EP0916236A1 - Dispositif de g n ration d'impulsions ultra-courtes de rayonnement x - Google Patents
Dispositif de g n ration d'impulsions ultra-courtes de rayonnement xInfo
- Publication number
- EP0916236A1 EP0916236A1 EP97935647A EP97935647A EP0916236A1 EP 0916236 A1 EP0916236 A1 EP 0916236A1 EP 97935647 A EP97935647 A EP 97935647A EP 97935647 A EP97935647 A EP 97935647A EP 0916236 A1 EP0916236 A1 EP 0916236A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- ray
- pulses
- rays
- focusing
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
Definitions
- the present invention relates to a device for generating ultra-short pulses of electromagnetic radiation of the X-ray type. It allows in particular:
- the device which is the subject of the invention makes it possible to diagnose the physical state of a condensed medium, ionized (of the plasma type) or not, at each moment of its evolution. This device makes it possible to detect the appearance of this micro-instabilities which disturb the thermodynamic equilibrium.
- the present invention finds applications in particular in studies:
- electromagnetic radiation short wavelength, X-ray type
- Such a source is sometimes called an auxiliary source.
- This technique requires the use of a source of intense electromagnetic radiation, capable of illuminating the medium that one wants to study during its transient evolutionary phase.
- the characteristics of the radiation from this source are chosen in such a way that the measurements, either of the reflected part, or of the transmitted part of this auxiliary electromagnetic radiation, can reveal, after interference and detection, the spatial and physical characteristics. temporal specific of the medium which was illuminated by this source.
- This known method consists in illuminating this plasma or this medium with an ultra-short pulse of X-ray radiation, induced by the impact of a beam to be lasered. of ultra-short duration (a few femtoseconds) on a metal target.
- a method of diagnosing a condensed medium, ionized or not, molecular or atomic, is also known.
- This method consists in illuminating this medium by partially coherent electromagnetic radiation, of the svnchrotron radiation type, emitted during the interaction of a beam of relativistic electrons with a magnetic structure of the inverter type ("wiggler").
- a pulsed radiation source either coherent (laser radiation), or partially coherent (synchrotron radiation of interaction of relativistic electrons-magnetic structure of inverter type) or inconsistent
- X-ray In the case of the study of a plasma-laser, it is known that this radiation can originate from the source of laser radiation which generates the plasma-laser to be studied. In this case, the diagnostic means is called X-ray X-ray.
- the radiation is reflected or transmitted can be focused diffractively in order to provide an image of the condensed medium via a camera.
- a material made up of a multilayer lamellar network diffracts an X-ray beam of given energy band as a function of the angle of incidence, on the one hand by dispersing the radiation in reflected multibeams of specific wavelengths (according to the different corresponding orders) and on the other hand by reducing the bandwidth.
- a metallic surface or a crystal for example a rubidium phthalate crystal, or RBAP, a potassium phthalate crystal, or KAP, or a lead stearate crystal
- a metallic surface or a crystal for example a rubidium phthalate crystal, or RBAP, a potassium phthalate crystal, or KAP, or a lead stearate crystal
- the devices of the prior art have a repeating optical source producing a sufficient number of pulses of electromagnetic radiation to illuminate the medium with a high repetition rate, during a shortest possible time.
- the devices fulfilling this function temporally modulate the radiation beam in a free pulse dispersing means of the type
- the principles of generating ultra-short pulses and using the modulator-sequencer forming part of these devices remain limited to the spectral domains of use of the optical components, ranging from the domain visible in the infrared and submillimetric domains. This does not apply to pulses of X-laser or synchrotron radiation.
- the pulse X serving as a probe cannot be considered to be of ultra-short duration compared to the lifetime of the atomic and molecular states to be studied,
- the object of the present invention is to remedy the above drawbacks by proposing a device for generating ultra-short pulses of X-rays which uses two multilayer lamellar networks for X-rays which occupy conjugate positions.
- the subject of the present invention is a device for generating pulses: on X-ray radiation, this device: f etar.t characterized in that l comprises:
- first and second multilayer lamellar networks for X-ray radiation occupying positions which are optically conjugate with each other, and - first and second X-ray focusing means, having a common focus and forming an optical assembly which is placed on the path of the X-ray, between the first and second networks, the X-ray thus passing from the intermediate optical means to the first network then to the second network via the first focusing means and then the second focusing means, the second network supplying ultra-short pulses of X-ray radiation.
- this device further comprises a mterferential filter which is arranged at the level of the focal plane common to the first and second focusing means.
- this device further comprises an adjustable collimation means which is arranged at the focal plane common to the first and second focusing means.
- this device further comprises an adjustable collimation means and a mterferential filter which are arranged at the level of the focal plane common to the first and second focusing means.
- Each of the first and second focusing means may comprise a cylindrical mirror for X-rays or a sphe ⁇ que mirror for X-rays or a curved crystal capable of focusing the X-rays.
- the intermediate optical means can also comprise a cylindrical mirror for X-ray radiation or a spherical mirror for X-rays or a curved crystal capable of focusing X-rays.
- This crystal can be a rubidium phthalate crystal or a potassium phthalate crystal.
- the means for generating the X-ray drawn beam include:
- FIG. 1 represents a block diagram of an example of the device described in document (1)
- FIGS. 2A to 2C represent the time evolution of various signals or beams used in the context of a method described in this document (1)
- FIG. 3 is a block diagram of an autocorrelator with optoelectronic sampling usable with the device of FIG. 1,
- FIG. 4 is a schematic view of a particular embodiment of the device which is the subject of the invention, using a mterferential filter, and
- FIG. 5 is a schematic view of another particular embodiment of the device object of the invention, using a collimation means. Detailed description of specific embodiments
- FIG. 1 represents a block diagram of an example of the device described in this document (1).
- a laser not shown in FIG. 1, emits pulses of radiation referenced 2 in this FIG. 1.
- the pulses emitted by the laser are preferably pulses of the femtosecond type, with a temporal width of the order of 10 " to 10 " 13 s.
- Target 6 is composed of a metallic material of the titanium, nickel, zinc or tungsten type. Under the effect of the focused laser beam 2, a radiative emission from the surface of this target takes place, which results in the emission of intense radiation 8 of X-ray radiation, the energy and spectral characteristics of which depend on the target material selected. .
- the radiation beam thus obtained is reflected by a mirror 12, for X-rays, in the direction of a multilayer mirror 14.
- This mirror essentially comprises a series of alternating layers 16, 18 20, 22.
- these layers may for example be alternately layers of carbon and tungsten, or tungsten and molybdenum.
- This multilayer mirror makes it possible to transform a single incident X-ray pulse into a plurality of pulses constituting a tra of pulses. In fact, a single X-ray pulse will undergo successive propagation and reflections on the stacked layers.
- n is the index of the material constituting a layer of the mirror, at the average wavelength of the X-rays, and knowing that a delay of nxlOO additional femtoseconds corresponds to a layer thickness of 30 ⁇ m (for directions of orthogonal incidence and reflection), it is possible to select the time difference between the X pulses of the pulse tram.
- the multilayer mirror 14 allows
- the angle solid of the reflected X-ray beam is sufficient to separate (by collimation) this beam into two distinct branches in two different directions.
- the temporal evolution of the intensity of the pulsed laser beam is shown schematically in solid lines in FIG. 2A, while the curve in dashed lines schematically represents the temporal evolution of the X-ray pulse obtained after breakdown on the surface of the target 16.
- This second pulse is wider than the first: for a laser pulse of the order of 10 " " s, the X-ray pulse has a time width of approximately 10 '* - s.
- FIG. 2B represents the time evolution of the pulse tra obtained after reflection of a single X-ray pulse on the multilayer mirror 14.
- the pulse tram has as many peaks or elementary pulses as there are reflections on the mirror 1.
- Each of the two beams, the beam emitted towards the medium 24 to be studied and the reference beam 30 emitted towards the detector 26, have the same time distribution as that shown in FIG. 2B.
- Temporal evolution signal 32 is schematically shown in Figure 2C.
- the detector is therefore subjected to two beams • the reference beam 30 coming directly from the mirror multilayer 14, and the signal beam 32 re-emitted by the medium 2.
- the field to be taken into account for the triggering of the latter is the electric field
- E E 0 + E 2 , where E 0 is the contribution of the beam 30 to the electric field, at the detector 26, and E., is the contribution of the beam 32 to the electric field, at the level of the detector 26. Consequently, if the fields E 0 and E- are, at a certain time t, in phase, the detector is sensitive to the total field and is triggered.
- This principle makes it possible to "mark" the signal beam 32 with a known time reference (the beam 30).
- the fast or ultra-fast detector 26 is sensitive in the range of radiation to be studied.
- this may for example be a detector based on an ultra-fast photoconductive material, the lifetime of the carriers being less than 1 ps.
- Such a material can be CdTe, GaAs, silicon doped with oxygen on sapphire or diamond.
- Diamond is the best performing material because it is the most resistant to radiation.
- This detector 26 can be coupled to an optoelectronic autocorrelator device 34, with sliding contact.
- This sampler is a microsystem capable of analyzing pulses up to 50 gigahertz.
- FIG. 3 Schematically, such a device is shown in Figure 3. It is an integrated component, made in a microelectronic type technology.
- It comprises a main propagation line 36 on which the single signal S (t) to be sampled is sent, as well as n sampling lines 38-1, 38-2, 38-3, ..., 38-n.
- sampling lines 38- ⁇ (l £ ⁇ ⁇ n) are arranged in a "comb" along the main line.
- each of the sampling lines 38- ⁇ and the main line 36 is a pad 40- ⁇ (l i ⁇ n) of photoconductive material.
- Each sampling line is also also connected to a storage capacity 42-1, 42-2, ..., 42-n as well as to an acquisition electronics not shown in FIG. 3.
- Each photoconductive element 40 -1, 40-2, ..., 40-n is triggered by an ultra-fast laser pulse.
- a convenient means of obtaining such a pulse for each photoconductive element consists, as shown in FIG. 1, of taking a secondary beam 44-1 from the beam 2 of the femtosecond laser, using a mirror 46.
- This secondary beam 44-1 can itself be divided into several into several sub-beams 44-2, ..., 44-n, using partially transparent mirrors 43-2, ..., 43-n , interposed on its route.
- the main sub-beam 44-1 triggers the photoconductive element 40-1.
- a first secondary sub-beam 44-2 obtained using the mirror 43-2 triggers the photoconductive element 40-2 at an instant determined by the length of the delay line defined by the beam path between the mirror 43 -2 and the photoconductive element 40-2.
- the third photoconductive element 40-3 is triggered by a second secondary sub-beam 44-3, at an instant itself defined by the length of a second delay line.
- each photoconductive element 40- ⁇ (l £ i ⁇ n), the latter being triggered at an instant t i. defined by the length of the ith delay line.
- the ultrafast laser pulse incident on a photoconductor 40- ⁇ closes the switch formed by this photoconductor.
- a signal is then taken, signal which corresponds to the intensity of the signal S opposite the line i at time t. closing the photoconductor.
- each photoconductive material may for example be cadmium telluride Pass temperature
- the main and secondary transmission lines can be made of aluminum.
- An electronic circuit for measuring for example of the charge amplifier type, and for recording the signals delivered by each sampling line
- the time step for sampling the signal delivered by the photodetector 26 is defined by the spatial distance between two neighboring lines 38-i, as explained in the publication mentioned above.
- 40-1 is closed, determines when the sampling will start.
- this triggering instant will define the portion of the plasma or of the medium 24 being studied, from which the analyzed signals will be retransmitted. This means that it is possible to choose to sample signals coming from a peripheral zone 50 of the studied medium 24 or from a zone 52 lying deep in the studied medium 24.
- the device according to the invention which is schematically shown in Figure 4, is intended to generate ultrashort X-ray pulses.
- these ultra-short X-ray pulses are intended for the characterization of a medium 53.
- the device of FIG. 4 comprises: means 54 for generating a pulsed beam 55 of X-ray radiation,
- an intermediate optical means 56 which transforms this beam 55 into a pulsed beam 58 substantially parallel to X-ray radiation (that is to say that the rays of this beam 58 are substantially parallel to each other),
- first multi-layer lamellar network 60 for X-ray radiation as well as a second multi-layer lamellar network 62 for X-ray radiation, these networks 60 and 62 occupying positions which are optically conjugate with each other, and
- first means 6-4 for focusing X-rays as well as a second means 66 for focusing X-rays which have a common focal plane and therefore a common focal point and form an optical assembly placed on the path of the X-ray between the reeds 60 and 62.
- the X-ray interacts successively with the optical means 56, the network 60, the focusing means 64, the location means 66 and the network 62.
- Ultra-short pulses 67 of X-ray radiation are consequently supplied by the network 62 and sent to the medium 53 via a mirror 68 for X-ray radiation, this mirror 68 being, for example, plane.
- the means 54 for generating the drawn beam 55 of X-ray radiation include:
- an intense laser source 70 capable of emitting ultra-short laser pulses 71
- a target 72 which is made of a solid material and which is capable of producing the intense beam 55 when it receives the laser pulses.
- the ultra-short pulses supplied by the laser 70 are focused on the target 72 by an appropriate lens 74.
- ultra-short pulses pulses of duration less than 10 " s, for example lying in the range from 10 " 1 "to 10 " 1 "s, or in any case of much longer duration short as the lifespan of the medium that we want to study.
- the target 72 is made of a metallic material such as T, Ni, Zn or W.
- the energetic and spectral characteristics of the intense beam 55 depend on this material.
- the X-radiation, reference 76 which is retransmitted by the medium 53 after interaction thereof with the radiation 69 reflected by the mirror 68, is measured by a suitable sensor 78 which is associated with an optoelectronic autocorrelating device 80.
- This device 80 is controlled by ultra-short laser pulses 81 which are taken from the palse beam from the laser 70 using a. n beam beam splitter 82 which is placed in the beam supplied by the laser 70 as seen in FIG. 4.
- the device of FIG. 4 also comprises a mterferential filter 84 which is arranged at the level of the focal plane P common to the focusing means 64 and 66.
- the networks 60 and 62 comprise reflective metallic layers regularly stacked.
- Each of the focusing means 64 and 66 can be a cylindrical or spherical mirror for X-rays or a curved crystal, capable of focusing X-rays.
- a rubidium phthalate crystal or a potassium phthalate crystal can be used.
- the intermediate optical means 56 can be a cylindrical or spherical mirror for X-ray radiation or a curved crystal, for example made of rubidium phthalate or potassium phthalate, of a suitable shape for focusing X-ray radiation.
- the device according to the invention differs from that of FIG. 4 by the fact that it includes, instead of the mterferential filter 84, a collimation means 86 which is arranged at the level from the focal plane P common to the focusing means 64 and 66.
- the filter 84 and the collimation means 86 are used in the fo ⁇ .s and these are placed at the focal plane P.
- the collimating means 86 can be a collimator or an openwork absorbent screen.
- this collimation means 86 is adjustable in the sense that it is displaceable parallel to the focal plane P in order to be able to select such and such a line of the radiation coming from the focusing means 64.
- X-ray radiation from a synchrotron can be used as 55 radiation.
- control the device 80 it is possible to use pulses produced by a triggering system itself controlled by synchrotron radiation.
- the intermediate optical means 56 makes it possible not only to significantly reduce the divergence of the beam 55 but also to filter the high frequencies and bass of this beam 55.
- the networks 60 and 62 which occupy conjugate positions and are associated with the focusing means 64 and 66, make it possible to remedy the drawbacks of the prior art.
- Each source point of the surface of the network 60 has an image point on the network 62 located at the same optical distance for all the equivalent frequency space.
- the beam resulting from the processing by the optical system composed of the grids 60 and 62 and the focusing means 64 and 66 has the same spectral distribution.
- the multiplicity of X-rays which are reflected at the same angle (and therefore have the same frequency) and which originate from the different source points of the surface of the network 60 will traverse optical trajectories that are shorter as the frequency of the considered radius will be higher due to the spectral dispersion property of the networks 60 and 62.
- the optical paths of the probing beams X (which come from the network 60 and are references FI, ..., FN, with N> 2, only the beams FI and FN being represented) appear, according to the mterferential structure of the filter 84 and / or the position of the collimator 86, at reflection angles (due to the properties of the grating 60) which differ according to the mean useful frequency of the X-ray.
- the respective positions considered of the source points and of the image points on the networks occupying conjugate positions, according to the characteristics of emission from the laser source (or synchrotron).
- the orientations of the two networks in conjugate positions offer a new possibility of temporal modulation of the single pulse original following a train of X pulses (which can reach 5 to 15 successive pulses) with a repetition rate which can be high and reach a few terahertz according to the principle of a sequencing system of the Michelson type applied to X-ray beams .
- the collimation reduces the bandwidth of the probing beams X and limits the duration of the resulting pulse.
- the choice of distribution and arrangement of the assembly formed by the networks 60, 62, the focusing means 64, 66, the filter 84 and / or the collimation means 86 depends on the temporal dispersion characteristics sought for the beam X.
- the choice of the position of the colli ation means 86 essentially allows the processing and selection of a preferential part of the X-ray spectrum.
- the assembly consisting of networks 60, 62, focusing means 64, 66, and the filter 84 and / or the collimation means 86 provides an X-ray beam composed of a train of X pulses which are regularly spaced apart. '' the same time interval and which are then directed towards the medium 53 to be characterized, by means of the mirror 68 for X-rays provided for this purpose.
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9609577A FR2752101B1 (fr) | 1996-07-30 | 1996-07-30 | Dispositif de generation d'impulsions ultra-courtes de rayonnement x |
FR9609577 | 1996-07-30 | ||
PCT/FR1997/001413 WO1998005189A1 (fr) | 1996-07-30 | 1997-07-29 | Dispositif de génération d'impulsions ultra-courtes de rayonnement x |
Publications (1)
Publication Number | Publication Date |
---|---|
EP0916236A1 true EP0916236A1 (fr) | 1999-05-19 |
Family
ID=9494628
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP97935647A Withdrawn EP0916236A1 (fr) | 1996-07-30 | 1997-07-29 | Dispositif de g n ration d'impulsions ultra-courtes de rayonnement x |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0916236A1 (fr) |
FR (1) | FR2752101B1 (fr) |
WO (1) | WO1998005189A1 (fr) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2764505B2 (ja) * | 1992-07-09 | 1998-06-11 | 工業技術院長 | 電子分光方法とこれを用いた電子分光装置 |
FR2742867B1 (fr) * | 1995-12-22 | 1998-02-06 | Commissariat Energie Atomique | Procede et dispositif interferometrique de caracterisation d'un milieu |
-
1996
- 1996-07-30 FR FR9609577A patent/FR2752101B1/fr not_active Expired - Fee Related
-
1997
- 1997-07-29 EP EP97935647A patent/EP0916236A1/fr not_active Withdrawn
- 1997-07-29 WO PCT/FR1997/001413 patent/WO1998005189A1/fr not_active Application Discontinuation
Non-Patent Citations (1)
Title |
---|
See references of WO9805189A1 * |
Also Published As
Publication number | Publication date |
---|---|
FR2752101A1 (fr) | 1998-02-06 |
FR2752101B1 (fr) | 1998-10-09 |
WO1998005189A1 (fr) | 1998-02-05 |
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