EP0748395B1 - Process for producing layers of cubic boron nitride - Google Patents

Process for producing layers of cubic boron nitride Download PDF

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Publication number
EP0748395B1
EP0748395B1 EP95911214A EP95911214A EP0748395B1 EP 0748395 B1 EP0748395 B1 EP 0748395B1 EP 95911214 A EP95911214 A EP 95911214A EP 95911214 A EP95911214 A EP 95911214A EP 0748395 B1 EP0748395 B1 EP 0748395B1
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Prior art keywords
substrate
target
layer
boron nitride
layers
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German (de)
French (fr)
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EP0748395A1 (en
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Holger Dipl.-Ing. Lüthje
Klaus Dr. Bewilogua
Simone Dipl.-Ing. Daaud
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Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
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Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/0021Reactive sputtering or evaporation
    • C23C14/0036Reactive sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/0641Nitrides
    • C23C14/0647Boron nitride
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders

Definitions

  • the invention relates to the field of the production of wear-resistant layers or the production of layers with certain wear properties. It relates to a process for the production of wear-resistant layers made of cubic boron nitride (cBN) or connecting layers with a high cBN content.
  • cBN cubic boron nitride
  • cBN In the field of manufacturing technology, cBN has the essential advantage over diamond that it is inert to steel and thus enables the machining of workpieces containing iron. This important area of production is not accessible to diamond tools due to chemical wear of the diamond.
  • the cBN layers are produced with the aid of an ion-assisted laser pulse method.
  • An hBN target is used.
  • the ion bombardment is carried out by applying a DC voltage potential.
  • the known CVD-EZR processes have the considerable disadvantage that the deposition can only take place at relatively high substrate temperatures of> 600 ° C. moreover, due to the limited extent of the EZR plasma, only relatively small substrates can be coated.
  • PVD processes are essentially used in hard film production in general, the plasma being generated for economic reasons with the help of direct current arc discharges (ARC process) or with the help of magnetron cathodes operated with direct current.
  • direct current operation also has the particular advantage that large-area coating systems can be implemented with it.
  • the object of the invention which includes proposing a method for producing hard and wear-resistant cBN layers or layers containing cBN, which does not have all the disadvantages of the prior art, is therefore to specify a method of the type mentioned which, in addition to a high degree Coating rate also allows the deposition at low substrate temperatures, which is not limited to small substrates, and which is economically advantageous and inexpensive to operate.
  • cBN layers or layers containing cBN can also be obtained using boron carbide (B 4 C) targets which contain approximately 20% carbon. let it separate.
  • B 4 C boron carbide
  • an output target is inventively used , on which the material removal for the layer production takes place, is made of electrically conductive material.
  • This target preferably consists of boron carbide, advantageously in the composition range from 90at% to 70at% boron and 10at% to 30at% carbon (eg B 4 C).
  • B- and / or BN- doped with metal eg Ti, Mo, Ta, Cr, Cu, Ni and / or Al
  • metal eg Ti, Mo, Ta, Cr, Cu, Ni and / or Al
  • borides or nitrides are used as starting targets.
  • the reactive process is carried out with the addition of Ar and N 2 in such a way that the required B: N stoichiometry can be set in the layer.
  • the process should be carried out in such a way that the carbon content in the cBN layer or in the cBN-containing layer is reduced to values ⁇ 5at%.
  • a reduced incorporation of carbon in the layer and the required adjustment of the BN ratio is achieved so that the process is carried out in an Ar / N 2 gas mixture.
  • an increased oxygen content in the working gas would reduce its proportion in the layer by selective reaction with the carbon.
  • a low oxygen partial pressure is particularly favorable for high proportions of the cubic phase in the layers.
  • a gradient layer should be deposited on the substrate before the actual cBN layer without interrupting the vacuum process, for example by gradually, continuously varying the process gas composition and the process conditions .
  • the substrate holder is coated with a layer of BC / BN (boron carbide and / or boron nitride), preferably with a thickness of 0.1 to 0.5 ⁇ m, before coating.
  • BC / BN boron carbide and / or boron nitride
  • the high-frequency coupling be coupled on the target and also on the substrate side, or alternatively, direct voltage (DC) on the substrate side, with a negative bias voltage ( Bias voltage) in the range of 100 to 1,000 V (for example 300 to 500 V), there is an area-related power between 3 and 17 W / cm 2 (e.g.
  • the substrate temperature is kept at a temperature in the range between 30 ° C and 500 ° C (for example at an equilibrium temperature of 350 ° C), an Ar / N 2 gas mixture, the N 2 content in the gas mixture being 5% to close to 100% (eg 10 to 70%), and the process pressure being set in the range from 1 to 50 ⁇ bar (eg 20 ⁇ bar).
  • an area-related power of 2 to 13 W / cm 2 (e.g. 5 W / cm 2 ) be applied to the target and an area-related power of 0 to the substrate , 4 to 8 W / cm 2 (eg 1 W / cm 2 ), the substrate holder, to which a bias voltage is to be applied, rotatably supported, the process pressure set in the range from 1 to 10 ⁇ bar (eg 4 ⁇ bar) and to use an Ar / N 2 gas mixture with N 2 contents between 10 and close to 100% (eg 50% gas flow) as process gas.
  • a high-frequency bias (HF bias) or a DC bias to the substrate holder to create.
  • HF bias high-frequency bias
  • a bias voltage of 100 - 800 V is advantageous, and if a high frequency bias voltage is applied to the substrate holder, a bias voltage would be in the range of 100 V to 1,000 V (e.g. from 200 V) up to 500 V) should preferably be applied.
  • the process should also be run in a generally magnetic field-assisted manner in order to favor the production of the desired layers.
  • This magnetic field support is expediently carried out in such a way that flux densities of approximately 4-7 mT are achieved by means of a coil installed in the recipient, or the additional magnetic field support is achieved by installing additional magnets or electromagnetic coils in such a way that maximum ion current compression takes place with respect to the substrate.
  • the process according to the invention is very economical, inexpensive and does not have all the disadvantages of the prior art, which makes its use extremely advantageous.
  • An additional advantage of the high-frequency sputtering method and DC magnetron method is that the process heat available in this method is sufficient so that external heating of the samples can be dispensed with.
  • the method according to the invention can advantageously be used in various fields of application. It is advantageous, for example, for the production of wear-resistant tools (e.g. for the coating of mechanically abrasive and / or adhesive-stressed components, such as indexable inserts, milling cutters, drills, pressing and forming tools, as well as bearings and / or bearing components), for the production of with cubic boron nitride (cBN) coated pickups and components for tape guidance of magnetic tapes, for the deposition of cBN for electronic applications, in particular for the production of electronic components with and without doping, for the production of corrosion protection layers and insulation layers and for the production of optical components with a coating and a protective layer against mechanical stress applied.
  • wear-resistant tools e.g. for the coating of mechanically abrasive and / or adhesive-stressed components, such as indexable inserts, milling cutters, drills, pressing and forming tools, as well as bearings and / or bearing components
  • cBN cubic
  • cBN layers consisting of components B, C and N are already known. Their advantage is, inter alia, that they have high mechanical strengths combined with good optical transparency and thus show advantages over the comparatively hard amorphous hydrocarbon layers, but which are not transparent in the visible spectral range.
  • Another advantage of the cBN layer is its low coefficient of friction ⁇ , which is ⁇ 0.2 and comparable to diamond layers.
  • is ⁇ 0.2 and comparable to diamond layers.
  • Such cBN layers have very good sliding properties, so that they can advantageously be used to coat mechanically abrasive and / or adhesively stressed components as well as bearings and / or bearing components. So far, however, it has not yet been possible to generate the hard cubic phase in such layers in a simple, cost-effective manner.
  • CBN and wBN are aimed for in an equivalent manner.
  • the two phases cBN and wBN, whose density is identical, are to be regarded as equivalent insofar as in both Modifications B and N atoms are coordinated fourfold and the same short-range order is present.
  • cBN can also be understood to mean a nanocrystalline or amorphous material which has an sp 3 hybrid bond for the elements B and N.
  • cBN means only the hard phases cBN and wBN.
  • a target cleaning phase and a simultaneous ion etching cleaning of the substrates separated by a mechanical shutter take place before the actual layer application.
  • the shutters were opened during the layer production.
  • Silicon wafers (orientations 100 and 111) were used as substrates, as well as steel samples made of 100 Cr6, HSS (High Speed Steel), hard metals, molybdenum and stainless steel.
  • a method has proven to be particularly advantageous in which the layer is produced in a high-frequency diode sputtering system.
  • bias voltages negative bias voltages
  • DC direct current
  • the desired properties of the layers to be produced are listed below Obtained using a conductive target from B 4 C.
  • area-related powers of 6 W / cm 2 are applied to the target. It works with powers on the substrate electrode of 2 W / cm 2 , the electrodes with a diameter of approx. 170 mm lying opposite each other at a distance of approx. 100 mm.
  • the substrate electrode can be covered with B 4 C or other B-containing materials. However, a steel plate or other metal can also be used.
  • the process is expediently carried out with magnetic field support in such a way that flux densities of about 4 to 7 mT are produced by means of a coil installed in the recipient, and thus the production of the desired layers is favored. It is not necessary to heat the samples. Due to the heat of the process, the substrates reach an equilibrium temperature of up to 350 ° C during the coating.
  • the cubic boron nitride layer is created using a gas mixture of Ar and N 2 , the process pressure being 20 ⁇ bar.
  • the N 2 content in the gas mixture was in the range of 50-70% of the total flow.
  • UBM unbalanced magnetron
  • the substrate holder can be operated with an RF bias as well as with a DC bias.
  • a commercial system with a vertically arranged magnetron cathode with additional coils was used for an unbalanced sputtering operation (UBM).
  • the B 4 C target used had dimensions of 254 mm x 127 mm.
  • the substrate holder which consisted of a stainless steel plate, was arranged at a distance of 80 mm to 150 mm. The substrate holder was rotatable, so that intermediate layers could also be applied during a vacuum cycle, in which the substrate holder was moved in front of a second magnetron cathode, which was arranged offset by 90 °.
  • a 100 nm to 1,000 nm thick intermediate layer composed of a conductive Ti B (N) and / or B 4 C layer is applied to the substrate holder and the substrates mounted thereon before the coating.
  • a comparable conductive layer can also be applied in between for the production of even thicker cBN layers in a very limited thickness.
  • External heating of the samples can also be dispensed with in the case of the DC magnetron example.

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
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Abstract

PCT No. PCT/DE95/00315 Sec. 371 Date Sep. 4, 1996 Sec. 102(e) Date Sep. 4, 1996 PCT Filed Mar. 3, 1995 PCT Pub. No. WO95/23879 PCT Pub. Date Sep. 8, 1995Process for producing wear-resistant layers of cubic boron nitride or wear-resistant layers containing cubic boron nitride by sputtering with RF or DC voltage in the operating mode of an unbalanced magnetron, in which the plasma is generated by DC arc discharges or DC operated magnetron cathodes. The initial target for the production of the layer from which the material is removed comprises electrically conductive material containing boron, preferably boron carbide, and, in the process, the reactive process is conducted with the addition of N2 and Ar in such a way that the necessary stoichiometric ratio BiN in the layer can be adjusted.

Description

Die Erfindung bezieht sich auf das Gebiet der Herstellung verschleißfester Schichten bzw. der Herstellung von Schichten mit bestimmten Verschleißeigenschaften. Sie betrifft ein Verfahren zur Herstellung von verschleißfesten Schichten aus kubischem Bornitrid (cBN) oder Verbindungsschichten mit einem hohen cBN-Anteil.The invention relates to the field of the production of wear-resistant layers or the production of layers with certain wear properties. It relates to a process for the production of wear-resistant layers made of cubic boron nitride (cBN) or connecting layers with a high cBN content.

Das thermodynamisch nicht stabile cBN zeichnet sich durch eine hohe, nur von Diamant übertroffene Härte aus und besitzt weitere Eigenschaften, die denen von Diamant ähnlich sind. Hierzu zählen insbesondere die gute thermische Leitfähigkeit, die hervorragenden tribologischen Eigenschaften und nicht zuletzt die gute Transparenz im Sichtbaren (n = 2.2), sowie ein extrem großer Bandabstand von >6,4 eV, wodurch cBN auch als Halbleitermaterial ein hohes Potential besitzt.The thermodynamically unstable cBN is characterized by a high hardness that is only surpassed by diamond and has other properties that are similar to those of diamond. These include in particular the good thermal conductivity, the excellent tribological properties and last but not least the good transparency in the visible (n = 2.2), as well as an extremely large band gap of> 6.4 eV, which means that cBN also has high potential as a semiconductor material.

Im Bereich der Fertigungstechnik hat cBN im Vergleich zu Diamant den essentiellen Vorteil, daß es gegenüber Stahl inert ist und somit die Bearbeitung von eisenhaltigen Werkstücken ermöglicht. Dieser wichtige Produktionsbereich ist Diamantwerkzeugen wegen chemischem Verschleiß des Diamanten nicht zugänglich.In the field of manufacturing technology, cBN has the essential advantage over diamond that it is inert to steel and thus enables the machining of workpieces containing iron. This important area of production is not accessible to diamond tools due to chemical wear of the diamond.

Seit in den 80er Jahren vornehmlich japanische und US-amerikanische Wissenschaftler grundsätzlich nachgewiesen haben, daß die kubische Phase von Bornitrid auch mit Hilfe von plasma-aktivierten Verfahren herstellbar ist, gab es weltweit vielfältige Bemühungen cBN-Schichten herzustellen.Since it was mainly Japanese and American scientists in the 80s who fundamentally demonstrated that the cubic phase of boron nitride can also be produced with the aid of plasma-activated processes, efforts have been made worldwide to produce cBN layers.

So wird zum Beispiel im "Journal of Applied Physics" 72 (2), 15.07.1992, Seite 504 und im "Journal of Material Research" Vol 8, No. 6, Jun. 1993, die Herstellung von cBN-Schichten beschrieben, wobei eine ionenstrahlunterstützte Aufdampftechnik (IBAD) zur Anwendung gelangte.For example, in "Journal of Applied Physics" 72 (2), July 15, 1992, page 504 and in "Journal of Material Research" Vol 8, No. 6, Jun. 1993, described the production of cBN layers, using an ion beam assisted vapor deposition technique (IBAD).

Desweiteren wird in "Diamond and Related Materials" 2 (1993), Seite 512 ein Verfahren beschrieben, das mit Hilfe von lonenstrahlkanonen arbeitet, wobei eine lonenquelle zur Zerstäubung der aus Bor oder hexagonalem Bornitrid (hBN) bestehenden Targets eingesetzt wird und eine zweite lonenkanone den Beschuß des auf einem Substrat angelagerten Films übernimmt.Furthermore, in "Diamond and Related Materials" 2 (1993), page 512, a method is described which works with the aid of ion beam guns, an ion source being used to atomize the targets consisting of boron or hexagonal boron nitride (hBN) and a second ion cannon Bombardment of the film deposited on a substrate takes over.

In "Surface and Coating Technology" 43/44 (1990), Seiten 145 - 153 wird darüber hinaus ein reaktives lonplating Verfahren beschrieben, bei dem man Bor mit Hilfe eines Elektronenstrahlverdampfers in einer Ar/N2-Atmosphäre, die zusätzlich ionisiert wird, verdampft. Die sich bildende Schicht liegt auf einem Substrathalter mit negativem Potential, so daß die wachsende Schicht mit den vorhandenen Ar und N2-lonen beschossen wird.In "Surface and Coating Technology" 43/44 (1990), pages 145-153, a reactive lonplating process is also described, in which boron is evaporated using an electron beam evaporator in an Ar / N 2 atmosphere which is additionally ionized . The layer that is formed lies on a substrate holder with negative potential, so that the growing layer is bombarded with the Ar and N 2 ions present.

Bei dem in "Thin Solid Films" 224 (1993), Seiten 46 - 51 beschriebenen Verfahren erfolgt die Herstellung der cBN-Schichten mit Hilfe eines lonen-unterstützten Laser-Puls-Verfahrens. Dabei wird ein hBN-Target benutzt. Der lonenbeschuß erfolgt durch Anlegen eines Gleichspannungspotentials.In the method described in "Thin Solid Films" 224 (1993), pages 46-51, the cBN layers are produced with the aid of an ion-assisted laser pulse method. An hBN target is used. The ion bombardment is carried out by applying a DC voltage potential.

Das in "Japanese Joumal of Applied Physics" Vol.- 30, No. 2, Febr. 1991, Seiten 344 - 348 beschriebene Verfahren arbeitet mit einer Mikrowellen-Elektron-Zyklotron-Resonanz (EZR)-Abscheidung, wobei BN aus der Gasphase Ar/N2/B2H6 gebildet wird und an das Substrat eine HF-Bias (Hochfrequenz-Vorspannung) gelegt wird.In "Japanese Joumal of Applied Physics" Vol.- 30, No. 2, Febr. 1991, pages 344-348 described method works with a microwave electron cyclotron resonance (EZR) deposition, wherein BN is formed from the gas phase Ar / N 2 / B 2 H 6 and an HF to the substrate -Bias (high frequency bias) is placed.

Schließlich ist noch im "Japanese Joumal of Applied Physics" Vol. 29, No. 7, July 1990, Seiten 1175 - 1177 ein Verfahren zur Herstellung von cBN enthaltenden Schichten dargestellt, bei dem ein hBN-Target in einem inerten Hochfrequenzplasma (HF-Plasma) zerstäubt wird. Das Substrat wird ebenfalls mit einem HF-Bias auf negativem Potential gehalten, so daß ein Beschuß mit Ar-lonen erfolgt.Finally, in "Japanese Joumal of Applied Physics" Vol. 29, No. 7, July 1990, pages 1175-1177, a method for producing layers containing cBN is shown, in which an hBN target is atomized in an inert high-frequency plasma (HF plasma). The substrate is also held at negative potential with an HF bias, so that bombardment with Ar ions takes place.

Der Vollständigkeit halber sei auch auf die DE-OS 38 10 237, US-PS 4 412 899, US-PS 4 415 420, US-PS 4 683 043 und US-PS 5 096 740 verwiesen, in denen ebenfalls unterschiedliche Verfahren zur Herstellung von cBN bzw. cBN-enthaltenden Schichten dargestellt sind.For the sake of completeness, reference is also made to DE-OS 38 10 237, US Pat. No. 4,412,899, US Pat. No. 4,415,420, US Pat. No. 4,683,043 and US Pat. No. 5,096,740, which likewise contain different processes for the preparation of cBN or cBN-containing layers are shown.

Die im Stand der Technik beschriebenen PVD-Verfahren verwenden einheitlich entweder Bor oder hexagonales Bornitrid (hBN) als Target oder Aufdampfmaterial. Hinsichtlich einer wirtschaftlichen Anwendung besaßen alle diese Verfahren erhebliche Nachteile. So lassen sich mit diesen Verfahren nur relativ kleine Flächen bei geringer Depositionsrate beschichten.The PVD processes described in the prior art uniformly use either boron or hexagonal boron nitride (hBN) as the target or vapor deposition material. All of these methods had considerable disadvantages in terms of economic application. With this method, only relatively small areas can be coated with a low deposition rate.

Die bekannten CVD-EZR-Verfahren haben den erheblichen Nachteil, daß die Abscheidung nur bei relativ hohen Substrattemperaturen von > 600°C erfolgen kann. außerdem lassen sich bedingt durch die begrenzte Ausdehnung des EZR-Plasmas, nur verhältnismäßig kleine Substrate beschichten.The known CVD-EZR processes have the considerable disadvantage that the deposition can only take place at relatively high substrate temperatures of> 600 ° C. moreover, due to the limited extent of the EZR plasma, only relatively small substrates can be coated.

In der Hartschichtherstellung allgemein werden heute im wesentlichen PVD-Verfahren angewandt, wobei die Plasmagenerierung aus ökonomischen Gründen mit Hilfe von Gleichstrombogenentladungen (ARC-Verfahren) oder mit Hilfe von mit Gleichstrom betriebenen Magnetron-Katoden erfolgt. Der Gleichstrombetrieb hat neben essentiellen Kostenvorteilen im apperativen Bereich insbesondere auch den Vorteil, daß sich großflächige Beschichtungsanlagen damit realisieren lassen.Nowadays, PVD processes are essentially used in hard film production in general, the plasma being generated for economic reasons with the help of direct current arc discharges (ARC process) or with the help of magnetron cathodes operated with direct current. In addition to essential cost advantages in the apperative area, direct current operation also has the particular advantage that large-area coating systems can be implemented with it.

Im Hinblick auf die Herstellung von cBN-Schichten bzw. cBN-enthaltenden Schichten haben diese Verfahren den Nachteil, daß die Verwendung elektrisch leitfähiger Ausgangstargets zwingend erforderlich ist und die Herstellung von cBN-Schichten nach dem Stand der Technik nur aus den elektrisch nicht leitfähigen B- bzw. hBN-Ausgangsmaterialien oder einer B2H6 enthaltenden Gasphase möglich ist. Somit ist dieses kostengünstige Verfahren nach dem Stand der Technik zur Herstellung von cBN-Schichten nicht einsetzbar.With regard to the production of cBN layers or layers containing cBN, these processes have the disadvantage that the use of electrically conductive starting targets is absolutely necessary and the production of cBN layers according to the prior art only from the electrically non-conductive B- or hBN starting materials or a gas phase containing B 2 H 6 is possible. This inexpensive state-of-the-art method for the production of cBN layers cannot therefore be used.

Die Aufgabe der Erfindung, die beinhaltet ein Verfahren zur Herstellung von harten und verschleißfesten cBN-Schichten bzw. cBN enthaltenden Schichten vorzuschlagen, das sämtliche Nachteile des Standes der Technik nicht aufweist, besteht somit darin, ein Verfahren der genannten Art anzugeben, das neben einer hohen Beschichtungsrate auch die Abscheidung bei geringen Substrattemperaturen erlaubt, das nicht ausschließlich auf kleine Substrate beschränkt ist, und das wirtschaftlich vorteilhaft und kostengünstig betreibbar ist.The object of the invention, which includes proposing a method for producing hard and wear-resistant cBN layers or layers containing cBN, which does not have all the disadvantages of the prior art, is therefore to specify a method of the type mentioned which, in addition to a high degree Coating rate also allows the deposition at low substrate temperatures, which is not limited to small substrates, and which is economically advantageous and inexpensive to operate.

Darüber hinaus ist es Aufgabe der Erfindung, ein Verfahren der genannten Art anzugeben, mit dem eine großflächige Beschichtung mit hohen Depositionsraten möglich ist, daß heißt es ist auch Aufgabe der Erfindung, die Voraussetzungen dafür zu schaffen, daß die PVD-Verfahren, bei denen die Plasmagenerierung mit Hilfe von Gleichstrombogenentladungen oder mit Hilfe von mit Gleichstrom betriebenen Magnetronkatoden erfolgt, für die Herstellung von cBN-Schichten bzw. cBN-enthaltenden Schichten anwendbar sind.In addition, it is an object of the invention to provide a method of the type mentioned, with which a large-area coating with high deposition rates is possible, that is, it is also an object of the invention to create the conditions for the PVD method in which the Plasma is generated with the aid of direct current arc discharges or with the aid of magnetron cathodes operated with direct current, for which cBN layers or layers containing cBN can be used.

Daraus resultierend ist es also Aufgabe der Erfindung ein Ausgangstargetmaterial mit einer elektrisch ausreichenden Leitfähigkeit anzugeben, aus dem cBN-Schichten bzw. cBN-enthaltende Schichten herstellbar sind, sowie die geeigneten Verfahrensparameter hierfür.As a result, it is therefore the object of the invention to provide a starting target material with an electrically sufficient conductivity, from which cBN layers or layers containing cBN can be produced, and the suitable process parameters for this.

Schließlich ist es noch Aufgabe der Erfindung, eine mögliche Anwendung des vorzuschlagenden Verfahrens der genannten Art anzugeben.Finally, it is still an object of the invention to specify a possible application of the method of the type to be proposed.

Erfindungsgemäß werden die Aufgaben verfahrensseitig, wie in den Ansprüchen 1 bis 16 und anwendungsseitig wie in den Ansprüchen 17 bis 22 beschrieben gelöst.According to the invention, the tasks are solved on the process side, as described in claims 1 to 16 and on the application side, as described in claims 17 to 22.

Überraschenderweise, und es war durchaus nicht zu erwarten, wurde gefunden, daß bei Einhaltung entsprechend gewählter Prozeßbedingungen sich cBN-Schichten bzw. cBN-enthaltende Schichten auch unter Verwendung von Borkarbid (B4C)-Targets, die ca. 20at% Kohlenstoff enthalten, abscheiden lassen. Vorteilhafterweise sollte vor der eigentlichen Schichtaufbringung eine Targetreinigungsphhase und eine gleichzeitig, durch eine mechanische Blende getrennte lonen-Ätzreinigung der Substrate erfolgen.Surprisingly, and it was not at all to be expected, it was found that, if the process conditions selected are observed, cBN layers or layers containing cBN can also be obtained using boron carbide (B 4 C) targets which contain approximately 20% carbon. let it separate. Advantageously, before the actual layer application, a target cleaning phase and a simultaneous ion etching cleaning of the substrates, separated by a mechanical screen, take place.

Bei dem Verfahren zur Herstellung von verschleißfesten Schichten aus cBN oder cBN-enthaltenden verschleißfesten Schichten mittels PVD- oder ähnlicher Verfahren, bei denen die Plasmagenerierung mit Hilfe von Gleichstrombogenentladungen (ARC-Verfahren) oder mit Hilfe von mit Gleichstrom betriebenen Magnetronkatoden erfolgt, wird erfindungsgemäß ein Ausgangstarget, an dem der Materialabtrag für die Schichtherstellung erfolgt, aus elektrisch leitendem Material eingsetzt. Dieses Target besteht vorzugsweise aus Borcarbid, günstigerweise im Zusammensetzungsbereich von 90at% bis 70at% Bor und 10at% bis 30at% Kohlenstoff (z.B. B4C). In einer anderen Verfahrensvariante werden als Ausgangstargets mit Metall (z.B. Ti, Mo, Ta, Cr, Cu, Ni und/oder Al) und/oder deren Boride oder Nitride, sofern diese eine gute Leitfähigkeit aufweisen, dotierte B- und/oder BN-Targets eingesetzt. Bei dem erfindungsgemäßen Verfahren erfolgt die reaktive Prozeßführung unter Zugabe von Ar und N2 derart, daß die erforderliche B:N-Stöchiometrie in der Schicht eingestellt werden kann.In the method for producing wear-resistant layers from cBN or cBN-containing wear-resistant layers by means of PVD or similar methods, in which the plasma is generated with the aid of direct current arc discharges (ARC method) or with the aid of magnetron cathodes operated with direct current, an output target is inventively used , on which the material removal for the layer production takes place, is made of electrically conductive material. This target preferably consists of boron carbide, advantageously in the composition range from 90at% to 70at% boron and 10at% to 30at% carbon (eg B 4 C). In another process variant, B- and / or BN- doped with metal (eg Ti, Mo, Ta, Cr, Cu, Ni and / or Al) and / or their borides or nitrides, provided that they have good conductivity, are used as starting targets. Targets used. In the process according to the invention, the reactive process is carried out with the addition of Ar and N 2 in such a way that the required B: N stoichiometry can be set in the layer.

Dabei sollte ganz allgemein die Prozeßführung so erfolgen, daß der Kohlenstoffanteil in der cBN-Schicht bzw. in der cBN-enthaltenden Schicht auf Werte < 5at% reduziert wird. In der vorliegenden Erfindung wird ein reduzierter Einbau von Kohlenstoff in die Schicht und die erforderliche Einstellung des BN-Verhältnisses so gelöst, daß der Prozeß in einer Ar/N2-Gas-Mischung durchgeführt wird. In Analogie zu Diamant-CVD-Abscheidung wäre zu erwarten gewesen, daß ein erhöhter Sauerstoffgehalt im Arbeitsgas durch selektive Reaktion mit dem Kohlenstoff dessen Anteil in der Schicht reduziert. Es zeigte sich aber, daß für hohe Anteile der kubischen Phase in den Schichten gerade ein niedriger Sauerstoff-Partialdruck günstig ist.In general, the process should be carried out in such a way that the carbon content in the cBN layer or in the cBN-containing layer is reduced to values <5at%. In the present invention, a reduced incorporation of carbon in the layer and the required adjustment of the BN ratio is achieved so that the process is carried out in an Ar / N 2 gas mixture. In analogy to diamond CVD deposition, it would have been expected that an increased oxygen content in the working gas would reduce its proportion in the layer by selective reaction with the carbon. However, it was found that a low oxygen partial pressure is particularly favorable for high proportions of the cubic phase in the layers.

Zur Verbesserung der Haftung der cBN-Schicht bzw. der cBN-enthaltenden Schicht auf dem Substrat sollte vor der eigentlichen cBN-Schicht noch eine Gradientenschicht ohne Unterbrechung des Vakuumprozesses, z.B. durch schrittweise, kontinuierliche Variation der Prozeßgaszusammensetzung und der Prozeßbedingungen, auf dem Substrat abgeschieden werden.In order to improve the adhesion of the cBN layer or the layer containing cBN to the substrate, a gradient layer should be deposited on the substrate before the actual cBN layer without interrupting the vacuum process, for example by gradually, continuously varying the process gas composition and the process conditions .

Ganz allgemein hat es sich weiterhin als günstig erwiesen, wenn der Substrathalter vor der Beschichtung mit einer Schicht aus BC/BN (Borcarbid und/oder Bornitrid), vorzugsweise mit einer Dicke von 0,1 bis 0,5 µm, belegt wird.In general, it has also proven to be advantageous if the substrate holder is coated with a layer of BC / BN (boron carbide and / or boron nitride), preferably with a thickness of 0.1 to 0.5 μm, before coating.

Für das erfindungsgemäße Verfahren sollte neben anderen existierenden Möglichkeiten zweckmäßigerweise entweder das Hochfrequenz-Sputterverfahren bzw. Aufstäuben oder das Gleichspannungs-(DC)-Magnetronverfahren angewandt werden.In addition to other existing possibilities, either the high-frequency sputtering method or sputtering or the direct voltage (DC) magnetron method should be used for the method according to the invention.

Sollte das Hochfrequenz-Sputterverfahren zur Anwendung gelangen, so ist es empfehlenswert, wenn die Hochfrequenz-Einkopplung auf der Target- und auch auf der Substratseite, oder alternativ hierzu Gleichspannung (DC) auf der Substratseite eingekoppelt wird, wobei mit einer negativen Bias-Spannung (Vorspannung) im Bereich von 100 bis 1.000 V (beispielsweise 300 bis 500 V) gearbeitet wird, erfolgt, am Target eine flächenbezogene Leistung zwischen 3 und 17 W/cm2 (z.B. 6 W/cm2) und am Substrat eine flächenbezogene Leistung zwischen 1 und 11 W/cm2 (z.B. 2 W/cm2) angelegt wird, die Substrattemperatur auf einer Temperatur im Bereich zwischen 30°C und 500°C (z.B. auf einer Gleichgewichtstemperatur von 350°C) gehalten wird, als Prozeßgas ein Ar/N2-Gasgemisch, wobei der N2-Gehalt in dem Gasgemisch 5 % bis nahe 100 % (z.B. 10 bis 70 %) beträgt, eingesetzt wird und der Prozeßdruck im Bereich von 1 bis 50 µbar (z.B.20 µbar) eingestellt wird.If the high-frequency sputtering process is used, it is recommended that the high-frequency coupling be coupled on the target and also on the substrate side, or alternatively, direct voltage (DC) on the substrate side, with a negative bias voltage ( Bias voltage) in the range of 100 to 1,000 V (for example 300 to 500 V), there is an area-related power between 3 and 17 W / cm 2 (e.g. 6 W / cm 2 ) on the target and an area-related power between 1 and 11 W / cm 2 (for example 2 W / cm 2 ) is applied, the substrate temperature is kept at a temperature in the range between 30 ° C and 500 ° C (for example at an equilibrium temperature of 350 ° C), an Ar / N 2 gas mixture, the N 2 content in the gas mixture being 5% to close to 100% (eg 10 to 70%), and the process pressure being set in the range from 1 to 50 µbar (eg 20 µbar).

Sollte das Gleichspannungs-Magnetronverfahren mit UBM (unbalanced Magnetron) zur Anwendung gelangen, so ist empfehlenswert, an das Target eine flächenbezogene Leistung von 2 bis 13 W/cm2 (z.B. 5 W/cm2) und an das Substrat eine flächenbezogene Leistung von 0,4 bis 8 W/cm2 (z.B. 1 W/cm2) anzulegen, den Substrathalter, an den eine Bias-Spannung anzulegen ist, drehbar zu lagern, den Prozeßdruck im Bereich von 1 bis 10 µbar (z.B. 4 µbar) einzustellen und als Prozeßgas eine Ar/N2-Gasmischung mit N2-Gehalten zwischen 10 und nahe 100 % (z.B. 50 % Gasfluß), einzusetzen. Bei dieser Variante des erfindungsgemäßen Verfahrens, bei der das Gleichspannungs-Magnetronverfahren angewendet wird, ist es möglich, an den Substrathalter eine Hochfrequenz-Vorspannung (HF-Bias) oder eine Gleichspannungs-Vorspannung anzulegen. Sollte eine Gleichspannungsvorspannung an den Substrathalter angelegt werden, so ist eine Vorspannung von 100 - 800 V von Vorteil, und sollte eine Hochfrequenz-Vorspannung an den Substrathalter angelegt werden, so wäre eine Vorspannung im Bereich von 100 V bis 1.000 V (z.B. von 200 V bis 500 V) vorzugsweise anzulegen.If the DC voltage magnetron method with UBM (unbalanced magnetron) is used, it is recommended that an area-related power of 2 to 13 W / cm 2 (e.g. 5 W / cm 2 ) be applied to the target and an area-related power of 0 to the substrate , 4 to 8 W / cm 2 (eg 1 W / cm 2 ), the substrate holder, to which a bias voltage is to be applied, rotatably supported, the process pressure set in the range from 1 to 10 µbar (eg 4 µbar) and to use an Ar / N 2 gas mixture with N 2 contents between 10 and close to 100% (eg 50% gas flow) as process gas. In this variant of the method according to the invention, in which the DC magnetron method is used, it is possible to apply a high-frequency bias (HF bias) or a DC bias to the substrate holder to create. If a DC voltage bias is applied to the substrate holder, a bias voltage of 100 - 800 V is advantageous, and if a high frequency bias voltage is applied to the substrate holder, a bias voltage would be in the range of 100 V to 1,000 V (e.g. from 200 V) up to 500 V) should preferably be applied.

Zweckmäßigerweise sollte ganz allgemein der Prozeß zusätzlich magnetfeldunterstützt gefahren werden, um somit die Herstellung der gewünschten Schichten zu begünstigen. Sinnvollerweise erfolgt diese Magneffeldunterstützung derart, daß mittels einer im Rezipienten eingebauten Spule Flußdichten von etwa 4 - 7 mT erzielt werden, oder die zusätzliche Magneffeldunterstützung wird erreicht, indem zusätzliche Magneten oder Elektromagnetspulen so eingebaut werden, daß eine maximale lonenstromverdichtung hinsichtlich des Substrates erfolgt.Expediently, the process should also be run in a generally magnetic field-assisted manner in order to favor the production of the desired layers. This magnetic field support is expediently carried out in such a way that flux densities of approximately 4-7 mT are achieved by means of a coil installed in the recipient, or the additional magnetic field support is achieved by installing additional magnets or electromagnetic coils in such a way that maximum ion current compression takes place with respect to the substrate.

Das erfindungsgemäße Verfahren ist sehr wirtschaftlich, kostengünstig und weist sämtliche Nachteile des Standes der Technik nicht auf, was seine Anwendung äußerst vorteilhaft werden läßt.The process according to the invention is very economical, inexpensive and does not have all the disadvantages of the prior art, which makes its use extremely advantageous.

Ein zusätzlicher Vorteil der Verfahrensvarianten Hochfrequenz-Sputterverfahren und Gleichspannungs-Magnetronverfahren ist der, daß die bei diesem Verfahren vorhandene Prozeßwärme ausreichend ist, so daß auf eine externe Beheizung der Proben verzichtet werden kann.An additional advantage of the high-frequency sputtering method and DC magnetron method is that the process heat available in this method is sufficient so that external heating of the samples can be dispensed with.

Es sei an dieser Stelle noch angeführt, daß es möglich und für bestimmte Anwendungsfälle vorteilhaft ist, dem Prozeßgasgemisch zusätzlich borhaltige Gase (z.B. Diboran oder Trimethylborazin) zuzuführen, sowie im Verlauf der Schichtherstellung unterschiedliche Temperaturen von 100°C bis 600°C anzuwenden.It should also be mentioned at this point that it is possible and advantageous for certain applications to additionally add boron-containing gases (eg diborane or trimethylborazine) to the process gas mixture and to use different temperatures from 100 ° C. to 600 ° C. in the course of the layer production.

Das erfindungsgemäße Verfahren ist vorteilhaft in verschiedenen Anwendungsgebieten einsetzbar. Es wird zum Beispiel vorteilhaft zur Herstellung verschleißfester Werkzeuge (z.B. zur Beschichtung von mechanisch abrasiv und/oder adhesiv beanspruchten Komponenten, wie beispielsweise Wendeschneidplatten, Fräser, Bohrer, Preß- und Umformwerkzeuge, sowie Lager und/oder Lagerbauteilen), zur Herstellung von mit kubischem Bornitrid (cBN) beschichteten Tonabnehmern und Komponenten zur Bandführunug von Magnetbändern, zur Abscheidung von cBN für elektronische Anwendungen, insbesondere zur Herstellung von elektronischen Bauteilen mit und ohne Dotierung, zur Herstellung von Korrosionsschutzschichten und Isolationsschichten und zur Herstellung von optischen Komponenten mit einer Vergütungsschicht und einer Schutzschicht gegen mechanische Beanspruchung angewendet.The method according to the invention can advantageously be used in various fields of application. It is advantageous, for example, for the production of wear-resistant tools (e.g. for the coating of mechanically abrasive and / or adhesive-stressed components, such as indexable inserts, milling cutters, drills, pressing and forming tools, as well as bearings and / or bearing components), for the production of with cubic boron nitride (cBN) coated pickups and components for tape guidance of magnetic tapes, for the deposition of cBN for electronic applications, in particular for the production of electronic components with and without doping, for the production of corrosion protection layers and insulation layers and for the production of optical components with a coating and a protective layer against mechanical stress applied.

Mit der erfindungsgemäßen Lösung ist es somit erstmals möglich, cBN-Schichten aus elektrisch ausreichend leitfähigen borhaltigen Targets herzustellen und somit die Möglichkeit geschaffen, die eingangs genannten, äußerst kostengünstigen und vorteilhaften PVD-Verfahren, wie beispielsweise das Gleichspannungs-Magnetronverfahren, das Hochfrequenz-Sputterverfahren und andere zur Herstellung von cBN-Schichten bzw. cBN-enthaltenden Schichten einzusetzen.With the solution according to the invention, it is thus possible for the first time to produce cBN layers from electrically sufficiently conductive boron-containing targets, thus creating the possibility of the extremely inexpensive and advantageous PVD processes mentioned at the outset, such as the DC magnetron process, the high-frequency sputtering process and use others to produce cBN layers or layers containing cBN.

Ganz allgemein sind Schichten, die aus den Komponenten B, C und N bestehen bereits bekannt. Ihr Vorteil besteht u.a. darin, daß sie hohe mechanische Festigkeiten verbunden mit einer guten optischen Transparenz besitzen und damit Vorteile gegenüber den vergleichbar harten amorphen Kohlenwasserstoffschichten zeigen, die aber im sichtbaren Spektralbereich nicht transparent sind. Ein weiterer Vorteil der cBN-Schicht liegt in ihrem geringen Reibwert µ, welcher < 0,2 und vergleichbar mit Diamantschichten ist. Somit besitzen derartige cBN-Schichten sehr gute Gleiteigenschaften, so daß mit ihnen vorteilhaft mechanisch abrasiv und/oder adhesiv beanspruchte Komponenten sowie Lager und/oder Lagerbauteile beschichtet werden können. Bisher ist es aber noch nicht gelungen, in einfacher kostengünstiger Weise in solchen Schichten die harte kubische Phase zu erzeugen. Dabei werden cBN und wBN (Wurtzit-Phase) in gleichwertiger Weise angestrebt. Die beiden Phasen cBN und wBN, deren Dichte identisch ist, sind insofern als gleichwertig anzusehen, als in beiden Modifikationen B- und N-Atome vierfach koordiniert sind und die gleiche Nahordnung vorliegt. Zwischen allen B- und N-Atomen bestehen Einfachbindungen (sp3-Zustand). Außerdem kann unter der Definition cBN auch ein nanokristallines oder amorphes Material, das eine sp3 Hybridbindung für die Elemente B und N aufweist, verstanden werden. In der vorliegenden Erfindung sind unter cBN nur die harten Phasen cBN und wBN zu verstehen.In general, layers consisting of components B, C and N are already known. Their advantage is, inter alia, that they have high mechanical strengths combined with good optical transparency and thus show advantages over the comparatively hard amorphous hydrocarbon layers, but which are not transparent in the visible spectral range. Another advantage of the cBN layer is its low coefficient of friction µ, which is <0.2 and comparable to diamond layers. Thus, such cBN layers have very good sliding properties, so that they can advantageously be used to coat mechanically abrasive and / or adhesively stressed components as well as bearings and / or bearing components. So far, however, it has not yet been possible to generate the hard cubic phase in such layers in a simple, cost-effective manner. CBN and wBN (wurtzit phase) are aimed for in an equivalent manner. The two phases cBN and wBN, whose density is identical, are to be regarded as equivalent insofar as in both Modifications B and N atoms are coordinated fourfold and the same short-range order is present. There are single bonds (sp 3 state) between all B and N atoms. In addition, the definition cBN can also be understood to mean a nanocrystalline or amorphous material which has an sp 3 hybrid bond for the elements B and N. In the present invention, cBN means only the hard phases cBN and wBN.

Das erfindungsgemäße Verfahren wird an nachfolgenden Ausführungsbeispielen näher erläutert.The method according to the invention is explained in more detail using the following exemplary embodiments.

Ausführungsbeispiele:Examples:

Es hat sich gezeigt, daß verschiedene Prozeßführungen zur Herstellung von verschleißfesten Schichten aus kubischem Bornitrid geeignet sind.It has been shown that various process controls are suitable for producing wear-resistant layers of cubic boron nitride.

In den hier aufgeführten Beispielen erfolgt vor der eigentlichen Schichtaufbringung eine Targetreinigungsphase und eine gleichzeitig, durch eine mechanische Blende (Shutter) getrennte lonen-Ätzreinigung der Substrate. Die Shutter waren in nachfolgenden Ausführungsbeispielen während der Schichtherstellung geöffnet.In the examples listed here, a target cleaning phase and a simultaneous ion etching cleaning of the substrates separated by a mechanical shutter (shutter) take place before the actual layer application. In the following exemplary embodiments, the shutters were opened during the layer production.

Als Substrate kamen Silizium Wafer (Orientierungen 100 und 111) zur Anwendung, sowie Stahlproben aus 100 Cr6, HSS (High Speed Steel), Hartmetalle, Molybdän und Edelstahl.Silicon wafers (orientations 100 and 111) were used as substrates, as well as steel samples made of 100 Cr6, HSS (High Speed Steel), hard metals, molybdenum and stainless steel.

1. HF-Sputterverfahren (Hochfrequenz-Aufstäubungs-Verfahren)1. HF sputtering process (high frequency sputtering process)

Als besonders vorteilhaft hat sich ein Verfahren erwiesen, bei welchem die Schicht in einer Hochfrequenz-Dioden Sputteranlage hergestellt wird. Hierbei erfolgt die Hochfrequenz-Einkopplung auf der Target- und auch auf der Substratseite, wobei mit negativen Biasspannungen (Vorspannungen) im Bereich von 300 - 500 V gearbeitet wird. Es besteht auch die Möglichkeit, auf der Substratseite Gleichspannung (DC = direct current = Gleichspannung) einzukoppeln. Die erwünschten Eigenschaften der herzustellenden Schichten werden unter Verwendung eines leitfähigen Targets aus B4C erhalten. Hierfür werden flächenbezogene Leistungen von 6 W/cm2 am Target angelegt. Es wird mit Leistungen an der Substratelektrode von 2 W/cm2 gearbeitet, wobei sich die Elektroden, mit einem Durchmesser von ca. 170 mm in einem Abstand von etwa 100 mm gegenüberliegen. Die Substratelektrode kann dabei mit B4C oder anderen B-haltigen Materialien belegt werden. Es kann jedoch auch eine Stahlplatte oder ein anderes Metall zur Anwendung kommen. Zweckmäßigerweise wird der Prozeß magnetfeldunterstützt gefahren, derart, daß mittels einer im Rezipienten eingebauten Spule Flußdichten von etwa 4 bis 7 mT entstehen und somit die Herstellung der erwünschten Schichten begünstigt wird. Eine Beheizung der Proben ist nicht erforderlich. Aufgrund der Prozeßwärme nehmen die Substrate während der Beschichtung eine Gleichgewichtstemperatur von bis zu 350°C an.A method has proven to be particularly advantageous in which the layer is produced in a high-frequency diode sputtering system. The high-frequency coupling takes place on the target and also on the substrate side, with negative bias voltages (bias voltages) in the range of 300-500 V being used. It is also possible to couple direct voltage (DC = direct current) on the substrate side. The desired properties of the layers to be produced are listed below Obtained using a conductive target from B 4 C. For this purpose, area-related powers of 6 W / cm 2 are applied to the target. It works with powers on the substrate electrode of 2 W / cm 2 , the electrodes with a diameter of approx. 170 mm lying opposite each other at a distance of approx. 100 mm. The substrate electrode can be covered with B 4 C or other B-containing materials. However, a steel plate or other metal can also be used. The process is expediently carried out with magnetic field support in such a way that flux densities of about 4 to 7 mT are produced by means of a coil installed in the recipient, and thus the production of the desired layers is favored. It is not necessary to heat the samples. Due to the heat of the process, the substrates reach an equilibrium temperature of up to 350 ° C during the coating.

Die kubische Bornitridschicht entsteht unter Verwendung von einem Gasgemisch aus Ar und N2, wobei der Prozeßdruck bei 20 µbar lag. Der N2-Gehalt in dem Gasgemisch lag in einem Bereich von 50 - 70 % des Gesamtflows. Mit diesem Verfahren wurde eine 0,8 µm dicke cBN-Schicht mit den typischen Eigenschaften der harten kubischen Bornitrid-Phase erhalten.The cubic boron nitride layer is created using a gas mixture of Ar and N 2 , the process pressure being 20 µbar. The N 2 content in the gas mixture was in the range of 50-70% of the total flow. With this method a 0.8 µm thick cBN layer with the typical properties of the hard cubic boron nitride phase was obtained.

2. DC-Magnetronverfahren (Gleichspannungs-Magnetronverfahren)2. DC magnetron method (direct voltage magnetron method)

Ein weiteres Herstellungsverfahren um verschleißfeste Schichten aus kubischem Bornitrid auf ein Substrat abzuscheiden, ist gemäß der Erfindung gegeben durch die Anwendung von mit einer Gleichspannung betriebenen UBM-Anlage (UBM = unbalanced Magnetron). In diesem Fall kann der Substrathalter sowohl mit einer HF-Bias, als auch mit einer DC-Bias betrieben werden. Es wurde eine kommerzielle Anlage mit einer vertikal angeordneten Magnetronkatode mit Zusatzspulen für einen unbalancierten Sputterbetrieb (UBM) verwandt. Das eingesetzte B4C Target hatte Abmessungen von 254 mm x 127 mm. Im Abstand von 80 mm bis 150 mm wurde der Substrathalter angeordnet, der aus einer Edelstahlplatte bestand. Der Substrathalter war drehbar, so daß während eines Vakuumzykluses auch Zwischenschichten aufgebracht werden konnten, in dem der Substrathalter vor eine zweite Magnetronkatode gefahren wurde, die um 90° versetzt angeordnet war.Another manufacturing process for depositing wear-resistant layers of cubic boron nitride on a substrate is provided according to the invention by the use of a UBM system (UBM = unbalanced magnetron) operated with a DC voltage. In this case, the substrate holder can be operated with an RF bias as well as with a DC bias. A commercial system with a vertically arranged magnetron cathode with additional coils was used for an unbalanced sputtering operation (UBM). The B 4 C target used had dimensions of 254 mm x 127 mm. The substrate holder, which consisted of a stainless steel plate, was arranged at a distance of 80 mm to 150 mm. The substrate holder was rotatable, so that intermediate layers could also be applied during a vacuum cycle, in which the substrate holder was moved in front of a second magnetron cathode, which was arranged offset by 90 °.

Im Vergleich zum vorhergehenden Ausführungsbeispiel mit Hochfrequenz betriebenen Elektroden werden hier wesentlich höhere Depositionsraten erzielt. Zudem können mit einer derartigen Anlage verhältnismäßig große Substrate beschichtet werden. Zweckmäßigerweise werden zusätzliche Magnetspulen und gegebenenfalls Stabmagneten derart eingebaut, daß eine maximale lonenstromverdichtung hinsichtlich des Substrates erfolgt.Compared to the previous embodiment with electrodes operated at high frequency, significantly higher deposition rates are achieved here. In addition, relatively large substrates can be coated with such a system. Advantageously, additional magnetic coils and, if necessary, bar magnets are installed in such a way that maximum ion current compression takes place with respect to the substrate.

Als Targetmaterial wurde hier B4C eingesetzt, wobei an das Target eine flächenbezogene Leistung von 5 W/cm2 angelegt wurde.B 4 C was used as the target material, an area-related power of 5 W / cm 2 being applied to the target.

Es wurden die beiden möglichen Varianten (Substrathalter auf Hochfrequenz- oder Gleichspannungs-Vorspannung) mit folgenden Parametern durchgeführt:

  • Substrathalter auf Hochfrequenz-Bias: In diesem Fall wurde an das Substrat eine Hochfrequenz-Leistung von 300 W angelegt. Hieraus resultiert eine Bias-Spannung von 200 V bis 500 V. Der Substrathalter, in welchen Hochfrequenz eingespeist wird, steht im Abstand von 80 bis 150 mm zum Target. Auch bei diesem Verfahren erfolgte eine zusätzliche Magneffeldunterstützung, indem zusätzliche Magneten derart eingebaut werden, daß eine maximale lonenstromverdichtung hinsichtlich des Substrates erfolgt. Der Prozeßdruck liegt im Bereich von 4·10-3 mbar, wobei auch hier mit einer Ar/N2 Mischung gearbeitet wird. Die N2-Gehalte liegen bei 80 % (Flow).
  • Substrathalter auf Gleichspannungs-Bias: Eine Variante des cBN Prozesses besteht darin, die DC-Magnetronanlage auch auf der Substratseite mit Gleichspannung zu betreiben. In diesem Fall besteht der Substrathalter aus Edelstahl oder anderen geeigneten Metallen. Die anderen Einstellungen bleiben gegenüber dem oben beschriebenen HF-Bias Beispiel gleich. Lediglich an den Substrathalter wird eine DC-Biasspannung von 500 V angelegt. Es zeigte sich, daß Beschichtungsdicken von bis zu 6 µm aus hochisolierenden cBN Schichten auf diese Weise herstellbar sind.
The two possible variants (substrate holder on high-frequency or DC bias) were carried out with the following parameters:
  • Substrate holder on high-frequency bias: In this case, a high-frequency power of 300 W was applied to the substrate. This results in a bias voltage of 200 V to 500 V. The substrate holder into which high frequency is fed is at a distance of 80 to 150 mm to the target. This method also provided additional magnetic field support in that additional magnets are installed in such a way that maximum ion current compression takes place with respect to the substrate. The process pressure is in the range of 4 · 10 -3 mbar, an Ar / N 2 mixture also being used here. The N 2 contents are 80% (flow).
  • Substrate holder with DC voltage bias: One variant of the cBN process is to operate the DC magnetron system with DC voltage also on the substrate side. In this case, the substrate holder is made of stainless steel or other suitable metals. The other settings remain the same compared to the RF bias example described above. A DC bias voltage of 500 V is only applied to the substrate holder. It was found that coating thicknesses of up to 6 μm can be produced from highly insulating cBN layers in this way.

Als eine Variante dieses Ausführungsbeispiels wird vor der Beschichtung eine 100 nm bis 1.000 nm dicke Zwischenschicht aus einer leitfähigen Ti B(N) und/oder B4C Schicht auf den Substrathalter und die darauf montierten Substrate aufgebracht.As a variant of this exemplary embodiment, a 100 nm to 1,000 nm thick intermediate layer composed of a conductive Ti B (N) and / or B 4 C layer is applied to the substrate holder and the substrates mounted thereon before the coating.

Eine vergleichbar leitfähige Schicht kann auch für die Herstellung von noch dickeren cBN Schichten in sehr begrenzter Dicke zwischendurch aufgebracht werden.A comparable conductive layer can also be applied in between for the production of even thicker cBN layers in a very limited thickness.

Auch bei dem Gleichspannungs-Magnetron Beispiel kann auf eine externe Beheizung der Proben verzichtet werden.External heating of the samples can also be dispensed with in the case of the DC magnetron example.

Claims (22)

  1. Method of manufacturing wear-resistant layers of cubic boron nitride or wear-resistant layers containing the same, by powdering with high frequency or with direct current in the operational mode as an unbalanced magnetron, in which the plasma is generated by means of DC arc discharges or magnetron cathodes operated by DC, characterised in that there is used as an initial target a target of electrically conductive boron carbide, and the stoichiometry of the layer is set with reactive process guidance with the supply of N2 and Ar.
  2. Method according to claim 1, characterised in that a target is used made of boron carbide in the composition range of 70 to 90atomic% boron and 10 to 30atomic% carbon.
  3. Method according to claim 2, characterised in that a target made of B4C is used.
  4. Method according to one or more of claims 1 to 3, characterised in that the carbon content of the deposited layer is reduced to values beneath 5atomic%.
  5. Method according to one or more of claims 1 to 4, characterised in that, in order to improve the adhesion of the layer of cubic boron nitride, a base is deposited by staged or continuous alteration of the process gas composition and of the process conditions on the substrate, without interrupting the vacuum.
  6. Method according to one or more of claims 1 to 5, characterised in that the substrate carrier is covered, before coating, with a layer of boron carbide/boron nitride in the layer thickness range of 0.1 to 0.5 µm.
  7. Method according to one or more of claims 1 to 6, characterised in that, in high frequency powdering, the high frequency coupling is effected on the target and on the substrate side, a negative bias in the range of 100 to 1,000 volts being used, a surface power between 3 and 17 W/cm2 being applied to the target and between 1 and 11 W/cm2 to the substrate, the substrate temperature being kept during coating in a range between 30°C and 500°C, a process gas of an Ar/N2 gas mixture with 5% to near 100% N2 is used, and the process pressure is set between 1 and 50 µbar.
  8. Method according to claim 7, characterised in that the substrate is supplied with direct current.
  9. Method according to claim 7 and 8, characterised in that a surface power of 6 W/cm2 is applied to the target, and of 2 W/cm2 to the substrate, the substrate is kept during coating at an equilibrium temperature of 350°C and a process gas mixture of Ar and N2 with 10 to 70% N2 and a process pressure of 20 µbar is used.
  10. Method according to one or more of claims 1 to 6, characterised in that, in DC magnetron powdering in the mode of operation as an unbalanced magnetron, a surface power of 2 to 13 W/cm2 is applied to the target and of 0.4 to 8 W/cm2 to the substrate, the substrate carrier is mounted to rotate, the process pressure lies in the range of 1 to 10 µbar, there is used as a process gas an Ar/N2 gas mixture with 10 to near 100% N2 in the range between 1 and 10 µbar, and there is applied to the substrate carrier either a bias voltage of 100 - 800 volts DC or from 100 to 1,000 volts of high frequency voltage.
  11. Method according to claim 10, characterised in that a surface power of 5 W/cm2 is applied to the target and of 1 W/cm2 to the substrate, a process gas flow with 50% N2 and a process pressure of 4 µbar are set.
  12. Method according to one or more of claims 1 to 11, characterised in that the process is operated with a reinforced magnetic field, a coil being incorporated in the recipient with flux densities of 4 to 7 mT.
  13. Method according to claim 12, characterised in that an additional magnetic field reinforcement is achieved if additional magnets or electromagnetic coils are incorporated so that a maximum ion flow density is achieved on the substrate.
  14. Method according to one or more of claims 1 to 13, characterised in that boron-containing gases are added to the process gas.
  15. Method according to claim 14, characterised in that diborane or trimethylborazine is added to the process gas.
  16. Method according to one or more of claims 1 to 15, characterised in that during coating temperatures of 100°C to 600°C are used.
  17. Application of the method according to one or more of claims 1 to 16 to the manufacture of wear-resistant tools.
  18. Application according to claim 17 to components subject to mechanical abrasive and/or adhesive stress, and to bearings and/or bearing components.
  19. Application according to one or more of claims 1 to 16 for manufacturing sound pick-ups coated with cubic boron nitride and components for guiding the tape of tape recorders.
  20. Application according to one or more of claims 1 to 16 for depositing cubic boron nitride for electronic applications, particularly for manufacturing electronic components with and without doping.
  21. Application according to one or more of claims 1 to 16 for manufacturing anti-corrosion layers and insulating layers.
  22. Application according to one or more of claims 1 to 16 for manufacturing optical components with a blooming layer and a protective layer against mechanical stress.
EP95911214A 1994-03-04 1995-03-03 Process for producing layers of cubic boron nitride Expired - Lifetime EP0748395B1 (en)

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DE4407274A DE4407274C1 (en) 1994-03-04 1994-03-04 Process for the production of wear-resistant coatings of cubic boron nitride, and their use
DE4407274 1994-03-04
PCT/DE1995/000315 WO1995023879A1 (en) 1994-03-04 1995-03-03 Process for producing layers of cubic boron nitride

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Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5928771A (en) * 1995-05-12 1999-07-27 Diamond Black Technologies, Inc. Disordered coating with cubic boron nitride dispersed therein
DE19535560C1 (en) * 1995-09-12 1996-10-31 Fraunhofer Ges Forschung Monitoring ion-assisted boron nitride deposition process
US5976716A (en) * 1996-04-04 1999-11-02 Kennametal Inc. Substrate with a superhard coating containing boron and nitrogen and method of making the same
US5948541A (en) * 1996-04-04 1999-09-07 Kennametal Inc. Boron and nitrogen containing coating and method for making
US5885666A (en) * 1997-05-06 1999-03-23 General Motors Corporation Conversion of hexagonal-like BN to cubic-like BN by ion implantation
US6352626B1 (en) 1999-04-19 2002-03-05 Von Zweck Heimart Sputter ion source for boron and other targets
US6593015B1 (en) * 1999-11-18 2003-07-15 Kennametal Pc Inc. Tool with a hard coating containing an aluminum-nitrogen compound and a boron-nitrogen compound and method of making the same
CH696179A5 (en) * 2000-06-08 2007-01-31 Satis Vacuum Ind Vertriebs Ag Plasma evaporation source for a vacuum coating arrangement for applying coating layers on optical substrates.
JP4677123B2 (en) * 2001-05-31 2011-04-27 株式会社アルバック Apparatus and method for forming dense hard thin film using high-density helicon plasma
US7954570B2 (en) 2004-02-19 2011-06-07 Baker Hughes Incorporated Cutting elements configured for casing component drillout and earth boring drill bits including same
DE102004028112B4 (en) 2004-06-09 2019-12-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Tool substrate with a boron-containing layer system, consisting of a boron carbide, a B-C-N and a carbon-modified cubic boron nitride layer and method for producing such a layer system and use
EP1609882A1 (en) * 2004-06-24 2005-12-28 METAPLAS IONON Oberflächenveredelungstechnik GmbH Coating device and method by cathodic sputtering
CN1721346B (en) * 2004-07-16 2011-03-23 鸿富锦精密工业(深圳)有限公司 Manufacturing method of core for molding glass
DE102004042407A1 (en) * 2004-09-02 2006-03-23 Forschungszentrum Karlsruhe Gmbh Layered composite with cubic boron nitride
US20070173925A1 (en) * 2006-01-25 2007-07-26 Cornova, Inc. Flexible expandable stent
US20080177371A1 (en) * 2006-08-28 2008-07-24 Cornova, Inc. Implantable devices and methods of forming the same
US7836978B2 (en) * 2007-06-15 2010-11-23 Baker Hughes Incorporated Cutting elements for casing component drill out and subterranean drilling, earth boring drag bits and tools including same and methods of use
US7954571B2 (en) * 2007-10-02 2011-06-07 Baker Hughes Incorporated Cutting structures for casing component drillout and earth-boring drill bits including same
JP5305683B2 (en) * 2008-02-18 2013-10-02 株式会社神戸製鋼所 Method for forming cubic boron nitride-containing coating
CZ304905B6 (en) * 2009-11-23 2015-01-14 Shm, S.R.O. Method of depositing PVD layers, using cylindrical rotating cathode and apparatus for making the same
CN102127743A (en) * 2011-02-15 2011-07-20 江苏大学 Preparation method of Ta-C-N thin-film
CZ201661A3 (en) * 2016-02-05 2017-06-07 Shm, S. R. O. A method of application of boron-based abrasion-resistant layers and an abrasion-resistant layer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4415420A (en) * 1983-02-07 1983-11-15 Applied Coatings International, Inc. Cubic boron nitride preparation
US4412899A (en) * 1983-02-07 1983-11-01 Applied Coatings International, Inc. Cubic boron nitride preparation utilizing nitrogen gas
US4683043A (en) * 1986-01-21 1987-07-28 Battelle Development Corporation Cubic boron nitride preparation
JPS63239103A (en) * 1987-03-27 1988-10-05 Ulvac Corp Cubic boron nitride coated body and production thereof
DE69119614D1 (en) * 1990-01-23 1996-06-27 Sumitomo Electric Industries Method of making a boron nitride film

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DE4407274C1 (en) 1995-03-30
KR100343654B1 (en) 2002-11-30
US5723188A (en) 1998-03-03
DE59500649D1 (en) 1997-10-16
KR970701803A (en) 1997-04-12
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JP3452578B2 (en) 2003-09-29
ATE158028T1 (en) 1997-09-15

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