EP1031812A3 - Measurement apparatus - Google Patents
Measurement apparatus Download PDFInfo
- Publication number
- EP1031812A3 EP1031812A3 EP99310593A EP99310593A EP1031812A3 EP 1031812 A3 EP1031812 A3 EP 1031812A3 EP 99310593 A EP99310593 A EP 99310593A EP 99310593 A EP99310593 A EP 99310593A EP 1031812 A3 EP1031812 A3 EP 1031812A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- image
- measurement object
- distortion
- parameters
- free
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11044864A JP2000241120A (en) | 1999-02-23 | 1999-02-23 | Measuring apparatus |
JP4486499 | 1999-02-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1031812A2 EP1031812A2 (en) | 2000-08-30 |
EP1031812A3 true EP1031812A3 (en) | 2001-05-02 |
Family
ID=12703373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99310593A Withdrawn EP1031812A3 (en) | 1999-02-23 | 1999-12-24 | Measurement apparatus |
Country Status (3)
Country | Link |
---|---|
US (1) | US6728417B1 (en) |
EP (1) | EP1031812A3 (en) |
JP (1) | JP2000241120A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7871812B2 (en) | 2002-03-15 | 2011-01-18 | Affymetrix, Inc. | System, method, and product for scanning of biological materials |
US8233735B2 (en) | 1994-02-10 | 2012-07-31 | Affymetrix, Inc. | Methods and apparatus for detection of fluorescently labeled materials |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE60009114T2 (en) * | 1999-09-20 | 2004-08-05 | Matsushita Electric Industrial Co. Ltd. | DEVICE FOR SUPPORTING VEHICLE DRIVERS |
CN101186010B (en) * | 2001-04-20 | 2010-06-02 | 本田技研工业株式会社 | Ring management system |
FI113132B (en) * | 2001-06-28 | 2004-02-27 | Nokia Corp | Method and apparatus for improving an image |
CA2455118C (en) * | 2001-08-03 | 2012-01-17 | Nanosphere, Inc. | Nanoparticle imaging system and method |
US20040146917A1 (en) * | 2001-08-03 | 2004-07-29 | Nanosphere, Inc. | Nanoparticle imaging system and method |
JP4095491B2 (en) * | 2003-05-19 | 2008-06-04 | 本田技研工業株式会社 | Distance measuring device, distance measuring method, and distance measuring program |
EP1524494A1 (en) * | 2003-10-17 | 2005-04-20 | inos Automationssoftware GmbH | Method for calibrating a camera-laser-unit in respect to a calibration-object |
US20050221351A1 (en) * | 2004-04-06 | 2005-10-06 | Affymetrix, Inc. | Methods and devices for microarray image analysis |
JP4529755B2 (en) * | 2005-03-25 | 2010-08-25 | セイコーエプソン株式会社 | Dot diameter correction coefficient acquisition method, dot diameter measurement method, dot diameter abnormality detection method, dot diameter measurement device, dot diameter abnormality detection device, and droplet discharge device |
JP4250620B2 (en) * | 2005-07-29 | 2009-04-08 | キヤノン株式会社 | Information processing method and apparatus |
JP4974044B2 (en) | 2006-03-23 | 2012-07-11 | ブラザー工業株式会社 | Embroidery sewing machine |
DE102006030670A1 (en) * | 2006-07-04 | 2008-01-10 | Carl Zeiss Sms Gmbh | Mechanical object image and/or image stack evaluating and correcting method, involves correcting mapping photograph or image stack with correction specification, and outputting and evaluating corrected mapping photograph |
JP4916280B2 (en) * | 2006-08-17 | 2012-04-11 | 国立大学法人 宮崎大学 | Automatic calibration apparatus and calibration method |
CN101534698A (en) * | 2006-09-27 | 2009-09-16 | 乔治亚技术研究公司 | Systems and methods for the measurement of surfaces |
JP2008294065A (en) * | 2007-05-22 | 2008-12-04 | Juki Corp | Mounting method and mounting device for electronic component |
JP5079547B2 (en) * | 2008-03-03 | 2012-11-21 | Toa株式会社 | Camera calibration apparatus and camera calibration method |
US7869645B2 (en) * | 2008-07-22 | 2011-01-11 | Seiko Epson Corporation | Image capture and calibratiion |
JP2010135642A (en) * | 2008-12-05 | 2010-06-17 | Tokyo Electron Ltd | Substrate inspection method and storage medium |
US9767342B2 (en) | 2009-05-22 | 2017-09-19 | Affymetrix, Inc. | Methods and devices for reading microarrays |
CN103115566B (en) * | 2013-01-21 | 2015-09-09 | 苏州富强科技有限公司 | A kind of line laser and image detection device |
US9863861B2 (en) | 2013-02-28 | 2018-01-09 | Perfect Coffee, Inc. | Method and apparatus for particle size determination |
US10332179B2 (en) | 2014-10-23 | 2019-06-25 | Tailored IP, LLC | Methods and systems for recommending fitted clothing |
CN104596431A (en) * | 2015-01-26 | 2015-05-06 | 张家港兴业钢管有限公司 | Inside and outside diameter measuring instrument for stainless steel pipe |
US9731328B2 (en) | 2015-08-03 | 2017-08-15 | Linear Group Services, LLC | Inspection and sorting machine |
US11850631B2 (en) * | 2015-08-31 | 2023-12-26 | Helmerich & Payne Technologies, Llc | System and method for estimating damage to a shaker table screen using computer vision |
JP2019012424A (en) | 2017-06-30 | 2019-01-24 | ブラザー工業株式会社 | Image processing device and computer program |
CN107665481B (en) * | 2017-09-21 | 2021-05-18 | 联想(北京)有限公司 | Image processing method, system, processing equipment and electronic equipment |
WO2020014296A1 (en) | 2018-07-12 | 2020-01-16 | Luminex Corporation | Systems and methods for performing variable sample preparation and analysis processes |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08201021A (en) * | 1995-01-23 | 1996-08-09 | Mazda Motor Corp | Calibration method |
US5675380A (en) * | 1994-12-29 | 1997-10-07 | U.S. Philips Corporation | Device for forming an image and method of correcting geometrical optical distortions in an image |
US5825483A (en) * | 1995-12-19 | 1998-10-20 | Cognex Corporation | Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04220511A (en) | 1990-12-20 | 1992-08-11 | Fujitsu Ltd | Inspecting method for linearity in display screen |
US6100925A (en) * | 1996-11-27 | 2000-08-08 | Princeton Video Image, Inc. | Image insertion in video streams using a combination of physical sensors and pattern recognition |
US6072496A (en) * | 1998-06-08 | 2000-06-06 | Microsoft Corporation | Method and system for capturing and representing 3D geometry, color and shading of facial expressions and other animated objects |
-
1999
- 1999-02-23 JP JP11044864A patent/JP2000241120A/en active Pending
- 1999-12-23 US US09/471,116 patent/US6728417B1/en not_active Expired - Fee Related
- 1999-12-24 EP EP99310593A patent/EP1031812A3/en not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5675380A (en) * | 1994-12-29 | 1997-10-07 | U.S. Philips Corporation | Device for forming an image and method of correcting geometrical optical distortions in an image |
JPH08201021A (en) * | 1995-01-23 | 1996-08-09 | Mazda Motor Corp | Calibration method |
US5825483A (en) * | 1995-12-19 | 1998-10-20 | Cognex Corporation | Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 1996, no. 12 26 December 1996 (1996-12-26) * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8233735B2 (en) | 1994-02-10 | 2012-07-31 | Affymetrix, Inc. | Methods and apparatus for detection of fluorescently labeled materials |
US7871812B2 (en) | 2002-03-15 | 2011-01-18 | Affymetrix, Inc. | System, method, and product for scanning of biological materials |
Also Published As
Publication number | Publication date |
---|---|
US6728417B1 (en) | 2004-04-27 |
EP1031812A2 (en) | 2000-08-30 |
JP2000241120A (en) | 2000-09-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1031812A3 (en) | Measurement apparatus | |
EP1596218A3 (en) | Information processing method and system | |
EP1507407A3 (en) | Electronic image pickup apparatus with image correction function and method thereof | |
EP1596332A3 (en) | Information processing method and apparatus for finding position and orientation of targeted object | |
EP1377038A3 (en) | Digital camera and photographing direction acquisition method | |
EP1026521A3 (en) | Method and apparatus for detecting an object | |
EP1184809A3 (en) | Object detecting method and object detecting apparatus and intruding object monitoring apparatus employing the object detecting method | |
EP0984393A3 (en) | Radiation image processing apparatus | |
WO2007121040B1 (en) | Method and system for improving image region of interest contrast for object recognition | |
EP1255410A3 (en) | System and method for capturing color images that extends the dynamic range of an image sensor | |
JP2000207563A5 (en) | ||
EP1134718A3 (en) | Image pickup system and vehicle-mounted-type sensor system | |
EP1048987A3 (en) | Image processing device and image input device equipped with a data synthesizing unit | |
TW429330B (en) | Method, article and system for detecting defective pixels within an image sensor | |
EP0588549A3 (en) | Position detecting methods | |
EP1814082A3 (en) | Face importance level determining apparatus and method, and image pickup apparatus | |
DK1175592T3 (en) | Position detection device with aids to determine the direction of gravity vector | |
EP1137270A3 (en) | Image-sensing apparatus for correcting blur of sensed image | |
EP1845709A3 (en) | Image capturing apparatus, control method therefor, image processing apparatus, image processing method, and program | |
WO2003067183A3 (en) | Wireless substrate-like sensor | |
EP1463338A3 (en) | System, method and software for processing a projected image | |
EP1574300A3 (en) | Measuring system | |
EP1713259A3 (en) | Photographing system | |
EP0908846A3 (en) | Moving object detection apparatus and method | |
EP1090716A3 (en) | Target-lens-shape measuring device, and eyeglass-lens processing apparatus having the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): DE |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
RIC1 | Information provided on ipc code assigned before grant |
Free format text: 7G 01B 11/02 A, 7G 01B 11/00 B, 7G 01N 21/88 B, 7G 01N 21/93 B, 7G 06T 3/00 B, 7G 06T 5/00 B, 7G 06T 7/00 B |
|
17P | Request for examination filed |
Effective date: 20011029 |
|
AKX | Designation fees paid |
Free format text: DE |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
18W | Application withdrawn |
Effective date: 20070208 |