EP0966694B1 - Process and device for determining bi-directional reflectance distribution - Google Patents
Process and device for determining bi-directional reflectance distribution Download PDFInfo
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- EP0966694B1 EP0966694B1 EP98910611A EP98910611A EP0966694B1 EP 0966694 B1 EP0966694 B1 EP 0966694B1 EP 98910611 A EP98910611 A EP 98910611A EP 98910611 A EP98910611 A EP 98910611A EP 0966694 B1 EP0966694 B1 EP 0966694B1
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- the invention relates to a device and a method for determining the bidirectional reflectance distribution.
- BRDF bidirectional reflectance distribution function
- the bidirectional reflectance distribution function depends on the wavelength of the examined light and the radiance of the incident unreflected Radiation. These in turn depend on the azimuth and zenith angles the position of the sun or the observation azimuth and the observation time angle.
- the expression bidirectional therefore indicates that the function not only from the zenith and azimuth of the observation point, but also from Zenith and azimuth of the light source (sun) is dependent.
- spectrophotometer is such. B. from the Brochure "SP1A” from Dr. Schulz & Partner, by means of which the Global radiation is measured.
- the spectrophotometer is attached to one Rotary device attached to the pivoting of the spectrophotometer two axes allowed in all directions.
- To from the measured radiance To determine the reflectance factor is usually the radiance above one Reference surface ("white disk") determined. This is preferably a spectral plate with a well-defined reflectivity that is independent on the direction of the incoming and outgoing radiation. Disadvantageous the known device is its lack of resolution.
- MAGNER THOMAS J "Moderate-resolution imaging spectrometer-tilt baseline concept "1991, EARTH AND ATMOSPHERIC REMOTE SENSING; ORLANDO, FL, USA APR 2-4 1991, PROC SPIE INT SOC OPT ENG; PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 1991 PUBL BY INT SOC FOR OPTICAL ENGINEERING, BELLINGHAM, WA, USA, PAGE (S) 272-285; and KOVALICK W M ET AL: "Data processing and calibration of the Advanced Solid-State Array Spectroradiometer ", IGARSS'94.
- KARNER KONRAD F ET AL 'Image based measurrment system for anisotropic reflection "August 26, 1996, PROCEEDINGS OF THE 1996 17TH ANNUAL CONFERENCE AND EXHIBITION OF THE EUROPEAN ASSOCIATION FOR COMPUTER GRAPHICS, EUROGRAPHICS'96; POI TIERS, FR AUG 26-30 1996, COMPUT GRAPHICS FORUM; COMPUTER GRAPHICS FORUM; GRAPHICS-VIRTUAL REALITY-GRAPHICS HIGHWAYS SEP 1996 BLACKWELL SCIENTIFIC PUBLISHERS, OXFORD, ENGL; PAGE (S) 119-128; a BRDF soil survey with a CCD camera known. A single picture is taken with the one under a fixed one Angle of the CCD camera aligned to the surface to be measured. The one with this The achievable accuracies of the BRDF measurement are low and for many use cases are not sufficient.
- the invention is therefore based on the technical problem of a device and a method for determining the bidirectional reflectance distribution create, with an improved resolution of the bidirectional reflectance distribution function is achievable.
- the optical detector device as a CCD line camera can each simultaneously, according to the Opening angle of the camera, a segment of the surface to be scanned measured and a horizontal adjustment of the detector device for It is not necessary to record individual measuring points. This allows the measurement surface faster by a factor of 2000, so that the errors are due to a change in the position of the sun is negligible.
- the length of time for a series of measurements including polarization measurement is approx. 65 seconds with a resolution of up to 0.5 °.
- Such wide-angle CCD line cameras have long been known from aerospace technology.
- Measurement errors caused can include at least one further reference measurement be performed at certain points on the surface be measured in a different CCD line position. Because the polarization the CCD line camera is known can by means of the two Measurement data of the measurement errors can be deducted.
- the device for determining the bidirectional reflectance distribution comprises a CCD line camera 1 and a rotating device 2 on which the CCD line camera 1 is mounted.
- the CCD line camera 1 By means of the rotating device 2 is the CCD line camera 1 both about a vertical axis 3 and about a horizontal axis 4 swiveling.
- Known CCD line cameras usually have three CCD lines with a line width of 5184 pixels. These lines are for the purpose the stereo image processing arranged so that the middle line is vertical look down and the two others look 25 ° forwards and backwards, where only to determine the bidirectional reflectance distribution middle CCD line is used.
- a slit-shaped diffuse protection is arranged in the camera optics.
- the CCD line camera 1 is aligned so that one end of the middle CCD line looks perpendicular to surface 5 and thereby an imaginary Circle center 6 of the surface 5 defined. The opposite The end of the CCD line is thus directed to a point 7 off-nadir.
- the opening angle of 80 ° is the optical axis of the CCD line camera 1 to the surface 5 at an angle of 40 °.
- the segment shown in dashed lines is included.
- the CCD line camera 1 by a certain angle vertical axis 3 rotated and another segment added. This The process is repeated until the CCD line camera 1 is rotated through 360 ° was and thus measured a circle 8 of the surface 5.
- the Gradual vertical rotation can be done either manually or automatically by means of a suitable programmable control.
- the detected radiation density has to be determined with a reference quantity corresponding to the incident radiation be compared.
- the CCD line camera 1 according to FIG horizontal axis 4 rotated by 180 ° and the incident radiation density again recorded in segments. This means that for each point on the surface 5 both the incident as well as the reflected radiation density are known, so that from it the resulting bidirectional reflectance distribution function of the surface 5 can be derived.
- the CCD line camera 1 or the camera optics Due to the large opening angle and the optical components the CCD line camera 1 or the camera optics have a certain intrinsic polarization on.
- the intrinsic polarization of the camera optics is in the area of optical Axis almost zero and increases towards both ends of the CCD line.
- Both Previously known CCD line cameras 1 can use the self-polarization Margins up to 20%.
- the polarization of the incident, from the earth's surface Depending on the background, reflected light can be up to 30% red Light and up to 60% in blue light.
- the decreasing Wavelength increasing measurement errors due to the polarization up to be 6% or 12%.
- To determine and suppress these measurement errors due to the intrinsic polarization of the CCD line cameras 1, according to FIG another reference measurement can be made. For this, e.g.
- the CCD line camera 1 aligned such that the optical axis of the CCD line camera 1 is directed to the off-nadir point 7 of the first measurement, ie the points where the largest self-polarization of the CCD line camera 1 in the previous measurement occurred. Since in the area of the optical axis Eigenpolarisation is zero, the measurement error is due to polarization for the off-nadir point 7 in the reference measurement zero. By means of a comparison between The two measured values can thus be based on the degree of polarization of the Surface 5 reflected radiation can be inferred. Because the polarization and their distribution over the CCD line a fixed, determinable Device size, the measurement error can be due to the polarization for everyone Points of a segment and thus the entire surface 5 are eliminated become.
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Description
Die Erfindung betrifft eine Vorrichtung und ein Verfahren zur Bestimmung der bidirektionalen Reflektanzverteilung.The invention relates to a device and a method for determining the bidirectional reflectance distribution.
Mittels der bidirektionalen Reflektanzverteilungsfunktion (BRDF) können z.B. Rückschlüsse auf den Gesundheitszustand von Waldgebieten und anderen Bodenflächen gezogen oder andere klimarelevante Aerosolparameter abgeleitet werden.By means of the bidirectional reflectance distribution function (BRDF) e.g. Conclusions about the health status of forest areas and others Floor areas pulled or other climate-relevant aerosol parameters derived become.
Die bidirektionale Reflektanzverteilungsfunktion ist abhängig von der Wellenlänge des untersuchten Lichts und der Strahldichten der einfallenden unreflektierten Strahlung. Diese wiederum sind abhängig von Azimut-und Zenitwinkel des Sonnenstandes bzw. dem Beobachtungsazimut- und dem Beobachtungszenitwinkel. Der Ausdruck bidirektional weist also darauf hin, daß die Funktion nicht nur von Zenit und Azimut des Beobachtungspunktes, sondern auch von Zenit und Azimut der Lichtquelle (Sonne) abhängig ist.The bidirectional reflectance distribution function depends on the wavelength of the examined light and the radiance of the incident unreflected Radiation. These in turn depend on the azimuth and zenith angles the position of the sun or the observation azimuth and the observation time angle. The expression bidirectional therefore indicates that the function not only from the zenith and azimuth of the observation point, but also from Zenith and azimuth of the light source (sun) is dependent.
Zur Bestimmung der bidirektionalen Reflektanzverteilungsfunktion werden Daten von Satelliten (Z.B. NOAA 6/7) genutzt oder Messungen mit Spektro- bzw. Radiometern vorgenommen. Ein solches Spektralphotometer ist z. B. aus dem Prospekt "SP1A" der Firma Dr. Schulz & Partner bekannt, mittels dessen die Globalstrahlung gemessen wird. Dabei wird das Spektralphotometer an einer Drehvorrichtung befestigt, die das Schwenken des Spektralphotometers um zwei Achsen in alle Richtungen erlaubt. Um aus der gemessenen Strahldichte den Reflektanzfaktor zu ermitteln, wird meistens die Strahldichte über einer Referenzfläche ("Weißscheibe") bestimmt. Dies ist vorzugsweise eine Spektralonplatte mit einem genau definierten Reflexionsvermögen, daß unabhängig von der Richtung der ein- und ausfallenden Strahlung sein soll. Nachteilig an der bekannten Vorrichtung ist deren mangelnde Auflösung. Bei Messung in einer Filterstellung und Schrittweiten von 1° in Azimut- und Zenitrichtung benötigt die Vorrichtung 18 Stunden Zeit für eine Messung, da alle zwei Sekunden gefahren und gemessen werden kann. Bei einer Schrittweite von 5° in Azimut-und Zenitrichtung kann alle drei Sekunden eine Messung durchgeführt werden. Damit dauert die Meßreihe eine Stunde und fünf Minuten. Da die bidirektionale Reflektanzverteilungsfunktion vom Azimut- und Zenitwinkel des Sonnenstandes abhängig ist, muß die Vermessung sehr zügig durchgeführt werden, um einen nahezu konstanten Sonnenstand sicherzustellen. Um dies bei der Vermessung des gesamten Halbraumes zu gewährleisten, muß bei dem bekannten Verfahren entweder der Öffnungswinkel (Field of View) und/oder die Schrittweite für die Azimut- und Zenitwinkel relativ groß gewählt werden. In der Regel benutzt man einen Öffnungswinkel und eine Schrittweite von 5° bis 15° und mißt dann in entsprechend vielen Einstellungen, die teilweise manuell vorgenommen werden, den gesamten unteren Halbraum. Im Ergebnis liegt eine bidirektionale Reflektanzverteilungsfunktion mit einer Auflösung von 5° bis zu 15° Winkelschrittweite vor. Ein weiterer Nachteil der bekannten Vorrichtung ist die mangelnde Genauigkeit der ermittelten Referenz, da die Konstanz des Reflexionsvermögens nicht vollständig gewährleistet ist, sowohl an den verschiedenen Punkten der Spektralonplatte als auch bezogen auf die Abhängigkeit von der Blickrichtung.Data is used to determine the bidirectional reflectance distribution function used by satellites (e.g. NOAA 6/7) or measurements with spectro or Radiometers made. Such a spectrophotometer is such. B. from the Brochure "SP1A" from Dr. Schulz & Partner, by means of which the Global radiation is measured. The spectrophotometer is attached to one Rotary device attached to the pivoting of the spectrophotometer two axes allowed in all directions. To from the measured radiance To determine the reflectance factor is usually the radiance above one Reference surface ("white disk") determined. This is preferably a spectral plate with a well-defined reflectivity that is independent on the direction of the incoming and outgoing radiation. Disadvantageous the known device is its lack of resolution. When measuring in a filter position and increments of 1 ° in the azimuth and zenith direction are required the device 18 hours for a measurement since every two seconds can be driven and measured. With a step size of 5 ° in azimuth and The zenith direction can be measured every three seconds. The series of measurements thus takes one hour and five minutes. Because the bidirectional Reflectance distribution function from the azimuth and zenith angle of the position of the sun is dependent, the measurement must be carried out very quickly in order to ensure an almost constant position of the sun. To do this when measuring To ensure the entire half-space must be in the known Process either the field of view and / or the The step size for the azimuth and zenith angles can be chosen to be relatively large. In the Usually you use an opening angle and a step size of 5 ° to 15 ° and then measures in correspondingly many settings, some of which are made manually the entire lower half space. The result is one bidirectional reflectance distribution function with a resolution of 5 ° up to 15 ° angle step forward. Another disadvantage of the known device is the lack of accuracy of the determined reference, since the constancy of the Reflectivity is not fully guaranteed, both at the different Points of the spectral plate as well as related to the dependency from the line of sight.
Aus den beiden Fachartikeln MAGNER THOMAS J: "Moderate-resolution imaging spectrometer-tilt baseline concept" 1991 , EARTH AND ATMOSPHERIC REMOTE SENSING; ORLANDO, FL , USA APR 2-4 1991, PROC SPIE INT SOC OPT ENG; PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 1991 PUBL BY INT SOC FOR OPTICAL ENGINEERING, BELLINGHAM, WA, USA, PAGE(S) 272 - 285; und KOVALICK W M ET AL: "Data processing and calibration of the Advanced Solid-State Array Spectroradiometer", IGARSS'94. INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM, SURFACE AND ATMOSPHERIC REMOTE SENSING: TECHNOLOGIES, DATA ANALYSIS AND INTERPRETATION (CAT. NO.94CH3378-7), PROCEEDINGS OF IGARSS'94 - 1994 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE , ISBN 0-7803-1497-2,1994, NEW YORK, NY, USA, IEEE, USA, PAGE(S) 1652 -1654 VOL.3. sind jeweils BRDF-Messungen mittels CCD-Kameras von einem Satelliten bzw. Flugzeug aus bekannt.From the two specialist articles MAGNER THOMAS J: "Moderate-resolution imaging spectrometer-tilt baseline concept "1991, EARTH AND ATMOSPHERIC REMOTE SENSING; ORLANDO, FL, USA APR 2-4 1991, PROC SPIE INT SOC OPT ENG; PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 1991 PUBL BY INT SOC FOR OPTICAL ENGINEERING, BELLINGHAM, WA, USA, PAGE (S) 272-285; and KOVALICK W M ET AL: "Data processing and calibration of the Advanced Solid-State Array Spectroradiometer ", IGARSS'94. INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM, SURFACE AND ATMOSPHERIC REMOTE SENSING: TECHNOLOGIES, DATA ANALYSIS AND INTERPRETATION (CAT.NO.94CH3378-7), PROCEEDINGS OF IGARSS'94 - 1994 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE, ISBN 0-7803-1497-2,1994, NEW YORK, NY, USA, IEEE, USA, PAGE (S) 1652 -1654 VOL.3. are each BRDF measurements using CCD cameras from a satellite or airplane known.
Aus dem Fachartikel KARNER KONRAD F ET AL: 'Image based measurrment system for anisotropic reflection" 26. August 1996, PROCEEDINGS OF THE 1996 17TH ANNUAL CONFERENCE AND EXHIBITION OF THE EUROPEAN ASSOCIATION FOR COMPUTER GRAPHICS, EUROGRAPHICS'96; POI-TIERS, FR AUG 26-30 1996, COMPUT GRAPHICS FORUM; COMPUTER GRAPHICS FORUM; GRAPHICS-VIRTUAL REALITY-GRAPHICS HIGHWAYS SEP 1996 BLACKWELL SCIENTIFIC PUBLISHERS, OXFORD, ENGL; PAGE(S) 119-128; eine BRDF-Bodenvermessung mit einer CCD-Kamera bekannt. Dabei erfolgt eine einzige Aufnahme mit der unter einem festen Winkel zur zu messenden Fläche ausgerichtete CCD-Kamera. Die mit diesem Verfahren erreichbaren Genauigkeiten der BRDF-Messung sind gering und für viele Anwendungsfälle nicht ausreichend.From the technical article KARNER KONRAD F ET AL: 'Image based measurrment system for anisotropic reflection "August 26, 1996, PROCEEDINGS OF THE 1996 17TH ANNUAL CONFERENCE AND EXHIBITION OF THE EUROPEAN ASSOCIATION FOR COMPUTER GRAPHICS, EUROGRAPHICS'96; POI TIERS, FR AUG 26-30 1996, COMPUT GRAPHICS FORUM; COMPUTER GRAPHICS FORUM; GRAPHICS-VIRTUAL REALITY-GRAPHICS HIGHWAYS SEP 1996 BLACKWELL SCIENTIFIC PUBLISHERS, OXFORD, ENGL; PAGE (S) 119-128; a BRDF soil survey with a CCD camera known. A single picture is taken with the one under a fixed one Angle of the CCD camera aligned to the surface to be measured. The one with this The achievable accuracies of the BRDF measurement are low and for many use cases are not sufficient.
Aus dem Fachartikel KARNER K F: "Using images to estimnate reflectance function, WSCG 96. FOURTH INTERNATIONAL CONFERENCE IN CENTRAL EUROPE ON COMPUTER GRAPHICS AND VISUALIZATION 96, IN CO-OPERATION WITH IFIP WORKING GROUP 5.10 ON COMPUTER GRAPHICS AND VIRTUAL WORLDS. CONFERENCE PROCEEDINGS, PROCEEDINGS OF WSCG 96: FOURTH INTERNA, ISBN 80-7082-238-4,1996, PLZEN, CZECH REPUBLIC, UNIV. WEST BOHEMIA, CZECH REPUBLIC, PAGE(S) 133 - 140 VOL. 1 ist eine BRDF-Bodenmessung mit einer CCD-Kamera bekannt, wobei die Messung unter verschiedenen Winkeln der Bestrahlungsquelle durchgeführt wird. Dabei wird wieder mittels einer einzigen Aufnahme der CCD-Kamera der Halbraum aufgenommen, so daß es sich bei dem CCD-Sensor um eine CCD-Matrix handelt, was die erreichbare Auflösung für die BRDF beschränkt.From the article KARNER K F: "Using images to estimnate reflectance function, WSCG 96th FOURTH INTERNATIONAL CONFERENCE IN CENTRAL EUROPE ON COMPUTER GRAPHICS AND VISUALIZATION 96, IN CO-OPERATION WITH IFIP WORKING GROUP 5.10 ON COMPUTER GRAPHICS AND VIRTUAL WORLDS. CONFERENCE PROCEEDINGS, PROCEEDINGS OF WSCG 96: FOURTH INTERNA, ISBN 80-7082-238-4,1996, ZIP codes, CZECH REPUBLIC, UNIV. WEST BOHEMIA, CZECH REPUBLIC, PAGE (S) 133 - 140 VOL. 1 is a BRDF soil measurement with a CCD camera known, the measurement at different angles of the radiation source is carried out. This is done again using a single shot the CCD camera recorded the half space, so that it CCD sensor is a CCD matrix, which is the achievable resolution for the BRDF restricted.
Der Erfindung liegt daher das technische Problem zugrunde, eine Vorrichtung und ein Verfahren zur Bestimmung der bidirektionalen Reflektanzverteilung zu schaffen, mit der eine verbesserte Auflösung der bidirektionalen Reflektanzverteilungsfunktion erreichbar ist.The invention is therefore based on the technical problem of a device and a method for determining the bidirectional reflectance distribution create, with an improved resolution of the bidirectional reflectance distribution function is achievable.
Die Lösung des technischen Problems ergibt sich durch die Merkmale der Patentansprüche 1 und 4. Durch die Ausgestaltung der optischen Detektoreinrichtung als CCD-Zeilen-Kamera kann jeweils simultan, entsprechend dem Öffnungswinkel der Kamera, ein Segment der abzutastenden Oberfläche ausgemessen werden und eine horizontale Verstellung der Detektoreinrichtung zur Erfassung einzelner Meßpunkte ist entbehrlich. Dadurch kann die Ausmessung der Oberfläche um den Faktor 2000 schneller erfolgen, so daß die Fehler aufgrund einer Sonnenstandsänderung vernachlässigbar sind. Die Zeitdauer für eine Meßreihe einschließlich Polarisationsmessung beträgt ca. 65 Sekunden bei einer Auflösung von bis zu 0,5°. Solche weitwinkligen CCD-Zeilen-Kameras sind seit langem aus der Luft- und Raumfahrttechnik bekannt. Eine beispielhafte Beschreibung einer derartigen Kamera ist dem Fachartikel "Weitwinkel-Stereokamera WAOSS-Konzept und Arbeitsweise, Sandau et al.; bild & ton, 9/10, 1992, S. 224 ff. entnehmbar, auf den hier bezüglich der Ausbildung der Kamera ausdrücklich Bezug genommen wird. Das Verfahren geht davon aus, daß nach Neigung der CCD-Kamera um 90° - 0,5 IFOV die Pixel der CCD-Zeilen als Zenitwinkel interpretiert werden können, die Messung bei unterschiedlichen Azimutwinkeln aber durch Rotation der geneigten Kamera um eine vertikale Achse realisiert werden kann, so daß eine parallaktische Montierung von Azimut- und Zenitdistanz wie beim Stand der Technik entbehrlich ist. Darüber hinaus entfällt das Erfordernis einer Weißscheibe, die im Stand der Technik aufgrund der nicht exakt lambertschen Eigenschaften eine weitere Fehlerquelle darstellt. Weitere vorteilhafte Ausgestaltungen der Erfindung ergeben sich aus den Unteransprüchen.The solution to the technical problem results from the features of the claims 1 and 4. By the design of the optical detector device as a CCD line camera can each simultaneously, according to the Opening angle of the camera, a segment of the surface to be scanned measured and a horizontal adjustment of the detector device for It is not necessary to record individual measuring points. This allows the measurement surface faster by a factor of 2000, so that the errors are due to a change in the position of the sun is negligible. The length of time for a series of measurements including polarization measurement is approx. 65 seconds with a resolution of up to 0.5 °. Such wide-angle CCD line cameras have long been known from aerospace technology. An exemplary Description of such a camera is the technical article "wide-angle stereo camera WAOSS concept and mode of operation, Sandau et al .; picture & sound, 9/10, 1992, pp. 224 ff. Can be seen on the here regarding the training of the camera explicit reference is made. The procedure assumes that after Tilt of the CCD camera by 90 ° - 0.5 IFOV the pixels of the CCD lines as the zenith angle can be interpreted, the measurement at different azimuth angles but by rotating the tilted camera around a vertical axis can be realized so that a parallactic mounting of azimuth and Zenith distance as is unnecessary in the prior art. In addition, it does not apply the requirement of a white disk, which is due to the state of the art not exactly Lambertian properties is another source of error. Further advantageous embodiments of the invention result from the subclaims.
Zur Erfassung und Unterdrückung der durch die Eigenpolarisation der CCD-Zeilen-Kamera verursachten Meßfehler kann mindestens eine weitere Referenzmessung durchgeführt werden, bei der bestimmte Punkte der Oberfläche in einer unterschiedlichen CCD-Zeilen-Position vermessen werden. Da die Eigenpolarisation der CCD-Zeilen-Kamera bekannt ist, kann mittels der beiden Meßdaten der Meßfehler herausgerechnet werden.For the detection and suppression of the self-polarization of the CCD line camera Measurement errors caused can include at least one further reference measurement be performed at certain points on the surface be measured in a different CCD line position. Because the polarization the CCD line camera is known can by means of the two Measurement data of the measurement errors can be deducted.
Durch die schnelle Erfassung aller Meßpunkte kann zur Bestimmung der Referenz auf eine Spektralonplatte verzichtet werden und die Referenz direkt durch Schwenkung der Drehvorrichtung um 180° um die horizontale Achse und Wiederholung der Messung in Himmelsrichtung ermittelt werden.By quickly acquiring all measuring points, you can determine the reference without a spectral plate and the reference directly through Rotation of the rotating device by 180 ° around the horizontal axis and repetition the measurement in the cardinal direction.
Die Erfindung wird nachfolgend anhand eines bevorzugten Ausführungsbeispieles näher erläutert. Die Fig. zeigen:
- Fig. 1
- eine perspektivische Darstellung der Vorrichtung bei Erfassung der Meßdaten,
- Fig. 2
- eine perspektivische Darstellung der Vorrichtung bei Erfassung der Referenz und
- Fig 3
- eine perspektivische Darstellung der Vorrichtung bei Erfassung einer weiteren Referenz zur Kompensation der Meßfehler aufgrund der Eigenpolarisation der CCD-Zeilen-Kamera.
- Fig. 1
- 1 shows a perspective view of the device when the measurement data are recorded,
- Fig. 2
- a perspective view of the device upon detection of the reference and
- Fig. 3
- a perspective view of the device upon detection of a further reference to compensate for the measurement errors due to the self-polarization of the CCD line camera.
Die Vorrichtung zur Bestimmung der bidirektionalen Reflektanzverteilung umfaßt
eine CCD-Zeilen-Kamera 1 und eine Drehvorrichtung 2, auf der die CCD-Zeilen-Kamera
1 montiert ist. Mittels der Drehvorrichtung 2 ist die CCD-Zeilen-Kamera
1 sowohl um eine vertikale Achse 3 als auch um eine horizontale Achse
4 schwenkbar. Bekannte CCD-Zeilen-Kameras weisen meist drei CCD-Zeilen
auf, wobei die Zeilenbreite 5184 Pixel umfaßt. Diese Zeilen sind zum Zwekke
der Stereo-Bildverarbeitung derart angeordnet, daß die mittlere Zeile senkrecht
nach unten und diezwei anderen jeweils 25° nach vorn bzw. hinten schauen,
wobei zur Bestimmung der bidirektionalen Reflektanzverteilung nur die
mittlere CCD-Zeile verwendet wird. Zur Unterdrückung von Streulicht kann vor
der Kameraoptik ein schlitzförmiger Streulichtschutz angeordnet werden. Zur
Erfassung der jeweiligen Strahlungsdichte einer zu untersuchenden Oberfläche
5 wird die CCD-Zeilen-Kamera 1 derart ausgerichtet, daß ein Ende der mittleren
CCD-Zeile senkrecht auf die Oberfläche 5 blickt und dadurch einen imaginären
Kreismittelpunkt 6 der Oberfläche 5 definiert. Das entgegengesetzte
Ende der CCD-Zeile ist somit auf einen Punkt 7 off-nadir gerichtet. Bei einem
Öffnungswinkel von 80° steht somit die optische Achse der CCD-Zeilen-Kamera
1 zur Oberfläche 5 in einem Winkel von 40°. Mittels einer simultanen Aufnahme
wird dabei das gestrichelt dargestellte Segment aufgenommen. Anschließend
wird die CCD-Zeilen-Kamera 1 um einen bestimmten Winkel um die
vertikale Achse 3 gedreht und ein weiteres Segment aufgenommen. Dieser
Vorgang wiederholt sich solange, bis die CCD-Zeilen-Kamera 1 um 360° gedreht
wurde und somit einen Kreis 8 der Oberfläche 5 vermessen hat. Die
schrittweise vertikale Drehung kann dabei entweder manuell oder automatisch
mittels einer geeigneten programmierbaren Steuerung erfolgen.The device for determining the bidirectional reflectance distribution comprises
a CCD line camera 1 and a
Zur Bestimmung der bidirektionalen Reflektanz muß die erfaßte Strahlungsdichte
mit einer der einfallenden Strahlung entsprechenden Referenzgröße
verglichen werden. Dazu wird gemäß Fig. 2 die CCD-Zeilen-Kamera 1 um die
horizontale Achse 4 um 180° gedreht und die einfallende Strahlungsdichte wieder
segmentweise erfaßt. Dadurch ist für jeden Punkt der Oberfläche 5 sowohl
die einfallende als auch die reflektierte Strahlungsdichte bekannt, so daß daraus
die resultierende bidirektionale Reflektanzverteilungsfunktion der Oberfläche
5 ableitbar ist.To determine the bidirectional reflectance, the detected radiation density has to be determined
with a reference quantity corresponding to the incident radiation
be compared. For this purpose, the CCD line camera 1 according to FIG
horizontal axis 4 rotated by 180 ° and the incident radiation density again
recorded in segments. This means that for each point on the
Aufgrund des großen Öffnungswinkels und der optischen Bauelemente weist
die CCD-Zeilen-Kamera 1 bzw. die Kameraoptik eine gewisse Eigenpolarisation
auf. Die Eigenpolarisation der Kameraoptik ist im Bereich der optischen
Achse nahezu null und nimmt zu beiden Enden der CCD-Zeile hin zu. Bei den
bisher bekannten CCD-Zeilen-Kameras 1 kann die Eigenpolarisation an den
Rändern bis zu 20 % betragen. Die Polarisation des einfallenden, von der Erdoberfläche
reflektierten Lichtes kann je nach Untergrund bis zu 30% bei rotem
Licht und bis zu 60% bei blauem Licht betragen. Somit kann der mit abnehmender
Wellenlänge größer werdende Meßfehler allein durch die Polarisation bis
zu 6% bzw. 12%betragen. Zur Ermittlung und Unterdrückung dieser Meßfehler
aufgrund der Eigenpolarisation der CCD-Zeilen-Kameras 1 kann gemäß Fig.3
eine weitere Referenzmessung vorgenommen werden. Dazu wird z.B. die
CCD-Zeilen-Kamera 1 derart ausgerichtet, daß die optische Achse der CCD-Zeilen-Kamera
1 auf den off-nadir Punkt 7 der ersten Messung gerichtet ist,
also den Punkte, wo die größte Eigenpolarisation der CCD-Zeilen-Kamera 1 in
der vorangegangenen Messung auftrat. Da im Bereich der optischen Achse die
Eigenpolarisation null ist, ist der Meßfehler aufgrund von Polarisation für den
off-nadir Punkt 7 bei der Referenzmessung null. Mittels eines Vergleichs zwischen
den beiden Meßwerten kann somit auf den Polarisationsgrad der von der
Oberfläche 5 reflektierten Strahlung zurückgeschlossen werden. Da die Eigenpolarisation
und deren Verteilung über die CCD-Zeile eine feste, bestimmbare
Gerätegröße ist, kann somit der Meßfehler aufgrund der Polarisation für alle
Punkte eines Segmentes und somit der gesamten Oberfläche 5 herausgerechnet
werden.Due to the large opening angle and the optical components
the CCD line camera 1 or the camera optics have a certain intrinsic polarization
on. The intrinsic polarization of the camera optics is in the area of optical
Axis almost zero and increases towards both ends of the CCD line. Both
Previously known CCD line cameras 1 can use the self-polarization
Margins up to 20%. The polarization of the incident, from the earth's surface
Depending on the background, reflected light can be up to 30% red
Light and up to 60% in blue light. Thus, the decreasing
Wavelength increasing measurement errors due to the polarization up to
to be 6% or 12%. To determine and suppress these measurement errors
due to the intrinsic polarization of the CCD line cameras 1, according to FIG
another reference measurement can be made. For this, e.g. the
CCD line camera 1 aligned such that the optical axis of the CCD line camera
1 is directed to the off-
Claims (4)
- Method of determining the bidirectional reflectance distribution by means of a CCD line-scanning camera (1), which is disposed on a rotating apparatus (2), the rotating apparatus (2) being configured to be pivotable about a vertical axis (3) and a horizontal axis (4), said method including the following method steps:a) aligning the central CCD line with the surface (5) in such a manner that one end of the CCD line looks perpendicularly relative to the surface (5) and thereby defines an imaginary centre of a circle (6) of the surface (5),b) simultaneously detecting the optical radiance of a segment of the surface (5),c) storing the detected radiance according to method step b),d) rotating the CCD line-scanning camera (1) about the vertical axis (3) through a specific angle and repeating the method steps b), c) and d) until the CCD line-scanning camera (1) has rotated about the vertical axis (3) through 360°,e) displacing the optical axis of the CCD line-scanning camera (1) by means of the horizontal axis (4) of the rotating apparatus (2) through 180°,f) segmentwisely detecting and storing the incident radiation,g) rotating the CCD line-scanning camera (1) about the vertical axis (3) through a specific angle and repeating the method steps f) and g) until the CCD line-scanning camera (1) has pivoted through 360°.
- Method according to claim 1, wherein the determination of the reference according to the method steps e) to g) is effected prior to and/or subsequent to the detection of the optical radiance of the surface (5).
- Method according to claim 1 or 2, wherein, in order to determine the inherent polarisation of the CCD line-scanning camera (1), the optical axis is directed towards the off-nadir point (7), and the optical radiance is detected and stored.
- Apparatus for accomplishing the method according to one of the preceding claims, said apparatus including an optical detector, which is in the form of a CCD line-scanning camera (1), and a rotating apparatus (2), which pivots the CCD line-scanning camera (1) and is configured to be pivotable about a vertical axis (3) and a horizontal axis (4).
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19711127 | 1997-03-10 | ||
DE19711127A DE19711127C2 (en) | 1997-03-10 | 1997-03-10 | Device and method for determining the bidirectional reflectance distribution |
PCT/DE1998/000384 WO1998040765A1 (en) | 1997-03-10 | 1998-02-02 | Process and device for determining bi-directional reflectance distribution |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0966694A1 EP0966694A1 (en) | 1999-12-29 |
EP0966694B1 true EP0966694B1 (en) | 2003-10-22 |
Family
ID=7823700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98910611A Expired - Lifetime EP0966694B1 (en) | 1997-03-10 | 1998-02-02 | Process and device for determining bi-directional reflectance distribution |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0966694B1 (en) |
JP (1) | JP2002500754A (en) |
DE (2) | DE19711127C2 (en) |
WO (1) | WO1998040765A1 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102608074B (en) * | 2012-03-21 | 2014-09-24 | 中国科学院安徽光学精密机械研究所 | Novel bidirectional reflectance distribution function measuring device |
JP6410451B2 (en) | 2014-03-31 | 2018-10-24 | キヤノン株式会社 | Information processing apparatus, measurement system, information processing method, and program. |
CN109073538B (en) * | 2016-08-22 | 2021-12-10 | 国立大学法人北海道大学 | Object state detection and transmission system |
CN110083176B (en) * | 2019-05-05 | 2020-07-24 | 宁夏大学 | BRDF data acquisition system and method based on unmanned aerial vehicle-mounted hyperspectral imaging |
CN110794382A (en) * | 2019-10-30 | 2020-02-14 | 上海禾赛光电科技有限公司 | Laser radar and detection method thereof |
JP7228860B1 (en) | 2022-02-07 | 2023-02-27 | 国立大学法人北海道大学 | Spectrometer |
-
1997
- 1997-03-10 DE DE19711127A patent/DE19711127C2/en not_active Expired - Fee Related
-
1998
- 1998-02-02 EP EP98910611A patent/EP0966694B1/en not_active Expired - Lifetime
- 1998-02-02 JP JP53905098A patent/JP2002500754A/en active Pending
- 1998-02-02 WO PCT/DE1998/000384 patent/WO1998040765A1/en active IP Right Grant
- 1998-02-02 DE DE59809972T patent/DE59809972D1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0966694A1 (en) | 1999-12-29 |
WO1998040765A1 (en) | 1998-09-17 |
DE59809972D1 (en) | 2003-11-27 |
DE19711127C2 (en) | 2000-09-14 |
DE19711127A1 (en) | 1998-09-24 |
JP2002500754A (en) | 2002-01-08 |
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