implementation of the same
US6917319B1 (en) * 2004-03-30 2005-07-12 International Business Machines Corporation Digital to analog converter using tunneling current element
US20080169837A1 (en) * 2007-01-15 2008-07-17 International Business Machines Corporation Current Control Mechanism For Dynamic Logic Keeper Circuits In An Integrated Circuit And Method Of Regulating Same
US20080169869A1 (en) * 2007-01-15 2008-07-17 International Business Machines Corporation Voltage Reference Circuit For Low Voltage Applications In An Integrated Circuit

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6265749B1 (en) * 1997-10-14 2001-07-24 Advanced Micro Devices, Inc. Metal silicide transistor gate spaced from a semiconductor substrate by a ceramic gate dielectric having a high dielectric constant
EP1014547A3 (fr) * 1998-12-21 2000-11-15 Fairchild Semiconductor Corporation Système de pompe de charge à courant bas
TW530422B (en) * 2001-10-31 2003-05-01 Univ Nat Taiwan MOS tunneling diode temperature sensor and the manufacturing method thereof
JP2005057256A (ja) * 2003-08-04 2005-03-03 Samsung Electronics Co Ltd 漏洩電流を利用した半導体検査装置および漏洩電流補償システム
KR100910861B1 (ko) * 2007-11-08 2009-08-06 주식회사 하이닉스반도체 밴드갭 레퍼런스 발생회로
US8149047B2 (en) * 2008-03-20 2012-04-03 Mediatek Inc. Bandgap reference circuit with low operating voltage
TWI501067B (zh) * 2010-08-18 2015-09-21 Novatek Microelectronics Corp 能帶隙參考電路及能帶隙參考電流源

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5883798A (en) * 1996-09-30 1999-03-16 Nec Corporation Voltage/current conversion circuit
US20020005749A1 (en) * 2000-06-13 2002-01-17 Arthur Descombes Method for generating a substantially temperature independent current and device allowing implementation of the same
US6917319B1 (en) * 2004-03-30 2005-07-12 International Business Machines Corporation Digital to analog converter using tunneling current element
US20080169837A1 (en) * 2007-01-15 2008-07-17 International Business Machines Corporation Current Control Mechanism For Dynamic Logic Keeper Circuits In An Integrated Circuit And Method Of Regulating Same
US20080169869A1 (en) * 2007-01-15 2008-07-17 International Business Machines Corporation Voltage Reference Circuit For Low Voltage Applications In An Integrated Circuit

Also Published As

Publication number Publication date
EP2592521B1 (fr) 2021-03-10
CN103149964B (zh) 2016-10-26
CN103149964A (zh) 2013-06-12
EP2592521A2 (fr) 2013-05-15
TWI570536B (zh) 2017-02-11
TW201324072A (zh) 2013-06-16

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