EP1505364A3 - Vorrichtung und Verfahren für die Parallele Interferometrische Messung mit einem erweiterten Lokaloszillatorsignal - Google Patents

Vorrichtung und Verfahren für die Parallele Interferometrische Messung mit einem erweiterten Lokaloszillatorsignal Download PDF

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Publication number
EP1505364A3
EP1505364A3 EP04009860A EP04009860A EP1505364A3 EP 1505364 A3 EP1505364 A3 EP 1505364A3 EP 04009860 A EP04009860 A EP 04009860A EP 04009860 A EP04009860 A EP 04009860A EP 1505364 A3 EP1505364 A3 EP 1505364A3
Authority
EP
European Patent Office
Prior art keywords
local oscillator
oscillator signal
beams
expanded
expanded local
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP04009860A
Other languages
English (en)
French (fr)
Other versions
EP1505364A2 (de
Inventor
Gregory D. Vanwiggeren
Douglan M. Baney
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of EP1505364A2 publication Critical patent/EP1505364A2/de
Publication of EP1505364A3 publication Critical patent/EP1505364A3/de
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
EP04009860A 2003-08-05 2004-04-26 Vorrichtung und Verfahren für die Parallele Interferometrische Messung mit einem erweiterten Lokaloszillatorsignal Withdrawn EP1505364A3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/634,358 US7023557B2 (en) 2003-08-05 2003-08-05 Parallel interferometric measurements using an expanded local oscillator signal
US634358 2003-08-05

Publications (2)

Publication Number Publication Date
EP1505364A2 EP1505364A2 (de) 2005-02-09
EP1505364A3 true EP1505364A3 (de) 2006-07-26

Family

ID=33552901

Family Applications (1)

Application Number Title Priority Date Filing Date
EP04009860A Withdrawn EP1505364A3 (de) 2003-08-05 2004-04-26 Vorrichtung und Verfahren für die Parallele Interferometrische Messung mit einem erweiterten Lokaloszillatorsignal

Country Status (5)

Country Link
US (1) US7023557B2 (de)
EP (1) EP1505364A3 (de)
JP (1) JP2005055437A (de)
CN (1) CN1580727A (de)
TW (1) TWI233990B (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7087965B2 (en) * 2004-04-22 2006-08-08 International Business Machines Corporation Strained silicon CMOS on hybrid crystal orientations
WO2007028345A1 (fr) * 2005-09-09 2007-03-15 Accelergy Shanghai R & D Center Co., Ltd Procede de detection a haut debit destine aux echantillons solides et systeme correspondant
CN1329711C (zh) * 2005-09-14 2007-08-01 哈尔滨工业大学 基于双光纤耦合的微小内腔体尺寸测量装置与方法
DE102007029822B4 (de) * 2007-06-28 2010-01-07 Siemens Ag Interferometer
US7821619B2 (en) * 2008-03-19 2010-10-26 Raytheon Company Rapid scan LADAR 3D imaging with compact digital beam formation
WO2010108365A1 (en) * 2009-03-24 2010-09-30 Harbin Institute Of Technology Micro focal-length collimation based micro-cavity measuring method and detecting equipment thereof
US20120200854A1 (en) * 2009-10-14 2012-08-09 Joss Bland-Hawthorn Integrated Photonic Spectrograph
TWI418774B (zh) * 2010-08-06 2013-12-11 大區域光學檢測裝置及其運作方法
CN101949840B (zh) * 2010-08-17 2011-11-16 中国农业大学 生肉肌红蛋白快速无损检测方法及系统
JP2012063377A (ja) * 2010-09-14 2012-03-29 Enplas Corp レンズアレイおよびそのレンズエッジ検出方法
ES2404673B2 (es) * 2011-10-20 2014-04-24 Universidad De Sevilla Método y aparato de medida para la caracterización de dispositivos ópticos y fotónicos
JP6112192B2 (ja) 2013-03-15 2017-04-12 日本電気株式会社 光送受信器、光通信システムおよび光送受信方法
WO2015052071A1 (en) * 2013-10-09 2015-04-16 Carl Zeiss Meditec Ag Improved line-field imaging systems and methods
US9791346B1 (en) * 2016-04-20 2017-10-17 Stmicroelectronics Sa Semiconductor device and wafer with reference circuit and related methods
CN107884157A (zh) * 2017-11-28 2018-04-06 维沃移动通信有限公司 一种光学衍射元件的异常检测方法、移动终端
FR3077887B1 (fr) 2018-02-13 2021-07-23 St Microelectronics Crolles 2 Sas Puce optoelectronique et procede de test de circuits photoniques d'une telle puce
FR3077888B1 (fr) 2018-02-13 2020-02-28 Stmicroelectronics (Crolles 2) Sas Puce optoelectronique et procede de test de circuits photoniques d'une telle puce
US10838047B2 (en) 2018-04-17 2020-11-17 Santec Corporation Systems and methods for LIDAR scanning of an environment over a sweep of wavelengths
US11808658B2 (en) * 2019-09-27 2023-11-07 Panduit Corp. Visual inspector attachment for fiber connector cleaners
US11513228B2 (en) 2020-03-05 2022-11-29 Santec Corporation Lidar sensing arrangements
US11486792B2 (en) * 2020-06-05 2022-11-01 Santec Corporation Tunable light source for optical fiber proximity and testing
CN111693509B (zh) * 2020-06-23 2021-04-23 清华大学 差分复用的干涉增强双光梳相干拉曼光谱探测系统与方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1182805A2 (de) * 2000-08-22 2002-02-27 Agilent Technologies, Inc. (a Delaware corporation) Prüfvorrichtung für optische Multiportkomponenten unter Verwendung eines einzelnen Empfängers
WO2003025537A1 (fr) * 2001-09-18 2003-03-27 Mitsubishi Denki Kabushiki Kaisha Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique
US20030081220A1 (en) * 2001-10-18 2003-05-01 Scimed Life Systems, Inc. Diffraction grating based interferometric systems and methods

Family Cites Families (5)

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Publication number Priority date Publication date Assignee Title
US4696061A (en) 1983-12-28 1987-09-22 Sperry Corporation Acousto-optic R-F receiver which is tunable and has adjustable bandwidth
US5946092A (en) 1998-02-27 1999-08-31 Pacific Scientific Instruments Company Dual laser heterodyne optical particle detection technique
JP3594875B2 (ja) * 2000-05-25 2004-12-02 独立行政法人 科学技術振興機構 ２次元光ヘテロダイン検出法を用いた光画像計測装置
US6750973B2 (en) * 2002-02-20 2004-06-15 Agilent Technologies, Inc. Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
AU2002325280A1 (en) * 2002-06-29 2004-01-19 Agilent Technologies, Inc. Polarization diversity detection using a polarization multiplexed local oscillator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1182805A2 (de) * 2000-08-22 2002-02-27 Agilent Technologies, Inc. (a Delaware corporation) Prüfvorrichtung für optische Multiportkomponenten unter Verwendung eines einzelnen Empfängers
WO2003025537A1 (fr) * 2001-09-18 2003-03-27 Mitsubishi Denki Kabushiki Kaisha Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique
US20030081220A1 (en) * 2001-10-18 2003-05-01 Scimed Life Systems, Inc. Diffraction grating based interferometric systems and methods

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
TIZIANI ET AL: "Progress in temporal speckle modulation", OPTIK, WISSENSCHAFTLICHE VERLAG GMBH.STUTTGART, DE, vol. 112, no. 9, 2001, pages 370 - 380, XP005256251, ISSN: 0030-4026 *

Also Published As

Publication number Publication date
US20050030544A1 (en) 2005-02-10
EP1505364A2 (de) 2005-02-09
TWI233990B (en) 2005-06-11
CN1580727A (zh) 2005-02-16
US7023557B2 (en) 2006-04-04
TW200506342A (en) 2005-02-16
JP2005055437A (ja) 2005-03-03

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