EP0381067A3 - A method for registration of cad model to video images with added clutter - Google Patents

A method for registration of cad model to video images with added clutter Download PDF

Info

Publication number
EP0381067A3
EP0381067A3 EP19900101560 EP90101560A EP0381067A3 EP 0381067 A3 EP0381067 A3 EP 0381067A3 EP 19900101560 EP19900101560 EP 19900101560 EP 90101560 A EP90101560 A EP 90101560A EP 0381067 A3 EP0381067 A3 EP 0381067A3
Authority
EP
European Patent Office
Prior art keywords
positioning
image
camera
pcb
site
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP19900101560
Other languages
German (de)
French (fr)
Other versions
EP0381067A2 (en
Inventor
H. Keith Nishihara
Neil D. Hunt
P. Anthony Crossley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Technologies Inc
Original Assignee
Schlumberger Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Inc filed Critical Schlumberger Technologies Inc
Publication of EP0381067A2 publication Critical patent/EP0381067A2/en
Publication of EP0381067A3 publication Critical patent/EP0381067A3/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
    • G06T7/32—Determination of transform parameters for the alignment of images, i.e. image registration using correlation-based methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

A technique for position-finding on a manufactured device such as an integrated circuit ("IC") or a printed circuit board ("PCB"), relating the observed image to a description such as the CAD database that was used to create the devices. The technique contemplates providing an optical image of the surface of the device, obtained with an imaging device such as a video camera and a microscope, generating a synthetic CAD image from the CAD database, subjecting both images to a filtering operation (Laplacian of Gaussian convolution), binarizing (taking the sign of) the results, and correlating the two filtered and binarized images (referred to as "processed" images) to determine relative alignment. One application of the invention is to allow precision positioning of a positioning head relative to a workpiece such as placing an IC device (12) on a PCB (15). A positioning head (17) to which a camera (22) is mounted is driven to the approximate location of the IC site by a positioning mechanism. The positioning mechannism need not be accurate for large increments of travel, but must be capable of providing small relative displacements with high precision. The camera image of the area near the IC site on the PCB is filtered and binarized, and correlated with a processed CAD image of the region surrounding the IC site. This establishes the actual position of the camera (and therefore the positioning head). The positioning head is then moved by the indicated amount.
EP19900101560 1989-01-31 1990-01-26 A method for registration of cad model to video images with added clutter Withdrawn EP0381067A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30494389A 1989-01-31 1989-01-31
US304943 1989-01-31

Publications (2)

Publication Number Publication Date
EP0381067A2 EP0381067A2 (en) 1990-08-08
EP0381067A3 true EP0381067A3 (en) 1992-08-12

Family

ID=23178632

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19900101560 Withdrawn EP0381067A3 (en) 1989-01-31 1990-01-26 A method for registration of cad model to video images with added clutter

Country Status (2)

Country Link
EP (1) EP0381067A3 (en)
JP (1) JPH03148774A (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5600734A (en) * 1991-10-04 1997-02-04 Fujitsu Limited Electron beam tester
FR2693813B1 (en) * 1992-07-20 1994-08-19 Commissariat Energie Atomique Method for producing a synthesized reference image from data contained in a CAD database.
FR2697930B1 (en) * 1992-11-09 1995-01-13 Commissariat Energie Atomique Method for producing a synthesized reference image for inspecting objects.
US5604819A (en) * 1993-03-15 1997-02-18 Schlumberger Technologies Inc. Determining offset between images of an IC
US6411915B1 (en) 1998-07-28 2002-06-25 General Electric Company Method and apparatus for calibrating a non-contact range sensor
US6748112B1 (en) 1998-07-28 2004-06-08 General Electric Company Method and apparatus for finding shape deformations in objects having smooth surfaces
EP1040449A1 (en) * 1998-07-28 2000-10-04 General Electric Company Method and apparatus for calibrating a non-contact range sensor
US7543326B2 (en) 2002-06-10 2009-06-02 Microsoft Corporation Dynamic rate control
US20030235250A1 (en) 2002-06-24 2003-12-25 Ankur Varma Video deblocking
US6985238B2 (en) 2002-09-25 2006-01-10 General Electric Company Non-contact measurement system for large airfoils
US7327857B2 (en) 2004-03-09 2008-02-05 General Electric Company Non-contact measurement method and apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0254644A2 (en) * 1986-07-22 1988-01-27 Schlumberger Technologies, Inc. Mask alignment and measurement of critical dimensions in integrated circuits

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0254644A2 (en) * 1986-07-22 1988-01-27 Schlumberger Technologies, Inc. Mask alignment and measurement of critical dimensions in integrated circuits

Also Published As

Publication number Publication date
JPH03148774A (en) 1991-06-25
EP0381067A2 (en) 1990-08-08

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