EP1470263A1 - Method for depositing metal-free carbon layers - Google Patents

Method for depositing metal-free carbon layers

Info

Publication number
EP1470263A1
EP1470263A1 EP03718664A EP03718664A EP1470263A1 EP 1470263 A1 EP1470263 A1 EP 1470263A1 EP 03718664 A EP03718664 A EP 03718664A EP 03718664 A EP03718664 A EP 03718664A EP 1470263 A1 EP1470263 A1 EP 1470263A1
Authority
EP
European Patent Office
Prior art keywords
target
substrate
targets
layers
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP03718664A
Other languages
German (de)
French (fr)
Other versions
EP1470263B1 (en
Inventor
Klaus Bewilogua
Ralf Wittorf
Helge Thomsen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Original Assignee
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV filed Critical Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Publication of EP1470263A1 publication Critical patent/EP1470263A1/en
Application granted granted Critical
Publication of EP1470263B1 publication Critical patent/EP1470263B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/0605Carbon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/02Pretreatment of the material to be coated
    • C23C14/024Deposition of sublayers, e.g. to promote adhesion of the coating
    • C23C14/025Metallic sublayers

Definitions

  • the invention relates to a method for the deposition of metal-free, amorphous, hydrogen-containing carbon layers by sputtering targets onto substrates.
  • layers of hard and wear-resistant diamond-like carbon are involved, these layers also being referred to as DLC (diamond-like carbon) layers or also a-C: H layers.
  • DLC diamond-like carbon
  • H layers a-C: H layers.
  • these layers also contain hydrogen with a concentration between 10 and 30 atom percent, metal components in less than 0.1 atom percent and other impurities (for example oxygen, nitrogen, argon) with a total concentration of less than 3 atom percent.
  • DLC hard amorphous hydrogen-containing carbon layers
  • aC hard amorphous hydrogen-containing carbon layers
  • the DLC layers are generally chemically inert, electrically insulating with resistivities of more than 10 6 ohm centimeters and they are transparent in the infrared spectral range.
  • High-quality aC H layers, especially high-quality in terms of hardness and wear, are still predominantly produced today in relatively small plants using plasma-activated chemical vapor deposition (plasma-activated chemical vapor deposition, or PACVD for short).
  • Plasma-activated chemical vapor deposition or PACVD for short.
  • High-frequency technologies with frequencies of more than one megahertz (MHz) are mainly used, usually 13.56 MHz.
  • the plasma-generating electrode is also the substrate to be coated.
  • Hydrocarbons preferably acetylene (C 2 H 2 ) or methane (CH 4 ) are used as the source of carbon.
  • the layers are created by the deposition of ions and radicals from a glow discharge on an unheated substrate. It is very disadvantageous that these high-frequency methods for DLC deposition can only be scaled up with difficulty.
  • a negative self-bias voltage U B of a few 100 volts is required. This voltage U B depends strongly on the ratio of the areas of the substrate electrode to the anode.
  • the grounded housing of the system is generally used as the anode.
  • U B drops significantly with increasing size of the substrate electrode.
  • a larger substrate area also requires more powerful high-frequency generators in order to maintain approximately constant power densities on the substrate. Such high-performance high-frequency generators are very expensive, however, and thus reduce the economic viability of such methods.
  • PE-CVD Plasma Enhanced Chemical Vapor Deposition
  • a pulsed direct voltage (DC) is present on the substrate in order to avoid substrate charging.
  • the result is very thin (15 nm) and polymer-like layers with a high specific resistance but a relatively low hardness of less than 15 GPa. The extremely thin layer and the low hardness are not sufficient for many applications.
  • metal-containing carbon layers have been proposed, for the first time in EP 0 087 836 B1.
  • Me-C Marked H or Me-DLC layers are produced in indus- • centering-relevant dimensions in vacuum coating process, by sputtering (sputtering) of a solid surface (a target) by bombardment with energy-rich ions.
  • Carbide-forming metals such as titanium, niobium, chromium, tungsten or also carbides such as tungsten carbide are usually used as target materials.
  • a disadvantage of such layers is that their lowest wear rates, measured with a calotte tester, are between approximately 2 and 5 VE, which means that they are significantly worse than those of hard a-C: H layers, which are approximately between 0.5 and 1 VE.
  • 1 VE is a wear unit and corresponds to 10 "15 m 3 / Nm.
  • the object of the invention is therefore to propose such a method.
  • This object is achieved by sputtering from targets onto the substrates or by means of arc evaporation, by biasing the targets with a negative DC voltage, by using a pure carbon target as a target, by biasing the substrate with a negative voltage and that an ion current density of at least 1 mA / cm 2 is achieved on the substrate.
  • layers with hardnesses of more than 30Gpa and from 1 ⁇ m to several micrometers in thickness are produced, that is to say more than in the method of Fujimaki et al.
  • the negative bias voltage on the target itself is a negative DC voltage.
  • the negative bias voltage on the substrate can and is really also a likewise negative DC voltage.
  • the distance of the substrate from the target is preferably greater than the discharge zone of the target. This can prevent the high plasma density frequently prevailing in the discharge zone of the target from causing a type of plasma-assisted CVD process to be carried out and contributing to polymer-like effects in the deposited hydrocarbon layers. The hardness of the layers is additionally supported by avoiding these effects.
  • a pure graphite target is preferably used as the carbon target, since this material has proven particularly useful. In certain applications, glassy carbon is also an advantage.
  • the method according to the invention for deposition can be scaled up relatively easily, as can the method with which Me-DLC layers, that is to say significantly poorer layers, can otherwise be scaled up.
  • the method according to the invention is a pure direct current method. As a result, no cost-intensive high-frequency (HF) or medium-frequency (MF) power supplies are required, and there are also no plasma states that are difficult to control, and therefore no discharges at undesirable locations in the coating chamber that occasionally occur at medium-frequency and high-frequency.
  • HF high-frequency
  • MF medium-frequency
  • a coating quality can be achieved more reliably, more cost-effectively and also with less expenditure on equipment, which is readily comparable to the conventional one which can be achieved with much greater expenditure and can also be applied to significantly larger substrate areas.
  • the method according to the invention for the deposition of metal-free carbon layers can also be integrated into a PVD (physical vapor deposition) coating arrangement.
  • PVD physical vapor deposition
  • the coating method according to the invention is extremely flexible. When using multiple targets, DLC or Me-DLC layers can even be deposited with a system suitable for the process, even in multilayers.
  • CN X layers combinations of, for example, DLC and carbon nitride layers (CN X layers) can be produced.
  • the hydrocarbon reactive gas is replaced by nitrogen, for example, at the end of the coating process.
  • Such a layer is useful, for example, if hard and also good wetting layers are required.
  • CN X (X to 0.2) has a significantly higher surface energy and thus better wetting than DLC.
  • a mixture of one or more noble gases and one or more hydrocarbons has proven itself as the reaction gas.
  • a mixture of argon and acetylene is particularly preferred.
  • intermediate layers can be deposited according to the invention, which consist of metals, metal nitrides, metal carbides, metal carbonitrides or also multilayer arrangements of these components.
  • a thickness range between 0.02 and 2 ⁇ m is particularly preferred.
  • a cover layer is preferably deposited which contains only carbon and hydrogen and / or nitrogen and less than 0.1% metal impurities.
  • the reactive gas is mixed during the coating process with additional gaseous or vaporous compounds and with nitrogen and / or oxygen or replaced by nitrogen.
  • the additional gaseous or vaporous compounds contain silicon or if the additional gaseous or vaporous compounds contain tetramethylsilane (TMS) or if the additional gaseous or vaporous compounds contain hexamethyldisiioxane (HMDSO). Silicon is not a metal, even if it has metallic properties. The installation silicon in the desired layers is particularly easily possible with these additional gaseous or vaporous compounds.
  • TMS tetramethylsilane
  • HMDSO hexamethyldisiioxane
  • the exemplary embodiments have been carried out in a large coating chamber which is particularly useful for carrying out a scaled-up coating.
  • the substrates to be coated can be rotated and moved through this coating chamber, for example with a double rotation.
  • the diameter of the substrate holder was 600 mm when the exemplary embodiments were carried out.
  • the distance of the substrate from the target was variable.
  • the minimum distance was 200 mm, but the distance was also up to about 500 mm.
  • the mobility of the substrates can of course also be used well for series production.
  • the substrates Due to the relatively high distances of the substrates from the cathode, it can be ensured that the substrates are located outside the discharge zone of the target. This reliably prevents the substrates from getting into the discharge zone of the target, which often has a high plasma density that is otherwise used for a plasma-assisted CVD process. However, this effect would be less desirable here, particularly in the case of the particularly hard layers to be produced. Rather, in the design of the exemplary embodiments, the substrates are subject to the sputter particle stream from the target, which consists of dusted carbon and hydrogen.
  • a metal-free carbon layer is deposited in a direct current magnetron sputtering system with four sputtering cathodes. Unbalanced magnetrons are used. Flat samples made of 100 Cr6 ball bearing steel and thin, 0.2 mm silicon disks, HSS twist drills and other metallic substrates with complex geometries are used as substrates. The substrates are placed on standard substrate holders Multiple rotations (2-fold or 3-fold) fastened and rotate during the entire coating process.
  • a total of four targets are used, namely two made of graphite and two made of titanium. The latter serve to produce a metallic adhesion promoter layer which is to be arranged below the metal-free carbon layer.
  • the coating process can be divided into four sections: in a first section, the substrate is cleaned by ion etching (Ar + ), the targets being covered by a shutter, the so-called shutter. In a second step, this shutter is opened in front of the two titanium targets, while the two graphite targets remain covered.
  • the metallic adhesive layer made of titanium is applied by non-reactive sputtering of the titanium with argon.
  • the reactive sputtering process is started.
  • the reactive gas C 2 H 2 is first slowly added to the sputtering gas and the C 2 H 2 gas flow is increased in a ramp up to the specified final value.
  • the titanium targets are switched off and the graphite targets start operating by opening the corresponding shutters.
  • the metal-free carbon layer is deposited in the form of a DLC (diamond like carbon) layer with a constant C 2 H 2 flow at a constant direct current bias voltage of minus 300 volts.
  • the deposition rate is 0.8 ⁇ m per hour and the layer thickness achieved is 2.5 ⁇ m.
  • the layer composition can be analyzed by means of secondary ion mass spectroscopy (SIMS) and the structure by means of Raman spectroscopy.
  • SIMS secondary ion mass spectroscopy
  • the hardness can be determined with an Indentor method, the wear values with a calotte tester and the adhesion with a Rockwell indentation test as well as with a scratch test.
  • a test evaluation shows that both the composition of the layers as well as the wear and hardness values and the adhesion of the layer produced according to the invention are practically identical to those which could be achieved with a conventional DLC layer deposited by means of high-frequency methods. Despite the significantly more advantageous and simpler manufacturing options, there is no quality night in the layer.
  • the Rockwell hardness (HRC) of the substrates is almost unchanged in the conventional as well as in the method according to the invention compared to the state before the coatings (HRC approximately 62). This shows that the substrate temperatures in the conventional method and in the method according to the invention each remain below 200 ° C.
  • the layer is also deposited in a direct current magnetron sputter system with four sputter cathodes. Again, unbalanced magnetrons are used.
  • Two targets consist of graphite, the other two targets of niobium (Nb).
  • the substrates are the same as in the first example.
  • the coating process again runs in four sections.
  • substrate cleaning is carried out by ion etching (Ar + ), the targets being covered by an aperture (shutter).
  • the shutters are opened in front of the niobium targets and the metallic adhesive layer (Nb) is applied by nonreactive sputtering of niobium with argon.
  • the third step is to switch to the reactive sputtering process by means of the two graphite targets, namely by slowly adding the reactive gas C 3 H 8 to the sputtering gas and by switching off the niobium targets.
  • the C 3 H 8 gas flow is increased in a ramp up to the specified final value.
  • the carbon layer is again deposited as a DLC layer with a constant C 3 H 8 flow at a constant direct current bias voltage of minus 200 volts.
  • the deposition rate in this test is 1.4 ⁇ m per hour and the layer thickness achieved is 3 ⁇ m.
  • An analysis of the layers gives the same results as in the first example.
  • the metallic interlayer is first deposited in front of a titanium target.
  • the substrates are then pivoted in front of a graphite target and then remain in this position.
  • the steps of transferring to the reactive sputtering process and deposition of the carbon layer are carried out.
  • acetylene is used as the carbon carrier.
  • the deposition rate is 2.3 ⁇ m per hour, the layer thickness achieved is 5 ⁇ m.
  • the Rockwell hardness (HRC) of the substrates after the coatings are also almost unchanged compared to the state before the coatings with HRC approximately 62, even when this example according to the invention is compared with a conventional method. Here, too, the substrate temperatures have remained below 200 ° C.

Abstract

The invention relates to a method for depositing metal-free, amorphous, hydrogenous carbon layers, according to which substrates are sputtered by targets. A pure carbon target, especially a graphite target, is used as a target and is biased by a negative direct-current voltage. Preferably, the substrate is also supplied with a direct-current. The inventive method is preferably carried out using the unbalanced magnetron mode of operation, enabling metal-free DLC layers to be produced with a high wear rate and a high hardness value.

Description

Verfahren zur Abscheidung von metallfreien Kohlenstoffschichten Process for the deposition of metal-free carbon layers
Die Erfindung betrifft ein Verfahren zur Abscheidung von metallfreien amorphen wasserstoffhaltigen Kohlenstoffschichten durch Sputtern von Targets auf Sub- strate.The invention relates to a method for the deposition of metal-free, amorphous, hydrogen-containing carbon layers by sputtering targets onto substrates.
Für viele Anweήdungsfälle ist es interessant, relativ dünne Kohlenstoffschichten auf Substraten abzuscheiden. Dabei geht es insbesondere um Schichten aus hartem und verschleißfestem diamantähnlichen Kohlenstoff, wobei diese Schichten auch als DLC (diamond like carbon)- Schichten oder auch a-C:H- Schichten bezeichnet werden. Diese Schichten enthalten neben Kohlenstoff auch Wasserstoff mit einer Konzentration zwischen 10 und 30 Atomprozent, Metallanteile in weniger als 0,1 Atomprozent und andere Verunreinigungen (beispielsweise Sauerstoff, Stickstoff, Argon) mit einer Gesamtkonzentration von weniger als 3 Atomprozent.For many applications it is interesting to deposit relatively thin carbon layers on substrates. In particular, layers of hard and wear-resistant diamond-like carbon are involved, these layers also being referred to as DLC (diamond-like carbon) layers or also a-C: H layers. In addition to carbon, these layers also contain hydrogen with a concentration between 10 and 30 atom percent, metal components in less than 0.1 atom percent and other impurities (for example oxygen, nitrogen, argon) with a total concentration of less than 3 atom percent.
Zur Abscheidung dieser harten amorphen wasserstoffhaltigen Kohlenstoffschichten (DLC beziehungsweise a-C:H) und zu ihren Eigenschaften gibt es zahlreiche Publikationen. Derartige Schichten weisen neben sehr niedrigen Reibwerten gegenüber Stahl (< 0,2) eine hohe Härte- und Verschleißbeständigkeit auf. Die DLC-Schichten sind in der Regel chemisch inert, elektrisch isolierend mit spezifischen Widerständen von mehr als 106 Ohmzentimenter und sie sind im infraroten Spektralbereich transparent.There are numerous publications on the deposition of these hard amorphous hydrogen-containing carbon layers (DLC or aC: H) and their properties. In addition to very low coefficients of friction compared to steel (<0.2), such layers have high hardness and wear resistance. The DLC layers are generally chemically inert, electrically insulating with resistivities of more than 10 6 ohm centimeters and they are transparent in the infrared spectral range.
Qualitativ hochwertige a-C:H-Schichten, insbesondere qualitativ hochwertig hinsichtlich Härte und Verschleiß, werden heute vorwiegend noch in relativ kleinen Anlagen mittels plasmaaktivierter Gasphasenabscheidung (plasma activated chemical vapour deposition, kurz PACVD) hergestellt. Dabei werden überwiegend Hochfrequenztechniken mit Frequenzen von mehr als einem Megahertz (MHz) eingesetzt, in der Regel 13,56 MHz. Dabei ist die plasmaerzeugende Elektrode gleichzeitig das zu beschichtende Substrat. Als Kohienstoffquelle werden dabei Kohlenwasserstoffe, vorzugsweise Acetylen (C2H2) oder Methan (CH4), eingesetzt. Die Schichten entstehen durch Abscheidung von Ionen und Radikalen aus einer Glimmentladung auf einem ungeheizten Substrat. Sehr nachteilig ist es, dass diese Hochfrequenzverfahren zur DLC-Abscheidung nur schwer hochskaliert werden können. Es wird eine negative Self-Bias-Span- nung UB von einigen 100 Volt benötigt. Diese Spannung UB hängt aber stark vom Verhältnis der Flächen der Substratelektrode zur Anode ab. Als Anode wird in der Regel das geerdete Gehäuse der Anlage verwendet. UB sinkt dabei mit zunehmender Größe der Substratelektrode erheblich ab. Eine größere Substratfläche erfordert außerdem leistungsstärkere Hochfrequenzgeneratoren, um etwa konstante Leistungsdichten am Substrat noch aufrechtzuerhalten. Derartige leistungsstarke Hochfrequenzgeneratoren sind allerdings sehr teuer und reduzie- ren damit die Wirtschaftlichkeit derartiger Verfahren.High-quality aC: H layers, especially high-quality in terms of hardness and wear, are still predominantly produced today in relatively small plants using plasma-activated chemical vapor deposition (plasma-activated chemical vapor deposition, or PACVD for short). High-frequency technologies with frequencies of more than one megahertz (MHz) are mainly used, usually 13.56 MHz. The plasma-generating electrode is also the substrate to be coated. Hydrocarbons, preferably acetylene (C 2 H 2 ) or methane (CH 4 ), are used as the source of carbon. The layers are created by the deposition of ions and radicals from a glow discharge on an unheated substrate. It is very disadvantageous that these high-frequency methods for DLC deposition can only be scaled up with difficulty. A negative self-bias voltage U B of a few 100 volts is required. This voltage U B depends strongly on the ratio of the areas of the substrate electrode to the anode. The grounded housing of the system is generally used as the anode. U B drops significantly with increasing size of the substrate electrode. A larger substrate area also requires more powerful high-frequency generators in order to maintain approximately constant power densities on the substrate. Such high-performance high-frequency generators are very expensive, however, and thus reduce the economic viability of such methods.
Um dieses Problem zu umgehen, ist daher schon vorgeschlagen worden, stattdessen den Mittelfrequenzbereich zwischen einem und einigen hundert kHz zur Abscheidung von a-C:H-Schichten zu nutzen. Die DE 195 13 614 C1 und andere haben dabei sowohl harmonische Wechselspannungen als auch gepulste Gleichspannungen vorgeschlagen. Auch hier handelt es sich aber meist um PACVD-Verfahren, bei denen wiederum die Substratelektrode gleichzeitig die plasmaerzeugende Elektrode ist. Dadurch ist es nicht möglich, Beschichtungspa- rameter wie beispielsweise den lonenstrom und die lonenenergie. unabhängig voneinander einzustellen. Auch hier sind daher wirtschaftlichen Einsätzen derartiger Verfahren Grenzen gesetzt.To avoid this problem, it has therefore already been proposed to use the medium frequency range between one and a few hundred kHz instead for the deposition of a-C: H layers. DE 195 13 614 C1 and others have proposed harmonic AC voltages as well as pulsed DC voltages. Here too, however, it is mostly a PACVD process, in which the substrate electrode is also the plasma-generating electrode. As a result, it is not possible to apply coating parameters such as, for example, the ion current and the ion energy. set independently. Here too, there are limits to the economic use of such processes.
Ähnliche Probleme bestehen bei Konzeptionen etwa nach der DE 196 51 615 C1, in der ein PVD-Verfahren vorgeschlagen wird. Dort wird am Target mit mittelfrequenter Spannung gearbeitet, um einen reaktiven Sputterprozess zu erhalten.Similar problems exist with conceptions, for example according to DE 196 51 615 C1, in which a PVD method is proposed. There, the target is operated with medium-frequency voltage in order to obtain a reactive sputtering process.
S. Fujimaki, H. Kashiwase und Y. Kokaku haben in „New DLC coating method using magnetron plasma in an unbalanced magnetic field" in: Vacuum 59 (2000), Seiten 657 bis 664 eine modifizierte Vorgehensweise angeregt, die sie als Plasma Enhanced Chemical Vapor Deposition (PE-CVD) bezeichnen. Zum Beschichten von Magnetspeicherplatten werden diese nahe am Target und in der Entladungszone des Targets als ebene Substrate in einen Bereich hoher Plasmadichte eingebracht. Der Abstand des Substrats vom Target bzw. der Kathode beträgt 40 mm und bleibt während der Beschichtung konstant, da alle Elemente zueinander in einer festen, unbeweglichen Position stehen. Eine unbalancierte Magnetronkathode am Target liefert die Plasmaunterstützung. Am Substrat liegt eine gepulste Gleichspannung (DC) an, um Substrataufladungen zu vermeiden. Es entstehen sehr dünne (15 nm) und polymerartige Schichten mit hohem spezi- fischem Widerstand, aber relativ niedriger Härte von weniger als 15 GPa. Die extrem geringe Schichtdicke und die niedrige Härte sind für viele Anwendungsfälle nicht ausreichend.S. Fujimaki, H. Kashiwase and Y. Kokaku in "New DLC coating method using magnetron plasma in an unbalanced magnetic field" in: Vacuum 59 (2000), pages 657 to 664 suggested a modified procedure which they called Plasma Enhanced Chemical Vapor Deposition (PE-CVD) For coating magnetic storage disks, they are placed close to the target and in the discharge zone of the target as flat substrates in an area of high plasma density. The distance of the substrate from the target or the cathode is 40 mm and remains during the coating is constant since all elements to each other in a fixed, immovable position. An unbalanced magnetron cathode on the target provides plasma support. A pulsed direct voltage (DC) is present on the substrate in order to avoid substrate charging. The result is very thin (15 nm) and polymer-like layers with a high specific resistance but a relatively low hardness of less than 15 GPa. The extremely thin layer and the low hardness are not sufficient for many applications.
Ältere, beispielsweise aus der US-PS 4,597,844 bekannte Vorschläge zur Ab- Scheidung von amorphen Kohlenstoff und Wasserstoff enthaltenden Schichten verwenden Graphittargets und nur Wasserstoff und/oder Fluor enthaltende Reaktivgase. Dies führt zu polymerartigen Schichten mit sehr hohen spezifischen Widerständen von mehr als 108 Ohmzentimetern und einem Wasserstoffgehalt in den Schichten von 0,5 bis 0,9, gemessen am Verhältnis von der Zahl der Wasserstoffatome zur Zahl der Kohlenstoffatome (H/C). Diese Schichten entsprechen nicht mehr den gestiegenen Anforderungen.Older proposals, for example known from US Pat. No. 4,597,844, for the deposition of layers containing amorphous carbon and hydrogen use graphite targets and reactive gases containing only hydrogen and / or fluorine. This leads to polymer-like layers with very high resistivities of more than 10 8 ohm centimeters and a hydrogen content in the layers of 0.5 to 0.9, measured by the ratio of the number of hydrogen atoms to the number of carbon atoms (H / C). These layers no longer meet the increased requirements.
Von daher sind gänzlich andere Ansätze zur Erzielung von Kohlenstoffschichten mit den geeigneten Eigenschaften getätigt worden. So sind metallhaltige Koh- lenstoffschichten vorgeschlagen worden, erstmals in der EP 0 087 836 B1. Derartige, meist als Me-C:H oder Me-DLC bezeichnete Schichten werden in indust- rierelevanten Dimensionen in Vakuumbeschichtungsverfahren hergestellt, und zwar durch Zerstäuben (Sputtern) einer Festkörperoberfläche (eines Targets) durch Beschuss mit energiereichen Ionen. Als Targetmaterialien dienen übli- cherweise Carbid-bildende Metalle wie Titan, Niob, Chrom, Wolfram oder auch Carbide wie Wolframcarbid. Ein Nachteil derartiger Schichten ist allerdings, dass ihre niedrigsten Verschleißraten, gemessen mit einem Kalotten-Tester, zwischen etwa 2 und 5 VE liegen, also wesentlich schlechter sind, als die von harten a- C:H-Schichten, die etwa zwischen 0,5 und 1 VE betragen. 1 VE ist eine Ver- schleißeinheit und entspricht 10"15 m3/Nm.For this reason, completely different approaches have been taken to achieve carbon layers with the appropriate properties. For example, metal-containing carbon layers have been proposed, for the first time in EP 0 087 836 B1. Such, mostly as Me-C: Marked H or Me-DLC layers are produced in indus- centering-relevant dimensions in vacuum coating process, by sputtering (sputtering) of a solid surface (a target) by bombardment with energy-rich ions. Carbide-forming metals such as titanium, niobium, chromium, tungsten or also carbides such as tungsten carbide are usually used as target materials. A disadvantage of such layers, however, is that their lowest wear rates, measured with a calotte tester, are between approximately 2 and 5 VE, which means that they are significantly worse than those of hard a-C: H layers, which are approximately between 0.5 and 1 VE. 1 VE is a wear unit and corresponds to 10 "15 m 3 / Nm.
Es ist daher versucht worden, den Metallanteil in derartigen Schichten zu reduzieren, indem die metallischen Targets durch eine modifizierte Prozessführung weitgehend mit Kohlenstoff bedeckt werden, was als „Vergiftung" bezeichnet wird. Derartige Verfahren sind aber schwer zu beherrschen, da die Entladungs- prozesse sehr instabil werden und nicht über längere Zeiten aufrecht zu erhalten sind.It has therefore been attempted to reduce the metal content in such layers by covering the metallic targets largely with carbon by means of a modified process control, which is referred to as "poisoning". However, such processes are difficult to master because the discharge processes become very unstable and cannot be maintained over long periods.
Als weiterer Ansatz wird daher von Da-Yung Wang, Chi-Lung Chang und Wei-Yu Ho in „Characterisation of hydrogen-free diamond-iike carbon films deposited by pulsed plasma technology" in: Thin Solid Films 355 bis 356 (1999), Seiten 246 bis 251 ein Beschichtungsverfahren für eine titandotierte, also metallhaltige, dafür aber wasserstofffreie Schicht vorgeschlagen. Die Autoren führen die mangelnde Härte bekannter Schichten auf das Vorhandensein von Wasserstoffato- men zurück. Sowohl die verwendeten Graphit- als auch die Titantargets und das Substrat werden jeweils mit gepulsten Mittelfrequenz-Gleichspannungen (DC) versorgt. Die entstehenden Schichten unterscheiden sich natürlich deutlich von wasserstoffhaltigen Beschichtungen.As a further approach, Da-Yung Wang, Chi-Lung Chang and Wei-Yu Ho in "Characterization of hydrogen-free diamond-iike carbon films deposited by pulsed plasma technology" in: Thin Solid Films 355 to 356 (1999), A coating process for a titanium-doped, that is, metal-containing, but hydrogen-free layer was proposed on pages 246 to 251. The authors attribute the lack of hardness of known layers to the presence of hydrogen atoms, both the graphite and titanium targets used and the substrate supplied with pulsed medium-frequency direct voltages (DC). The layers that arise are of course clearly different from hydrogen-containing coatings.
Es besteht daher unverändert der Wunsch, metallfreie Kohlenstoffschichten abzuscheiden, um die Nachteile der Me-C:H-Schichten nicht in Kauf nehmen zu müssen. Gewünscht wäre ein Verfahren zur Abscheidung einer derartigen metallfreien Kohlenstoffschicht, das auch in größerem Maßstab und wirtschaftlich eingesetzt werden kann.There is therefore still the desire to deposit metal-free carbon layers in order not to have to accept the disadvantages of the Me-C: H layers. A method for the deposition of such a metal-free carbon layer, which can also be used on a larger scale and economically, would be desirable.
Aufgabe der Erfindung ist es daher, ein derartiges Verfahren vorzuschlagen.The object of the invention is therefore to propose such a method.
Diese Aufgabe wird dadurch gelöst, dass von Targets auf die Substrate gesput- tert oder mittels Bogenverdampfung abgeschieden wird, dass die Targets mit einer negativen Gleichspannung vorgespannt werden, dass als Target ein reines Kohlenstoff-Target eingesetzt wird, dass das Substrat mit einer negativen Spannung vorgespannt ist, und dass eine lonenstromdichte von mindestens 1 mA/cm2 am Substrat erreicht wird.This object is achieved by sputtering from targets onto the substrates or by means of arc evaporation, by biasing the targets with a negative DC voltage, by using a pure carbon target as a target, by biasing the substrate with a negative voltage and that an ion current density of at least 1 mA / cm 2 is achieved on the substrate.
Überraschenderweise zeigte sich, dass bei einem derartigen Verfahren die von herkömmlich hergestellten a-C:H beziehungsweise DLC-Schichten bekannten Verschleiß- und Härtewerte erreicht und zum Teil noch übertroffen werden können. Bisher war es nicht für möglich gehalten worden, mit einem reinen Gleich- strom-Sputter-Verfahren derartige Werte erreichen zu können, also ohne den Einsatz von Hochfrequenz- oder wenigstens Mittelfrequenz-Verfahren. Nur bei den in der Qualität schlechteren und ganz anders aufgebauten Me-C:H-Schich- ten wurde bisher ein Sputtern als sinnvoll gesehen, für a-C:H-Schichten sind nur Entladungen von Kohlenstoffplasmen in Betracht gezogen worden.Surprisingly, it was found that with such a method the wear and hardness values known from conventionally produced aC: H or DLC layers can be achieved and in some cases even exceeded. Until now, it had not been thought possible to be able to achieve such values with a pure direct-current sputtering method, that is, without the use of high-frequency or at least medium-frequency methods. Only at Sputtering has so far been seen as meaningful for the poorer quality and very differently constructed Me-C: H layers. For aC: H layers, only discharges of carbon plasmas have been considered.
Darüber hinaus entstehen Schichten mit Härten von mehr als 30Gpa und von 1 μm bis zu mehreren Mikrometern Dicke, also mit mehr als etwa bei dem Verfahren von Fujimaki et al.In addition, layers with hardnesses of more than 30Gpa and from 1 μm to several micrometers in thickness are produced, that is to say more than in the method of Fujimaki et al.
Zu unterscheiden ist dabei noch zwischen der negativen Vorspannung am Target und der negativen Vorspannung am Substrat. Die negative Vorspannung am Target selbst ist erfindungsgemäß eine negative Gleichspannung. Die negative Vorspannung am Substrat kann und ist in einer bevorzugten Ausführungsform auch wirklich eine ebenfalls negative Gleichspannung.A distinction must be made between the negative bias on the target and the negative bias on the substrate. According to the invention, the negative bias voltage on the target itself is a negative DC voltage. In a preferred embodiment, the negative bias voltage on the substrate can and is really also a likewise negative DC voltage.
Es ist aber in einer anderen Ausführungsform auch möglich, die negative Vorspannung am Substrat mit einer Mittelfrequenzspannung zwischen 30 und 300 kHz anzuregen. Es wird dann unverändert vom Target mit Gleichstrom gesputtert, da dort eine negative Gleichspannung anliegt, im Gegensatz etwa zur DE 196 51 615 C1.In another embodiment, however, it is also possible to excite the negative bias on the substrate with a medium frequency voltage between 30 and 300 kHz. It is then sputtered unchanged by the target with direct current, since there is a negative direct voltage, in contrast to DE 196 51 615 C1.
In der DE 100 18 143 A1 wird zwar mit einer Mittelfrequenz am Substrat gearbeitet, dort aber findet kein Sputtern von einem Target statt.In DE 100 18 143 A1, a medium frequency is used on the substrate, but there is no sputtering from a target.
Bevorzugt ist der Abstand des Substrats vom Target größer als die Entladungs- zone des Targets. Dadurch kann verhindert werden, dass während der Beschichtung die in der Entladungszone des Targets häufig herrschende hohe Plasmadichte dazu führt, dass eine Art Plasma unterstütztes CVD-Verfahren mit durchgeführt wird und zu polymerartigen Effekten in den abgeschiedenen Kohlenwasserstoffschichten beiträgt. Durch das Vermeiden dieser Effekte wird die Härte der Schichten zusätzlich unterstützt.The distance of the substrate from the target is preferably greater than the discharge zone of the target. This can prevent the high plasma density frequently prevailing in the discharge zone of the target from causing a type of plasma-assisted CVD process to be carried out and contributing to polymer-like effects in the deposited hydrocarbon layers. The hardness of the layers is additionally supported by avoiding these effects.
Dabei haben sich Abstände der Substrate vom Target von mehr als 50 mm, insbesondere von mehr als 100 mm und besonders bevorzugt von 200 mm und mehr als günstig herausgestellt. Als Kohlenstoff-Tafget wird bevorzugt ein reines Graphit-Target eingesetzt, da sich dieses Material besonders bewährt hat. In bestimmten Anwendungsfällen ist aber auch Glaskohlenstöff von Vorteil.Distances of the substrates from the target of more than 50 mm, in particular of more than 100 mm and particularly preferably of 200 mm and more, have been found to be favorable. A pure graphite target is preferably used as the carbon target, since this material has proven particularly useful. In certain applications, glassy carbon is also an advantage.
Dabei lassen sich die besten Werte erreichen, wenn in der unbalancierten Magnetron-Betriebsart gearbeitet wird. Dadurch werden in einem Substrat wesentlich höhere lonenstromdichten realisiert, als im balancierten, konventionellen Magnetronbetrieb. Diese lonenstromdichten haben sich als erforderlich herausgestellt, um die harte DLC-Modifikation abzuscheiden.The best values can be achieved when working in the unbalanced magnetron mode. As a result, significantly higher ion current densities are achieved in a substrate than in balanced, conventional magnetron operation. These ion current densities have been found necessary to separate the hard DLC modification.
Das erfindungsgemäße Verfahren zur Abscheidung lässt sich relativ einfach hochskalieren, ebenso wie das Verfahren, mit dem sonst Me-DLC-Schichten, also deutlich schlechtere Schichten, hochskalierbar sind.The method according to the invention for deposition can be scaled up relatively easily, as can the method with which Me-DLC layers, that is to say significantly poorer layers, can otherwise be scaled up.
Bei dem erfindungsgemäßen Verfahren handelt es sich um ein reines Gleichstromverfahren. Dadurch werden keine kostenintensiven Hochfrequenz (HF-) oder Mittelfrequenz (MF-) Stromversorgungen benötigt und es gibt auch keine schwer beherrschbaren Plasmazustände, also auch keine Entladungen an unerwünschten Orten in der Beschichtungskammer, die bei Mittelfrequenz und Hochfrequenz gelegentlich auftreten.The method according to the invention is a pure direct current method. As a result, no cost-intensive high-frequency (HF) or medium-frequency (MF) power supplies are required, and there are also no plasma states that are difficult to control, and therefore no discharges at undesirable locations in the coating chamber that occasionally occur at medium-frequency and high-frequency.
Erfindungsgemäß lässt sich zuverlässiger, kostengünstiger und auch mit geringerem apparativem Aufwand eine Beschichtungsqualität erreichen, die der herkömmlichen mit viel größerem Aufwand erzielbaren ohne weiteres vergleichbar ist und sich auch auf deutlich größere Substratflächen anwenden lässt.According to the invention, a coating quality can be achieved more reliably, more cost-effectively and also with less expenditure on equipment, which is readily comparable to the conventional one which can be achieved with much greater expenditure and can also be applied to significantly larger substrate areas.
Von besonderem Vorteil ist es auch, dass das erfindungsgemäße Verfahren zur Abscheidung von metallfreien Kohlenstoffschichten auch in eine PVD-(physical vapour deposition) Beschichtungsaniage integriert werden kann. Dadurch wird es besonders einfach möglich, die für eine optimale Haftung sinnvoll erscheinenden Zwischenschichten aus Übergangsmetallen wie Titan, Niob oder Chrom zunächst abzuscheiden, bevor dann die eigentlich gewünschte metallfreie Kohlenstoffschicht über dieser Zwischenschicht abgeschieden wird. Das erfindungsgemäße Beschichtungsverfahren ist außerordentlich flexibel. Bei Verwendung mehrerer Targets können mit einer für das Verfahren geeigneten Anlage sogar wahlweise DLC oder Me-DLC-Schichten abgeschieden werden, auch in Multilagen.It is also particularly advantageous that the method according to the invention for the deposition of metal-free carbon layers can also be integrated into a PVD (physical vapor deposition) coating arrangement. This makes it particularly easy to first separate the intermediate layers made of transition metals such as titanium, niobium or chromium, which seem sensible for optimal adhesion, before the actually desired metal-free carbon layer is then deposited over this intermediate layer. The coating method according to the invention is extremely flexible. When using multiple targets, DLC or Me-DLC layers can even be deposited with a system suitable for the process, even in multilayers.
Außerdem lassen sich Kombinationen von zum Beispiel DLC-und Kohlenstoffnitridschichten (CNX-Schichten) herstellen. Hierzu wird beispielsweise am Ende des Beschichtungsvorganges das Kohlenwasserstoffreaktivgas durch Stickstoff ersetzt. Eine solche Schicht ist zum Beispiel sinnvoll, wenn harte und außerdem gut benetzende Schichten benötigt werden. CNX (X bis 0,2) weist eine deutlich höhere Oberflächenenergie und damit eine bessere Benetzung als DLC auf.In addition, combinations of, for example, DLC and carbon nitride layers (CN X layers) can be produced. For this purpose, the hydrocarbon reactive gas is replaced by nitrogen, for example, at the end of the coating process. Such a layer is useful, for example, if hard and also good wetting layers are required. CN X (X to 0.2) has a significantly higher surface energy and thus better wetting than DLC.
Als Reaktionsgas hat sich eine Mischung aus einem oder mehreren Edelgasen und einem oder mehreren Kohlenwasserstoffen bewährt. Besonders bevorzugt ist eine Mischung aus Argon und Acetylen.A mixture of one or more noble gases and one or more hydrocarbons has proven itself as the reaction gas. A mixture of argon and acetylene is particularly preferred.
Zur Haftungsverbesserung können erfindungsgemäß beispielsweise Zwischenschichten abgeschieden werden, die aus Metallen, Metallnitriden, Metallcarbiden, Metallcarbonitriden oder auch aus Mehrlagenanordnungen aus diesen Kompo- nenten bestehen. Besonders bevorzugt ist dabei ein Dickenbereich zwischen 0,02 und 2 μm.To improve the adhesion, for example, intermediate layers can be deposited according to the invention, which consist of metals, metal nitrides, metal carbides, metal carbonitrides or also multilayer arrangements of these components. A thickness range between 0.02 and 2 μm is particularly preferred.
Bevorzugt wird außerdem eine Deckschicht abgeschieden, die ausschließlich Kohlenstoff und Wasserstoff und/oder Stickstoff und weniger als 0,1 % Metallverunreinigungen enthält.In addition, a cover layer is preferably deposited which contains only carbon and hydrogen and / or nitrogen and less than 0.1% metal impurities.
In einer Ausführungsform der Erfindung wird das Reaktivgas während des Beschichtungsvorganges mit zusätzlichen gas- oder dampfförmigen Verbindungen sowie mit Stickstoff und/oder Sauerstoff gemischt oder durch Stickstoff ersetzt.In one embodiment of the invention, the reactive gas is mixed during the coating process with additional gaseous or vaporous compounds and with nitrogen and / or oxygen or replaced by nitrogen.
Dabei ist es bevorzugt, wenn die zusätzlichen gas- oder dampfförmigen Verbindungen Silizium enthalten oder wenn die zusätzlichen gas- oder dampfförmigen Verbindungen Tetramethylsilan (TMS) enthalten oder wenn die zusätzlichen gas- oder dampfförmigen Verbindungen Hexamethyldisiioxan (HMDSO) enthalten. Silizium ist kein Metall, wenn es auch metallische Eigenschaften hat. Der Einbau von Silizium in die gewünschten Schichten ist mit diesen zusätzlichen gas- oder dampfförmigen Verbindungen besonders leicht möglich.It is preferred if the additional gaseous or vaporous compounds contain silicon or if the additional gaseous or vaporous compounds contain tetramethylsilane (TMS) or if the additional gaseous or vaporous compounds contain hexamethyldisiioxane (HMDSO). Silicon is not a metal, even if it has metallic properties. The installation silicon in the desired layers is particularly easily possible with these additional gaseous or vaporous compounds.
Im Folgenden werden anhand einiger Ausführungsbeispiele Möglichkeiten für eine Durchführung des erfindungsgemäßen Verfahrens beschrieben. Es handelt sich dabei um praktisch erprobte Ausführungsbeispieie.In the following, possibilities for carrying out the method according to the invention are described using some exemplary embodiments. These are practically proven design examples.
Die Ausführungsbeispiele sind in einer großen Beschichtungskammer durchgeführt worden, die sich besonders sinnvoll für eine hochskalierte Durchführung von Beschichtungen eignet. Die zu beschichtenden Substrate können durch diese Beschichtungskammer gedreht und bewegt werden, etwa mit einer Zweifachrotation. Der Durchmesser des Substrathalters betrug bei der Durchführung der Ausführungsbeispiele 600 mm.The exemplary embodiments have been carried out in a large coating chamber which is particularly useful for carrying out a scaled-up coating. The substrates to be coated can be rotated and moved through this coating chamber, for example with a double rotation. The diameter of the substrate holder was 600 mm when the exemplary embodiments were carried out.
Auf Grund der Beweglichkeit der Substrate war der Abstand des Substrates vom Target variabel. Der minimale Abstand lag dabei bei 200 mm, der Abstand betrug aber auch bis zu etwa 500 mm. Die Beweglichkeit der Substrate lässt sich natürlich für eine Serienfertigung ebenfalls gut nutzen.Due to the mobility of the substrates, the distance of the substrate from the target was variable. The minimum distance was 200 mm, but the distance was also up to about 500 mm. The mobility of the substrates can of course also be used well for series production.
Auf Grund der relativ hohen Abstände der Substrate von der Kathode kann sichergestellt werden, dass die Substrate sich außerhalb der Entladungszone des Targets befinden. Dadurch wird zuverlässig vermieden, dass die Substrate in die Entladungszone des Targets geraten, in der häufig eine hohe Plasmadichte herrscht, die sonst für ein Plasma unterstütztes CVD-Verfahren genutzt wird. Dieser Effekt wäre hier aber gerade bei den zu erzeugenden besonders harten Schichten weniger erwünscht. Bei der Konzeption der Ausführungsbeispiele unterliegen die Substrate vielmehr dem Sputterteilchenstrom vom Target, der aus ausgestäubtem Kohlenstoff und Wasserstoff besteht.Due to the relatively high distances of the substrates from the cathode, it can be ensured that the substrates are located outside the discharge zone of the target. This reliably prevents the substrates from getting into the discharge zone of the target, which often has a high plasma density that is otherwise used for a plasma-assisted CVD process. However, this effect would be less desirable here, particularly in the case of the particularly hard layers to be produced. Rather, in the design of the exemplary embodiments, the substrates are subject to the sputter particle stream from the target, which consists of dusted carbon and hydrogen.
In einem ersten Beispiel erfolgt die Abscheidung einer metallfreien Kohlenstoffschicht in einer Gleichstrom-Magnetron-Sputteranlage mit vier Sputterkathoden. Es wird mit unbalancierten Magnetrons gearbeitet. Als Substrate dienen Flachproben aus Kugellagerstahl 100 Cr6 sowie dünne, etwa 0,2 mm messende Siliziumscheiben, ferner HSS-Spiralbohrer und andere metallische Substrate mit komplexen Geometrien. Die Substrate werden auf Standard-Substrathaltern für Mehrfachrotationen (2-fach oder 3-fach) befestigt und rotieren während des gesamten Beschichtungsprozesses.In a first example, a metal-free carbon layer is deposited in a direct current magnetron sputtering system with four sputtering cathodes. Unbalanced magnetrons are used. Flat samples made of 100 Cr6 ball bearing steel and thin, 0.2 mm silicon disks, HSS twist drills and other metallic substrates with complex geometries are used as substrates. The substrates are placed on standard substrate holders Multiple rotations (2-fold or 3-fold) fastened and rotate during the entire coating process.
Es werden insgesamt vier Targets eingesetzt, nämlich zwei aus Graphit und zwei aus Titan. Letztere dienen zur Herstellung einer metallischen Haftvermittlerschicht, die unterhalb der metallfreien Kohlenstoffschicht angeordnet werden soll.A total of four targets are used, namely two made of graphite and two made of titanium. The latter serve to produce a metallic adhesion promoter layer which is to be arranged below the metal-free carbon layer.
Der Beschichtungsprozess lässt sich in vier Abschnitte unterteilen: in einem ers- ten Abschnitt wird das Substrat durch lonenätzen (Ar+) gereinigt, wobei die Targets durch eine Blende, den sogenannten Shutter, abgedeckt sind.' In ejnem zweiten Schritt wird dieser Shutter vor den beiden Titan-Targets geöffnet, während die beiden Graphit-Targets abgedeckt bleiben. Es wird die metallische Haftvermittlerschicht aus Titan durch nichtreaktives Sputtern des Titans mit Argon aufgebracht.The coating process can be divided into four sections: in a first section, the substrate is cleaned by ion etching (Ar + ), the targets being covered by a shutter, the so-called shutter. In a second step, this shutter is opened in front of the two titanium targets, while the two graphite targets remain covered. The metallic adhesive layer made of titanium is applied by non-reactive sputtering of the titanium with argon.
In einem dritten Abschnitt wird in den reaktiven Sputterprozess übergeleitet. Dabei wird zunächst langsam das Reaktivgas C2H2 zum Sputtergas dazugegeben und der C2H2-Gasfluss in einer Rampe bis zum festgelegten Endwert gesteigert. Die Titan-Targets werden abgeschaltet und die Graphit-Targets durch Öffnen der entsprechenden Shutter nehmen ihre Tätigkeit auf.In a third section the reactive sputtering process is started. The reactive gas C 2 H 2 is first slowly added to the sputtering gas and the C 2 H 2 gas flow is increased in a ramp up to the specified final value. The titanium targets are switched off and the graphite targets start operating by opening the corresponding shutters.
In einem vierten Schritt wird die metallfreie Kohlenstoffschicht in Form einer DLC- (Diamond like Carbon) Schicht mit einem konstanten C2H2-Fluss bei einer konstanten Gleichstrom-Bias-Spannung von minus 300 Volt abgeschieden. In einem praktischen Versuch beträgt die Abscheiderate 0,8 μm pro Stunde und die erreichte Schichtdicke 2,5 μm.In a fourth step, the metal-free carbon layer is deposited in the form of a DLC (diamond like carbon) layer with a constant C 2 H 2 flow at a constant direct current bias voltage of minus 300 volts. In a practical test, the deposition rate is 0.8 μm per hour and the layer thickness achieved is 2.5 μm.
Die Schichtzusammensetzung kann mittels Sekundärionenmassenspektroskopie (SIMS) und die Struktur mittels Raman-Spektroskopie analysiert werden. Zur Charakterisierung der mechanischen und tribologischen Eigenschaften sind die Härte und der abrasive Verschleiß und auch die Haftung interessant. Die Härte kann mit einem Indentor-Verfahren, die Verschleißwerte mit einem Kalotten (Calo)-Tester und die Haftung mittels eines Rockwell-Eindruck-Testes sowie mittels Scretch-Testen bestimmt werden. Eine Versuchsauswertung zeigt, dass sowohl die Zusammensetzung der Schichten als auch die Verschleiß- und Härtewerte als auch die Haftung der erfindungsgemäß erzeugten Schicht praktisch identisch derjenigen ist, die bei einer herkömmlich, mittels Hochfrequenzverfahren abgeschiedenen DLC-Schicht erreicht werden konnte. Trotz der deutlich vorteilhafteren und einfacheren Herstellungsmöglichkeiten zeigt sich also keinerlei Qualitätsnachteii bei der Schicht.The layer composition can be analyzed by means of secondary ion mass spectroscopy (SIMS) and the structure by means of Raman spectroscopy. To characterize the mechanical and tribological properties, the hardness and abrasive wear and also the adhesion are interesting. The hardness can be determined with an Indentor method, the wear values with a calotte tester and the adhesion with a Rockwell indentation test as well as with a scratch test. A test evaluation shows that both the composition of the layers as well as the wear and hardness values and the adhesion of the layer produced according to the invention are practically identical to those which could be achieved with a conventional DLC layer deposited by means of high-frequency methods. Despite the significantly more advantageous and simpler manufacturing options, there is no quality night in the layer.
Die Rockwellhärte (HRC) der Substrate ist sowohl beim herkömmlichen als auch beim erfindungsgemäßen Verfahren gegenüber dem Zustand vor den Beschichtungen (HRC ungefähr 62) nahezu unverändert. Dies zeigt, dass die Substrattemperaturen bei dem herkömmlichen und bei dem erfindungsgemäßen Verfahren jeweils unter 200 °C bleiben.The Rockwell hardness (HRC) of the substrates is almost unchanged in the conventional as well as in the method according to the invention compared to the state before the coatings (HRC approximately 62). This shows that the substrate temperatures in the conventional method and in the method according to the invention each remain below 200 ° C.
Bei einem zweiten Beispiel erfolgt die Schichtabscheidung ebenfalls in einer Gleichstrom-Magnetron-Sputter-Anlage mit vier Sputterkathoden. Es wird wiederum mit unbalancierten Magnetrons gearbeitet. Zwei Targets bestehen wiederum aus Graphit, die beiden anderen Targets aus Niob (Nb). Die Substrate sind die gleichen wie im ersten Beispiel.In a second example, the layer is also deposited in a direct current magnetron sputter system with four sputter cathodes. Again, unbalanced magnetrons are used. Two targets consist of graphite, the other two targets of niobium (Nb). The substrates are the same as in the first example.
Der Beschichtungsprozess läuft wiederum in vier Abschnitten ab. Zunächst wird eine Substratreinigung durch lonenätzen (Ar+) durchgeführt, wobei die Targets durch eine Blende (Shutter) abgedeckt sind. Als zweites werden die Shutter vor den Niob-Targets geöffnet und die metallische Haftvermittlerschicht (Nb) durch nichtreaktives Sputtern von Niob mit Argon aufgebracht. Als drittes wird in den reaktiven Sputter-Prozess mittels der beiden Graphit-Targets übergeleitet, und zwar durch langsame Zugabe des Reaktivgases C3H8 zum Sputtergas und durch Abschalten der Niob-Targets. Dabei wird der C3H8-Gasfluss in einer Rampe bis zum festgelegten Endwert gesteigert. Schließlich wird die Kohlenstoffschicht wiederum als DLC-Schicht mit einem konstanten C3H8-Fluss bei einer konstanten Gleichstrom-Bias-Spannung von minus 200 Volt abgeschieden. Die Abscheiderate beträgt bei diesem Versuch 1 ,4 μm pro Stunde und die erreichte Schichtdicke 3 μm. Eine Analyse der Schichten erbringt in einem Versuch die gleichen Ergebnisse wie beim ersten Beispiel.The coating process again runs in four sections. First, substrate cleaning is carried out by ion etching (Ar + ), the targets being covered by an aperture (shutter). Secondly, the shutters are opened in front of the niobium targets and the metallic adhesive layer (Nb) is applied by nonreactive sputtering of niobium with argon. The third step is to switch to the reactive sputtering process by means of the two graphite targets, namely by slowly adding the reactive gas C 3 H 8 to the sputtering gas and by switching off the niobium targets. The C 3 H 8 gas flow is increased in a ramp up to the specified final value. Finally, the carbon layer is again deposited as a DLC layer with a constant C 3 H 8 flow at a constant direct current bias voltage of minus 200 volts. The deposition rate in this test is 1.4 μm per hour and the layer thickness achieved is 3 μm. An analysis of the layers gives the same results as in the first example.
In einem dritten Beispiel werden jetzt im Gegensatz zu den beiden vorgehen- den Beispielen Flachproben aus verschiedenen Stahlsorten beschichtet. Dabei wird hier auf die Rotation verzichtet. Mit einer Substratanordnung direkt gegenüber einem Graphit-Target wird eine um etwa den Faktor 3 höhere Beschich- tungsrate erreicht.In a third example, in contrast to the two previous examples, flat samples made of different types of steel are coated. The rotation is omitted here. With a substrate arrangement directly opposite a graphite target, a coating rate that is approximately three times higher is achieved.
Zunächst erfolgt vor einem Titantarget die Abscheidung der metallischen Zwischenschicht. Anschließend werden die Substrate vor ein Graphit-Target geschwenkt und verbleiben dann in dieser Position. Dann werden, wie in den anderen Beispielen, die Schritte des Überleitens in den reaktiven Sputter-Prozess und der Abscheidung der Kohlenstoffschicht durchgeführt. Dabei wird als Koh- lenstoffträger in diesem Beispiel Acetylen genutzt.The metallic interlayer is first deposited in front of a titanium target. The substrates are then pivoted in front of a graphite target and then remain in this position. Then, as in the other examples, the steps of transferring to the reactive sputtering process and deposition of the carbon layer are carried out. In this example, acetylene is used as the carbon carrier.
Die Abscheiderate beträgt 2,3 μm pro Stunde, die erreichte Schichtdicke 5 μm. Die Rockwellhärten (HRC) der Substrate nach den Beschichtungen sind auch bei einem Vergleich dieses erfindungsgemäßen Beispiels mit einem herkömmlichen Verfahren jeweils gegenüber dem Zustand vor den Beschichtungen mit HRC ungefähr 62 nahezu unverändert. Auch hier sind die Substrattemperaturen demnach unter 200 °C geblieben. The deposition rate is 2.3 μm per hour, the layer thickness achieved is 5 μm. The Rockwell hardness (HRC) of the substrates after the coatings are also almost unchanged compared to the state before the coatings with HRC approximately 62, even when this example according to the invention is compared with a conventional method. Here, too, the substrate temperatures have remained below 200 ° C.
In der folgenden Tabelle sind einige der bei den tatsachlich durchgeführten Beispielen festgestellten Ergebnisse zusammengestellt.The following table summarizes some of the results found in the actual examples.

Claims

Ansprüche Expectations
1. Verfahren zur Abscheidung von metallfreien amorphen wasserstoffhaltigen Kohlenstoffschichten auf Substraten, dadurch gekennzeichnet, dass von Targets auf die Substrate gesputtert oder mittels Bogenverdamp- fung abgeschieden wird, dass die Targets mit einer negativen Gleichspannung vorgespannt werden, dass als Target ein reines Kohlenstoff-Target eingesetzt wird, dass das Substrat mit einer negativen Spannung vorgespannt wird, und dass eine lonenstromdichte von mindestens 1 mA/cm2 am Substrat erreicht wird.1. A process for the deposition of metal-free amorphous hydrogen-containing carbon layers on substrates, characterized in that targets are sputtered onto the substrates or deposited by means of arc evaporation, that the targets are biased with a negative direct voltage that a pure carbon target is used as the target that the substrate is biased with a negative voltage and that an ion current density of at least 1 mA / cm 2 is achieved on the substrate.
2. Verfahren nach Anspruch 1 , dadurch gekennzeichnet, dass der Abstand des Substrats vom Target größer ist als die Entladungszone des Targets.2. The method according to claim 1, characterized in that the distance of the substrate from the target is greater than the discharge zone of the target.
3. Verfahren nach einem der Ansprüche 1 oder 2, dadurch gekennzeichnet, dass der Abstand des Substrates vom Target größer ist als 50 mm, insbesondere größer als 100 mm, bevorzugt größer als 200 mm.3. The method according to any one of claims 1 or 2, characterized in that the distance of the substrate from the target is greater than 50 mm, in particular greater than 100 mm, preferably greater than 200 mm.
4. Verfahren nach einem der Ansprüche 1 bis 3, dadurch gekennzeichnet, dass als Target ein Graphit-Target eingesetzt wird.4. The method according to any one of claims 1 to 3, characterized in that a graphite target is used as the target.
5. Verfahren nach einem der Ansprüche 1 bis 3, dadurch gekennzeichnet, dass als Target ein Glaskohlenstoff-Target eingesetzt wird.5. The method according to any one of claims 1 to 3, characterized in that a glassy carbon target is used as the target.
6. Verfahren nach einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass mehrere Targets eingesetzt werden. 6. The method according to any one of the preceding claims, characterized in that several targets are used.
7. Verfahren nach Anspruch 6, dadurch gekennzeichnet, dass unterschiedliche, durch Blenden abtrennbare Targets eingesetzt werden, die zu zeitlich unterschiedlichen Abschnitten freigegeben werden und eine Doppel- beziehungsweise Multilagenbeschichtung des Substrates herbeiführen.7. The method according to claim 6, characterized in that different targets which can be separated by diaphragms are used, which are released at different times and bring about a double or multilayer coating of the substrate.
8. Verfahren nach Anspruch 7, dadurch gekennzeichnet, dass mindestens eines der weiteren Targets ein metallisches Target ist.8. The method according to claim 7, characterized in that at least one of the further targets is a metallic target.
9. Verfahren nach Anspruch 7 oder 8, dadurch gekennzeichnet, dass dabei eine Zwischenschicht zur Haftverbesserung aus Metallen, Me- tallnitriden, Metallcarbiden, Metallcarbonitriden oder Mehrlagenanordnungen mit diesen Komponenten abgeschieden wird, bevorzugt mit einer Dicke zwischen 0,02 μm und 2 μm.9. The method according to claim 7 or 8, characterized in that an intermediate layer for improving the adhesion of metals, metal nitrides, metal carbides, metal carbonitrides or multilayer arrangements is deposited with these components, preferably with a thickness between 0.02 μm and 2 μm.
10. Verfahren nach einem der Ansprüche 7 bis 9, dadurch gekennzeichnet, dass eine Deckschicht aus Kohlenstoff, Wasserstoff und/oder Stickstoff mit Metallverunreinigungen von weniger als 0,1 % abgeschieden wird.10. The method according to any one of claims 7 to 9, characterized in that a cover layer of carbon, hydrogen and / or nitrogen with metal impurities of less than 0.1% is deposited.
11. Verfahren nach einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass das Substrat mit einer negativen Gleichspannung vorgespannt wird.11. The method according to any one of the preceding claims, characterized in that the substrate is biased with a negative DC voltage.
12. Verfahren nach einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass das Substrat mit einer Mittelfrequenzspannung zwischen 30 und12. The method according to any one of the preceding claims, characterized in that the substrate with a medium frequency voltage between 30 and
300 kHz angeregt wird. 300 kHz is excited.
13. Verfahren nach einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass die hohe lonenstromdichte am Substrat dadurch erzielt wird, dass in der unbalancierten Magnetronbetriebsart gearbeitet wird.13. The method according to any one of the preceding claims, characterized in that the high ion current density on the substrate is achieved by working in the unbalanced magnetron mode.
14. Verfahren nach einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass als Reaktivgas eine Mischung aus Edelgasen und Kohlenwasserstoffgasen und/oder Kohlenwasserstoffdämpfen eingesetzt wird.14. The method according to any one of the preceding claims, characterized in that a mixture of noble gases and hydrocarbon gases and / or hydrocarbon vapors is used as the reactive gas.
15. Verfahren nach Anspruch 14, dadurch gekennzeichnet, dass als Reaktivgas eine Mischung aus Argon und Acetylen eingesetzt wird.15. The method according to claim 14, characterized in that a mixture of argon and acetylene is used as the reactive gas.
16. Verfahren nach einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass das Reaktivgas während des Beschichtungsvorganges mit zusätzlichen gas- oder dampfförmigen Verbindungen sowie mit Stickstoff und/oder Sauerstoff gemischt oder durch Stickstoff ersetzt wird.16. The method according to any one of the preceding claims, characterized in that the reactive gas is mixed during the coating process with additional gaseous or vaporous compounds and with nitrogen and / or oxygen or is replaced by nitrogen.
17. Verfahren nach Anspruch 16, dadurch gekennzeichnet, dass die zusätzlichen gas- oder dampfförmigen Verbindungen Silizium enthalten.17. The method according to claim 16, characterized in that the additional gaseous or vaporous compounds contain silicon.
18. Verfahren nach Anspruch 16 oder 17, dadurch gekennzeichnet, dass die zusätzlichen gas- oder dampfförmigen Verbindungen Tetramethyl- silan (TMS) enthalten. 18. The method according to claim 16 or 17, characterized in that the additional gaseous or vaporous compounds contain tetramethylsilane (TMS).
9. Verfahren nach einem der Ansprüche 16 bis 18, dadurch gekennzeichnet, dass die zusätzlichen gas- oder dampfförmigen Verbindungen Hexamethyl- disiloxan (HMDSO) enthalten.. 9. The method according to any one of claims 16 to 18, characterized in that the additional gaseous or vaporous compounds contain hexamethyl disiloxane (HMDSO).
EP03718664A 2002-01-30 2003-01-28 Method for depositing metal-free carbon layers Expired - Lifetime EP1470263B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10203730A DE10203730B4 (en) 2002-01-30 2002-01-30 Method for depositing metal-free carbon layers
DE10203730 2002-01-30
PCT/EP2003/000844 WO2003064720A1 (en) 2002-01-30 2003-01-28 Method for depositing metal-free carbon layers

Publications (2)

Publication Number Publication Date
EP1470263A1 true EP1470263A1 (en) 2004-10-27
EP1470263B1 EP1470263B1 (en) 2009-09-09

Family

ID=27588157

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03718664A Expired - Lifetime EP1470263B1 (en) 2002-01-30 2003-01-28 Method for depositing metal-free carbon layers

Country Status (4)

Country Link
EP (1) EP1470263B1 (en)
AT (1) ATE442465T1 (en)
DE (2) DE10203730B4 (en)
WO (1) WO2003064720A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112267100A (en) * 2020-09-30 2021-01-26 大连交通大学 Preparation method of carbon membrane material with high carrier concentration

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004041234A1 (en) * 2004-08-26 2006-03-02 Ina-Schaeffler Kg Wear resistant coating and method of making same
CH697552B1 (en) 2004-11-12 2008-11-28 Oerlikon Trading Ag Vacuum treatment installation.
DE102006027502A1 (en) * 2005-09-10 2007-03-22 Schaeffler Kg Wear resistant coating and method of making same
ATE452218T1 (en) * 2005-09-10 2010-01-15 Schaeffler Kg WEAR-RESISTANT COATING AND METHOD FOR PRODUCING THE SAME
DE202006007420U1 (en) * 2006-05-09 2007-09-20 Pepperl + Fuchs Gmbh housing arrangement
GB0613510D0 (en) * 2006-07-07 2006-08-16 Teer Coatings Ltd A method and apparatus for the formation of coatings on drills
EP1887099A1 (en) * 2006-08-12 2008-02-13 Tatung Company Method for manufacturing diamond-like carbon film
DE102006057484B4 (en) * 2006-12-06 2010-05-12 Schaeffler Kg Rolling bearings with a surface coating
AT504482B1 (en) * 2007-03-01 2008-06-15 Ruebig Gmbh & Co Kg Producing optionally-doped coating of amorphous silicon, germanium or their oxides on metallic substrate, subjects area to oxidation before coating deposition
EP2362000B1 (en) * 2008-10-29 2017-11-22 NTN Corporation Hard multilayer film formed body and method for manufacturing same
DE102009028504C5 (en) 2009-08-13 2014-10-30 Federal-Mogul Burscheid Gmbh Piston ring with a coating
DE102009057444A1 (en) * 2009-12-08 2011-06-09 Dürr Systems GmbH Lackieranlagenbauteil with a surface coating
DE102012214284B4 (en) 2012-08-10 2014-03-13 Federal-Mogul Burscheid Gmbh Sliding element, in particular piston ring, with a resistant coating
CN104593724A (en) * 2015-01-13 2015-05-06 上海应用技术学院 Process for preparing diamond-like coating doped with silicon element
DE102015208644A1 (en) * 2015-05-11 2016-11-17 Schaeffler Technologies AG & Co. KG Component, use of the component and method for producing the component

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3246361A1 (en) * 1982-02-27 1983-09-08 Philips Patentverwaltung Gmbh, 2000 Hamburg CARBON-CONTAINING SLIP LAYER
CA1232228A (en) * 1984-03-13 1988-02-02 Tatsuro Miyasato Coating film and method and apparatus for producing the same
DE19513614C1 (en) * 1995-04-10 1996-10-02 Fraunhofer Ges Forschung Bipolar pulsed plasma CVD of carbon@ layer on parts with complicated geometry
DE19651615C1 (en) * 1996-12-12 1997-07-10 Fraunhofer Ges Forschung Sputter coating to produce carbon layer for e.g. magnetic heads
US6726993B2 (en) * 1997-12-02 2004-04-27 Teer Coatings Limited Carbon coatings, method and apparatus for applying them, and articles bearing such coatings
GB2348158A (en) * 1999-03-16 2000-09-27 Teer Coatings Ltd Lubricated cutting
US6086730A (en) * 1999-04-22 2000-07-11 Komag, Incorporated Method of sputtering a carbon protective film on a magnetic disk with high sp3 content
EP2000560B1 (en) * 1999-07-08 2013-10-02 Sumitomo Electric Industries, Ltd Hard coating and coated member
DE10018143C5 (en) * 2000-04-12 2012-09-06 Oerlikon Trading Ag, Trübbach DLC layer system and method and apparatus for producing such a layer system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO03064720A1 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112267100A (en) * 2020-09-30 2021-01-26 大连交通大学 Preparation method of carbon membrane material with high carrier concentration
CN112267100B (en) * 2020-09-30 2022-11-18 大连交通大学 Preparation method of carbon membrane material with high carrier concentration

Also Published As

Publication number Publication date
DE10203730B4 (en) 2010-09-16
ATE442465T1 (en) 2009-09-15
DE50311895D1 (en) 2009-10-22
DE10203730A1 (en) 2003-08-14
EP1470263B1 (en) 2009-09-09
WO2003064720A1 (en) 2003-08-07

Similar Documents

Publication Publication Date Title
EP0990061B1 (en) Method and device for vacuum-coating a substrate
DE10203730B4 (en) Method for depositing metal-free carbon layers
EP2165003A1 (en) Pdv method and pdv device for producing low friction, wear resistant, functional coatings, and coatings produced therewith
EP1362931B2 (en) Method and apparatus for fabrication of a DLC layer system
Liao et al. Characteristics of carbon films prepared by plasma-based ion implantation
EP0958195B1 (en) Method for coating surfaces using an installation with sputter electrodes
EP0748395B1 (en) Process for producing layers of cubic boron nitride
DE19547305A1 (en) Coating metal substrates with titanium aluminium nitride for coating steel
DE60300293T2 (en) An article provided with a carbon coating and process for its production
DE102010052971A1 (en) Workpiece with Si-DLC coating and process for the production of coatings
DE102015114479A1 (en) MANUFACTURING METHOD FOR HARD SURFACE ELEMENT
EP1784524A2 (en) Layered composite comprising cubic boron nitride
Riley et al. Formation of Q-carbon with wafer scale integration
Makówka et al. Modification of magnetron sputter deposition of nc-WC/aC (: H) coatings with an additional RF discharge
EP0971048A1 (en) Amorphous carbon containing layer and process for its fabrication
EP1876257A2 (en) Method for manufacturing an object with differing friction coefficients on different surface areas and object
DE3442208C2 (en)
Zhang et al. High-temperature oxidation resistant (Cr, Al) N films synthesized using pulsed bias arc ion plating
Panjan et al. Carbon-containing Ti–C: H and Cr–C: H PVD hard coatings
Schröer et al. The properties of amorphous carbon films obtained by ion-beam-assisted carbon evaporation
EP1397526A2 (en) Modified diamond-like carbon (dlc) layer structure
WO2001068790A2 (en) Low-friction protective layers that reduce wear and tear and a method for depositing same
DE102021129950B4 (en) Device for measuring potentials and method of manufacturing such a device
EP1154034B1 (en) Method for making a low wear low friction coating on light metal objects
Kaczorowski et al. Wytwarzanie warstw węglowych w nowym reaktorze MW/RF

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20040625

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT SE SI SK TR

AX Request for extension of the european patent

Extension state: AL LT LV MK RO

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWAN

17Q First examination report despatched

Effective date: 20080924

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT SE SI SK TR

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

Free format text: NOT ENGLISH

REG Reference to a national code

Ref country code: CH

Ref legal event code: NV

Representative=s name: KELLER & PARTNER PATENTANWAELTE AG

Ref country code: CH

Ref legal event code: EP

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

REF Corresponds to:

Ref document number: 50311895

Country of ref document: DE

Date of ref document: 20091022

Kind code of ref document: P

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

NLV1 Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act
PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

REG Reference to a national code

Ref country code: IE

Ref legal event code: FD4D

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20091220

Ref country code: IE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100111

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

26N No opposition filed

Effective date: 20100610

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MC

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100131

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

Effective date: 20100930

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20091210

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100201

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100128

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HU

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100310

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100128

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20090909

REG Reference to a national code

Ref country code: CH

Ref legal event code: PCAR

Free format text: NEW ADDRESS: EIGERSTRASSE 2 POSTFACH, 3000 BERN 14 (CH)

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: CH

Payment date: 20150123

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20150123

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: BE

Payment date: 20150119

Year of fee payment: 13

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160131

REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20160128

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160131

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160128

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160131

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20220120

Year of fee payment: 20

REG Reference to a national code

Ref country code: DE

Ref legal event code: R071

Ref document number: 50311895

Country of ref document: DE