EP1654789A4 - Method and device for non-destructive analysis of perforations in a material - Google Patents

Method and device for non-destructive analysis of perforations in a material

Info

Publication number
EP1654789A4
EP1654789A4 EP03818337A EP03818337A EP1654789A4 EP 1654789 A4 EP1654789 A4 EP 1654789A4 EP 03818337 A EP03818337 A EP 03818337A EP 03818337 A EP03818337 A EP 03818337A EP 1654789 A4 EP1654789 A4 EP 1654789A4
Authority
EP
European Patent Office
Prior art keywords
perforations
destructive analysis
destructive
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP03818337A
Other languages
German (de)
French (fr)
Other versions
EP1654789A2 (en
Inventor
Jeffrey A Schuster
Sudarsan Srinivasan
Thor Miller Wilbanks
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aradigm Corp
Original Assignee
Aradigm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aradigm Corp filed Critical Aradigm Corp
Priority claimed from PCT/US2003/025455 external-priority patent/WO2005020392A2/en
Publication of EP1654789A2 publication Critical patent/EP1654789A2/en
Publication of EP1654789A4 publication Critical patent/EP1654789A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/894—Pinholes
EP03818337A 2003-08-14 2003-08-14 Method and device for non-destructive analysis of perforations in a material Withdrawn EP1654789A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2003/025455 WO2005020392A2 (en) 1999-06-10 2003-08-14 Method and device for non-destructive analysis of perforations in a material

Publications (2)

Publication Number Publication Date
EP1654789A2 EP1654789A2 (en) 2006-05-10
EP1654789A4 true EP1654789A4 (en) 2010-07-07

Family

ID=34910288

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03818337A Withdrawn EP1654789A4 (en) 2003-08-14 2003-08-14 Method and device for non-destructive analysis of perforations in a material

Country Status (4)

Country Link
EP (1) EP1654789A4 (en)
JP (1) JP2007528980A (en)
AU (1) AU2003258227B2 (en)
CA (1) CA2535839A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6277876B2 (en) * 2014-06-12 2018-02-14 住友ベークライト株式会社 Resin film processing equipment
JP7141872B2 (en) * 2018-07-10 2022-09-26 花王株式会社 Perforated sheet inspection method and inspection apparatus, and perforated sheet manufacturing method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5636029A (en) * 1995-07-21 1997-06-03 Bmc Industries, Inc. Elliptical laser probe for shadow mask
US5640236A (en) * 1992-10-30 1997-06-17 Nok Corporation Method and apparatus for detecting the position of defect in a hollow fiber membrane module
US20030153459A1 (en) * 2001-05-01 2003-08-14 Yasushi Kato Electron beam apparatus and device manufacturing method using the electron beam apparatus

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5026964A (en) * 1986-02-28 1991-06-25 General Electric Company Optical breakthrough sensor for laser drill
US5063280A (en) * 1989-07-24 1991-11-05 Canon Kabushiki Kaisha Method and apparatus for forming holes into printed circuit board
US6140604A (en) * 1998-06-18 2000-10-31 General Electric Company Laser drilling breakthrough detector
US6624885B1 (en) * 1999-06-10 2003-09-23 Aradigm Corporation Method and device for non-destructive analysis of perforation in a material

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5640236A (en) * 1992-10-30 1997-06-17 Nok Corporation Method and apparatus for detecting the position of defect in a hollow fiber membrane module
US5636029A (en) * 1995-07-21 1997-06-03 Bmc Industries, Inc. Elliptical laser probe for shadow mask
US20030153459A1 (en) * 2001-05-01 2003-08-14 Yasushi Kato Electron beam apparatus and device manufacturing method using the electron beam apparatus

Also Published As

Publication number Publication date
EP1654789A2 (en) 2006-05-10
AU2003258227B2 (en) 2009-04-23
JP2007528980A (en) 2007-10-18
AU2003258227A1 (en) 2005-03-10
CA2535839A1 (en) 2005-03-03

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Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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Effective date: 20060223

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AX Request for extension of the european patent

Extension state: AL LT LV MK

DAX Request for extension of the european patent (deleted)
RBV Designated contracting states (corrected)

Designated state(s): DE EE FR GB IT

PUAK Availability of information related to the publication of the international search report

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RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 21/00 20060101AFI20070605BHEP

A4 Supplementary search report drawn up and despatched

Effective date: 20100607

RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 21/894 20060101ALI20100531BHEP

Ipc: G01N 21/88 20060101ALI20100531BHEP

Ipc: G01B 11/12 20060101ALI20100531BHEP

Ipc: G01N 21/00 20060101AFI20070605BHEP

18D Application deemed to be withdrawn

Effective date: 20100907

18RA Request filed for re-establishment of rights before grant

Effective date: 20111026

D18D Application deemed to be withdrawn (deleted)
STAA Information on the status of an ep patent application or granted ep patent

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18W Application withdrawn

Effective date: 20150218