EP2592424A4 - Automatic analyzer - Google Patents

Automatic analyzer Download PDF

Info

Publication number
EP2592424A4
EP2592424A4 EP11803502.1A EP11803502A EP2592424A4 EP 2592424 A4 EP2592424 A4 EP 2592424A4 EP 11803502 A EP11803502 A EP 11803502A EP 2592424 A4 EP2592424 A4 EP 2592424A4
Authority
EP
European Patent Office
Prior art keywords
automatic analyzer
analyzer
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP11803502.1A
Other languages
German (de)
French (fr)
Other versions
EP2592424B1 (en
EP2592424A1 (en
Inventor
Shinji Azuma
Teruhiro Yamano
Hiroshi Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Publication of EP2592424A1 publication Critical patent/EP2592424A1/en
Publication of EP2592424A4 publication Critical patent/EP2592424A4/en
Application granted granted Critical
Publication of EP2592424B1 publication Critical patent/EP2592424B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1065—Multiple transfer devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0491—Position sensing, encoding; closed-loop control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1011—Control of the position or alignment of the transfer device

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
EP11803502.1A 2010-07-09 2011-06-30 Automatic analyzer Active EP2592424B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010156311A JP5097804B2 (en) 2010-07-09 2010-07-09 Automatic analyzer
PCT/JP2011/065060 WO2012005168A1 (en) 2010-07-09 2011-06-30 Automatic analyzer

Publications (3)

Publication Number Publication Date
EP2592424A1 EP2592424A1 (en) 2013-05-15
EP2592424A4 true EP2592424A4 (en) 2017-11-22
EP2592424B1 EP2592424B1 (en) 2022-05-11

Family

ID=45441149

Family Applications (1)

Application Number Title Priority Date Filing Date
EP11803502.1A Active EP2592424B1 (en) 2010-07-09 2011-06-30 Automatic analyzer

Country Status (5)

Country Link
US (1) US9052301B2 (en)
EP (1) EP2592424B1 (en)
JP (1) JP5097804B2 (en)
CN (1) CN102985830B (en)
WO (1) WO2012005168A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5854647B2 (en) * 2011-05-31 2016-02-09 株式会社東芝 Automatic analyzer
JP6026753B2 (en) * 2012-02-23 2016-11-16 株式会社日立ハイテクノロジーズ Automatic analyzer
JP6879871B2 (en) * 2017-09-07 2021-06-02 株式会社日立ハイテク Automatic analyzer
US20220214371A1 (en) * 2019-05-16 2022-07-07 Hitachi High-Tech Corporation Automatic Analyzer
CN117157529A (en) * 2021-04-27 2023-12-01 株式会社日立高新技术 Automatic analysis device
CN116413460A (en) * 2021-12-31 2023-07-11 力合科技（湖南）股份有限公司 Automatic solution analysis device

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5051238A (en) * 1987-11-20 1991-09-24 Hitachi, Ltd. Automatic analyzing system
US6429016B1 (en) * 1999-10-01 2002-08-06 Isis Pharmaceuticals, Inc. System and method for sample positioning in a robotic system
US20040134750A1 (en) * 2001-04-24 2004-07-15 Luoma Robert Paul Assay testing diagnostic analyzer
US20040208787A1 (en) * 2003-04-16 2004-10-21 Katsuaki Takahashi Automatic analyzer
US20060062692A1 (en) * 2004-09-17 2006-03-23 Hitoshi Tokieda Automatic analyzer
US20080199358A1 (en) * 2007-02-19 2008-08-21 Yamano Teruhiro Automatic analyzer
US20090215183A1 (en) * 2008-02-27 2009-08-27 Sysmex Corporation Specimen analyzer, abnormality control method of the same and computer program product
US20090276071A1 (en) * 2008-04-30 2009-11-05 James Sim Mutex-mediated control of spatial access by appliances moveable over a common physical space
US20100098589A1 (en) * 2007-06-19 2010-04-22 Beckman Coulter, Inc. Error specifying method and analyzer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09196925A (en) 1996-01-19 1997-07-31 Hitachi Ltd Automatic analyser
JP4033060B2 (en) 2003-07-17 2008-01-16 株式会社日立ハイテクノロジーズ Automatic analyzer
JP4538365B2 (en) * 2005-04-25 2010-09-08 株式会社日立ハイテクノロジーズ Reagent cooler and automatic analyzer equipped with the same
JP4861762B2 (en) 2006-07-13 2012-01-25 ベックマン コールター， インコーポレイテッド Automatic analyzer
JP2010145284A (en) * 2008-12-19 2010-07-01 Toshiba Corp Automatic analyzer
JP2010151519A (en) * 2008-12-24 2010-07-08 Hitachi High-Technologies Corp Automatic analyzer

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5051238A (en) * 1987-11-20 1991-09-24 Hitachi, Ltd. Automatic analyzing system
US6429016B1 (en) * 1999-10-01 2002-08-06 Isis Pharmaceuticals, Inc. System and method for sample positioning in a robotic system
US20040134750A1 (en) * 2001-04-24 2004-07-15 Luoma Robert Paul Assay testing diagnostic analyzer
US20040208787A1 (en) * 2003-04-16 2004-10-21 Katsuaki Takahashi Automatic analyzer
US20060062692A1 (en) * 2004-09-17 2006-03-23 Hitoshi Tokieda Automatic analyzer
US20080199358A1 (en) * 2007-02-19 2008-08-21 Yamano Teruhiro Automatic analyzer
US20100098589A1 (en) * 2007-06-19 2010-04-22 Beckman Coulter, Inc. Error specifying method and analyzer
US20090215183A1 (en) * 2008-02-27 2009-08-27 Sysmex Corporation Specimen analyzer, abnormality control method of the same and computer program product
US20090276071A1 (en) * 2008-04-30 2009-11-05 James Sim Mutex-mediated control of spatial access by appliances moveable over a common physical space

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
LI T-Y ET AL: "ON-LINE MANIPULATION PLANNING FOR TWO ROBOT ARMS IN A DYNAMIC ENVIRONMENT", INTERNATIONAL JOURNAL OF ROBOTICS RESEARCH, SAGE SCIENCE PRESS, THOUSAND OAKS, US, vol. 16, no. 2, 1 April 1997 (1997-04-01), pages 143 - 167, XP000656529, ISSN: 0278-3649 *
See also references of WO2012005168A1 *

Also Published As

Publication number Publication date
EP2592424B1 (en) 2022-05-11
JP2012018104A (en) 2012-01-26
JP5097804B2 (en) 2012-12-12
CN102985830A (en) 2013-03-20
WO2012005168A1 (en) 2012-01-12
EP2592424A1 (en) 2013-05-15
US9052301B2 (en) 2015-06-09
US20130115134A1 (en) 2013-05-09
CN102985830B (en) 2014-12-03

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