EP1407222A1 - Procede de mesure par balayage d'un contour de surface - Google Patents

Procede de mesure par balayage d'un contour de surface

Info

Publication number
EP1407222A1
EP1407222A1 EP02740764A EP02740764A EP1407222A1 EP 1407222 A1 EP1407222 A1 EP 1407222A1 EP 02740764 A EP02740764 A EP 02740764A EP 02740764 A EP02740764 A EP 02740764A EP 1407222 A1 EP1407222 A1 EP 1407222A1
Authority
EP
European Patent Office
Prior art keywords
sensor
measuring point
workpiece
scanning
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP02740764A
Other languages
German (de)
English (en)
Inventor
Ralf Christoph
Michael Hammer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Werth Messtechnik GmbH
Original Assignee
Werth Messtechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Werth Messtechnik GmbH filed Critical Werth Messtechnik GmbH
Publication of EP1407222A1 publication Critical patent/EP1407222A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045Correction of measurements
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/20Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines

Definitions

  • the invention relates to a method for the scanning measurement of a surface contour of a workpiece mounted about a rotational and / or swivel axis by means of a coordinate measuring device using a sensor that can be moved along its Cartesian coordinates.
  • DE 44 31 059 C2 relates to a method and a device for measuring tools with which the tool contours of at least one tool section in various tool positions are optically and electronically detected and the geometry data determined therefrom are processed in a computer for determining and outputting dimension values , wherein a comparison between contour sections detected in different tool positions with the result of an extreme value determination under the compared geometry data takes place simultaneously over the entire contour section.
  • the present invention is based on the problem of developing a method of the type mentioned at the outset in such a way that the surface contour of a workpiece can be determined very precisely with simple measures, in particular profiles with a high height should also be precisely detected.
  • the problem is essentially solved in that the sensor and the workpiece are aligned with respect to one another in such a way that the scanning direction of the sensor in the respective measuring point extends at a constant angle ⁇ to the surface normal of the workpiece passing through the measuring point.
  • the scanning direction of the sensor runs in particular along the surface normal at the measuring point.
  • the distance between the measuring point on the surface and the sensor is always kept constant.
  • the secondary condition is met that the probing direction of the sensor always runs at a constant angle to the surface normal passing through the measuring point.
  • the impinging and reflected beam always describes a constant angle to the surface normal.
  • incident and reflected rays run along the surface normal.
  • a method for scanning measurement of a surface contour is proposed, which is characterized by the method steps:
  • teaching according to the invention can be carried out not only with contactlessly operating sensors, but also with tactile, in particular opto-tactile sensors, such as are described for example in EP 0 988 505 B1, to the disclosure of which reference is expressly made.
  • Fig. 4 is a schematic diagram of a tactile measuring sensor.
  • Fig. 2 is a coordinate measuring machine 10 with a z. B. made of granite base frame 12 with measuring table 14, on which a workpiece, not shown, is arranged, the surface of which is to be measured by scanning.
  • a portal 16 is adjustable in the Y direction along the base frame 12.
  • columns or stands 18, 20 are slidably supported on the base frame 12.
  • a crossbeam 22 extends from the columns 18, 20, along which, as shown in the drawing in the X direction, a carriage 24 is adjustable, which in turn receives a quill or column 26 which is adjustable in the Z direction.
  • a measuring sensor 28 which is preferably a distance sensor, the z. B.
  • a tactile or an opto-tactile sensor can also emanate from the sleeve 26, as described in EP 0 988 505 B1. In this regard, reference is made to the disclosure in this regard.
  • the sensor 28 is at a constant distance from the measuring workpiece or the respective measuring point of z. B. 30 - 80 mm, in particular about 50 mm and on the other hand describes the probing direction to the measuring point penetrating surface normal of the workpiece a constant angle ⁇ , which is in particular at zero degrees.
  • the scanning direction of the sensor 28 should run along the surface normal, ie perpendicular to the workpiece surface at the measuring point.
  • a laser sensor provided with reference number 1 being mentioned as an example as the sensor.
  • the laser sensor 1 itself starts from a movable slide 3 in order to be adjusted in the X direction in the exemplary embodiment, an adjustment in the XY plane of the coordinate measuring machine also being possible, of course.
  • a workpiece 4 to be measured in the form of a cam is arranged so as to be rotatable about an axis of rotation 2, it being possible to provide an axis of rotation / pivoting instead of the axis of rotation 2.
  • the secondary condition is met that the distance between the distance sensor 1 and the measuring point on the workpiece 4 is set to a constant value by regulation.
  • the additional condition must also be met that, according to the exemplary embodiment, the probing direction in the respective measuring point coincides with the surface normal of the workpiece 4 passing through the measuring point, that is to say the probing direction 5 in the exemplary embodiment describes a right angle to the surface at the measuring point. If the angle deviates from 90 °, the workpiece 4 is rotated about the axis 2 until the condition is met. In order to keep the distance to the measuring point constant, the distance sensor is adjusted accordingly in the Z direction (Fig. La, lb).
  • the sensor 1 is moved in the X direction in the exemplary embodiment by means of the slide 3 until the secondary condition of the light beam of the distance sensor incident at a right angle to the surface measuring point is no longer fulfilled (FIG. 1c, Id or . le).
  • the workpiece 4 is rotated accordingly about the axis 2, the distance sensor 1 remaining aligned on the measuring point. Due to the rotation of the workpiece 4, it may be necessary for the sensor 1 to be adjusted in the X direction, as illustrated in FIG. At the same time, regulation takes place in the Z direction.
  • the previously explained method steps are carried out until the workpiece 4 or its surfaces have been scanned to the desired extent, the workpiece 4 always rotating when the secondary condition is not met, that the scanning direction 5 runs along the surface normal at the measuring point.
  • tracking takes place in the Z direction or movement in the X direction (FIG. Le) so that the distance sensor remains aligned with the desired measuring point while the distance to it is kept constant.
  • the process sequence also results from the flow diagram according to FIG. 3.
  • start 30 the measurement sensor and the workpiece are moved into the desired position. alignment aligned with each other (method step 32) in order to then carry out measurements (method step 34).
  • method step 36 there is a Z control (method step 36), on the basis of which the distance between the measuring sensor and the surface to be measured is kept constant.
  • method step 36 it is checked whether the probing direction of the measuring sensor fulfills the specified secondary condition with regard to the surface normal passing through the measuring point. If this occurs before the entire measurement sequence (method step 36) has been reached, a new position is set in such a way that the required secondary condition with regard to the probing direction is fulfilled (method steps 38, 32).
  • method steps 38, 32 the distance between the distance sensor and the measuring point is readjusted (method step 36). If the workpiece has been scanned to the desired extent, the measurement is ended (method step 40).
  • FIG. 4 A tactile, optionally opto-tactile, sensor 42, which starts from a swivel / swivel joint 44, is guided at a constant angle ⁇ along a surface 46 of a workpiece 48 (movement in the X or Y direction) until the angle ⁇ changes.
  • the workpiece 48 is then rotated (arrow 50) until the sensor 42 again describes the angle ⁇ to the surface 52 to be measured.
  • the tactile measurement in the X or Y direction then takes place again in accordance with the method previously described in connection with the contactlessly operating measurement sensor.

Abstract

L'invention concerne un procédé pour mesurer par balayage le contour de surface d'une pièce logée sur un axe de rotation et/ou de pivotement, au moyen d'un appareil de mesure de coordonnées et d'un capteur mobile le long des coordonnées cartésiennes de l'appareil de mesure. L'invention vise à déterminer avec précision le contour de surface d'une pièce en faisant appel à des moyens simples, des profilés très marqués devant, notamment en hauteur, être également saisis avec précision. A cet effet, l'orientation mutuelle du capteur et de la pièce durant la mesure est telle que la direction de balayage du capteur, pour chaque point de mesure, forme un angle constant α avec la normale de surface de la pièce fixant le point de mesure.
EP02740764A 2001-07-16 2002-07-05 Procede de mesure par balayage d'un contour de surface Withdrawn EP1407222A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10133825 2001-07-16
DE10133825 2001-07-16
PCT/EP2002/007470 WO2003008900A1 (fr) 2001-07-16 2002-07-05 Procede de mesure par balayage d'un contour de surface

Publications (1)

Publication Number Publication Date
EP1407222A1 true EP1407222A1 (fr) 2004-04-14

Family

ID=7691482

Family Applications (1)

Application Number Title Priority Date Filing Date
EP02740764A Withdrawn EP1407222A1 (fr) 2001-07-16 2002-07-05 Procede de mesure par balayage d'un contour de surface

Country Status (2)

Country Link
EP (1) EP1407222A1 (fr)
WO (1) WO2003008900A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0605796D0 (en) * 2006-03-23 2006-05-03 Renishaw Plc Apparatus and method of measuring workpieces
DE102006019354B3 (de) 2006-04-24 2007-07-19 Rattunde & Co Gmbh Profilmessung von Rohrenden
ITBG20070005A1 (it) * 2007-01-18 2008-07-19 Costanzo Perico Gruppo per l'analisi di una superficie tridimensionale di un manufatto e macchina comprendente tale gruppo.

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3911568A1 (de) * 1989-04-08 1990-10-18 Krupp Medizintechnik Verfahren und vorrichtung zur ueberpruefung eines zahnaerztlichen abdruckes eines gebisses
JPH0482658A (ja) * 1990-07-25 1992-03-16 Fanuc Ltd 非接触ならい制御装置
US5377011A (en) * 1991-09-06 1994-12-27 Koch; Stephen K. Scanning system for three-dimensional object digitizing
US6217334B1 (en) * 1997-01-28 2001-04-17 Iris Development Corporation Dental scanning method and apparatus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO03008900A1 *

Also Published As

Publication number Publication date
WO2003008900A1 (fr) 2003-01-30
WO2003008900B1 (fr) 2003-03-27

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