EP1281091A4 - Procede et appareil permettant de detecter une tentative de violation d'acces et d'isoler un circuit de cette tentative - Google Patents

Procede et appareil permettant de detecter une tentative de violation d'acces et d'isoler un circuit de cette tentative

Info

Publication number
EP1281091A4
EP1281091A4 EP01922385A EP01922385A EP1281091A4 EP 1281091 A4 EP1281091 A4 EP 1281091A4 EP 01922385 A EP01922385 A EP 01922385A EP 01922385 A EP01922385 A EP 01922385A EP 1281091 A4 EP1281091 A4 EP 1281091A4
Authority
EP
European Patent Office
Prior art keywords
isolating
detecting
tamper condition
circuit therefrom
therefrom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP01922385A
Other languages
German (de)
English (en)
Other versions
EP1281091A1 (fr
Inventor
Trevor A Blyth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Technology Materials Inc
Original Assignee
Advanced Technology Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Technology Materials Inc filed Critical Advanced Technology Materials Inc
Publication of EP1281091A1 publication Critical patent/EP1281091A1/fr
Publication of EP1281091A4 publication Critical patent/EP1281091A4/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
EP01922385A 2000-03-17 2001-03-14 Procede et appareil permettant de detecter une tentative de violation d'acces et d'isoler un circuit de cette tentative Withdrawn EP1281091A4 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US531131 2000-03-17
US09/531,131 US6421213B1 (en) 2000-03-17 2000-03-17 Method and apparatus for detecting a tamper condition and isolating a circuit therefrom
PCT/US2001/008153 WO2001071370A1 (fr) 2000-03-17 2001-03-14 Procede et appareil permettant de detecter une tentative de violation d'acces et d'isoler un circuit de cette tentative

Publications (2)

Publication Number Publication Date
EP1281091A1 EP1281091A1 (fr) 2003-02-05
EP1281091A4 true EP1281091A4 (fr) 2005-04-13

Family

ID=24116362

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01922385A Withdrawn EP1281091A4 (fr) 2000-03-17 2001-03-14 Procede et appareil permettant de detecter une tentative de violation d'acces et d'isoler un circuit de cette tentative

Country Status (4)

Country Link
US (1) US6421213B1 (fr)
EP (1) EP1281091A4 (fr)
AU (1) AU2001249195A1 (fr)
WO (1) WO2001071370A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7015823B1 (en) 2004-10-15 2006-03-21 Systran Federal Corporation Tamper resistant circuit boards
US20060109117A1 (en) * 2004-11-22 2006-05-25 International Business Machines Corporation Apparatus and Method of Intelligent Multistage System Deactivation
US20070255966A1 (en) * 2006-05-01 2007-11-01 Vincenzo Condorelli Cryptographic circuit with voltage-based tamper detection and response circuitry
KR20120024099A (ko) * 2010-09-06 2012-03-14 삼성전자주식회사 멀티-칩 패키지 및 그의 제조 방법
US8575560B1 (en) 2012-06-21 2013-11-05 Honeywell International Inc. Integrated circuit cumulative dose radiation sensor
US9618635B2 (en) 2012-06-21 2017-04-11 Honeywell International Inc. Integrated radiation sensitive circuit
US8933412B2 (en) 2012-06-21 2015-01-13 Honeywell International Inc. Integrated comparative radiation sensitive circuit
US9246501B2 (en) 2014-04-29 2016-01-26 Honeywell International Inc. Converter for analog inputs

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0631284A1 (fr) * 1993-06-28 1994-12-28 STMicroelectronics S.r.l. Circuit de protection pour les dispositifs comprenant des mémoires non-volatiles
US5444664A (en) * 1993-07-13 1995-08-22 Hitachi, Ltd. Flash memory and a microcomputer
US5663918A (en) * 1994-10-19 1997-09-02 Intel Corporation Method and apparatus for detecting and selecting voltage supplies for flash memory
WO1998031016A1 (fr) * 1997-01-08 1998-07-16 Micron Technology, Inc. Protection de la tension de programmation dans un systeme de memoire remanente

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5185717A (en) * 1988-08-05 1993-02-09 Ryoichi Mori Tamper resistant module having logical elements arranged in multiple layers on the outer surface of a substrate to protect stored information
US5254482A (en) * 1990-04-16 1993-10-19 National Semiconductor Corporation Ferroelectric capacitor test structure for chip die
US5345225A (en) * 1992-10-30 1994-09-06 Scientific-Atlanta, Inc. Tamper detection system for load management device
DE69534757T2 (de) * 1994-09-15 2006-08-31 International Business Machines Corp. System und Verfahren zur sicheren Speicherung und Verteilung von Daten unter Verwendung digitaler Unterschriften
US5548560A (en) * 1995-04-19 1996-08-20 Alliance Semiconductor Corporation Synchronous static random access memory having asynchronous test mode
DE19806311A1 (de) * 1998-02-16 1999-08-26 Siemens Ag Vorrichtung zum Schalten induktiver Verbraucher

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0631284A1 (fr) * 1993-06-28 1994-12-28 STMicroelectronics S.r.l. Circuit de protection pour les dispositifs comprenant des mémoires non-volatiles
US5444664A (en) * 1993-07-13 1995-08-22 Hitachi, Ltd. Flash memory and a microcomputer
US5663918A (en) * 1994-10-19 1997-09-02 Intel Corporation Method and apparatus for detecting and selecting voltage supplies for flash memory
WO1998031016A1 (fr) * 1997-01-08 1998-07-16 Micron Technology, Inc. Protection de la tension de programmation dans un systeme de memoire remanente

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO0171370A1 *

Also Published As

Publication number Publication date
US6421213B1 (en) 2002-07-16
WO2001071370A1 (fr) 2001-09-27
EP1281091A1 (fr) 2003-02-05
AU2001249195A1 (en) 2001-10-03

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RIC1 Information provided on ipc code assigned before grant

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