EP1210586A4 - Detection of inclusions in glass - Google Patents

Detection of inclusions in glass

Info

Publication number
EP1210586A4
EP1210586A4 EP00958046A EP00958046A EP1210586A4 EP 1210586 A4 EP1210586 A4 EP 1210586A4 EP 00958046 A EP00958046 A EP 00958046A EP 00958046 A EP00958046 A EP 00958046A EP 1210586 A4 EP1210586 A4 EP 1210586A4
Authority
EP
European Patent Office
Prior art keywords
inclusions
glass
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP00958046A
Other languages
German (de)
French (fr)
Other versions
EP1210586A1 (en
Inventor
Geoff Edwards
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resolve Engineering Pty Ltd
Original Assignee
Resolve Engineering Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Resolve Engineering Pty Ltd filed Critical Resolve Engineering Pty Ltd
Publication of EP1210586A1 publication Critical patent/EP1210586A1/en
Publication of EP1210586A4 publication Critical patent/EP1210586A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
EP00958046A 1999-09-02 2000-09-01 Detection of inclusions in glass Withdrawn EP1210586A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AUPQ2622A AUPQ262299A0 (en) 1999-09-02 1999-09-02 Detection of inclusions in glass
AUPQ992622 1999-09-02
PCT/AU2000/001032 WO2001018532A1 (en) 1999-09-02 2000-09-01 Detection of inclusions in glass

Publications (2)

Publication Number Publication Date
EP1210586A1 EP1210586A1 (en) 2002-06-05
EP1210586A4 true EP1210586A4 (en) 2002-12-04

Family

ID=3816792

Family Applications (1)

Application Number Title Priority Date Filing Date
EP00958046A Withdrawn EP1210586A4 (en) 1999-09-02 2000-09-01 Detection of inclusions in glass

Country Status (7)

Country Link
EP (1) EP1210586A4 (en)
JP (1) JP2003508786A (en)
CN (1) CN1377462A (en)
AU (1) AUPQ262299A0 (en)
CA (1) CA2384005A1 (en)
HK (1) HK1049042A1 (en)
WO (1) WO2001018532A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
DE102004005019A1 (en) * 2004-01-30 2005-08-18 Isra Glass Vision Gmbh Method for determining the depth of a defect in a glass ribbon
WO2006029536A1 (en) * 2004-09-17 2006-03-23 De.Vice Scientific Incorporated Optical inspection of flat media using direct image technology
GB0606217D0 (en) * 2006-03-29 2006-05-10 Pilkington Plc Glazing inspection
JPWO2009031420A1 (en) * 2007-09-04 2010-12-09 旭硝子株式会社 Method and apparatus for detecting minute foreign matter inside transparent plate
DE102013002602B4 (en) 2013-02-15 2022-05-05 Hegla Boraident Gmbh & Co. Kg Method and device for detecting particles in glass
DE102013107215B3 (en) 2013-07-09 2014-10-09 Heraeus Quarzglas Gmbh & Co. Kg Method for producing a mirror substrate blank made of titanium-doped silica glass for EUV lithography, and system for determining the position of defects in a blank
WO2019171319A1 (en) * 2018-03-07 2019-09-12 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on wavelength(s) analysis
US10481097B1 (en) * 2018-10-01 2019-11-19 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on spectral reflectance analysis
CN116835863B (en) * 2023-07-14 2023-12-12 连云港双石特种玻璃有限公司 Processing equipment capable of accurately controlling thickness of special glass and application method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3814946A (en) * 1972-12-04 1974-06-04 Asahi Glass Co Ltd Method of detecting defects in transparent and semitransparent bodies
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
US4681442A (en) * 1984-05-14 1987-07-21 International Business Machines Corporation Method for surface testing
US5235400A (en) * 1988-10-12 1993-08-10 Hitachi, Ltd. Method of and apparatus for detecting defect on photomask
JPH07294422A (en) * 1994-04-27 1995-11-10 Mitsubishi Materials Corp Detecting method for surface vicinity crystal defect and device therefor

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4136961A (en) * 1977-07-01 1979-01-30 Corning Glass Works Method and apparatus for detection of inclusions in glass article or the like
US4401893A (en) * 1981-07-29 1983-08-30 Intec Corporation Method and apparatus for optically inspecting a moving web of glass
EP0189551B1 (en) * 1984-12-14 1988-10-26 Flachglas Aktiengesellschaft Method and device for inspecting transparent strip material, in particular flat glass ribbons
EP0315697B1 (en) * 1987-05-27 1993-08-04 Nippon Sheet Glass Co., Ltd. Discriminative flaw detector for light-transmissive sheet material
DE3800053A1 (en) * 1988-01-04 1989-07-13 Sick Optik Elektronik Erwin OPTICAL ERROR INSPECTION DEVICE
FR2681429B1 (en) * 1991-09-13 1995-05-24 Thomson Csf METHOD AND DEVICE FOR INSPECTING GLASS.
AT402860B (en) * 1993-06-22 1997-09-25 Oesterr Forsch Seibersdorf METHOD AND DEVICE FOR TESTING TRANSPARENT OBJECTS
NL1006378C2 (en) * 1997-06-23 1998-12-24 Tno Method and device for inspecting an object with respect to disturbances.

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3814946A (en) * 1972-12-04 1974-06-04 Asahi Glass Co Ltd Method of detecting defects in transparent and semitransparent bodies
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
US4681442A (en) * 1984-05-14 1987-07-21 International Business Machines Corporation Method for surface testing
US5235400A (en) * 1988-10-12 1993-08-10 Hitachi, Ltd. Method of and apparatus for detecting defect on photomask
JPH07294422A (en) * 1994-04-27 1995-11-10 Mitsubishi Materials Corp Detecting method for surface vicinity crystal defect and device therefor

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO0118532A1 *

Also Published As

Publication number Publication date
WO2001018532A1 (en) 2001-03-15
HK1049042A1 (en) 2003-04-25
EP1210586A1 (en) 2002-06-05
AUPQ262299A0 (en) 1999-09-23
CA2384005A1 (en) 2001-03-15
JP2003508786A (en) 2003-03-04
CN1377462A (en) 2002-10-30

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