EP2160766A4 - ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT - Google Patents

ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT

Info

Publication number
EP2160766A4
EP2160766A4 EP08761717.1A EP08761717A EP2160766A4 EP 2160766 A4 EP2160766 A4 EP 2160766A4 EP 08761717 A EP08761717 A EP 08761717A EP 2160766 A4 EP2160766 A4 EP 2160766A4
Authority
EP
European Patent Office
Prior art keywords
power measurement
radiation power
absolute radiation
absolute
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP08761717.1A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP2160766A1 (en
Inventor
Erkki Ikonen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aalto Korkeakoulusaatio sr
Original Assignee
Teknillinen Korkeakoulu
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teknillinen Korkeakoulu filed Critical Teknillinen Korkeakoulu
Publication of EP2160766A1 publication Critical patent/EP2160766A1/en
Publication of EP2160766A4 publication Critical patent/EP2160766A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02165—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0271—Housings; Attachments or accessories for photometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/044—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using shutters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Light Receiving Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
EP08761717.1A 2007-05-31 2008-06-02 ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT Withdrawn EP2160766A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20070429A FI125849B (fi) 2007-05-31 2007-05-31 Absoluuttinen säteilytehon mittaus
PCT/FI2008/050321 WO2008145829A1 (en) 2007-05-31 2008-06-02 Absolute radiation power measurement

Publications (2)

Publication Number Publication Date
EP2160766A1 EP2160766A1 (en) 2010-03-10
EP2160766A4 true EP2160766A4 (en) 2014-06-11

Family

ID=38069468

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08761717.1A Withdrawn EP2160766A4 (en) 2007-05-31 2008-06-02 ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT

Country Status (3)

Country Link
EP (1) EP2160766A4 (fi)
FI (1) FI125849B (fi)
WO (1) WO2008145829A1 (fi)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4096387A (en) * 1976-12-09 1978-06-20 Rca Corporation Ultraviolet radiation detector
CH669050A5 (de) * 1985-05-29 1989-02-15 Oerlikon Buehrle Holding Ag Sensor zum nachweis von aenderungen der brechzahl einer festen oder fluessigen messsubstanz.
US5281804A (en) * 1992-08-06 1994-01-25 Fujitsu Ltd. Mirror apparatus for increasing light absorption efficiency of an optical detector
US20040033025A1 (en) * 2002-08-15 2004-02-19 Richard Fred Vincent Orthogonal coupled transceiver
US20040169245A1 (en) * 2001-11-05 2004-09-02 The Trustees Of Boston University Reflective layer buried in silicon and method of fabrication

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3506835A (en) * 1967-08-01 1970-04-14 Zenith Radio Corp Photo-detector signal-translating device
US3567948A (en) 1969-04-14 1971-03-02 Us Navy Method and apparatus for improving the quantum efficiency of phototubes
JPS596582A (ja) * 1982-07-05 1984-01-13 Mitsubishi Electric Corp 電源装置
US4681450A (en) * 1985-06-21 1987-07-21 Research Corporation Photodetector arrangement for measuring the state of polarization of light
US4782382A (en) * 1986-10-17 1988-11-01 Applied Solar Energy Corporation High quantum efficiency photodiode device
DE3920219A1 (de) * 1989-06-21 1991-01-10 Licentia Gmbh Betrieb eines optischen detektors bzw. optischer detektor geeignet fuer diesen betrieb
US5291055A (en) * 1992-01-28 1994-03-01 The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration Resonant infrared detector with substantially unit quantum efficiency

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4096387A (en) * 1976-12-09 1978-06-20 Rca Corporation Ultraviolet radiation detector
CH669050A5 (de) * 1985-05-29 1989-02-15 Oerlikon Buehrle Holding Ag Sensor zum nachweis von aenderungen der brechzahl einer festen oder fluessigen messsubstanz.
US5281804A (en) * 1992-08-06 1994-01-25 Fujitsu Ltd. Mirror apparatus for increasing light absorption efficiency of an optical detector
US20040169245A1 (en) * 2001-11-05 2004-09-02 The Trustees Of Boston University Reflective layer buried in silicon and method of fabrication
US20040033025A1 (en) * 2002-08-15 2004-02-19 Richard Fred Vincent Orthogonal coupled transceiver

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2008145829A1 *

Also Published As

Publication number Publication date
FI20070429A (fi) 2008-12-01
WO2008145829A1 (en) 2008-12-04
FI125849B (fi) 2016-03-15
FI20070429A0 (fi) 2007-05-31
EP2160766A1 (en) 2010-03-10

Similar Documents

Publication Publication Date Title
GB0719004D0 (en) Interference power measurement
EP2281707A4 (en) PROTECTIVE STRUCTURE FOR POWER SOURCE
PL2208085T3 (pl) Pomiar oparty na funkcji szczegółowej
EP2180342A4 (en) RADIATION DETECTOR
GB0722430D0 (en) Radiation detection
IL205972A0 (en) Power sensor
EP2351526A4 (en) TOMOGRAPHY BASED ON RAYS
EP2502236A4 (en) COMPACT RADIATION GENERATOR
GB201018305D0 (en) Eletro-magnetic radiation detectot
GB0811509D0 (en) Power sensor
EP2154559A4 (en) OBJECT INVESTIGATORS
AU316226S (en) External power device
EP2312649A4 (en) RADIATION DETECTOR
GB0722416D0 (en) Novel radiation detector
EP2177932A4 (en) RADIATION METER
GB0704847D0 (en) Detector
EP2333584A4 (en) RADIATION DETECTOR
EP2191256A4 (en) CELL OF MEASUREMENT
EP2126935A4 (en) POWER CABLE
GB2453606B (en) Solar power source
GB2449341B (en) Radiation detector
IL179877A0 (en) Remote power supplay detector
GB0709280D0 (en) Detector
EP2160766A4 (en) ABSOLUTELY RADIATION PERFORMANCE MEASUREMENT
GB0801875D0 (en) Power unit

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20091228

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA MK RS

DAX Request for extension of the european patent (deleted)
RIC1 Information provided on ipc code assigned before grant

Ipc: H01L 31/0216 20140101ALI20140430BHEP

Ipc: G01J 1/42 20060101ALI20140430BHEP

Ipc: H01L 31/0232 20140101AFI20140430BHEP

Ipc: G01J 1/02 20060101ALI20140430BHEP

Ipc: G01J 1/04 20060101ALI20140430BHEP

A4 Supplementary search report drawn up and despatched

Effective date: 20140509

17Q First examination report despatched

Effective date: 20161020

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20181106