EP0437249A3 - Spectrometric method free from variations of error - Google Patents

Spectrometric method free from variations of error Download PDF

Info

Publication number
EP0437249A3
EP0437249A3 EP19910100214 EP91100214A EP0437249A3 EP 0437249 A3 EP0437249 A3 EP 0437249A3 EP 19910100214 EP19910100214 EP 19910100214 EP 91100214 A EP91100214 A EP 91100214A EP 0437249 A3 EP0437249 A3 EP 0437249A3
Authority
EP
European Patent Office
Prior art keywords
error
variations
spectrometric method
method free
free
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19910100214
Other versions
EP0437249A2 (en
EP0437249B1 (en
Inventor
Hiroshi Yokota
Masaaki Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kurashiki Spinning Co Ltd
Original Assignee
Kurashiki Spinning Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kurashiki Spinning Co Ltd filed Critical Kurashiki Spinning Co Ltd
Publication of EP0437249A2 publication Critical patent/EP0437249A2/en
Publication of EP0437249A3 publication Critical patent/EP0437249A3/en
Application granted granted Critical
Publication of EP0437249B1 publication Critical patent/EP0437249B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods
EP91100214A 1990-01-11 1991-01-09 Spectrometric method free from variations of error Expired - Lifetime EP0437249B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP4042/90 1990-01-11
JP2004042A JPH06105217B2 (en) 1990-01-11 1990-01-11 Spectrometry

Publications (3)

Publication Number Publication Date
EP0437249A2 EP0437249A2 (en) 1991-07-17
EP0437249A3 true EP0437249A3 (en) 1992-07-08
EP0437249B1 EP0437249B1 (en) 1995-07-12

Family

ID=11573884

Family Applications (1)

Application Number Title Priority Date Filing Date
EP91100214A Expired - Lifetime EP0437249B1 (en) 1990-01-11 1991-01-09 Spectrometric method free from variations of error

Country Status (6)

Country Link
US (1) US5227986A (en)
EP (1) EP0437249B1 (en)
JP (1) JPH06105217B2 (en)
KR (1) KR0163788B1 (en)
CA (1) CA2033832A1 (en)
DE (1) DE69111085T2 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5397899A (en) * 1992-07-21 1995-03-14 Western Atlas International, Inc. Method for improving infrared analysis estimations by automatically compensating for instrument instabilities
JPH07218491A (en) * 1994-01-31 1995-08-18 Shimadzu Corp Detector for chromatograph
JP3555706B2 (en) * 1995-03-13 2004-08-18 大日精化工業株式会社 Correcting colorimetric values
JP3476958B2 (en) * 1995-04-12 2003-12-10 アークレイ株式会社 A method for stabilizing spectra in spectrometry.
JP3526652B2 (en) * 1995-05-11 2004-05-17 倉敷紡績株式会社 Optical measuring method and optical measuring device
US5610836A (en) * 1996-01-31 1997-03-11 Eastman Chemical Company Process to use multivariate signal responses to analyze a sample
US6750848B1 (en) * 1998-11-09 2004-06-15 Timothy R. Pryor More useful man machine interfaces and applications
US20020036617A1 (en) 1998-08-21 2002-03-28 Timothy R. Pryor Novel man machine interfaces and applications
AT406711B (en) * 1999-02-25 2000-08-25 Joanneum Research Forschungsge PROCEDURE FOR THE SPECTROSCOPIC DETERMINATION OF THE CONCENTRATION OF ALCOHOLS WITH 1 TO 5 CARBON ATOMS
US6442411B1 (en) 1999-04-21 2002-08-27 Optix, Lp Method for improving calibration of an instrument for non-invasively measuring constituents in arterial blood
US7015950B1 (en) 1999-05-11 2006-03-21 Pryor Timothy R Picture taking method and apparatus
US6766036B1 (en) 1999-07-08 2004-07-20 Timothy R. Pryor Camera based man machine interfaces
JP4812599B2 (en) * 2006-11-17 2011-11-09 倉敷紡績株式会社 Method and apparatus for measuring dye concentration
US20120029348A1 (en) * 2009-04-14 2012-02-02 The Gemeral Hospital Corporation Method and apparatus for multimodal imaging of biological tissue
JP5180263B2 (en) 2010-07-23 2013-04-10 倉敷紡績株式会社 Substrate processing equipment
JP6521056B2 (en) * 2015-03-31 2019-05-29 日本電気株式会社 Spectroscopic analyzer, spectral analysis method, and program

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0299652A1 (en) * 1987-07-15 1989-01-18 Hewlett-Packard Company Baseline correction for chromatography

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4627014A (en) * 1984-04-09 1986-12-02 Eastman Kodak Company Method and apparatus for determination of an analyte and method of calibrating such apparatus
JPH0629852B2 (en) * 1985-08-26 1994-04-20 富士写真フイルム株式会社 Quantitative analysis method of test substance in liquid sample using biased dry analysis element
US4800279A (en) * 1985-09-13 1989-01-24 Indiana University Foundation Methods and devices for near-infrared evaluation of physical properties of samples
US4805623A (en) * 1987-09-04 1989-02-21 Vander Corporation Spectrophotometric method for quantitatively determining the concentration of a dilute component in a light- or other radiation-scattering environment
JPH01124751A (en) * 1987-11-10 1989-05-17 Konica Corp Preparation of conversion expression
JPH0774761B2 (en) * 1987-12-16 1995-08-09 株式会社島津製作所 Spectral pattern similarity determination method
US4864842A (en) * 1988-07-29 1989-09-12 Troxler Electronic Laboratories, Inc. Method and system for transferring calibration data between calibrated measurement instruments

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0299652A1 (en) * 1987-07-15 1989-01-18 Hewlett-Packard Company Baseline correction for chromatography

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 13, no. 428 (P-936)25 September 1989 & JP-A-1 161 123 ( SHIMADZU CORP ) 23 June 1989 *

Also Published As

Publication number Publication date
US5227986A (en) 1993-07-13
EP0437249A2 (en) 1991-07-17
DE69111085T2 (en) 1995-11-16
KR0163788B1 (en) 1999-03-30
JPH06105217B2 (en) 1994-12-21
CA2033832A1 (en) 1991-07-12
JPH03209149A (en) 1991-09-12
DE69111085D1 (en) 1995-08-17
EP0437249B1 (en) 1995-07-12

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