EP2179296B1 - Appareil et procédé pour tester un transformateur d'instruments - Google Patents

Appareil et procédé pour tester un transformateur d'instruments Download PDF

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Publication number
EP2179296B1
EP2179296B1 EP08797677.5A EP08797677A EP2179296B1 EP 2179296 B1 EP2179296 B1 EP 2179296B1 EP 08797677 A EP08797677 A EP 08797677A EP 2179296 B1 EP2179296 B1 EP 2179296B1
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EP
European Patent Office
Prior art keywords
solid state
transformer
burden
circuit
state switch
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EP08797677.5A
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German (de)
English (en)
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EP2179296A4 (fr
EP2179296A1 (fr
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Matthew Eric Kraus
David Andrew Bobick
Glenn A. Mayfield
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Radian Research Inc
Radian Res Inc
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Radian Research Inc
Radian Res Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62—Testing of transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/20—Measuring number of turns; Measuring transformation ratio or coupling factor of windings

Definitions

  • This invention relates to instrument transformer test equipment. It is disclosed in the context of equipment and methods for burden testing of instrument transformers, but is believed to have utility in other applications as well.
  • US 2002/109507 A1 A system and method for testing an on-line current transformer is provided.
  • the current transformer includes a primary winding and a secondary winding.
  • An operating current continues to flow through the primary winding during testing of the current transformer.
  • a controllable load is applied to the current transformer secondary winding.
  • the controllable load is varied over a range of load settings including a maximum current setting and a maximum voltage setting.
  • a current flowing through the current transformer secondary winding is measured.
  • a voltage across the current transformer secondary winding is measured.
  • An actual excitation curve is generated from the measured currents and voltages corresponding to the plurality of load settings.
  • US 6,160,697 A A method and apparatus for establishing and maintaining a preferred induction level in a magnetic body.
  • a varying voltage is applied to a conductive winding that magnetically interacts with a magnetic body.
  • the voltage is controlled during a first phase in such a way that the magnetic induction level of the magnetic body is changed from an unknown induction level to a known induction level.
  • the induced voltage across the winding is controlled so that the induction level is changed from the known induction level to the preferred induction level.
  • An optional third phase may be utilized, during which the average value of induced voltage is kept near zero in order to keep the induction level near the preferred induction level.
  • the test resistor device consists of a multiplicity of fixed resistors which can be connected and disconnected in parallel.
  • the connection and disconnection of the fixed resistors is in each case effected at the zero crossing of the power system voltage by means of controllable semiconductor switches.
  • the semiconductor switches are controlled via a binary counter, clocked by a power-system-frequency pulse sequence, with a number of counting stages corresponding to the number of fixed resistors. This makes it possible to generate a sinusoidal fault current, which varies continuously with a corresponding number of fixed resistors, for testing fault current and fault voltage protection circuits.
  • a dry type load resistor for testing a generator or the like comprises a switching circuit made up of a semiconductor element, a testing load resistor circuit connected in series therewith, a controller for controlling a current supply to said switching circuit (31), and a programmable logic controller for sending a control instruction to said controller.
  • GB 1 161 789 A In a semi-conductor circuit comprising a plurality of semi-conductor devices connected with their load current paths in parallel and including in each load current path a printed circuit resistor for avoiding unequal load distribution, the semi-conductor devices and resistors are mounted on a cooling body. Power transistors P 2 - P 5 form a single stage of a regulating unit and have their emitter collector paths in parallel the transistors being controlled in unison by transistors being controlled in unison by transistor P 1 .
  • JP63055501U This document discloses a similar device.
  • a method for testing a transformer comprises operating a controller to generate a switching signal, supplying the switching signal to a solid state switch in circuit with a test load of known magnitude, switching the solid state switch to place the test load in circuit with the transformer, and measuring a signal through or across the transformer.
  • the method further includes analog-to-digital converting the measured signal.
  • the method further includes locking the phase of the switching signal to the phase of the measured signal.
  • supplying the switching signal to the solid state switch in circuit with the test load comprises supplying the switching signal to the solid state switch in parallel with the test load.
  • supplying the switching signal to the solid state switch in circuit with the test load comprises supplying the switching signal to the solid state switch in series with the test load.
  • supplying the switching signal to the solid state switch in circuit with the test load comprises supplying the switching signal to the solid state switch in series-parallel with the test load.
  • the method further includes monitoring zero crossings of the measured signal.
  • the method further includes operating the controller to generate the switching signal substantially at the zero crossings of the measured signal.
  • the method further includes analog-to-digital converting the measured signal.
  • supplying the switching signal to a solid state switch comprises supplying the switching signal to a field effect transistor.
  • apparatus for testing a transformer comprises a controller for generating a switching signal, a test load of known magnitude, and a solid state switch in circuit with the test load.
  • the solid state switch has a control port coupled to the controller for supplying the switching signal to the solid state switch to place the test load in circuit with the transformer.
  • the apparatus further comprises a measurement device coupled to the test load for measuring a signal through or across the transformer.
  • the apparatus further includes an analog-to-digital converter coupled to the transformer and to the measurement device for analog-to-digital converting the measured signal.
  • the controller is coupled to the test load to lock the phase of the switching signal to the phase of the measured signal.
  • the solid state switch is coupled in series circuit with the test load.
  • the solid state switch is coupled in parallel circuit with the test load.
  • the apparatus further includes multiple solid state switches.
  • the solid state switches are coupled in series-parallel circuit with the test load.
  • the controller is coupled to the test load to monitor zero crossings of the measured signal.
  • the controller supplies the switching signal to the solid state switch substantially at the zero crossings of the measured signal.
  • the apparatus further includes an analog-to-digital converter coupled to the transformer and to the measurement device for analog-to-digital converting the measured signal.
  • the solid state switch comprises a field effect transistor.
  • Power distribution from the generating plant to the load is accomplished by high-voltage, high-current transmission lines.
  • the high voltages (for example, 345 KV or 765 KV) and currents (for example, in the thousands of amperes) necessary to transmit power efficiently from the plant are impractical for ordinary use at most loads.
  • substations convert input voltage levels to output voltage levels (14.4 KV, 440 V, and so on) that are better suited for use at subscribers' loads.
  • a substation may also interconnect multiple power generators' networks into a grid. The or each power generator typically monitors its contribution to the energy at the substation or interconnection for, for example, billing purposes.
  • the voltages and currents at the substations are typically too large to be measured directly by an energy meter.
  • an instrument transformer generally is used.
  • a potential or voltage transformer (hereinafter sometimes VT) and a current transformer (hereinafter sometimes CT) are employed to generate precision ratio voltages and currents, and thus precision ratios to the energy passing through the substation at levels that are compatible with the energy meters installed at the substation; (typically 69 to 600 V AC and 0 - 20 A AC).
  • Fig. 1 is a diagrammatic illustration of such an installation. For economic reasons, it is important to measure accurately the energy passing through a substation.
  • One of the ways in which instrument transformers are rated is in accordance with so-called "Accuracy Class at Standard Burden" as defined in IEEE Standard C57.13-1993.
  • Fig. 2 illustrates diagrammatically a basic setup for burden testing. Such a test sequence may proceed generally as follows: a voltage or current reading M1 is measured. The rated burden is inserted into the circuit (generally in parallel for voltage and generally in series for current) and a second measurement M2 is taken. The burden is then removed from the circuit. The two readings are then compared as shown in equation 1 to determine the accuracy of the transformer.
  • burden testing by its nature assumes that the primary current is constant during the test interval. Small load shifts during a test yield inaccurate results. Further, internal heating of the burden may contribute to inaccuracies. As an example, an 8 ⁇ load conducting 5 A rms needs to be able to dissipate 200 W. However, temperature coefficients are associated with all resistors. The longer current passes through the burden, the more the burden heats up. The more the burden heats up, the greater is its drift from its nominal resistance.
  • the length of time that the burden needs to be in the circuit is a function of the settling time of the measurement device and how quickly the operator can record the measurement before removing the burden.
  • the resistors have definite life spans which are affected by temperature cycling. This requires that the burden resistors have power rating capability to dissipate the heat generated during burden testing.
  • burden resistors typically are relatively heavy, unwieldy devices. Many early burden testers were designed for "pulse" dissipation operation, and were subject to accidental overload by careless operators who left burdens in circuit for too long. While burning open a burden resistor used for PT testing only leads to inaccurate test results, burning open a burden resistor used for CT testing can damage the CT and/or the test equipment, and potentially harm the operator.
  • the operator may take multiple measurements and average the results in an effort to reduce the effect of a varying primary load.
  • this compounds the problems associated with internal heating of the burden and the length of time that the burden needs to be in the circuit.
  • the operator may insert the burden just long enough to read the measurement device. This may shorten the time that the burden is in the circuit.
  • this technique relies on, for example, the operator's memory and, as a result, is subject to error. This technique also risks that the operator may not allow sufficient settling time for the measurement device.
  • the 1980's-1990's generation of burden testers although an improvement over the "manual" burden test kits, typically requires an array of costly, high current relays and a number of discrete power burden resistors mounted on a relatively massive heat sink.
  • the length of time any particular burden is in circuit depends on the switching speeds of the associated relays (which can be greater than 10 msec) and the settling time of the measurement circuit.
  • the 1980's-1990's generation of transformer testers, using relays does not address control of the points in the waveform at which the burden is inserted into, and removed from, the measurement circuit. This may result in a burden being added and/or removed in mid-cycle.
  • a test switch 20 is provided in the paths 22-1, 22-2, 22-3 of the three phases ⁇ 1, ⁇ 2, ⁇ 3, respectively, of the current transformers 24-1, 24-2, 24-3, respectively, so that a test paddle or "duck bill" 25 (see Fig. 9d ), such as, for example, a Tesco model 1077 make-before-break test plug, may be inserted into the respective current loops without breaking the respective current paths.
  • a test paddle or "duck bill" 25 such as, for example, a Tesco model 1077 make-before-break test plug
  • Current burdens 26 are added in series with the transformer 24-m, 1 ⁇ m ⁇ 3, secondaries 24-m-s by, for example, opening respective bypass switches 28-m that otherwise shunt the current.
  • the resistance values of the current burdens 26 are dictated by IEEE Standard C57.13-1993, but values in the range of .2 ⁇ are typical.
  • a current measurement device in the illustrated embodiment an ammeter A, is inserted in series with the burden 26-m-switch 28-m parallel combination to measure the effect of inserting the burden 26-m in the secondary 24-m-s of the current transformer 24-m under test.
  • a voltage transformer 30-m, 1 ⁇ m ⁇ 3, may be tested in a similar manner by, for example, placing a burden 32 in parallel with the secondary 30-m-s of the transformer 30-m and closing the respective series switch 36-m, Fig. 2 .
  • the resistance values of the voltage burdens 32 are dictated by IEEE Standard C57.13-1993, but values in the range of 288 ⁇ are typical.
  • a voltage measurement device, in the illustrated embodiment a voltmeter V, is inserted in parallel with the burden 32-m-switch 36-m series combination to measure the effect of inserting the burden 32-m in the secondary 30-m-s of the voltage transformer 30-m under test.
  • a high accuracy, high speed measurement circuit 40 is used to measure the voltage or current of a TUT 24, 30.
  • the accuracy and speed of the circuit 40 are such that it is possible to lock it in phase with the zero crossings 42, Fig. 4 , of the voltage or current waveform and perform an rms measurement in a single cycle.
  • prior art high current relays may have on the order of 10 msec of lag time while engaging or disengaging, which distorts the measurement. An appropriate number of cycles must then be integrated in an effort to reduce this distortion.
  • the prior art's relays and switches have been replaced by high speed MOSFET switches 28, 36 which are capable of switching a burden 26, 32 in under 100 nsec.
  • ⁇ P Under the control of a computer (hereinafter sometimes microprocessor or ⁇ P) 44, Fig. 3a , working in conjunction with a digital signal processor (hereinafter sometimes DSP) 46, Fig. 3b , insertion and removal of a burden 26, 32 can be synchronized with the zero crossings 42, Fig. 4 , of the signal.
  • DSP digital signal processor
  • Fig. 3b insertion and removal of a burden 26, 32 can be synchronized with the zero crossings 42, Fig. 4 , of the signal.
  • a more accurate, more distortion-free measurement of the instrument transformer 24 or 30's response to the burden 26, 32 can be completed in as short a time as one cycle (16.66 msec at 60 Hz).
  • ⁇ P illustratively is an NXP LPC2141 32 bit ARM7 processor.
  • DSP 46 illustratively is a Texas Instruments type TMS320 DSP.
  • the measurement circuit includes the ⁇ P 44, the DSP 46, an integrated power resistor array (hereinafter sometimes IPRA) 50, Fig. 3c , providing the burden 26 or 32, an analog-to-digital converter (hereinafter sometimes ADC) 53 and compensated transformer 59, Fig. 3d , and a power supply 55 and user interface 57, Fig. 3e , all coupled in circuit as illustrated in Figs. 3a-e with the transformer CT or VT under test.
  • ADC 53 is of the general type described in U. S. Patent 6,833,803 , the disclosure of which is hereby incorporated herein by reference.
  • compensated transformer 59 is of the general type described in U. S. Patent 5,276,394 .
  • Power supply 55 receives at an input port AC LINE IN[0:1] power from the substation or the like at substation level, for example, 60 to 600 VAC, and provides at an output port POWER[0:1] the necessary voltages and currents to power all of ⁇ P 44 ( Fig. 3a ), DSP 46 ( Fig. 3b ), IPRA 50 ( Fig. 3c ), compensated transformer 59 and ADC 53 ( Fig. 3d ) to all of which it is coupled either directly, or, in the case of IPRA 50, from the ⁇ P 44's POWER2[0:1] port to the IPRA 50's POWER[0:1] port.
  • the user interface 57, Fig. 3e which may be a stand-alone PC connected or coupled wirelessly (e. g., by WiFi or Bluetooth protocol) or may be incorporated into the measurement device 62, includes user port USER INPUT[0:2], which may include KEYBOARD/TOUCHSCREEN, MOUSE/TOUCHPAD AND MONITOR/GUI I/Os, and port SERIAL_PC[0:1] which is coupled to DSP 46's SERIAL_PC[0:1] port.
  • DSP 46's SERIAL [0:1] port is coupled to ⁇ P 44's SERIAL [0:1] port.
  • IPRA 50's TRANSFORMER OUT[0:1] port is coupled to the measurement compensated transformer 59's TRANSFORMER IN[0:1] port.
  • the measurement compensated transformer 59's ANALOG SIGNAL [0:1] port is coupled to the ADC 53's ANALOG SIGNAL [0:1] port.
  • the MOSFET switches 28, 36 can be placed in parallel with the burden elements 26, 32 ( Figs. 5a-b , particularly Fig. 5b ), in series with the burden elements 26, 32 ( Figs. 6a-b , particularly Fig. 6b ) or in any combination of series and parallel required to achieve the desired composite burden 26, 32 value(s).
  • the number n of stages of switching that is desirable depends upon the desired range and increments of burdens to be added to the test loop. In an example, n might equal 10, with one resistor 26n of .2 ⁇ , one of 1/3 ⁇ , seven resistors of 1 ⁇ resistance each, and one of 2 ⁇ resistance.
  • Switches 26-n each illustratively comprise two International Rectifier IRF6618 FETs. Higher voltage FETs are required for switches 36-n.
  • Typical turns ratios for current transformers 24-m are 400:5, providing a 5 A secondary current for a 400 A primary current, 200:5, providing a 5 A secondary current for a 200 A primary current, 100:5, providing a 5 A secondary current for a 100 A primary current, and so on.
  • ten burden resistors 26-1, 26-2, ... 26-10 having values of .2 ⁇ , 1/3 ⁇ , 1 ⁇ , 1 ⁇ , 1 ⁇ , 1 ⁇ , 1 ⁇ , 1 ⁇ , 1 ⁇ , 1 ⁇ , and 2 ⁇ . These values permit a number of desirable current burdens to be put in circuit with the secondary 24-m-s of current transformer 24-m.
  • a test cycle may, for example, proceed as illustrated in Fig. 4 , with the signal being applied sequentially to a series of burdens 26, 32 incrementing from the highest value to the lowest value. An illustrative test cycle might then continue from the lowest value back to the highest.
  • Such a test cycle can measure the response of an instrument transformer 24, 30 at, for example, seven burden 26-n, 32-n values in less than 0.5 second at 60 Hz.
  • test cycle can effectively demagnetize a core that might otherwise be operating with a residual flux by subjecting it to progressively lower induced magnetic field, effectively ramping down through the hysteresis curve.
  • the energy that must be dissipated by the burden 26-n, 32-n is directly proportional to the applied power and the time the burden 26-n, 32-n is in circuit.
  • a one and a half orders of magnitude drop in test time equates to a one and a half orders of magnitude drop in energy that needs to be dissipated.
  • a feature of prior art discrete power resistors was used to advantage.
  • the heat sink(s) housing all of the resistors 26-n, 32-n can be used to help dissipate the heat when only one or two resistors may be used during a test, effectively increasing m in equation 5 above.
  • the multiple burden resistors 26-n, 32-n are mounted together in IPRA 50.
  • a common heat sink 52 constructed from a material, such as, for example, aluminum, copper or the like, having a high heat capacity, using a highly thermally conductive, yet electrically insulating potting material 51, thereby forming an aggregate or composite burden element.
  • An illustrative potting material 51 is Aremco Products Inc,, CERAMACAST 675 mixed with green silicon carbide at a ratio of 5:3.
  • Generally circular cross section channels are provided in heat sink 52 for slidably receiving two resistors 26-1, 26-2, ... 26-n, 32-1, 32-2, ... 32-n each.
  • the resistors 26-1, 26-2, ... 26-n, 32-1, 32-2, ... 32-n are coating with the potting material 51 before or as they are inserted into the channels, and additional potting material is added to fill the channels after the resistors are inserted into the channels.
  • the potting material is then permitted to harden, fixing the resistors 26-1, 26-2, ... 26-n, 32-1, 32-2, ... 32-n in thermal contact with the heat sink 52 while electrically insulating them from the heat sink 52.
  • the IPRA 50 When compared to, for example, ten discrete parts such as, for example, Vishay RH-50 resistors, Fig. 8 , the IPRA 50 has 30% less weight, and any switched series and/or parallel combination of values is capable of dissipating 105 W continuously at 25°C.
  • a single unmounted Vishay RH-50 resistor, Fig 8 is capable of dissipating 12 W when operated in free air.
  • a burden tester 54 ( Figs. 3a and 3c ) configured for testing an instrument current transformer 56, Fig. 9a , comprises a test paddle or duck bill 25 having leads 25-1, 25-2 for coupling to high and low side leads 56-s-1 and 56-s-2, respectively, of the secondary 56-s of transformer 56.
  • the high side 25-1 of the duck bill 25 is coupled to a high current connector pin 50-1, Figs. 9a-b , that is coupled to the high side of an IPRA 50 in the burden tester 54.
  • the low side 25-2 of the duck bill 25 is coupled via a high current connector pin 50-2 to one terminal 70-p-1 of the primary winding 70-p of a continuity transformer 70 in the burden tester 54.
  • First 60-1 and second 60-2 high current paths couple the burden tester 54 to a high accuracy DSP 46-controlled current measurement device 62 ( Figs. 3b , d and e ).
  • the first and second high current paths 60-1, 60-2, respectively, are coupled together by high-current, low-bias clamping diodes 64-1, 64-2, Fig. 9c , to provide a high current, low burden path if the current measurement device 62 is not in circuit.
  • Diodes 64-1, 64-2 illustratively are ST Microelectronics STPS30H60CG diodes.
  • the first high current path 60-1 couples the low side of the IPRA 50 to a high current test lead 66 terminated with a high current plug 68.
  • the second high current path 60-2 couples a low side terminal 70-p-2 of a primary 70-p of continuity transformer 70 to a high current test lead 72 terminated with a high current plug 74.
  • the n resistors 26-1, 26-2, ... 26-n, Figs. 9b and d , in the IPRA 50 are coupled in series.
  • a relay 76 when activated, shunts the secondary 56-s of the current transformer 56 by shunting high current connector pin 50-1, Fig 9a , to high current connector pin 50-2 when relay 76 is closed.
  • An illustrative relay 76 is the Tyco RTD14012F relay.
  • a high current fault circuit 78 is placed across high current connector pin 50-1 and high current connector pin 50-2.
  • Circuit 78 monitors the voltage across secondary 56-s of the current transformer 56 under test and clamps the secondary 56-s in the event of an over-burden condition, such as, for example, when the voltage across the secondary 56-s gets above 60 volts peak.
  • Circuit 78 also shorts the secondary until relay 76 closes.
  • a typical relay 76 has a 20 msec switching time.
  • a second relay 80 shunts the IPRA 50 high side 50-h to its low side 50-l when closed.
  • An illustrative relay 80 is the Tyco RTD14012F relay.
  • a high-side terminal 70-s-1, Fig. 9c , of the secondary 70-s of the continuity transformer 70 is coupled to an output terminal of an amplifier 84 having an inverting (-) input terminal and a non-inverting (+) input terminal.
  • a low-side terminal 70-s-2 of the continuity transformer 70 is coupled to ground.
  • the output terminal of the amplifier 84 is coupled through a 1 K ⁇ resistor to the - input terminal of amplifier 84.
  • the - input terminal of amplifier 84 is further coupled through a 1 K ⁇ resistor to ground.
  • the microprocessor 44 is coupled by a high pass filter 86 including a resistor having a resistance of, illustratively, 1 K ⁇ , and a capacitor having a capacitance of, illustratively, 10 ⁇ F, to the + input terminal of the amplifier 84.
  • a signal may be generated by the microprocessor 44 and coupled to the high current path 60-1, 60-2 and measured by the current measurement device 62 to assure that a good path exists before applying a burden 26-1, 26-2, ... 26-n to the current transformer 56 secondary 56-s.
  • An illustrative continuity transformer 70 has a turns ratio of 125:2.
  • the high side terminal 70-s-1 of secondary 70-s is also coupled through a low-value load resistor, illustratively, a 5 ⁇ resistor, and a relay 100 to ground.
  • Relay 100 illustratively is an Omron G5V relay. The purpose of relay 100 is to shunt the secondary 70-s when amplifier 84 is not injecting a signal. Otherwise, an impedance will be reflected back into the load of the secondary 56-s of the current transformer 56.
  • amplifier 84 is a Burr-Brown (now Texas Instruments) type OPA227, V CC is 6V and V EE is -6V.
  • a MOSFET switch 28-1, 28-2, ... 28-n couples the high side of each of resistors 26-1, 26-2, ... 26-n, respectively, in the IPRA 50 to the respective resistor's low side.
  • Each resistor 26-1, 26-2, ... 26-n thus may be individually put in or taken out of circuit by turning its respective MOSFET switch 28-1, 28-2, ... 28-n off or on.
  • a low power plug 90 is provided to obtain auxiliary power, for serial communication and interfacing between the burden tester 54, Figs. 3a and c , and the measurement device 62, Figs. 3b , d and e .
  • a low power jack 96 is provided to "daisy chain" additional devices to auxiliary power, to the serial communication lines 98, and for interfacing the low level current measurement circuit 62, Figs. 3b , d and e .
  • Relay 100, Figs. 9d and 10a permits selection between coupling the local continuity circuit, Fig. 9d , or a daisy chained device coupled to jack 96 to the current measurement circuit 62, Figs. 3b , d and e .
  • Relay 100 is driven from ⁇ P 44 through a bipolar transistor, illustratively a type 2N2222.
  • a clamp-on current probe such as, for example, an AEMC model JM845A clamp-on current probe, may be attached to the pass-through connector 96 so that the primary current at the installation may be compared to the secondary current being measured directly on the high current path 60-1, 60-2.
  • Microprocessor 44 controls the relays 76, 80, 100 and MOSFET switches 28-1, 28-2, ... 28-n or 36-1, 36-2, ... 36-n, monitors a temperature sensor 110, Fig. 10b , affixed to the IPRA 50, monitors the overburden trip circuit 78, sources the voltage at the output port of amplifier 84 for the continuity test, modulates the fan 114, Fig. 7 , associated with IPRA 50, and communicates with the DSP 46 over the serial communication lines 98.
  • the temperature sensor 110 is coupled to the microprocessor 44 via two-wire serial line 98.
  • Temperature sensor 110 illustratively is a NXP SA56004 with V DD of 3.3 V.
  • Each MOSFET switch 28-n, 36-n is driven from the microprocessor 44 through a buffer 116-n, driving a pulse transformer 118-n. See Figs. 5a , 6a and 10c .
  • An illustrative buffer 116-n is the Texas Instruments UCC27324D FET driver with V CC of 6V, driving a pulse transformer 118-n having a turns ratio of 1:2, and a driver transistor such as an ON Semiconductor or Motorola BSS138 FET coupling the pulse transformer to the input ports of switches 28-n, 36-n.
  • LEDs 122 are coupled to the microprocessor 44 to provide a visual indication of the status of the burden tester 54.
  • LEDs 122 are a Dialight 521-9450. Because the power supply in the illustrated example had limited power, the circuit of Fig. 10d was provided to shift the voltage supply level from the +3.3 V supply to the ⁇ P 44 to the system's -6 V supply. In the circuit illustrated in Fig.
  • R53 and R54 are 3.16 K ⁇ resistors
  • Q42 and Q45 are type 2N2907 bipolar transistors
  • Q43 and Q44 are type BSS138 FETs
  • R55 and R56 are 46.4 K ⁇ resistors
  • R58 and R59 are 316 ⁇ resistors.
  • a user request to start a burden test signals the start of a test.
  • the burden measurement logic is switched on, Figs. 11a and c , the "start of test" trigger is detected by the "count down to start of burden measurement” routine, Fig. 11b , which triggers "start of control.”
  • a vector of selected burdens to measure is provided to the burden hardware controller, Figs. 11b and d.
  • a burden counter is incremented, Fig. 11b , and current measurement inputs are provided, Fig. 11c , to a "zero crossing detection” routine, a "frequency detection” routine and an “integrate and dump” routine.
  • the "zero crossing" routine also provides phase measurement output to an "even zero crossing" decision block, Fig. 11c , to the burden hardware ( Figs. 9a-d , 10a-d ) controller, Figs. 11b and d , and to the "count down to start of burden measurement" routine, Fig. 11b . If the zero crossing is not even, Figs. 11c and b, the burden counter is incremented, Fig. 11b . If the zero crossing is even, Fig. 11c , indicating that a complete cycle of the input current or voltage has passed, the "integrate and dump” routine dumps the integrated value to storage and clears the integrator, and the ith burden measurement is stored, Figs. 11c-d .
  • Fig. 11b the routine asks, Figs. 11a-b , if the counter has exceeded the maximum number of burdens 26, 32 with which the instrument transformer, 24, 30, 56 is to be tested. If not, the routine continues to run. If the burden counter has exceeded the maximum number of burdens, Fig. 11a , the program has reached the "end of test," and the routine is switched off.
  • the illustrated high accuracy current measurement device 62 includes a low burden, precision ratio, current measurement stage 59, Fig. 3d , coupled to a 24 bit ADC 53 coupled to DSP 46, Fig. 3b . While illustrated as embedded or incorporated into the device 40, ⁇ P 44 can also be external to the current measurement apparatus 40 and communicate with it, for example, via serial communication.
  • the microprocessor 44's and DSP 46's software configures the microprocessor 44 and DSP 46 to function together in a phase locked loop (hereinafter sometimes PLL), synchronizing measurements and burden commands with the zero crossings (see Fig. 4 ) of the current or voltage being measured.
  • PLL phase locked loop
  • the software analyzes the spectrum of the measured current or voltage, providing harmonic and inter-harmonic information, measures the unburdened current/voltage and the burdened current/voltage and provides the percentage (%) difference measurement.
  • the software also multiplexes between the high current path and the low current path. With a calibrated primary current clamp (not shown) attached to the pass-through connector, the software calculates the ratio of the primary current to the secondary current through, for example, 56-s.
  • the software further communicates with the built-in user interface 57 of the current measurement device 62 or with an external interface (not shown) by serial communication.
  • This system thus permits the user to interface with the transformer test apparatus 40. This includes, but is not limited to, creating, editing, and executing test sequences, collecting and displaying test results, and generating reports of gathered results.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Claims (15)

  1. Procédé destiné à essayer un transformateur (24, 30, 56), le procédé comprenant les étapes suivantes : actionner un contrôleur (44) pour générer un signal de commutation, fournir le signal de commutation à un commutateur semi-conducteur (28, 36) dans le circuit avec une charge d'essai (26, 32) d'une grandeur connue, commuter le commutateur semi-conducteur (28, 36) pour placer la charge d'essai (26, 32) dans le circuit avec le transformateur (24, 30, 56), mesurer un signal dans le transformateur (24, 30, 56), surveiller les passages par zéro (42) du signal mesuré, et actionner le contrôleur (44) pour générer le signal de commutation sensiblement aux passages par zéro (42) du signal mesuré.
  2. Procédé selon la revendication 1, comprenant en outre une étape de conversion analogique - numérique (53) du signal mesuré.
  3. Procédé selon la revendication 2, comprenant en outre une étape de verrouillage de la phase du signal de commutation, avec la phase du signal mesuré.
  4. Procédé selon la revendication 1, où l'étape de fourniture du signal de commutation au commutateur semi-conducteur (28, 36) dans le circuit avec la charge d'essai (26, 32) d'une grandeur connue, comprend la fourniture du signal de commutation au commutateur semi-conducteur (28, 36) en parallèle avec la charge d'essai (26, 32).
  5. Procédé selon la revendication 1, où l'étape de fourniture du signal de commutation au commutateur semi-conducteur (28, 36) dans le circuit avec la charge d'essai (26, 32) d'une grandeur connue, comprend la fourniture du signal de commutation au commutateur semi-conducteur (28, 36) en série avec la charge d'essai (26, 32).
  6. Procédé selon la revendication 1, où l'étape de fourniture du signal de commutation au commutateur semi-conducteur (28, 36) dans le circuit avec la charge d'essai (26, 32) d'une grandeur connue, comprend la fourniture du signal de commutation au commutateur semi-conducteur (28, 36) en série - parallèle avec la charge d'essai (26, 32).
  7. Procédé selon la revendication 1, comprenant en outre une étape de conversion analogique - numérique (53) du signal mesuré.
  8. Procédé selon la revendication 1, où l'étape de fourniture du signal de commutation à un commutateur semi-conducteur (28, 36), comprend une étape de fourniture du signal de commutation à un transistor à effet de champ (28, 36).
  9. Appareil destiné à essayer un transformateur (24, 30, 56), l'appareil comprenant un contrôleur (44) pour générer un signal de commutation, une charge d'essai d'une grandeur connue, un commutateur semi-conducteur (28, 36) dans le circuit avec la charge d'essai (26, 32), le commutateur semi-conducteur (28, 36) présentant un port de commande couplé au contrôleur (44) pour fournir le signal de commutation au commutateur semi-conducteur (28, 36) pour placer la charge d'essai (26, 32) dans le circuit avec le transformateur (24, 30, 56), et un dispositif de mesure (62) couplé à la charge d'essai (26, 32) pour mesurer un signal dans le transformateur (24, 30, 56), où le contrôleur (44) est couplé à la charge d'essai pour surveiller les passages par zéro (42) du signal mesuré, et le contrôleur (44) fournit le signal de commutation au commutateur semi-conducteur (28, 36) sensiblement aux passages par zéro (42) du signal mesuré.
  10. Appareil selon la revendication 11, comprenant en outre un convertisseur analogique - numérique (53) couplé au transformateur (24, 30, 56) et au dispositif de mesure (62) pour convertir le signal mesuré de manière analogique - numérique.
  11. Appareil selon la revendication 12, où le contrôleur (44) est couplé à la charge d'essai (26, 32) d'une grandeur connue, pour verrouiller la phase du signal de commutation avec la phase du signal mesuré.
  12. Appareil selon la revendication 11, où le commutateur semi-conducteur (28, 36) est couplé en série (26-n, 28-notn, 32-n, 36-n) avec la charge d'essai (26, 32) d'une grandeur connue.
  13. Appareil selon la revendication 11, où le commutateur semi-conducteur (28, 36) est couplé en parallèle (26-n, 28-n, 32-n, 36-notn) avec la charge d'essai (26, 32) d'une grandeur connue.
  14. Appareil selon la revendication 11, comprenant plusieurs commutateurs semi-conducteurs (28, 36), les commutateurs semi-conducteurs (28, 36) étant couplés en série - parallèle (26-n, 28-notn, 32-n, 36n, 36-notn) avec la charge d'essai (26, 32) d'une grandeur connue.
  15. Appareil selon la revendication 11, où le commutateur semi-conducteur (28, 36) comprend un transistor à effet de champ (28, 36).
EP08797677.5A 2007-08-16 2008-08-12 Appareil et procédé pour tester un transformateur d'instruments Active EP2179296B1 (fr)

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US95632207P 2007-08-16 2007-08-16
PCT/US2008/072873 WO2009026038A1 (fr) 2007-08-16 2008-08-12 Appareil et procédé pour tester un transformateur d'instruments

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EP2179296A4 (fr) 2013-05-22
ES2745414T3 (es) 2020-03-02
US9366744B2 (en) 2016-06-14
CA2698428C (fr) 2017-05-30
US20120139555A1 (en) 2012-06-07
CA2698428A1 (fr) 2009-02-26
BRPI0815488A2 (pt) 2018-06-05
WO2009026038A1 (fr) 2009-02-26
EP2179296A1 (fr) 2010-04-28

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