EP1031812A3 - Measurement apparatus - Google Patents

Measurement apparatus Download PDF

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Publication number
EP1031812A3
EP1031812A3 EP99310593A EP99310593A EP1031812A3 EP 1031812 A3 EP1031812 A3 EP 1031812A3 EP 99310593 A EP99310593 A EP 99310593A EP 99310593 A EP99310593 A EP 99310593A EP 1031812 A3 EP1031812 A3 EP 1031812A3
Authority
EP
European Patent Office
Prior art keywords
image
measurement object
distortion
parameters
free
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP99310593A
Other languages
German (de)
French (fr)
Other versions
EP1031812A2 (en
Inventor
Ryuichi Hara
Taro Arimatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fanuc Corp
Original Assignee
Fanuc Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fanuc Corp filed Critical Fanuc Corp
Publication of EP1031812A2 publication Critical patent/EP1031812A2/en
Publication of EP1031812A3 publication Critical patent/EP1031812A3/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

There is provided a measurement device being capable of obtaining an image being free from a distortion even if the position of a measurement object varies in image pickup and being capable of performing a precise measurement according to the image. Camera calibration is executed by using a dot pattern or the like, and parameters of a camera model are stored (S1). The image of a reference object is fetched (S2), a corrected reference image being free from a lens distortion and a distortion caused by image pickup in a diagonal direction is formed on the basis of the equation of the camera model (S3), and parameters for detecting the measurement object are set in accordance with the image (S4). In a system operation, the image of the measurement object, the position of which varies, is acquired (S5), and the corrected reference image being free from a distortion as in S3 is formed (S6). The measurement object is detected by using the parameters for detecting the measurement object (S7, S8), necessary data for an application is formed and output (S9). In failure to perform detection, an appropriate message is output (S10, S11).
EP99310593A 1999-02-23 1999-12-24 Measurement apparatus Withdrawn EP1031812A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP11044864A JP2000241120A (en) 1999-02-23 1999-02-23 Measuring apparatus
JP4486499 1999-02-23

Publications (2)

Publication Number Publication Date
EP1031812A2 EP1031812A2 (en) 2000-08-30
EP1031812A3 true EP1031812A3 (en) 2001-05-02

Family

ID=12703373

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99310593A Withdrawn EP1031812A3 (en) 1999-02-23 1999-12-24 Measurement apparatus

Country Status (3)

Country Link
US (1) US6728417B1 (en)
EP (1) EP1031812A3 (en)
JP (1) JP2000241120A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7871812B2 (en) 2002-03-15 2011-01-18 Affymetrix, Inc. System, method, and product for scanning of biological materials
US8233735B2 (en) 1994-02-10 2012-07-31 Affymetrix, Inc. Methods and apparatus for detection of fluorescently labeled materials

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DE60009114T2 (en) * 1999-09-20 2004-08-05 Matsushita Electric Industrial Co. Ltd. DEVICE FOR SUPPORTING VEHICLE DRIVERS
CN101186010B (en) * 2001-04-20 2010-06-02 本田技研工业株式会社 Ring management system
FI113132B (en) * 2001-06-28 2004-02-27 Nokia Corp Method and apparatus for improving an image
CA2455118C (en) * 2001-08-03 2012-01-17 Nanosphere, Inc. Nanoparticle imaging system and method
US20040146917A1 (en) * 2001-08-03 2004-07-29 Nanosphere, Inc. Nanoparticle imaging system and method
JP4095491B2 (en) * 2003-05-19 2008-06-04 本田技研工業株式会社 Distance measuring device, distance measuring method, and distance measuring program
EP1524494A1 (en) * 2003-10-17 2005-04-20 inos Automationssoftware GmbH Method for calibrating a camera-laser-unit in respect to a calibration-object
US20050221351A1 (en) * 2004-04-06 2005-10-06 Affymetrix, Inc. Methods and devices for microarray image analysis
JP4529755B2 (en) * 2005-03-25 2010-08-25 セイコーエプソン株式会社 Dot diameter correction coefficient acquisition method, dot diameter measurement method, dot diameter abnormality detection method, dot diameter measurement device, dot diameter abnormality detection device, and droplet discharge device
JP4250620B2 (en) * 2005-07-29 2009-04-08 キヤノン株式会社 Information processing method and apparatus
JP4974044B2 (en) 2006-03-23 2012-07-11 ブラザー工業株式会社 Embroidery sewing machine
DE102006030670A1 (en) * 2006-07-04 2008-01-10 Carl Zeiss Sms Gmbh Mechanical object image and/or image stack evaluating and correcting method, involves correcting mapping photograph or image stack with correction specification, and outputting and evaluating corrected mapping photograph
JP4916280B2 (en) * 2006-08-17 2012-04-11 国立大学法人 宮崎大学 Automatic calibration apparatus and calibration method
CN101534698A (en) * 2006-09-27 2009-09-16 乔治亚技术研究公司 Systems and methods for the measurement of surfaces
JP2008294065A (en) * 2007-05-22 2008-12-04 Juki Corp Mounting method and mounting device for electronic component
JP5079547B2 (en) * 2008-03-03 2012-11-21 Ｔｏａ株式会社 Camera calibration apparatus and camera calibration method
US7869645B2 (en) * 2008-07-22 2011-01-11 Seiko Epson Corporation Image capture and calibratiion
JP2010135642A (en) * 2008-12-05 2010-06-17 Tokyo Electron Ltd Substrate inspection method and storage medium
US9767342B2 (en) 2009-05-22 2017-09-19 Affymetrix, Inc. Methods and devices for reading microarrays
CN103115566B (en) * 2013-01-21 2015-09-09 苏州富强科技有限公司 A kind of line laser and image detection device
US9863861B2 (en) 2013-02-28 2018-01-09 Perfect Coffee, Inc. Method and apparatus for particle size determination
US10332179B2 (en) 2014-10-23 2019-06-25 Tailored IP, LLC Methods and systems for recommending fitted clothing
CN104596431A (en) * 2015-01-26 2015-05-06 张家港兴业钢管有限公司 Inside and outside diameter measuring instrument for stainless steel pipe
US9731328B2 (en) 2015-08-03 2017-08-15 Linear Group Services, LLC Inspection and sorting machine
US11850631B2 (en) * 2015-08-31 2023-12-26 Helmerich & Payne Technologies, Llc System and method for estimating damage to a shaker table screen using computer vision
JP2019012424A (en) 2017-06-30 2019-01-24 ブラザー工業株式会社 Image processing device and computer program
CN107665481B (en) * 2017-09-21 2021-05-18 联想(北京)有限公司 Image processing method, system, processing equipment and electronic equipment
WO2020014296A1 (en) 2018-07-12 2020-01-16 Luminex Corporation Systems and methods for performing variable sample preparation and analysis processes

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08201021A (en) * 1995-01-23 1996-08-09 Mazda Motor Corp Calibration method
US5675380A (en) * 1994-12-29 1997-10-07 U.S. Philips Corporation Device for forming an image and method of correcting geometrical optical distortions in an image
US5825483A (en) * 1995-12-19 1998-10-20 Cognex Corporation Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing

Family Cites Families (3)

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Publication number Priority date Publication date Assignee Title
JPH04220511A (en) 1990-12-20 1992-08-11 Fujitsu Ltd Inspecting method for linearity in display screen
US6100925A (en) * 1996-11-27 2000-08-08 Princeton Video Image, Inc. Image insertion in video streams using a combination of physical sensors and pattern recognition
US6072496A (en) * 1998-06-08 2000-06-06 Microsoft Corporation Method and system for capturing and representing 3D geometry, color and shading of facial expressions and other animated objects

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675380A (en) * 1994-12-29 1997-10-07 U.S. Philips Corporation Device for forming an image and method of correcting geometrical optical distortions in an image
JPH08201021A (en) * 1995-01-23 1996-08-09 Mazda Motor Corp Calibration method
US5825483A (en) * 1995-12-19 1998-10-20 Cognex Corporation Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 1996, no. 12 26 December 1996 (1996-12-26) *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8233735B2 (en) 1994-02-10 2012-07-31 Affymetrix, Inc. Methods and apparatus for detection of fluorescently labeled materials
US7871812B2 (en) 2002-03-15 2011-01-18 Affymetrix, Inc. System, method, and product for scanning of biological materials

Also Published As

Publication number Publication date
US6728417B1 (en) 2004-04-27
EP1031812A2 (en) 2000-08-30
JP2000241120A (en) 2000-09-08

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