EP2175288A4 - Vorrichtung zur messung von chip-leckagefluss und -temperatur - Google Patents

Vorrichtung zur messung von chip-leckagefluss und -temperatur

Info

Publication number
EP2175288A4
EP2175288A4 EP08805308A EP08805308A EP2175288A4 EP 2175288 A4 EP2175288 A4 EP 2175288A4 EP 08805308 A EP08805308 A EP 08805308A EP 08805308 A EP08805308 A EP 08805308A EP 2175288 A4 EP2175288 A4 EP 2175288A4
Authority
EP
European Patent Office
Prior art keywords
chip
leakage current
measuring temperature
measuring
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP08805308A
Other languages
English (en)
French (fr)
Other versions
EP2175288A1 (de
Inventor
Herrero Pablo Ituero
Rodrigo Jose Luis Ayala
Vallejo Marisa Lopez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad Politecnica de Madrid
Original Assignee
Universidad Politecnica de Madrid
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad Politecnica de Madrid filed Critical Universidad Politecnica de Madrid
Publication of EP2175288A1 publication Critical patent/EP2175288A1/de
Publication of EP2175288A4 publication Critical patent/EP2175288A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
EP08805308A 2007-07-27 2008-07-07 Vorrichtung zur messung von chip-leckagefluss und -temperatur Withdrawn EP2175288A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES200702109A ES2291143B2 (es) 2007-07-27 2007-07-27 Aparato para la medida de temperatura y corriente de fugas en un chip.
PCT/ES2008/000478 WO2009022038A1 (es) 2007-07-27 2008-07-07 Aparato para la medida de temperatura y corriente de fugas en un chip.

Publications (2)

Publication Number Publication Date
EP2175288A1 EP2175288A1 (de) 2010-04-14
EP2175288A4 true EP2175288A4 (de) 2013-03-13

Family

ID=39031190

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08805308A Withdrawn EP2175288A4 (de) 2007-07-27 2008-07-07 Vorrichtung zur messung von chip-leckagefluss und -temperatur

Country Status (4)

Country Link
US (1) US20100274505A1 (de)
EP (1) EP2175288A4 (de)
ES (1) ES2291143B2 (de)
WO (1) WO2009022038A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10031180B2 (en) 2015-07-22 2018-07-24 International Business Machines Corporation Leakage power characterization at high temperatures for an integrated circuit
US20180367881A1 (en) * 2017-06-15 2018-12-20 Apple Inc. Dual Battery Smart Charge Sharing
CN121139547B (zh) * 2025-10-29 2026-02-13 北京东方启晨智能装备制造有限公司 一种电液伺服阀测试试验台及其测试试验方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB999933A (en) * 1963-08-09 1965-07-28 Cossor Ltd A C Logarithmic counter
JPS52136557A (en) * 1976-05-11 1977-11-15 Oki Electric Ind Co Ltd Logarithm counter circuit device
US20070132523A1 (en) * 2005-12-08 2007-06-14 Intel Corporation Leakage oscillator based aging monitor

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6882172B1 (en) * 2002-04-16 2005-04-19 Transmeta Corporation System and method for measuring transistor leakage current with a ring oscillator
US7193427B2 (en) * 2003-06-30 2007-03-20 Intel Corporation Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB999933A (en) * 1963-08-09 1965-07-28 Cossor Ltd A C Logarithmic counter
JPS52136557A (en) * 1976-05-11 1977-11-15 Oki Electric Ind Co Ltd Logarithm counter circuit device
US20070132523A1 (en) * 2005-12-08 2007-06-14 Intel Corporation Leakage oscillator based aging monitor

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PABLO ITUERO ET AL: "Leakage-based On-Chip Thermal Sensor for CMOS Technology", CIRCUITS AND SYSTEMS, 2007. ISCAS 2007. IEEE INTERNATIONAL SYMPOSIUM O N, IEEE, PI, 1 May 2007 (2007-05-01), pages 3327 - 3330, XP031182017, ISBN: 978-1-4244-0920-4 *
See also references of WO2009022038A1 *

Also Published As

Publication number Publication date
WO2009022038A1 (es) 2009-02-19
ES2291143A1 (es) 2008-02-16
US20100274505A1 (en) 2010-10-28
ES2291143B2 (es) 2008-07-16
EP2175288A1 (de) 2010-04-14

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