EP2144271A4 - X-ray imaging device and x-ray radiographic apparatus - Google Patents

X-ray imaging device and x-ray radiographic apparatus

Info

Publication number
EP2144271A4
EP2144271A4 EP08751624A EP08751624A EP2144271A4 EP 2144271 A4 EP2144271 A4 EP 2144271A4 EP 08751624 A EP08751624 A EP 08751624A EP 08751624 A EP08751624 A EP 08751624A EP 2144271 A4 EP2144271 A4 EP 2144271A4
Authority
EP
European Patent Office
Prior art keywords
ray
imaging device
radiographic apparatus
ray imaging
ray radiographic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP08751624A
Other languages
German (de)
French (fr)
Other versions
EP2144271B1 (en
EP2144271A1 (en
Inventor
Toshiyoshi Yamamoto
Yoshihiro Ino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PHC Corp
Original Assignee
Panasonic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp filed Critical Panasonic Corp
Publication of EP2144271A1 publication Critical patent/EP2144271A1/en
Publication of EP2144271A4 publication Critical patent/EP2144271A4/en
Application granted granted Critical
Publication of EP2144271B1 publication Critical patent/EP2144271B1/en
Not-in-force legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/085—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors the device being sensitive to very short wavelength, e.g. X-ray, Gamma-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/246—Measuring radiation intensity with semiconductor detectors utilizing latent read-out, e.g. charge stored and read-out later
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00—Cathode ray tubes; Electron beam tubes
    • H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
    • H01J31/26—Image pick-up tubes having an input of visible light and electric output
    • H01J31/28—Image pick-up tubes having an input of visible light and electric output with electron ray scanning the image screen
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00—Cathode ray tubes; Electron beam tubes
    • H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
    • H01J31/49—Pick-up adapted for an input of electromagnetic radiation other than visible light and having an electric output, e.g. for an input of X-rays, for an input of infrared radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer
    • H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Multimedia (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
EP08751624.1A 2007-04-26 2008-04-25 X-ray imaging device and x-ray radiographic apparatus Not-in-force EP2144271B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007116939 2007-04-26
PCT/JP2008/001099 WO2008136188A1 (en) 2007-04-26 2008-04-25 X-ray imaging device and x-ray radiographic apparatus

Publications (3)

Publication Number Publication Date
EP2144271A1 EP2144271A1 (en) 2010-01-13
EP2144271A4 true EP2144271A4 (en) 2010-12-08
EP2144271B1 EP2144271B1 (en) 2014-04-09

Family

ID=39943309

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08751624.1A Not-in-force EP2144271B1 (en) 2007-04-26 2008-04-25 X-ray imaging device and x-ray radiographic apparatus

Country Status (6)

Country Link
US (1) US8270567B2 (en)
EP (1) EP2144271B1 (en)
JP (1) JPWO2008136188A1 (en)
KR (1) KR20100015849A (en)
CN (1) CN101669186B (en)
WO (1) WO2008136188A1 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5850309B2 (en) * 2011-09-16 2016-02-03 国立大学法人 筑波大学 In vivo indwelling object visualization device
JP5965665B2 (en) * 2012-02-23 2016-08-10 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Detector module, light shielding member, radiation detection apparatus, and radiation tomography apparatus
US10242836B2 (en) 2012-03-16 2019-03-26 Nanox Imaging Plc Devices having an electron emitting structure
CN104584179B (en) 2012-08-16 2017-10-13 纳欧克斯影像有限公司 Image capture device
WO2015063665A1 (en) * 2013-11-01 2015-05-07 Koninklijke Philips N.V. Radiation detector and detection method having reduced polarization
US10269527B2 (en) 2013-11-27 2019-04-23 Nanox Imaging Plc Electron emitting construct configured with ion bombardment resistant
CN104237264B (en) * 2014-09-10 2017-01-11 西安交通大学 Multi-specification automatic film feeding regulating device
JP6921858B2 (en) * 2016-01-07 2021-08-18 ザ リサーチ ファウンデイション フォー ザ ステイト ユニヴァーシティ オブ ニューヨーク Selenium photomultiplier tube and its manufacturing method
US10790069B2 (en) * 2016-10-11 2020-09-29 Source Production & Equipment Co., Inc. Delivering radiation
JP6863267B2 (en) * 2017-12-21 2021-04-21 株式会社島津製作所 X-ray analyzer and abnormality detection method
JP6790005B2 (en) * 2018-02-23 2020-11-25 株式会社東芝 Detection element and detector
JP6790008B2 (en) * 2018-03-14 2020-11-25 株式会社東芝 Detection element and detector
WO2019185831A1 (en) * 2018-03-29 2019-10-03 Koninklijke Philips N.V. Pixel definition in a porous silicon quantum dot radiation detector
CN110911501A (en) * 2019-12-04 2020-03-24 中国工程物理研究院材料研究所 Detection device
CN111180472A (en) * 2019-12-23 2020-05-19 德润特医疗科技（武汉）有限公司 Multilayer compound X-ray detector

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2608842A1 (en) * 1986-12-22 1988-06-24 Commissariat Energie Atomique PHOTOELECTRONIC TRANSDUCER USING MICROPOINT EMISSIVE CATHODE
US5117114A (en) * 1989-12-11 1992-05-26 The Regents Of The University Of California High resolution amorphous silicon radiation detectors
JPH07335927A (en) * 1994-06-03 1995-12-22 Japan Energy Corp Fabrication of semiconductor radiation detector
US5515411A (en) * 1993-03-31 1996-05-07 Shimadzu Corporation X-ray image pickup tube
JP2000048743A (en) * 1998-05-26 2000-02-18 Futaba Corp Plane image pick-up device, and its manufacture
US6042267A (en) * 1997-04-09 2000-03-28 Hamamatsu Photonics K.K. X-ray image pickup apparatus for intraoral radiography
US6559451B1 (en) * 1999-09-08 2003-05-06 Sharp Kabushiki Kaisha Manufacturing method for two-dimensional image detectors and two-dimensional image detectors
US20060072427A1 (en) * 2003-06-11 2006-04-06 Yoshihiro Kanda Information storage

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6078643A (en) * 1998-05-07 2000-06-20 Infimed, Inc. Photoconductor-photocathode imager
JP3969981B2 (en) * 2000-09-22 2007-09-05 キヤノン株式会社 Electron source driving method, driving circuit, electron source, and image forming apparatus
US7099428B2 (en) * 2002-06-25 2006-08-29 The Regents Of The University Of Michigan High spatial resolution X-ray computed tomography (CT) system

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2608842A1 (en) * 1986-12-22 1988-06-24 Commissariat Energie Atomique PHOTOELECTRONIC TRANSDUCER USING MICROPOINT EMISSIVE CATHODE
US5117114A (en) * 1989-12-11 1992-05-26 The Regents Of The University Of California High resolution amorphous silicon radiation detectors
US5515411A (en) * 1993-03-31 1996-05-07 Shimadzu Corporation X-ray image pickup tube
JPH07335927A (en) * 1994-06-03 1995-12-22 Japan Energy Corp Fabrication of semiconductor radiation detector
US6042267A (en) * 1997-04-09 2000-03-28 Hamamatsu Photonics K.K. X-ray image pickup apparatus for intraoral radiography
JP2000048743A (en) * 1998-05-26 2000-02-18 Futaba Corp Plane image pick-up device, and its manufacture
US6559451B1 (en) * 1999-09-08 2003-05-06 Sharp Kabushiki Kaisha Manufacturing method for two-dimensional image detectors and two-dimensional image detectors
US20060072427A1 (en) * 2003-06-11 2006-04-06 Yoshihiro Kanda Information storage

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2008136188A1 *

Also Published As

Publication number Publication date
CN101669186A (en) 2010-03-10
US8270567B2 (en) 2012-09-18
WO2008136188A1 (en) 2008-11-13
EP2144271B1 (en) 2014-04-09
US20100128845A1 (en) 2010-05-27
JPWO2008136188A1 (en) 2010-07-29
EP2144271A1 (en) 2010-01-13
KR20100015849A (en) 2010-02-12
CN101669186B (en) 2012-04-25

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