EP0886759A4 - Compton-rückstreuungs-wanddickenmesser mit fokussierkollimator und ringförmigem detektor - Google Patents

Compton-rückstreuungs-wanddickenmesser mit fokussierkollimator und ringförmigem detektor

Info

Publication number
EP0886759A4
EP0886759A4 EP97908911A EP97908911A EP0886759A4 EP 0886759 A4 EP0886759 A4 EP 0886759A4 EP 97908911 A EP97908911 A EP 97908911A EP 97908911 A EP97908911 A EP 97908911A EP 0886759 A4 EP0886759 A4 EP 0886759A4
Authority
EP
European Patent Office
Prior art keywords
wall thickness
pipe wall
thickness gauge
annular detector
focusing collimator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP97908911A
Other languages
English (en)
French (fr)
Other versions
EP0886759A1 (de
Inventor
Robert Gould
Edward S Kenney
Saifullah Khan
Xiangjun Xu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Penn State Research Foundation
Original Assignee
Penn State Research Foundation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Penn State Research Foundation filed Critical Penn State Research Foundation
Publication of EP0886759A1 publication Critical patent/EP0886759A1/de
Publication of EP0886759A4 publication Critical patent/EP0886759A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
EP97908911A 1996-03-04 1997-03-03 Compton-rückstreuungs-wanddickenmesser mit fokussierkollimator und ringförmigem detektor Withdrawn EP0886759A4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US1275596P 1996-03-04 1996-03-04
US12755 1996-03-04
PCT/US1997/003516 WO1997033141A1 (en) 1996-03-04 1997-03-03 Compton backscatter pipe wall thickness gauge employing focusing collimator and annular detector

Publications (2)

Publication Number Publication Date
EP0886759A1 EP0886759A1 (de) 1998-12-30
EP0886759A4 true EP0886759A4 (de) 2000-11-22

Family

ID=21756530

Family Applications (1)

Application Number Title Priority Date Filing Date
EP97908911A Withdrawn EP0886759A4 (de) 1996-03-04 1997-03-03 Compton-rückstreuungs-wanddickenmesser mit fokussierkollimator und ringförmigem detektor

Country Status (4)

Country Link
EP (1) EP0886759A4 (de)
AU (1) AU2070397A (de)
CA (1) CA2248145A1 (de)
WO (1) WO1997033141A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5896429A (en) * 1997-09-15 1999-04-20 Massachusetts Institute Of Technology Method for measurement of blast furnace liner thickness
US8767912B1 (en) 2013-04-09 2014-07-01 King Abdulaziz University System for inspection and imaging of insulated pipes and vessels using backscattered radiation and X-ray fluorescence
US9151722B2 (en) 2014-01-15 2015-10-06 King Abdulaziz University Systems for determining and imaging wax deposition and simultaneous corrosion and wax deposit determination in pipelines
US9690006B2 (en) 2014-01-21 2017-06-27 Halliburton Energy Services, Inc. Downhole logging system with azimuthal and radial sensitivity
JP6299033B2 (ja) * 2014-05-12 2018-03-28 一般財団法人電力中央研究所 非破壊検査方法およびその装置
US8976936B1 (en) 2014-05-22 2015-03-10 King Abdulaziz University Collimator for backscattered radiation imaging and method of using the same
CN103969270A (zh) * 2014-05-27 2014-08-06 东莞理工学院 基于背散射成像技术的发射装置
US20160274039A1 (en) 2014-09-25 2016-09-22 King Abdulaziz University System for determining and imaging wax deposition and corrosion in pipelines
WO2016053344A1 (en) * 2014-10-02 2016-04-07 Halliburton Energy Services, Inc. Downhole tomographic imaging
WO2016058095A1 (en) * 2014-10-14 2016-04-21 Inversa Systems Ltd. Method of inspecting a degraded area of a metal structure covered by a composite repair and method of measuring a remaining wall thickness of a composite structure
US9020099B1 (en) 2014-12-03 2015-04-28 King Abdulaziz University Miniaturized pipe inspection system for measuring corrosion and scale in small pipes
WO2017062011A1 (en) * 2015-10-08 2017-04-13 Halliburton Energy Services, Inc. Determining tubing wall thickness
FR3043247B1 (fr) 2015-10-30 2020-06-19 Commissariat A L'energie Atomique Et Aux Energies Alternatives Collimateur pour la spectrometrie de diffraction x, dispositif associe et son utilisation
CN111694046B (zh) * 2020-07-24 2022-06-07 中国工程物理研究院核物理与化学研究所 一种单能γ装置
CN117686533B (zh) * 2023-12-13 2024-05-17 中国特种设备检测研究院 一种检测管壁缺陷、相邻连续缺陷及绘制管壁缺陷图像的方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4825454A (en) * 1987-12-28 1989-04-25 American Science And Engineering, Inc. Tomographic imaging with concentric conical collimator
US5195117A (en) * 1992-04-24 1993-03-16 University Of Houston Method for using secondary radiation scattering to evaluate the thickness of materials
US5400380A (en) * 1991-03-18 1995-03-21 Data Measurement Corporation Dynamic alloy correction gauge

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4825454A (en) * 1987-12-28 1989-04-25 American Science And Engineering, Inc. Tomographic imaging with concentric conical collimator
US5400380A (en) * 1991-03-18 1995-03-21 Data Measurement Corporation Dynamic alloy correction gauge
US5195117A (en) * 1992-04-24 1993-03-16 University Of Houston Method for using secondary radiation scattering to evaluate the thickness of materials

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO9733141A1 *

Also Published As

Publication number Publication date
WO1997033141A1 (en) 1997-09-12
CA2248145A1 (en) 1997-09-12
AU2070397A (en) 1997-09-22
EP0886759A1 (de) 1998-12-30

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