EP0451350B1 - Contact detecting device for positioning relatively movable elements - Google Patents
Contact detecting device for positioning relatively movable elements Download PDFInfo
- Publication number
- EP0451350B1 EP0451350B1 EP90123566A EP90123566A EP0451350B1 EP 0451350 B1 EP0451350 B1 EP 0451350B1 EP 90123566 A EP90123566 A EP 90123566A EP 90123566 A EP90123566 A EP 90123566A EP 0451350 B1 EP0451350 B1 EP 0451350B1
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- EP
- European Patent Office
- Prior art keywords
- voltage
- contact
- detecting device
- signal
- contact detecting
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H7/00—Processes or apparatus applicable to both electrical discharge machining and electrochemical machining
- B23H7/02—Wire-cutting
- B23H7/06—Control of the travel curve of the relative movement between electrode and workpiece
- B23H7/065—Electric circuits specially adapted therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H2500/00—Holding and positioning of tool electrodes
- B23H2500/20—Methods or devices for detecting wire or workpiece position
Definitions
- the present invention relates to a contact detecting device for detecting a contact between a work and a machine element in an electric discharge machine. Furthermore, the present invention relates to a method for detecting such a contact. Said device and method operate by analyzing voltage variations of a detection voltage applied to a gap between said work and said machine element.
- the present invention relates to a contact detecting device of the type specified in the preamble of claim 1, and to a contact detecting method of the type specified in the preamble part of claim 18.
- the invention finds specific application in the positioning of a tool electrode with respect to a workpiece, for use with a machine tool such as an electric discharge machining system (hereinafter referred to as an "EDM").
- EDM electric discharge machining system
- the invention as exemplified in the embodiments herein described concerns a contact detecting device for judging the relative position of a wire electrode and a workpiece on the basis of a predetermined reference contact point.
- the tool electrode and the workpiece are moved relative to each other to bring a reference surface of the workpiece and a surface of the tool electrode into contact with each other to establish the reference contact point.
- an EDM for cutting a workpiece with electrical discharge generated between an electrode and the workpiece
- the cutting proceeds by changing the relative positions of the electrode and the workpiece in accordance with the commands of a numerical control ("NC") unit.
- NC numerical control
- the relative positions of the electrode and the workpiece must be precisely maintained in order to provide high cutting accuracy.
- contact detecting devices for use with an EDM have been developed. Such devices have a contact position determining function that detects a point of contact between the electrode and the workpiece to subsequently determine the relative positions thereof. This device requires that the electrode and the workpiece be moved into direct contact with each other.
- a prior art contact detecting device applied to a wirecut EDM for cutting a workpiece (hereinafter referred to as the "work") with a wire electrode (hereinafter referred to as the "wire”) is illustrated in Figure 7, where wire 1 is provided with cutting power from power supply 3.
- a work 2 is positioned with respect to the wire by a movable table 40, operated by orthogonal positioning motors 42 (x-direction) and 43 (y-direction) under control of a numerical controller 41.
- the wire 1 is connected by a first electrode to the cutting power supply 3 and receives a discharge current in order to effect a cut.
- the wire 1 also is connected by a second electrode to a diode 30, located in series with resistors 31 and 32, followed by a comparator 33.
- the work 2 is EDMed by applying a pulsed voltage of approximately -100V, for example, to the wire 1 from the cutting power supply 3.
- a pulsed voltage of approximately -100V for example
- the voltage applied to the wire 1 is blocked by the diode 30 which keeps the comparator 33 from receiving the voltage.
- a low d.c. voltage -V e.g., -5V to -15V
- This low voltage may be applied during movement of the wire 1 and the work 2 relative to each other and into contact with each other.
- Contact of the wire 1 and the work 2 changes the input to the comparator 33. If this change is compared with a reference voltage V L , the result of the comparison can be used to detect the contact of the wire 1 and the work 2, to thereby judge the relative positions of the wire 1 and the work 2.
- FIG. 8 illustrates a device disclosed in JP-A-60 29 246.
- This publication generally describes a wirecut EDM equipped with a contact detecting device of the type as specified in the preamble part of claim 1, for applying a voltage across a gap between the wire 1 and the work 2 (hereinafter referred to as the "gap") and detecting the contact of the wire 1 and the work 2 in accordance with the voltage variations at the gap.
- a moving table 40 mounts the work 2 and is movable in X-axis and Y-axis directions.
- An NC control unit 41 connects to motors 42, 43 for moving the table 40 in accordance with commands from the NC control unit 41.
- a contact detecting device 4 is operative to judge whether or not the wire 1 and the work 2 are making contact with each other and to send a corresponding signal to the NC control unit 41.
- the work 2 and the moving table 40 are electrically connected to each other.
- the contact detecting device 4 applies a bipolar pulse voltage to the gap for purposes of contact detection.
- the bipolar voltage acts to reduce the occurrence of discharge traces, corrosion, electrolysis, etc., thereby improving the detection accuracy of contact.
- the bipolar pulse voltage to be detected is produced by circuit 5 including a transistor 50, whose gate is connected to a reference oscillation signal 51 for switching the transistor 50 on/off. As transistor 50 is operated, a voltage V+ from a source connected to a collector of transistor 50 is switched across the primary coil of pulse transformer 53.
- a diode 52 is connected across the primary coil of the pulse transformer 53 and a current limiting resistor 54 is connected across the secondary coil of the transformer.
- a switch 55 selectively connects the secondary coil to ground.
- a contact detecting circuit 44 determines if contact has been made at the gap in accordance with the level of the gap voltage and provides a corresponding signal to the NC unit 41.
- the contact detecting circuit 44 comprises an absolute value circuit (ABS) 45 for full wave-rectifying the gap voltage, a filter circuit 46 for smoothing the full wave-rectified voltage, and a comparator 47 for comparing the full wave-rectified and filtered gap voltage with a reference voltage V1 and transmitting a corresponding signal to the NC unit (41).
- ABS absolute value circuit
- Figs. 9A-9F illustrate the contact judging operation of the contact detecting device 4 using voltage waveforms from within the circuit in Fig. 8.
- the switch 55 is closed and the bipolar pulse voltage is applied to the gap by the bipolar pulse voltage generating circuit 5.
- the approaching speeds and approaching directions of the wire 1 and the work 2 are determined and the wire 1 and the work 2 move toward each other.
- the gap voltage is full-wave rectified and smoothed by the contact judging circuit 44.
- the comparator 47 is operative to compare the detected voltage with the predetermined reference voltage V1 and judge whether or not the wire 1 and the work 2 are making contact with each other.
- the full-wave rectified and smoothed gap voltage becomes smaller than the reference voltage V1, as the wire 1 and the work 2 approach and touch each other.
- a signal indicating the occurrence of contact is sent to the NC control unit 41 by the contact judging circuit 44.
- the control unit causes the relative wire and work movement at the gap to stop, and the contact position determining operation is complete.
- Figure 9A shows the "open" and "contact” state of the wire 1 and work 2 over a period of time.
- the gap voltage as seen in Figure 9B, will vary between a positive peak and a negative peak during the contact position determining operation with a crossing point at P1, so long as the transistor 50 is conducting, during period T on .
- the gap voltage is zero.
- the magnitude of the gap voltage during T on is reduced as contact is made between the wire 1 and work 2, since the work is electrically connected to the table 40, which is at a lower voltage as seen in Figure 8.
- the gap voltage changes as the wire 1 and work 2 are brought in and out of contact, and as the transistor 50 is switched ON and OFF.
- the gap voltage is rectified by the absolute value circuit 45 and smoothed by circuit 46 before being applied to the comparator 47.
- the comparator will provide an output only when the filtered gap voltage is less than the reference voltage V1. Once this transition occurs, the contact detecting device judges that the wire 1 and work 2 are in contact, as seen in Figure 9F.
- the judgment of the contact detecting device 44 as to whether or not the wire 1 and the work 2 are making contact with each other includes a delay, due to the absolute value circuit 45 and the filter circuit 46.
- an extremely large time constant must be set for the filter circuit 46 in order to avoid misjudging non-contact as contact during the time when the pulse voltage is not applied (T off ) and the time when the pulse voltage polarity is switched (P1).
- T off time when the pulse voltage is not applied
- P1 the time when the pulse voltage polarity is switched
- an object of the present invention to overcome the disadvantages of the prior art by providing a contact position determining device which will minimize damage to the elements to be contacted.
- the foregoing objects are accomplished in the present invention by providing a contact detecting device according to claim 1 and by providing a method for detecting a contact according to claim 18, respectively.
- the contact detecting device may repeatedly apply an asymmetrical bipolar pulse voltage to a gap between a tool electrode and a workpiece and may detect contact of the tool electrode and the workpiece in accordance with a change in the asymmetrical bipolar pulse voltage, the voltage being provided by a low-duty, asymmetrical bipolar pulse voltage generating current.
- the contact detecting device further may comprise a contact judging circuit for detecting the high-peak level of an asymmetrical bipolar pulse voltage applied to the gap in synchronization with a cycle of the asymmetrical bipolar pulse voltage and for judging whether or not the tool electrode and the workpiece are making contact with each other.
- Fig. 1 is a circuit diagram of a contact detecting device for use with a wirecut EDM according to one embodiment of the present invention.
- Fig. 2 is a circuit diagram illustrating one embodiment of faulty pulse detecting means of the contact detecting device of the present invention.
- Figs. 3A-3G are operation diagrams and waveforms of the embodiment of the present invention illustrated in Figs. 1 and 2.
- Fig. 4 is a circuit diagram illustrating another embodiment of an interface of the faulty pulse detecting means of the present invention.
- Fig. 5 is a circuit diagram illustrating another embodiment of a signal forming portion of the faulty pulse detecting means of the present invention.
- Figs. 6A-6F are operation diagrams and waveforms for an embodiment of the present invention.
- Fig. 7 is a circuit diagram of a contact detecting device known in the prior art.
- Fig. 8 is a circuit diagram of another prior art contact detecting device which solves some disadvantages of the prior art shown in Fig. 7.
- Figs. 9A-9F are operation diagrams and waveforms for the prior art circuit shown in Fig. 8.
- Fig. 1 illustrates one embodiment of the present invention and provides a general view of a wirecut EDM equipped with a wire-work contact detecting device.
- like numerals indicate like or corresponding parts in Fig. 8.
- Figure 1 includes a faulty pulse detecting circuit 10, which detects the high-peak level of an asymmetrical bipolar pulse voltage applied to the gap, in synchronization with the cycle of the asymmetrical bipolar pulse voltage, judges whether the wire 1 and the work 2 are making contact with each other, and transmits a corresponding signal to the NC control unit (41).
- Fig. 2 illustrates one embodiment of the faulty pulse detecting circuit 10.
- An interface 11 is used for converting an analog signal applied to the gap into a binary signal.
- a signal forming circuit 12 is used to determine if contact has been made at the gap, in accordance with the gap signal digitized by the interface 11, and to form a binary signal to be transmitted to the NC unit 41.
- a comparator 21 compares the gap voltage, as seen in Figure 3B, with the reference voltage V2 and outputs a binary signal having "high" magnitude Vcc or "low” magnitude 0, as seen in Figure 3C, denoting whether or not the gap voltage exceeds the threshold voltage V2.
- an inverter 22 is used to invert a reference oscillation signal 51A, having a magnitude Vcc, as seen in Figure 3D.
- Signal 51A also controls the on/off switching of transistor 50 in Fig. 1.
- the inverted signal is seen in Figure 3E.
- a flip-flop 23 forms signals identifying contact and non-contact at the gap, in synchronization with the detection pulse, as seen in Figure 3F. Specifically, the output of flip-flop 23 at terminal Q is generated in accordance with the signal inverted by the inverter 22 (input to terminal T) and the signal binarized by the interface 11 (input to terminal D). The flip-flop 23 continues outputting the state of input D until the instant when the next leading edge of input T occurs, as seen in Figures 3E and 3F.
- FIG. 3A-3G illustrate operating conditions and waveforms relevant to the contact position determining operation in a wirecut EDM employing the contact detecting device shown in Figs. 1 and 2.
- the switch 55 is closed.
- a low-duty, asymmetrical bipolar pulse voltage is applied to the gap by the bipolar pulse voltage generating circuit 5A.
- the asymmetrical bipolar pulse voltage is generated on the secondary side of the pulse transformer 53 by applying a single-polar pulse to a combination of the primary side of the pulse transformer 53 and the diode 52.
- the pulse leading edge side i.e., the side on which voltage is not cut by the diode 52, has a high peak value. Approaching speeds and approaching directions of the wire 1 and the work 2 are determined, and movement proceeds.
- the faulty pulse detecting circuit 10 periodically compares the gap voltage, i.e., the high-peak voltage of the asymmetrical bipolar pulse voltage (Fig. 3B), with reference voltage V2 in synchronization with the leading edge of the single-polarity pulse applied to the primary side of the pulse transformer 53. If the actual contact condition of the wire and the work is represented by Figure 3A, then a judgment of the contact detecting device as seen in Figure 3G is desired, showing a relatively minor delay in identifying the contact. To this end, if the high-peak voltage of the asymmetrical bipolar pulse voltage is equal to or less than V2, as seen in Fig. 3B, the comparator fails to produce a pulse in response to the bipolar pulse voltage as seen in Fig. 3C. In the absence of this pulse a signal indicating a contact is sent to the NC unit 41 for the period of the detection pulse cycle only (Fig. 3F). The approaching of the wire 1 and the work 2 is stopped and the contact position determining operation is complete.
- the gap voltage i.e.
- the contact is detected in complete synchronization with the asymmetrical bipolar pulse voltage, and the delay of detection is made less than the period of the detection pulse. Since the determination of the contact is only made at the high peak of the detection pulse applied to the gap, the pulse voltage no-application time T off and the voltage at the low peak of the detection pulse are not a factor. This allows the detection pulse supplied to the gap to have a significantly lower duty. In other words, pulse width T on can be reduced to a value of several ⁇ s or less, which is small as compared to the pulse cycle of up to ten ms or more. Further, the low-peak voltage of the detection pulse can be significantly low as compared to the high-peak voltage.
- the cycle of the detection pulse is another factor having great influence on the generation of damage and detection accuracy. It is assumed that as the pulse cycle becomes longer, the damage is less and the detection delay increases. When a typical table feed rate is used for general positioning, if the pulse cycle is less than about 10msec, an error will rarely result from the delay and any subtle change in the gap may be detected. In addition, since the low peak voltage of the detection pulse can be held at a low level, the high-peak voltage can be increased to a relatively high level and the large voltage difference at the gap between an open gap and contact allows contact to be detected with higher sensitivity.
- a negative peak voltage of the asymmetrical bipolar pulse may be applied to the wire 1 instead of a positive peak voltage as in the foregoing embodiment.
- a photocoupler illustrated in Fig. 4 may be utilized.
- a photocoupler 24 includes a transistor 24b that is connected to a voltage V cc and is on/off controlled in accordance with the value of the current flowing in a diode 24b.
- a diode 25 serves to protect the photocoupler 24 from the application of excessive reverse voltage.
- a variable resistor 26 is used for controlling the current flowing in the diode 24a of the photocoupler 24 and determining a gap voltage value for changing the on/off state of the transistor 24b in the photocoupler 24.
- a resistor 27 connects the photocoupler transistor 24b to ground.
- the transistor 24b of the photocoupler 24 is switched ON when the value of the current flowing in the diode 24a of the photocoupler 24 is greater than I2, and the transistor is switched OFF when the value is smaller than I2, the resistance value of the variable resistor 26 is V2/I2. Then, a "high” signal appears at the output line 28 when the gap voltage value is greater than V2, a “low” signal appears at 28 when the value is smaller than V2, and the relationship between the gap voltage and the signal transmitted to the signal forming circuit 12 is the same as that shown in Figs. 2 and 3.
- a one-shot circuit 29 illustrated in Fig. 5 also may be utilized.
- output Q is switched high when a leading edge signal enters input T and is held high for a predetermined period of time (T H ).
- T H has elasped, output Q is switched low and held low until the leading edge signal enters input T again. If the leading edge signal enters input T when output Q is high, output Q is held high for T H from that instant. Therefore, contact at the gap can be detected in synchronization with the cycle of the detection pulse without the input of a reference oscillation signal 3. Since the signal holding time T H may be set to any value, a T H value slightly longer than the detection pulse cycle will provide substantially equivalent operation to that shown in Figs. 2 and 3.
- the addition of another one-shot circuit to a subsequent stage of the faulty pulse detecting circuit 10 will retain the signal sent to the NC unit 41 at the time of a state change for a period several times longer than the period of the detection pulse applied to the gap.
- the speed of contact judgment may be lowered without varying the duty, frequency, peak voltage, etc. of the detection pulse, and contact/non-contact judgment may be avoided for subtle state changes in the gap.
- Additional one shot circuits may be placed in series where vibration is excessive.
- FIGs. 6A-6G illustrate timing diagrams and operation charts for a circuit having a one-shot circuit at a subsequent stage of the faulty pulse detecting circuit 10, with a signal holding time T H twice as long as the period T1 of the asymmetrical alternating-current pulse voltage.
- Figure 6A identifies the actual contact condition of the wire and the work while Figure 6B illustrates the gap voltage, Figure 6C the comparator output from circuit 11 and Figure 6D the output from circuit 12.
- the present invention may be used as a contact detector in an engraving EDM in addition to the wirecut EDM as described previously. Moreover, the invention may be applied to any other device requiring contact detection, so long as contact is detectable by electrical means.
- the present invention can achieve a contact detecting device which will minimize damage to the contacting elements by applying a low-duty, asymmetrical bipolar pulse voltage to the gap between the elements, detecting the high-peak level of an asymmetrical bipolar pulse voltage by means of faulty pulse detecting means, and judging from the detection whether or not the elements are making contact with each other.
- the invention also lowers significantly the reduction of contact positioning accuracy by eliminating the occurrence of detection delay.
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- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
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Description
- The present invention relates to a contact detecting device for detecting a contact between a work and a machine element in an electric discharge machine. Furthermore, the present invention relates to a method for detecting such a contact. Said device and method operate by analyzing voltage variations of a detection voltage applied to a gap between said work and said machine element.
- More specifically, the present invention relates to a contact detecting device of the type specified in the preamble of claim 1, and to a contact detecting method of the type specified in the preamble part of claim 18.
- The invention finds specific application in the positioning of a tool electrode with respect to a workpiece, for use with a machine tool such as an electric discharge machining system (hereinafter referred to as an "EDM"). In particular, the invention as exemplified in the embodiments herein described concerns a contact detecting device for judging the relative position of a wire electrode and a workpiece on the basis of a predetermined reference contact point. The tool electrode and the workpiece are moved relative to each other to bring a reference surface of the workpiece and a surface of the tool electrode into contact with each other to establish the reference contact point.
- Generally, in an EDM for cutting a workpiece with electrical discharge generated between an electrode and the workpiece, the cutting proceeds by changing the relative positions of the electrode and the workpiece in accordance with the commands of a numerical control ("NC") unit. The relative positions of the electrode and the workpiece must be precisely maintained in order to provide high cutting accuracy. To satisfy such a requirement, contact detecting devices for use with an EDM have been developed. Such devices have a contact position determining function that detects a point of contact between the electrode and the workpiece to subsequently determine the relative positions thereof. This device requires that the electrode and the workpiece be moved into direct contact with each other.
- A prior art contact detecting device applied to a wirecut EDM for cutting a workpiece (hereinafter referred to as the "work") with a wire electrode (hereinafter referred to as the "wire") is illustrated in Figure 7, where wire 1 is provided with cutting power from
power supply 3. Awork 2 is positioned with respect to the wire by a movable table 40, operated by orthogonal positioning motors 42 (x-direction) and 43 (y-direction) under control of anumerical controller 41. The wire 1 is connected by a first electrode to thecutting power supply 3 and receives a discharge current in order to effect a cut. The wire 1 also is connected by a second electrode to adiode 30, located in series withresistors comparator 33. - In the prior art device shown in Fig. 7, the
work 2 is EDMed by applying a pulsed voltage of approximately -100V, for example, to the wire 1 from thecutting power supply 3. During this EDMing operation, the voltage applied to the wire 1 is blocked by thediode 30 which keeps thecomparator 33 from receiving the voltage. In positioning the wire 1 and thework 2, a low d.c. voltage -V (e.g., -5V to -15V) is applied to wire 1 via theresistors diode 30 and the second electrode. This low voltage may be applied during movement of the wire 1 and thework 2 relative to each other and into contact with each other. Contact of the wire 1 and thework 2 changes the input to thecomparator 33. If this change is compared with a reference voltage VL, the result of the comparison can be used to detect the contact of the wire 1 and thework 2, to thereby judge the relative positions of the wire 1 and thework 2. - In the prior art device, however, corrosion may occur at a contact surface of the
work 2 when the wire 1 and thework 2 are brought into contact with each other and a low voltage is applied. Since the wire 1 and thework 2 are contacted with each other several times in order to judge their relative position, a significant amount of corrosion will be generated on the contact surface of thework 2. This corrosion will reduce the accuracy of the measurement and reduce repeatability. If there is corrosion, the change in voltage input to thecomparator 33 as a result of a contact will be delayed because the layer of oxide built up by the corrosion will act as an insulator. As a result of the delay, thework 2 will be in contact with the wire 1 for a period longer than desired, and contact will not be detected until after it has occurred, leading to inaccuracy in the contact position detection. - This problem is particularly acute when water is used as a dielectric. In a wirecut EDM employing water as the EDMing dielectric, if positioning is effected in the water or with water drops on the wire 1 and/or the
work 2, corrosion rapidly occurs on the contact surface(s). If this corrosion causes the wire 1 to rest for an extended period against thewire 2, due to the delay in detecting a voltage change, the contact surface(s) will be damaged by electrolysis and the water will become ionized. Also, as the corrosion increases and/or electrolysis occurs and the delay is changed, there is a further reduction in repeatability. - A device for resolving the disadvantages of the prior art system is shown in Fig. 8, which illustrates a device disclosed in JP-A-60 29 246. This publication generally describes a wirecut EDM equipped with a contact detecting device of the type as specified in the preamble part of claim 1, for applying a voltage across a gap between the wire 1 and the work 2 (hereinafter referred to as the "gap") and detecting the contact of the wire 1 and the
work 2 in accordance with the voltage variations at the gap. A moving table 40 mounts thework 2 and is movable in X-axis and Y-axis directions. An NCcontrol unit 41 connects tomotors control unit 41. Acontact detecting device 4 is operative to judge whether or not the wire 1 and thework 2 are making contact with each other and to send a corresponding signal to theNC control unit 41. Thework 2 and the moving table 40 are electrically connected to each other. - The
contact detecting device 4 applies a bipolar pulse voltage to the gap for purposes of contact detection. The bipolar voltage acts to reduce the occurrence of discharge traces, corrosion, electrolysis, etc., thereby improving the detection accuracy of contact. The bipolar pulse voltage to be detected is produced bycircuit 5 including atransistor 50, whose gate is connected to areference oscillation signal 51 for switching thetransistor 50 on/off. Astransistor 50 is operated, a voltage V⁺ from a source connected to a collector oftransistor 50 is switched across the primary coil ofpulse transformer 53. Adiode 52 is connected across the primary coil of thepulse transformer 53 and a current limitingresistor 54 is connected across the secondary coil of the transformer. Aswitch 55 selectively connects the secondary coil to ground. Acontact detecting circuit 44 determines if contact has been made at the gap in accordance with the level of the gap voltage and provides a corresponding signal to theNC unit 41. Thecontact detecting circuit 44 comprises an absolute value circuit (ABS) 45 for full wave-rectifying the gap voltage, afilter circuit 46 for smoothing the full wave-rectified voltage, and a comparator 47 for comparing the full wave-rectified and filtered gap voltage with a reference voltage V₁ and transmitting a corresponding signal to the NC unit (41). - The contact position determining operation conducted by means of the contact detecting device of the prior art can be understood with reference to Figs. 9A-9F, which illustrate the contact judging operation of the
contact detecting device 4 using voltage waveforms from within the circuit in Fig. 8. - Referring to Figure 8, when a command to request the contact position determining operation is transmitted to the
NC control unit 41, theswitch 55 is closed and the bipolar pulse voltage is applied to the gap by the bipolar pulsevoltage generating circuit 5. The approaching speeds and approaching directions of the wire 1 and thework 2 are determined and the wire 1 and thework 2 move toward each other. At this time, the gap voltage is full-wave rectified and smoothed by thecontact judging circuit 44. The comparator 47 is operative to compare the detected voltage with the predetermined reference voltage V₁ and judge whether or not the wire 1 and thework 2 are making contact with each other. The full-wave rectified and smoothed gap voltage becomes smaller than the reference voltage V₁, as the wire 1 and thework 2 approach and touch each other. When this occurs, a signal indicating the occurrence of contact is sent to theNC control unit 41 by thecontact judging circuit 44. The control unit causes the relative wire and work movement at the gap to stop, and the contact position determining operation is complete. - Figure 9A shows the "open" and "contact" state of the wire 1 and work 2 over a period of time. The gap voltage, as seen in Figure 9B, will vary between a positive peak and a negative peak during the contact position determining operation with a crossing point at P1, so long as the
transistor 50 is conducting, during period Ton. When thetransistor 50 is not conducting during period Toff, the gap voltage is zero. As seen by a comparison of Figs. 9A and 9B, the magnitude of the gap voltage during Ton is reduced as contact is made between the wire 1 andwork 2, since the work is electrically connected to the table 40, which is at a lower voltage as seen in Figure 8. The gap voltage changes as the wire 1 andwork 2 are brought in and out of contact, and as thetransistor 50 is switched ON and OFF. - As seen in Figures 9C and 9D, respectively, the gap voltage is rectified by the
absolute value circuit 45 and smoothed bycircuit 46 before being applied to the comparator 47. - As seen from Figure 9E, the comparator will provide an output only when the filtered gap voltage is less than the reference voltage V₁. Once this transition occurs, the contact detecting device judges that the wire 1 and
work 2 are in contact, as seen in Figure 9F. - However, as compared to actual gap changes, the judgment of the
contact detecting device 44 as to whether or not the wire 1 and thework 2 are making contact with each other includes a delay, due to theabsolute value circuit 45 and thefilter circuit 46. In particular, an extremely large time constant must be set for thefilter circuit 46 in order to avoid misjudging non-contact as contact during the time when the pulse voltage is not applied (Toff) and the time when the pulse voltage polarity is switched (P1). As a result, it is impossible to accurately and reliably judge subtle changes of the gap state, and it is inevitable that the wire will contact the work for some time before contact is detected, with the consequent disadvantages. - In order to decrease the time constants of the
absolute value circuit 45 andfilter circuit 46, for purposes of reducing the delay in contact determination, it is necessary to shorten the period Toff of thepulse voltage 51 and to reduce the peak to peak voltage thereof. But in such case, the duty of the detection pulse is high, the positive and negative sides of the bipolar pulse are nearly symmetrical, and a large current will flow due to electrolysis in water when the wire 1 andwork 2 are adjacent to or in contact with each other. As a result, the wire 1 andwork 2 will be damaged, resulting in poor positioning repeatability and unreliable contact detection. - A highly similar prior art circuit is shown in US-A-4,654,497.
- It is, accordingly, an object of the present invention to overcome the disadvantages of the prior art by providing a contact position determining device which will minimize damage to the elements to be contacted.
- It is another object of the present invention to provide a contact position determining device that will ensure high detection sensitivity.
- It is a further object of the present invention to provide a contact position determining device that will enable precision positioning at the time of contact position determination.
- The foregoing objects are accomplished in the present invention by providing a contact detecting device according to claim 1 and by providing a method for detecting a contact according to claim 18, respectively. The contact detecting device may repeatedly apply an asymmetrical bipolar pulse voltage to a gap between a tool electrode and a workpiece and may detect contact of the tool electrode and the workpiece in accordance with a change in the asymmetrical bipolar pulse voltage, the voltage being provided by a low-duty, asymmetrical bipolar pulse voltage generating current.
- The contact detecting device further may comprise a contact judging circuit for detecting the high-peak level of an asymmetrical bipolar pulse voltage applied to the gap in synchronization with a cycle of the asymmetrical bipolar pulse voltage and for judging whether or not the tool electrode and the workpiece are making contact with each other.
- Fig. 1 is a circuit diagram of a contact detecting device for use with a wirecut EDM according to one embodiment of the present invention.
- Fig. 2 is a circuit diagram illustrating one embodiment of faulty pulse detecting means of the contact detecting device of the present invention.
- Figs. 3A-3G are operation diagrams and waveforms of the embodiment of the present invention illustrated in Figs. 1 and 2.
- Fig. 4 is a circuit diagram illustrating another embodiment of an interface of the faulty pulse detecting means of the present invention.
- Fig. 5 is a circuit diagram illustrating another embodiment of a signal forming portion of the faulty pulse detecting means of the present invention.
- Figs. 6A-6F are operation diagrams and waveforms for an embodiment of the present invention.
- Fig. 7 is a circuit diagram of a contact detecting device known in the prior art.
- Fig. 8 is a circuit diagram of another prior art contact detecting device which solves some disadvantages of the prior art shown in Fig. 7.
- Figs. 9A-9F are operation diagrams and waveforms for the prior art circuit shown in Fig. 8.
- Fig. 1 illustrates one embodiment of the present invention and provides a general view of a wirecut EDM equipped with a wire-work contact detecting device. In Fig. 1, like numerals indicate like or corresponding parts in Fig. 8. Figure 1 includes a faulty
pulse detecting circuit 10, which detects the high-peak level of an asymmetrical bipolar pulse voltage applied to the gap, in synchronization with the cycle of the asymmetrical bipolar pulse voltage, judges whether the wire 1 and thework 2 are making contact with each other, and transmits a corresponding signal to the NC control unit (41). - Fig. 2 illustrates one embodiment of the faulty
pulse detecting circuit 10. Aninterface 11 is used for converting an analog signal applied to the gap into a binary signal. Asignal forming circuit 12 is used to determine if contact has been made at the gap, in accordance with the gap signal digitized by theinterface 11, and to form a binary signal to be transmitted to theNC unit 41. In theinterface 11, acomparator 21 compares the gap voltage, as seen in Figure 3B, with the reference voltage V₂ and outputs a binary signal having "high" magnitude Vcc or "low"magnitude 0, as seen in Figure 3C, denoting whether or not the gap voltage exceeds the threshold voltage V₂. In thesignal forming circuit 12, aninverter 22 is used to invert areference oscillation signal 51A, having a magnitude Vcc, as seen in Figure 3D.Signal 51A also controls the on/off switching oftransistor 50 in Fig. 1. The inverted signal is seen in Figure 3E. A flip-flop 23 forms signals identifying contact and non-contact at the gap, in synchronization with the detection pulse, as seen in Figure 3F. Specifically, the output of flip-flop 23 at terminal Q is generated in accordance with the signal inverted by the inverter 22 (input to terminal T) and the signal binarized by the interface 11 (input to terminal D). The flip-flop 23 continues outputting the state of input D until the instant when the next leading edge of input T occurs, as seen in Figures 3E and 3F. - Operation of the embodiment will now be described with reference to Figs. 1, 2 and 3A-3G. Figs. 3A-3G illustrate operating conditions and waveforms relevant to the contact position determining operation in a wirecut EDM employing the contact detecting device shown in Figs. 1 and 2.
- Initially, when a command requesting conduct of the contact position determining operation is transmitted to the
NC control unit 41, theswitch 55 is closed. As a result, a low-duty, asymmetrical bipolar pulse voltage is applied to the gap by the bipolar pulsevoltage generating circuit 5A. The asymmetrical bipolar pulse voltage is generated on the secondary side of thepulse transformer 53 by applying a single-polar pulse to a combination of the primary side of thepulse transformer 53 and thediode 52. The pulse leading edge side, i.e., the side on which voltage is not cut by thediode 52, has a high peak value. Approaching speeds and approaching directions of the wire 1 and thework 2 are determined, and movement proceeds. - At this time, the faulty
pulse detecting circuit 10 periodically compares the gap voltage, i.e., the high-peak voltage of the asymmetrical bipolar pulse voltage (Fig. 3B), with reference voltage V₂ in synchronization with the leading edge of the single-polarity pulse applied to the primary side of thepulse transformer 53. If the actual contact condition of the wire and the work is represented by Figure 3A, then a judgment of the contact detecting device as seen in Figure 3G is desired, showing a relatively minor delay in identifying the contact. To this end, if the high-peak voltage of the asymmetrical bipolar pulse voltage is equal to or less than V₂, as seen in Fig. 3B, the comparator fails to produce a pulse in response to the bipolar pulse voltage as seen in Fig. 3C. In the absence of this pulse a signal indicating a contact is sent to theNC unit 41 for the period of the detection pulse cycle only (Fig. 3F). The approaching of the wire 1 and thework 2 is stopped and the contact position determining operation is complete. - The contact is detected in complete synchronization with the asymmetrical bipolar pulse voltage, and the delay of detection is made less than the period of the detection pulse. Since the determination of the contact is only made at the high peak of the detection pulse applied to the gap, the pulse voltage no-application time Toff and the voltage at the low peak of the detection pulse are not a factor. This allows the detection pulse supplied to the gap to have a significantly lower duty. In other words, pulse width Ton can be reduced to a value of several µs or less, which is small as compared to the pulse cycle of up to ten ms or more. Further, the low-peak voltage of the detection pulse can be significantly low as compared to the high-peak voltage. Since the duty of the detection pulse supplied to the gap can be significantly lowered, only a small current flows due to electrolysis when the wire 1 and
work 2 are adjacent to or in contact with each other. Accordingly, little if any damage to the wire 1 andwork 2 will occur and the accuracy of the device is not degraded by repeated positioning. - The cycle of the detection pulse is another factor having great influence on the generation of damage and detection accuracy. It is assumed that as the pulse cycle becomes longer, the damage is less and the detection delay increases. When a typical table feed rate is used for general positioning, if the pulse cycle is less than about 10msec, an error will rarely result from the delay and any subtle change in the gap may be detected. In addition, since the low peak voltage of the detection pulse can be held at a low level, the high-peak voltage can be increased to a relatively high level and the large voltage difference at the gap between an open gap and contact allows contact to be detected with higher sensitivity.
- It will be appreciated that a negative peak voltage of the asymmetrical bipolar pulse may be applied to the wire 1 instead of a positive peak voltage as in the foregoing embodiment.
- As another embodiment of the
interface 11 shown in Fig. 2, a photocoupler illustrated in Fig. 4 may be utilized. In Fig. 4, aphotocoupler 24 includes a transistor 24b that is connected to a voltage Vcc and is on/off controlled in accordance with the value of the current flowing in a diode 24b. Adiode 25 serves to protect thephotocoupler 24 from the application of excessive reverse voltage. Avariable resistor 26 is used for controlling the current flowing in thediode 24a of thephotocoupler 24 and determining a gap voltage value for changing the on/off state of the transistor 24b in thephotocoupler 24. Aresistor 27 connects the photocoupler transistor 24b to ground. - In operation, if the transistor 24b of the
photocoupler 24 is switched ON when the value of the current flowing in thediode 24a of thephotocoupler 24 is greater than I₂, and the transistor is switched OFF when the value is smaller than I₂, the resistance value of thevariable resistor 26 is V₂/I₂. Then, a "high" signal appears at theoutput line 28 when the gap voltage value is greater than V₂, a "low" signal appears at 28 when the value is smaller than V₂, and the relationship between the gap voltage and the signal transmitted to thesignal forming circuit 12 is the same as that shown in Figs. 2 and 3. - As another embodiment of the
signal forming circuit 12 shown in Fig. 2, a one-shot circuit 29 illustrated in Fig. 5 also may be utilized. In the one-shot circuit shown in Fig. 5, output Q is switched high when a leading edge signal enters input T and is held high for a predetermined period of time (TH). When TH has elasped, output Q is switched low and held low until the leading edge signal enters input T again. If the leading edge signal enters input T when output Q is high, output Q is held high for TH from that instant. Therefore, contact at the gap can be detected in synchronization with the cycle of the detection pulse without the input of areference oscillation signal 3. Since the signal holding time TH may be set to any value, a TH value slightly longer than the detection pulse cycle will provide substantially equivalent operation to that shown in Figs. 2 and 3. - If a contact judgment is not desired in response to subtle changes at the gap, resulting from, for example, minor vibration of the wire 1 or conductive materials attaching to the wire 1, the addition of another one-shot circuit to a subsequent stage of the faulty
pulse detecting circuit 10 will retain the signal sent to theNC unit 41 at the time of a state change for a period several times longer than the period of the detection pulse applied to the gap. As a result, the speed of contact judgment may be lowered without varying the duty, frequency, peak voltage, etc. of the detection pulse, and contact/non-contact judgment may be avoided for subtle state changes in the gap. Additional one shot circuits may be placed in series where vibration is excessive. - Figs. 6A-6G illustrate timing diagrams and operation charts for a circuit having a one-shot circuit at a subsequent stage of the faulty
pulse detecting circuit 10, with a signal holding time TH twice as long as the period T₁ of the asymmetrical alternating-current pulse voltage. In this case, Figure 6A identifies the actual contact condition of the wire and the work while Figure 6B illustrates the gap voltage, Figure 6C the comparator output fromcircuit 11 and Figure 6D the output fromcircuit 12. When a one shot is applied between thecircuit 10 and theNC unit 41, the signal denoting a contact is not transmitted to theNC unit 41 unless contact is maintained for a continuous period of time twice the period of the detection pulse, as seen in Figure 6E. The contact judgment timing is seen in Figure 6F. - It will be recognized that the present invention may be used as a contact detector in an engraving EDM in addition to the wirecut EDM as described previously. Moreover, the invention may be applied to any other device requiring contact detection, so long as contact is detectable by electrical means.
- It will be apparent that the present invention, as described above, can achieve a contact detecting device which will minimize damage to the contacting elements by applying a low-duty, asymmetrical bipolar pulse voltage to the gap between the elements, detecting the high-peak level of an asymmetrical bipolar pulse voltage by means of faulty pulse detecting means, and judging from the detection whether or not the elements are making contact with each other. The invention also lowers significantly the reduction of contact positioning accuracy by eliminating the occurrence of detection delay.
- While the present invention has been described using several preferred embodiments, it is not intended to be limited thereto and its full scope is defined by the appended claims.
Claims (20)
- A contact detecting device for detecting a contact between a work (2) and a machine element (1) in an electric discharge machine by analyzing voltage variations of a detection voltage applied to a gap between said work (2) and said machine element (1), comprising(a) a detection voltage generation means (5A) for generating said detection voltage in form of a bipolar pulse voltage and for applying it across said gap;(b) a reference oscillation signal source operative to provide a reference oscillation signal (51A) for the timing of said pulse voltage;(c) a voltage source operative to provide a reference voltage (V₂); and(d) comparing means for comparing the detection voltage to the reference voltage (V₂), and for generating a comparison output signal;
characterized in that(e) said detection voltage generation means (5A) is provided for generating as bipolar pulse detection voltage a low-duty asymmetrical bipolar pulse voltage; and(f) control means (12) are provided which are synchronized with said low-duty pulse voltage for generating a control signal in response to the comparison output signal from said comparing means for identifying a contact. - The contact detecting device as claimed in claim 1, characterized in that said asymmetrical bipolar pulse voltage has a predetermined cycle.
- The contact detecting device as claimed in claim 1 or 2, characterized in that said comparing means is provided to generate a binary signal to be transmitted to an NC unit (41) of the electric discharge machine.
- The contact detecting device as claimed in anyone of claims 1 to 3, characterized in that said comparing means is provided for generating said comparison output signal when a peak of said low-duty asymmetrical bipolar pulse voltage exceeds said reference voltage (V₂).
- The contact detecting device as claimed in anyone of claims 1 to 4, characterized in that said comparing means comprises comparator means (21).
- The contact detecting device as claimed in anyone of claims 1 to 4, characterized in that said comparing means comprises a photocoupler (24).
- The contact detecting device as claimed in any one of claims 1 to 6, characterized in that said control means (12) is controlled by the reference oscillation signal (51A) from said reference oscillation signal source.
- The contact detecting device as claimed in any one of claims 1 to 7, characterized in that said control means (12) comprises a one-shot circuit (29).
- The contact detecting device as claimed in any one of the preceding claims, characterized in that said control means (12) comprises delay means responsive to a change in said low-duty asymmetrical bipolar pulse voltage for delaying identification of a contact for a predetermined period of time.
- The contact detecting device as claimed in claim 9, characterized in that said delay means of said control means (12) is set to a delay period longer than the period of said low-duty pulse voltage.
- The contact detecting device as claimed in any one of the preceding claims, characterized by retaining means for retaining said control signal generated by said control means (12) for a predetermined period of time, for lowering the speed of identifying a contact.
- The contact detecting device as claimed in claim 11, characterized in that said retaining means comprises one-shot means.
- The contact detecting device as claimed in claim 11, characterized in that a plurality of one-shot means is provided which are connected in series.
- The contact detecting device as claimed in any one of the preceding claims, characterized in that said control means (12) comprises inverter means (22) responsive to said reference oscillation signal (51A) from said reference oscillation signal source for generating a gate signal operative to provide timing for detecting a change in the gap voltage.
- The contact detecting device as claimed in claim 14, characterized by means responsive to said comparison output signal from said comparing means and said gate signal for judging the coincidence of said signals and for generating a contact judgement signal.
- The contact detecting device as claimed in any one of the preceding claims, characterized in that a positive peak voltage of said asymmetrical bipolar pulse voltage is applied to the wire (1) of the electric discharge machine.
- The contact detecting device as claimed in any one of the preceding claims, characterized in that a negative peak voltage of said asymmetrical bipolar pulse voltage is applied to the wire (1) of the electric discharge machine.
- A method for detecting a contact between a work and a machine element in an electric discharge machine by analyzing voltage variations of a detection voltage applied to a gap between said work and said machine element, comprising the steps of(a) generating as a first signal a detection voltage in form of a bipolar pulse voltage of a predetermined period and applying it across said gap; and(b) detecting a resultant gap voltage; and(c) comparing the resultant gap voltage to a predetermined reference voltage (V₂) and generating a comparison output signal;
characterized by(c) generating as bipolar pulse detection voltage a low-duty asymmetrical bipolar pulse voltage; and(d) generating as a second signal a control signal synchronized with said first signal, in response to the comparison output signal for identifying a contact. - The method as claimed in claim 18, characterized by delaying said second signal by a time longer than predetermined period.
- The method as claimed in claim 18 or 19, characterized by retaining said second signal for a predetermined period.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP79509/90 | 1990-03-28 | ||
JP2079509A JP2536223B2 (en) | 1990-03-28 | 1990-03-28 | Contact detection device |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0451350A2 EP0451350A2 (en) | 1991-10-16 |
EP0451350A3 EP0451350A3 (en) | 1993-01-27 |
EP0451350B1 true EP0451350B1 (en) | 1996-03-13 |
Family
ID=13691922
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP90123566A Expired - Lifetime EP0451350B1 (en) | 1990-03-28 | 1990-12-07 | Contact detecting device for positioning relatively movable elements |
Country Status (4)
Country | Link |
---|---|
US (1) | US5254826A (en) |
EP (1) | EP0451350B1 (en) |
JP (1) | JP2536223B2 (en) |
DE (1) | DE69025917T2 (en) |
Families Citing this family (17)
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US5691647A (en) * | 1995-03-03 | 1997-11-25 | Tooling & Production Systems, Inc. | Object sensing device and method for using same |
JP3540474B2 (en) * | 1995-11-11 | 2004-07-07 | 株式会社ソディック | Positioning method and reference device for reference contact position of wire electric discharge machine |
JP3390652B2 (en) * | 1998-02-10 | 2003-03-24 | 株式会社ソディック | Electric discharge machine |
CH694154A5 (en) * | 1998-05-08 | 2004-08-13 | Mitsubishi Electric Corp | Electric discharge machine positioning |
JP3996812B2 (en) * | 2002-08-06 | 2007-10-24 | ファナック株式会社 | Wire contact / non-contact boundary position detection device for wire cut electrical discharge machine |
US20120128439A1 (en) * | 2009-04-28 | 2012-05-24 | Georgia Tech Research Corporation | Smart Conductive Tool-Part Registration System |
JP5048108B2 (en) * | 2010-08-06 | 2012-10-17 | ファナック株式会社 | Wire-cut EDM with workpiece measurement function |
JP5155418B2 (en) * | 2011-03-07 | 2013-03-06 | ファナック株式会社 | EDM machine |
JP5543522B2 (en) | 2012-04-24 | 2014-07-09 | ファナック株式会社 | Contact detection device for wire electric discharge machine with variable applied voltage between electrodes |
JP6140221B2 (en) * | 2015-07-08 | 2017-05-31 | ファナック株式会社 | Wire electrical discharge machine with positioning and shape measurement functions |
CN107073614B (en) * | 2015-10-30 | 2019-01-04 | 三菱电机株式会社 | Wire electric discharge machine, wire electric discharge machine control device control method and localization method |
US10272510B2 (en) * | 2016-01-14 | 2019-04-30 | United Technologies Corporation | Electrical discharge machining apparatus |
RU2669673C2 (en) * | 2016-05-31 | 2018-10-12 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Воронежский государственный технический университет" | Method and device for manufacturing profile in semi-enclosed channel of part with wire electrode tool |
CN110091014A (en) * | 2018-01-29 | 2019-08-06 | 上海东熠数控科技有限公司 | The workpiece positioning system and method for thermoelectricity flower molding machine |
CN111211029B (en) * | 2018-11-21 | 2023-09-01 | 中微半导体设备(上海)股份有限公司 | Multi-zone temperature-control plasma reactor |
JP7010872B2 (en) * | 2019-03-27 | 2022-01-26 | ファナック株式会社 | Wire electric discharge machine and end face position determination method |
JP7355633B2 (en) * | 2019-12-13 | 2023-10-03 | ファナック株式会社 | Control device and program |
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US3609281A (en) * | 1969-12-15 | 1971-09-28 | Cincinnati Milacron Inc | Method and apparatus for detecting short circuits in the machining gap in an edm process |
JPS5656341A (en) * | 1979-10-05 | 1981-05-18 | Fanuc Ltd | Power source for wire cut electric discharge machining |
JPS57201134A (en) * | 1981-05-30 | 1982-12-09 | Mitsubishi Electric Corp | Wire cut electric discharge processing method |
JPS5973232A (en) * | 1982-10-20 | 1984-04-25 | Mitsubishi Electric Corp | Wire cut electric discharge machining device |
JPS5993227A (en) * | 1982-11-15 | 1984-05-29 | Fanuc Ltd | Edm control circuit |
JPS59152021A (en) * | 1983-02-15 | 1984-08-30 | Fanuc Ltd | Wire cut electric discharge machining equipment |
JPS6029246A (en) * | 1983-07-13 | 1985-02-14 | Fanuc Ltd | Contact sensor for electric discharge machine |
JPS60135127A (en) * | 1983-12-23 | 1985-07-18 | Fanuc Ltd | Positioning device of electric discharge machining unit |
JPS60201826A (en) * | 1984-03-26 | 1985-10-12 | Fanuc Ltd | Power source for wire electric discharge machining |
JPS60255319A (en) * | 1984-05-30 | 1985-12-17 | Mitsubishi Electric Corp | Method of detecting disconnection of wire in electric discharge machining apparatus |
JPS6150714A (en) * | 1984-08-21 | 1986-03-13 | Inoue Japax Res Inc | Power supplying device for electrical discharge machining |
JPH035405Y2 (en) * | 1985-05-09 | 1991-02-12 | ||
JPS632612A (en) * | 1986-06-18 | 1988-01-07 | Fanuc Ltd | Electric discharge machining controller |
JPS637225A (en) * | 1986-06-25 | 1988-01-13 | Mitsubishi Electric Corp | Wire cut electric discharge machine |
DE3708771C1 (en) * | 1987-03-18 | 1988-01-21 | Daimler Benz Ag | Device for the contactless determination of the distances of an object from the contours of an object which can be moved relative to this by means of pulsed spark discharges |
JPS63318222A (en) * | 1987-06-22 | 1988-12-27 | Hoden Seimitsu Kako Kenkyusho Ltd | Detecting device for short circuit of wire electric discharge machine |
JPH0248117A (en) * | 1988-08-09 | 1990-02-16 | Mitsubishi Electric Corp | Wire electric discharge machining method |
JP2869545B2 (en) * | 1989-12-25 | 1999-03-10 | 株式会社ソディック | Electric discharge machine |
-
1990
- 1990-03-28 JP JP2079509A patent/JP2536223B2/en not_active Expired - Lifetime
- 1990-11-27 US US07/618,446 patent/US5254826A/en not_active Expired - Lifetime
- 1990-12-07 EP EP90123566A patent/EP0451350B1/en not_active Expired - Lifetime
- 1990-12-07 DE DE69025917T patent/DE69025917T2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2536223B2 (en) | 1996-09-18 |
EP0451350A2 (en) | 1991-10-16 |
DE69025917T2 (en) | 1996-08-14 |
EP0451350A3 (en) | 1993-01-27 |
DE69025917D1 (en) | 1996-04-18 |
US5254826A (en) | 1993-10-19 |
JPH03281150A (en) | 1991-12-11 |
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