EP0842581B1 - Thermal sensing system having a fast response calibration device - Google Patents
Thermal sensing system having a fast response calibration device Download PDFInfo
- Publication number
- EP0842581B1 EP0842581B1 EP96925850A EP96925850A EP0842581B1 EP 0842581 B1 EP0842581 B1 EP 0842581B1 EP 96925850 A EP96925850 A EP 96925850A EP 96925850 A EP96925850 A EP 96925850A EP 0842581 B1 EP0842581 B1 EP 0842581B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- detector
- array
- emitting diode
- radiation
- sensing system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G7/00—Direction control systems for self-propelled missiles
- F41G7/001—Devices or systems for testing or checking
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G7/00—Direction control systems for self-propelled missiles
- F41G7/20—Direction control systems for self-propelled missiles based on continuous observation of target position
- F41G7/22—Homing guidance systems
- F41G7/2253—Passive homing systems, i.e. comprising a receiver and do not requiring an active illumination of the target
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G7/00—Direction control systems for self-propelled missiles
- F41G7/20—Direction control systems for self-propelled missiles based on continuous observation of target position
- F41G7/22—Homing guidance systems
- F41G7/2273—Homing guidance systems characterised by the type of waves
- F41G7/2293—Homing guidance systems characterised by the type of waves using electromagnetic waves other than radio waves
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
- H04N23/23—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only from thermal infrared radiation
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/61—Noise processing, e.g. detecting, correcting, reducing or removing noise the noise originating only from the lens unit, e.g. flare, shading, vignetting or "cos4"
Definitions
- This invention relates to a thermal sensing system and more particularly to both imaging and non-imaging sensing systems incorporating an array of photon-detecting elements.
- Thermal imaging systems are known in the prior art. Such imaging systems can involve either series or parallel processing. In the former case a scene is scanned and each component of the scene is focused sequentially onto a detector. These systems are not easy to design however if compactness is important: the scanning mechanism renders the adaptation to lightweight imagers extremely difficult.
- An alternative arrangement for area imaging is to employ many detectors to sample simultaneously distinct sections of the scene.
- a major disadvantage of this system is that the transfer function from incident infrared flux to output signal (detector signal) is particularly sensitive to variation between detecting elements. This results in an image degraded by fixed pattern noise arising from sources both within and independent of the detecting elements. Imperfections in the optical system (e.g.
- Photodetector sources can be static variations in characteristics (e.g. area. quantum efficiency or cutoff wavelength) or dynamic instabilities (temperature offset voltage and slope resistance all drift over a period of time) which give rise to the need for regular array recalibration. Additionally 1 / f noise introduces an error which increases with the period between calibrations. Compensation for inter-detector variations is particularly important in "staring" applications which measure the absolute radiation intensity within a scene. Scanning imagers measure only changes in intensity across a scene. The output from a staring array is thus of poor contrast in comparison.
- Non-imaging thermal detectors are also known in the prior art. They have applications in areas such as robotics and missile guidance systems for which human interpretation of detector output is not required. The actual detecting elements are similar to those described above in relation to imaging systems. In non-imaging systems however an object (robot or missile) is arranged to respond to a particular signal appearing on the detectors. This recognition feature may vary in its complexity. For example, pattern recognition can be linked to a number of response options or a less complex reflex can result in steering towards the achievement of a characteristic detector response. Staring arrays are particularly suitable in satisfying the lightweight requirements of missile systems. However in such missiles the detector system is subject to rapid temperature change as the missile cone heats up during flight. Frequent recalibration is necessary in order to maintain an acceptable accuracy.
- An imaging system incorporating a detector array is disclosed by P.N.J.Dennis et al. in Proc. SPIE 572 22 (1985 ).
- the authors describe a two dimensional close packed array of cadmium mercury telluride detectors interfaced to a silicon charge coupled device (CCD).
- CCD silicon charge coupled device
- Infrared light incident on a detector elicits a response signal which is injected into the CCD and integrated over a period of time (the stare time).
- the subsequent signal processing system addresses the fundamental problems of poor contrast from the infrared scene and nonuniformity of detector element responses.
- the nonuniformity, correction is made by exposing the array to two uniform scenes of different temperature with an arrangement of mirrors used to introduce them into the optical path.
- a correction factor is derived for each individual detector by forcing a uniform scene to give rise to a uniform image.
- the signal response is fitted linearly to incident radiation intensity and an offset and gradient derived to describe the transfer function for each detector in the array. All values of signal response at all detectors can thus be converted into corrected incident flux values.
- Array calibration in this way is performed periodically (perhaps hourly or daily) and the updated correction factors applied to subsequent measurements. This compensates for 1 / f noise and detector parameters drifting over a period of time as a result of, for example, temperature changes.
- reference temperature sources limit the performance in terms of speed and compactness. If physically separate reference scenes are used then the sensor requires an optical system with considerable complexity and bulk. Alternatively reference temperatures could be supplied by a Peltier cooled/heated reference plane but the finite time taken to adjust to temperature leads to a lengthy calibration process.
- US patents 4 948 964 and 5 354 987 describe infrared (IR) imaging systems having IR detector arrays and means for calibrating or normalising the responses of individual detectors. Both systems employ a variable thermal source as a reference IR source; that of US 4 948 964 employs a thermo-electric device. Use of IR LEDs in scene simulation has been suggested in the Journal of Optical Technology 61 (1994) pp 713-714 .
- the present invention provides a thermal sensing system including an array of photon-detecting elements, a variable luminescence device arranged to provide array illumination for calibration purposes and switching means for interchanging between scene observation and detector calibration modes of the system characterised in that the variable luminescence device is an infrared light-emitting diode which is electrically biasable to provide both positive and negative luminescence emission to be usable as a calibrated variable-intensity source or sink for IR radiation, having a pre-determined relationship between emission intensity and biasing strength.
- the invention provides the advantage that it can be constructed in compact form and is capable of providing a means for fast, frequent and accurate correction for nonuniformity of detector elements.
- an infrared light-emitting diode (IRLED) which is arranged such that it may be positively or negatively luminescent is capable of providing a reference temperature which is optionally above or below ambient temperature. It can cover a greater temperature range than the commonly used Peltier cooler. Practically, a Peltier cooler is run in reverse to reach temperatures above ambient and the range covered is only a few tens of degrees. An IRLED is capable of simulating temperatures across a range far in excess of that of the Peltier cooler/heater.
- An IRLED is capable of readjusting the intensity of flux emission to within 1% of a steady state value in a settling time of less than one second.
- P.Berdahl et al. in Infrared Phys. 22(2-4) 667 (1989 ) explain positive luminescence as an increase in the radiation emitted from a body when its situation of thermal equilibrium is perturbed by some exciting mechanism. Similarly negative luminescence is a decrease in emitted radiation relative to equilibrium thermal emission,
- the IR LED ideally has a predetermined relationship between emission intensity and biasing strength. This provides capability for rapid calibration. In this embodiment the system lends itself to providing a more accurate uniformity correction than is possible on a similar timescale in prior art thermal sensors.
- detector nonuniformity is not linear over the temperature range of interest and making a nonlinear correction requires at least three reference scenes to emit radiation onto the detector.
- the fast settling speed of IR LEDs provides for a series of different intensity reference fluxes to be used in the uniformity correction and so the calibration function relating individual detector signal response to incident flux can be fitted to a polynomial expansion which does not assume linearity.
- the switching means is preferably arranged for the detector array to receive radiation from the IRLED between intervals of scene observation.
- the switching means is switchable between a first configuration in which radiation from a scene under observation is incident on the detector and a second configuration in which radiation from an IRLED is incident on the detector, This provides the advantage that the time for which the detector array is idle is reduced to the time taken to switch between these two configurations only.
- Prior art imagers with n physically separate reference scenes require a switching means which provides for n+1 different configurations.
- the thermal sensing system of the invention may include a computer arranged to derive a corrective function for each detector in the array from the detector output response to the IRLED and in accordance therewith to correct the detector output response to an observed scene,
- a computer may be arranged to calculate the relationship between the intensity of infrared radiation (F 1 ) incident on a detector of the array and magnitude of electrical signal response (S in ) therefrom when the IRLED is arranged to provide infrared flux at a predetermined intensity.
- the computer is then also arranged to apply the derived relationship as a correction to signals output from that detector in the course of scene observation.
- the IRLED may be arranged to emit radiation with at least three different predetermined intensities for array calibration purposes and the computer is then arranged to calibrate each detector in the array by fitting the predetermined radiation intensities to detector signal responses as a power series expansion of at least quadratic order, in this way the advantage of accurate (nonlinear) correction factors over a range of incident flux intensities described previously can be combined with the advantage of fast calculation also described above.
- the computer is preferably arranged to use the derived relationships between incident flux and detector response and thereby to apply a uniformity correction to the array signal responses.
- the computer is also arranged to pass the corrected signals to a means for display arranged to indicate strength of signal from each individual detector at a position in the image corresponding to that in the detector array.
- the computer is also preferably arranged to update the derived relationship between incident flux and each single detector signal response at intervals and to apply the updated relationships to subsequent observations.
- the computer may be arranged to update the derived relationship between incident flux and each single detector response more frequently than once per hour.
- the drift associated with the 1 / f noise alone can half the sensitivity of a high performance 2D detector array in less than one hour.
- the updating frequency may be adaptive to the observed scene. It can be chosen as appropriate in that detector properties change with scene temperature rendering a previous uniformity correction inaccurate. Resolution will therefore be lost in proportion with the rate of mean temperature change within the scene and frequent updating will be necessary in order to resolve small temperature differences.
- the IR LED may be arranged to emit reference fluxes which cover a similar intensity range to that of the radiation emanating from a scene under observation. This provides for the uniformity correction to be derived from reference radiation characteristic of an observed scene. This enables error correction to be most effective in the region of the temperatures actually being measured.
- the dynamic range of the IR LED makes an imager incorporating such a reference source capable of effective imaging of a wide variety of environments.
- the computer may be arranged to control the current through the IR LED in response to detector output signals.
- the current may be controlled in the first instance in response to uncorrected signals and subsequently to corrected values of incident flux intensity.
- variable luminescence device may be a light emitting diode of cadmium mercury telluride or an indium antimonide based material such as InAISb.
- a second aspect of the invention provides a method of applying a uniformity correction to an array ( 14 ) of photon-detecting elements, the method comprising the step of arranging for a variable luminescence device to provide illumination of the array for calibration purposes, characterised in that the variable luminescence device is an infrared light-emitting diode biasable to provide both positive and negative luminescence to be used as a calibrated variable-intensity source or sink for IR radiation, having a pre-determined relationship between emission intensity and biasing strength.
- the method provides for improved correction because an infrared light-emitting diode (IRLED) is capable of simulating temperatures across a range far in excess of that of a Peltier cooler/heater.
- IRLED infrared light-emitting diode
- the method may comprise the steps of:
- Steps (a) and (b) may be repeated at intervals in order to update the correction factors derived in Step (b) and thus there is the additional advantage that the uniformity correction can be updated with a frequency appropriate to the system's operating requirements.
- Array irradiation in Step (a) may be performed with at least three different predetermined flux intensities output from the IRLED and the correction factors of Step (b) derived by fitting the incident radiation intensities to a power series expansion to at least quadratic terms of detector signal response. This provides the advantage of dealing with nonlinearity in the detector response to incident flux across the range of radiation intensities which may emanate from the observation scene.
- the system 10 incorporates an objective lens L 1 which focuses infrared (IR) radiation, indicated by rays 11, 12, emanating from an observed scene (not shown) onto a two-dimensional array of microdetectors 14 .
- a two-position mirror M 1 is in either an observation position P obs (indicated by a dashed line) or a calibration position P cal (bold line).
- P obs observation position
- P cal calibration position
- An indium antimonide light emitting diode (LED) 20 is mounted on a Peltier cooler/heater device 22.
- a lens L2 passes IR radiation emitted by the LED 20 to the detector array 14 via reflection from the mirror M1 in its position P cal .
- the path followed by this radiation beam is contained within the rays 24, 25, 17 and 26. 27, 19.
- a computer 28 processes information received from the detector array 14 , passes information to a display apparatus 30 and controls current input to the LED 20.
- the detector array 14 When exposed to an IR flux the detector array 14 responds with a corresponding array of electronic signals S n , 1 ⁇ n ⁇ N, where S n is the signal from the n th detector in the array and N is the total number of detectors in the array.
- the IR LED 20 In a situation of radiative equilibrium the IR LED 20 will be emitting as much radiation into its surroundings as it absorbs from them. However this equilibrium situation is disturbed by the application of an electric current. In such a situation the IR LED 20 will either be a net emitter (positively luminescent) or a net absorber (negatively luminescent) of IR radiation. The mode of operation depends on whether the LED is forward or reverse biased. The intensity of IR radiation emitted (or absorbed) is dependent on the strength of current flowing. The IR LED 20 is calibrated so that for any particular value of current flowing and any sense of biasing the intensity of IR radiation emitted or absorbed by the IR LED is known.
- the Peltier device 22 serves to hold the temperature of the IR LED stable at the temperature at which its IR emission was calibrated. In this way the IR LED 20 acts as a calibrated variable-intensity source or sink for IR radiation.
- This IR flux can equivalently be regarded as that emanating from, or absorbed by, a body at a particular (nonequilibrium) temperature T. It is not strictly necessary to use a Peltier device 22 to stabilise the temperature of the IR LED. All that is required is that the IR flux is maintained at a level appropriate to the temperature simulation required. In an alternative embodiment this is done by implementing an electronic feedback mechanism which adjusts the current through the IR LED in response to a direct measurement of the LED temperature.
- the detector array 14 receives radiation from the IR LED 20 when the mirror M1 is in position P cal .
- a known IR flux emitted by the LED 20 is passed by the lens L2 and reflected by the mirror M1 at P cal to the detector array 14.
- the known flux emitted from the IR LED 20, say F 1 . is assumed to then be incident on each detector of the array 14.
- S ln' from the n th detector is interpreted as the response to F 1 .
- the current through the IR LED 20 is adjusted to a variety of strengths in forward and reverse biasing directions. This provides for further reference fluxes. F 2 , F 3 , F 4 , etc. to be directed onto the detector array.
- the time in which the IR LED stabilises at a new flux value is less than a second, a response which compares very favourably with alternative methods of variable flux provision e.g. a cooled/heated reference plane for which temperature control (equivalently, flux control) is provided by a Peltier cooler/heater.
- Similar sets of simultaneous equations are derived and solved for each of the N detectors in the array with the aid of a computer.
- the analogue detector signals are first converted into a digital representation and a computer is used to set up and solve the N series of i max equations.
- the N sets of values a n , b n , c n , d n , etc. are then stored in the computer memory for later use in applying the uniformity correction.
- the mirror M1 is pivoted to position P obs . Radiation from the scene is then focused onto the detector array 14 and the output electronic signal from each detector in the array is recorded. This yields N signals which are then converted into N uniformity-corrected IR flux values using the a n , b n , c n , d n , etc.
- Equation (3) coefficients from Equation ( 2 ) to perform the calculation shown in Equation (3)
- F n obs a n + b n ⁇ s n obs + c n ⁇ s n obs 2 + d n ⁇ s n obs 3 + ...
- the superscript obs indicates that the signals are measured while the system is in observation mode and the flux derived is hence the IR flux incident on the n th detector.
- the IR radiation intensity incident on the n th detector at array position D n is displayed visually on a display screen at pixel position P n .
- the N values of F n obs are thus used to construct a thermal image with reduced fixed pattern noise.
- the relationship between the signal response of a detector and the incident flux necessary to produce that response can be graphically represented by a curve covering the range of detector operation.
- the method of obtaining the constants a, b. c. d, .... outlined above amounts to fixing a few discrete points on this curve (reference fluxes) and fitting these points to a polynomial function in order to interpolate for intermediate values.
- an approximation to the true curve is derived and used to calculate incident flux (F n obs ) from a. measured detector signal response (S n obs ).
- the greater the number of discrete points that are actually measured on this curve then the more accurate are the points derived by interpolation.
- the system 10 may be employed with periodic updating of the calibration coefficients a n . b n , c n d n , etc. Observations of the scene are interrupted, the mirror M1 is pivoted to position P cal and calibration measurements are quickly taken. The mirror M1 is then returned to position P obs and the scene measurements continued using the updated values of the coefficients. Updates can in this way be carried out frequently and so reduce inaccuracies arising from drift of detector parameters.
- the computer 28 stores the minimum and maximum values of the signals s n obs registered by any detector in the array 14 while the imaging system 10 is in observation mode. It then controls the current input into the IR LED 20 in order to provide two reference fluxes. One such flux results in a signal response at or near to the maximum value of S n obs and the other is that which gives rise to the minimum response. Further reference fluxes are then produced from intermediate values of current through the LED 20. After the first calibration the computer converts all the s n obs to flux values and thus adjusts the IR LED to reproduce the flux intensities incident on the detector array in preference to the signal response. In this way the coefficients a m b n , C n , d n , etc are calculated to reproduce (to a close approximation) the actual relationship between incident flux and measured electronic signal over the temperature range of relevance to the observed scene.
- the invention is equally adapted to incorporation in a non-imaging thermal detection system.
- the display 30 is absent and the computer 28 is arranged to drive a response in accordance with the characteristics of the output signals S in , S n obs of the detector array 14 .
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Chemical & Material Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Physics & Mathematics (AREA)
- Radiation Pyrometers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9515682 | 1995-07-31 | ||
GB9515682A GB2303988A (en) | 1995-07-31 | 1995-07-31 | Thermal imaging system with detector array calibration mode |
PCT/GB1996/001805 WO1997005742A1 (en) | 1995-07-31 | 1996-07-29 | Thermal sensing system having a fast response calibration device |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0842581A1 EP0842581A1 (en) | 1998-05-20 |
EP0842581B1 true EP0842581B1 (en) | 2008-03-26 |
Family
ID=10778540
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP96925850A Expired - Lifetime EP0842581B1 (en) | 1995-07-31 | 1996-07-29 | Thermal sensing system having a fast response calibration device |
Country Status (10)
Families Citing this family (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2319141B (en) * | 1995-10-02 | 2000-03-08 | Secr Defence | Thermal imaging system |
GB2314227B (en) * | 1996-06-14 | 1998-12-23 | Simage Oy | Calibration method and system for imaging devices |
DE19715983C1 (de) * | 1997-04-17 | 1998-09-24 | Aeg Infrarot Module Gmbh | Verfahren zum Korrigieren der Grauwerte von Bildern einer digitalen Infrarot-Kamera |
DE69807096T2 (de) * | 1997-09-26 | 2003-03-20 | Qinetiq Ltd., London | Sensorvorrichtung |
US6864916B1 (en) | 1999-06-04 | 2005-03-08 | The Trustees Of Columbia University In The City Of New York | Apparatus and method for high dynamic range imaging using spatially varying exposures |
US7084905B1 (en) | 2000-02-23 | 2006-08-01 | The Trustees Of Columbia University In The City Of New York | Method and apparatus for obtaining high dynamic range images |
US6728016B1 (en) | 2000-06-05 | 2004-04-27 | Calient Networks, Inc. | Safe procedure for moving mirrors in an optical cross-connect switch |
US6587611B1 (en) | 2000-06-06 | 2003-07-01 | Calient Networks, Inc. | Maintaining path integrity in an optical switch |
GB0205482D0 (en) | 2002-03-08 | 2002-04-24 | Bae Systems Plc | Improvements in or relating to infra red camera calibration |
US6737639B2 (en) * | 2002-03-27 | 2004-05-18 | Raytheon Company | Display uniformity calibration system and method for a staring forward looking infrared sensor |
SE0301137D0 (sv) | 2003-04-16 | 2003-04-16 | Saab Ab | Optiskt system samt ett målsökande system innefattande ett optiskt system |
US7433097B2 (en) * | 2003-04-18 | 2008-10-07 | Hewlett-Packard Development Company, L.P. | Optical image scanner with moveable calibration target |
WO2004097389A2 (en) | 2003-04-25 | 2004-11-11 | Land Instruments International Limited | Thermal imaging system and method |
US7071462B2 (en) * | 2003-06-16 | 2006-07-04 | Raytek Corporation | Calibration system and method to correct distortion of thermal images from in-line and rotary thermoforming machines |
DE10340515B4 (de) * | 2003-09-03 | 2007-04-19 | Carl Zeiss Optronics Gmbh | Verfahren und Einrichtung zur Inhomogenitätskorrektur und Kalibrierung von optronischen Kameras mit Hilfe aufgenommener Bilder und Darstellen physikalischer Größen |
US7081614B2 (en) * | 2004-05-21 | 2006-07-25 | Raytheon Company | Optical sensor system with built-in optical test capability |
US7880777B2 (en) * | 2005-05-26 | 2011-02-01 | Fluke Corporation | Method for fixed pattern noise reduction in infrared imaging cameras |
JP4806584B2 (ja) * | 2006-04-27 | 2011-11-02 | 富士通セミコンダクター株式会社 | 画像処理方法及び画像処理回路 |
US7924728B2 (en) | 2006-08-25 | 2011-04-12 | Raytheon Bbn Technologies Corp | Systems and methods for energy-conscious communication in wireless ad-hoc networks |
US8240912B2 (en) * | 2008-08-15 | 2012-08-14 | Fluke Corporation | Multi-zone non-contact spot thermometer |
US8376610B2 (en) * | 2008-09-09 | 2013-02-19 | Fluke Corporation | Automated self calibration in optical detectors |
JP2013509820A (ja) | 2009-10-28 | 2013-03-14 | ザ トラスティーズ オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク | 符号化ローリングシャッタの方法およびシステム |
US9108338B2 (en) * | 2011-04-13 | 2015-08-18 | Align Technology, Inc. | Methods and systems for thermal forming an object |
US9083946B2 (en) * | 2012-02-21 | 2015-07-14 | Rockwell Automation Technologies, Inc. | System to detect failed pixels in a sensor array |
US9024253B2 (en) * | 2012-08-21 | 2015-05-05 | Raytheon Company | Calibration system for detector |
FR3000789B1 (fr) * | 2013-01-09 | 2015-02-27 | Thales Sa | Pointe avant d'aeronef avec dispositif de calibration d'un detecteur ir et procede de calibration |
US20140267758A1 (en) * | 2013-03-15 | 2014-09-18 | Pelco, Inc. | Stereo infrared detector |
US10057509B2 (en) * | 2014-05-30 | 2018-08-21 | Flir Systems, Inc. | Multiple-sensor imaging system |
JP5915949B2 (ja) * | 2014-06-25 | 2016-05-11 | パナソニックIpマネジメント株式会社 | 投影システム |
CN105092046B (zh) * | 2015-05-15 | 2018-10-30 | 中国计量科学研究院 | 一种自校准地表红外辐射测温系统 |
KR20170003359U (ko) | 2016-03-18 | 2017-09-27 | 이지혜 | 척추 교정 벨트 |
US10263330B2 (en) * | 2016-05-26 | 2019-04-16 | Nokia Solutions And Networks Oy | Antenna elements and apparatus suitable for AAS calibration by selective couplerline and TRX RF subgroups |
KR101947256B1 (ko) * | 2017-03-06 | 2019-02-12 | 동의대학교 산학협력단 | 고온계측이 가능한 교정곡선 산출 방법 |
KR101863498B1 (ko) * | 2017-04-04 | 2018-05-31 | 동의대학교 산학협력단 | 고온계측이 가능한 교정곡선 산출 시스템 |
KR101846017B1 (ko) * | 2017-09-18 | 2018-04-05 | 엘아이지넥스원 주식회사 | 노이즈 영상 생성 장치 및 방법 |
CN108254083B (zh) * | 2018-01-18 | 2019-06-14 | 武汉格物优信科技有限公司 | 一种红外图像固定图案噪声抑制和评估方法 |
RU2729946C1 (ru) * | 2019-11-20 | 2020-08-13 | Российская Федерация, от имени которой выступает Государственная корпорация по космической деятельности "РОСКОСМОС" | Способ полетной абсолютной радиометрической калибровки с использованием зондирующего сигнала |
US11614365B1 (en) | 2021-04-13 | 2023-03-28 | Bae Systems Information And Electronic Systems Integration Inc. | Luminescent cold shield paneling for infrared camera continuous non-uniformity correction |
DE102023002291A1 (de) * | 2023-06-06 | 2024-12-12 | Diehl Defence Gmbh & Co. Kg | Suchkopfmesssystem und Messverfahren zur optischen Vermessung eines Suchkopfs |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4419692A (en) * | 1981-12-31 | 1983-12-06 | Texas Medical Instruments, Inc. | High speed infrared imaging system |
US4789788A (en) * | 1987-01-15 | 1988-12-06 | The Boeing Company | Optically pumped radiation source |
US5023459A (en) * | 1987-04-17 | 1991-06-11 | Ford Aerospace & Communications Corporation | Miniature multi-temperature radiometric reference |
US4948964A (en) * | 1988-01-14 | 1990-08-14 | Texas Instruments Incorporated | Artificial target for automatic gain normalization |
DE3836294A1 (de) * | 1988-10-25 | 1990-04-26 | Eltro Gmbh | Waermebildgeraet mit detektorausgleich |
US5302824A (en) * | 1992-12-01 | 1994-04-12 | Hughes Aircraft Company | Measurement of relative detector gain |
CA2110368C (en) * | 1992-12-07 | 1999-11-23 | Gary M. Lindgren | Wide dynamic range non-uniformity compensation for infrared focal plane arrays |
US5354987A (en) * | 1992-12-07 | 1994-10-11 | Texas Instruments Incorporated | Calibrating focal plane arrays using multiple variable radiometric sources |
US5343040A (en) * | 1993-06-10 | 1994-08-30 | Martin Marietta Corporation | Thermal reference technique for flir sensors |
US5820261A (en) * | 1995-07-26 | 1998-10-13 | Applied Materials, Inc. | Method and apparatus for infrared pyrometer calibration in a rapid thermal processing system |
-
1995
- 1995-07-31 GB GB9515682A patent/GB2303988A/en not_active Withdrawn
-
1996
- 1996-07-29 KR KR10-1998-0700775A patent/KR100402194B1/ko not_active Expired - Fee Related
- 1996-07-29 PL PL96324754A patent/PL181075B1/pl not_active IP Right Cessation
- 1996-07-29 WO PCT/GB1996/001805 patent/WO1997005742A1/en active IP Right Grant
- 1996-07-29 EP EP96925850A patent/EP0842581B1/en not_active Expired - Lifetime
- 1996-07-29 CN CNB961959649A patent/CN1196321C/zh not_active Expired - Fee Related
- 1996-07-29 JP JP9507344A patent/JP2000500226A/ja active Pending
- 1996-07-29 DE DE69637471T patent/DE69637471T2/de not_active Expired - Lifetime
- 1996-07-29 US US08/983,349 patent/US6127679A/en not_active Expired - Lifetime
- 1996-07-29 CA CA002226495A patent/CA2226495C/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1192313A (zh) | 1998-09-02 |
GB9515682D0 (en) | 1995-09-27 |
WO1997005742A1 (en) | 1997-02-13 |
EP0842581A1 (en) | 1998-05-20 |
PL324754A1 (en) | 1998-06-08 |
PL181075B1 (pl) | 2001-05-31 |
KR100402194B1 (ko) | 2004-02-11 |
GB2303988A (en) | 1997-03-05 |
KR19990036107A (ko) | 1999-05-25 |
US6127679A (en) | 2000-10-03 |
DE69637471D1 (de) | 2008-05-08 |
DE69637471T2 (de) | 2009-04-16 |
CA2226495A1 (en) | 1997-02-13 |
CN1196321C (zh) | 2005-04-06 |
JP2000500226A (ja) | 2000-01-11 |
CA2226495C (en) | 2005-03-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0842581B1 (en) | Thermal sensing system having a fast response calibration device | |
US6610984B2 (en) | Method and apparatus for correction of microbolometer output | |
US7235785B2 (en) | Imaging device with multiple fields of view incorporating memory-based temperature compensation of an uncooled focal plane array | |
US6690013B2 (en) | Apparatus and method for compensating for pixel non-uniformity in a bolometer | |
US7105818B2 (en) | Microbolometer focal plane array with temperature compensated bias | |
US6444983B1 (en) | Microbolometer focal plane array with controlled bias | |
US6274869B1 (en) | Digital offset corrector | |
US6476392B1 (en) | Method and apparatus for temperature compensation of an uncooled focal plane array | |
US6630674B2 (en) | Method and apparatus for correction of microbolometer output | |
US5354987A (en) | Calibrating focal plane arrays using multiple variable radiometric sources | |
JP2014157156A (ja) | 抵抗型イメージングボロメータを具備した赤外線放射検出用デバイス、そのようなボロメータのアレイを具備したシステム、及びそのようなシステムに一体化されたイメージングボロメータの補正方法 | |
EP1279011A2 (en) | Methods and apparatus for compensating a radiation sensor for temperature variations of the sensor | |
US8426820B2 (en) | Image sensor system | |
JP7143558B2 (ja) | 赤外線撮像装置及びそれに用いられるプログラム | |
US20020125430A1 (en) | Bolometer operation using fast scanning | |
EP0880853A1 (en) | Thermal imaging system | |
RU2324152C1 (ru) | Способ термографирования и устройство для его осуществления | |
RU2755093C1 (ru) | Способ градуировки приборов тепловизионных и устройство для его осуществления | |
Young et al. | Ground test characterization of the Multiband Imaging Photometer for SIRTF (MIPS) | |
WO2001071299A2 (en) | Method and apparatus for correction of microbolometer output | |
Briles et al. | Significant improvement in IR surface-temperature measurements | |
Kiyota | Operating temperature compensation for LAIRD S-270 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 19971212 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): CH DE ES FR GB IT LI NL SE |
|
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: QINETIQ LIMITED |
|
17Q | First examination report despatched |
Effective date: 20040204 |
|
GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
|
GRAS | Grant fee paid |
Free format text: ORIGINAL CODE: EPIDOSNIGR3 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): CH DE ES FR GB IT LI NL SE |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
REF | Corresponds to: |
Ref document number: 69637471 Country of ref document: DE Date of ref document: 20080508 Kind code of ref document: P |
|
REG | Reference to a national code |
Ref country code: SE Ref legal event code: TRGR |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: ES Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20080707 |
|
ET | Fr: translation filed | ||
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
26N | No opposition filed |
Effective date: 20081230 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080731 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080731 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20080326 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: NL Payment date: 20090730 Year of fee payment: 14 |
|
REG | Reference to a national code |
Ref country code: NL Ref legal event code: V1 Effective date: 20110201 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20110201 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20121211 Year of fee payment: 17 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20121220 Year of fee payment: 17 Ref country code: SE Payment date: 20121220 Year of fee payment: 17 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20130205 Year of fee payment: 17 |
|
REG | Reference to a national code |
Ref country code: SE Ref legal event code: EUG |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20130729 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R119 Ref document number: 69637471 Country of ref document: DE Effective date: 20140201 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST Effective date: 20140331 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20140201 Ref country code: SE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20130730 Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20130729 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20130731 |