EP2160766A4 - ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT - Google Patents
ABSOLUTELY RADIATION PERFORMANCE MEASUREMENTInfo
- Publication number
- EP2160766A4 EP2160766A4 EP08761717.1A EP08761717A EP2160766A4 EP 2160766 A4 EP2160766 A4 EP 2160766A4 EP 08761717 A EP08761717 A EP 08761717A EP 2160766 A4 EP2160766 A4 EP 2160766A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- power measurement
- radiation power
- absolute radiation
- absolute
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000005259 measurement Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
- H01L31/02165—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/044—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using shutters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20070429A FI125849B (fi) | 2007-05-31 | 2007-05-31 | Absoluuttinen säteilytehon mittaus |
PCT/FI2008/050321 WO2008145829A1 (en) | 2007-05-31 | 2008-06-02 | Absolute radiation power measurement |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2160766A1 EP2160766A1 (en) | 2010-03-10 |
EP2160766A4 true EP2160766A4 (en) | 2014-06-11 |
Family
ID=38069468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP08761717.1A Withdrawn EP2160766A4 (en) | 2007-05-31 | 2008-06-02 | ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP2160766A4 (fi) |
FI (1) | FI125849B (fi) |
WO (1) | WO2008145829A1 (fi) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4096387A (en) * | 1976-12-09 | 1978-06-20 | Rca Corporation | Ultraviolet radiation detector |
CH669050A5 (de) * | 1985-05-29 | 1989-02-15 | Oerlikon Buehrle Holding Ag | Sensor zum nachweis von aenderungen der brechzahl einer festen oder fluessigen messsubstanz. |
US5281804A (en) * | 1992-08-06 | 1994-01-25 | Fujitsu Ltd. | Mirror apparatus for increasing light absorption efficiency of an optical detector |
US20040033025A1 (en) * | 2002-08-15 | 2004-02-19 | Richard Fred Vincent | Orthogonal coupled transceiver |
US20040169245A1 (en) * | 2001-11-05 | 2004-09-02 | The Trustees Of Boston University | Reflective layer buried in silicon and method of fabrication |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3506835A (en) * | 1967-08-01 | 1970-04-14 | Zenith Radio Corp | Photo-detector signal-translating device |
US3567948A (en) | 1969-04-14 | 1971-03-02 | Us Navy | Method and apparatus for improving the quantum efficiency of phototubes |
JPS596582A (ja) * | 1982-07-05 | 1984-01-13 | Mitsubishi Electric Corp | 電源装置 |
US4681450A (en) * | 1985-06-21 | 1987-07-21 | Research Corporation | Photodetector arrangement for measuring the state of polarization of light |
US4782382A (en) * | 1986-10-17 | 1988-11-01 | Applied Solar Energy Corporation | High quantum efficiency photodiode device |
DE3920219A1 (de) * | 1989-06-21 | 1991-01-10 | Licentia Gmbh | Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betrieb |
US5291055A (en) * | 1992-01-28 | 1994-03-01 | The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration | Resonant infrared detector with substantially unit quantum efficiency |
-
2007
- 2007-05-31 FI FI20070429A patent/FI125849B/fi not_active IP Right Cessation
-
2008
- 2008-06-02 WO PCT/FI2008/050321 patent/WO2008145829A1/en active Application Filing
- 2008-06-02 EP EP08761717.1A patent/EP2160766A4/en not_active Withdrawn
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4096387A (en) * | 1976-12-09 | 1978-06-20 | Rca Corporation | Ultraviolet radiation detector |
CH669050A5 (de) * | 1985-05-29 | 1989-02-15 | Oerlikon Buehrle Holding Ag | Sensor zum nachweis von aenderungen der brechzahl einer festen oder fluessigen messsubstanz. |
US5281804A (en) * | 1992-08-06 | 1994-01-25 | Fujitsu Ltd. | Mirror apparatus for increasing light absorption efficiency of an optical detector |
US20040169245A1 (en) * | 2001-11-05 | 2004-09-02 | The Trustees Of Boston University | Reflective layer buried in silicon and method of fabrication |
US20040033025A1 (en) * | 2002-08-15 | 2004-02-19 | Richard Fred Vincent | Orthogonal coupled transceiver |
Non-Patent Citations (1)
Title |
---|
See also references of WO2008145829A1 * |
Also Published As
Publication number | Publication date |
---|---|
FI20070429A (fi) | 2008-12-01 |
WO2008145829A1 (en) | 2008-12-04 |
FI125849B (fi) | 2016-03-15 |
FI20070429A0 (fi) | 2007-05-31 |
EP2160766A1 (en) | 2010-03-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20091228 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR |
|
AX | Request for extension of the european patent |
Extension state: AL BA MK RS |
|
DAX | Request for extension of the european patent (deleted) | ||
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 31/0216 20140101ALI20140430BHEP Ipc: G01J 1/42 20060101ALI20140430BHEP Ipc: H01L 31/0232 20140101AFI20140430BHEP Ipc: G01J 1/02 20060101ALI20140430BHEP Ipc: G01J 1/04 20060101ALI20140430BHEP |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20140509 |
|
17Q | First examination report despatched |
Effective date: 20161020 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20181106 |